JP2010531031A5 - - Google Patents
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- Publication number
- JP2010531031A5 JP2010531031A5 JP2010510468A JP2010510468A JP2010531031A5 JP 2010531031 A5 JP2010531031 A5 JP 2010531031A5 JP 2010510468 A JP2010510468 A JP 2010510468A JP 2010510468 A JP2010510468 A JP 2010510468A JP 2010531031 A5 JP2010531031 A5 JP 2010531031A5
- Authority
- JP
- Japan
- Prior art keywords
- ion
- ion source
- mass spectrometer
- axis
- ion guide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 150000002500 ions Chemical class 0.000 claims 34
- 230000005405 multipole Effects 0.000 claims 9
- 239000002245 particle Substances 0.000 claims 5
- 238000003795 desorption Methods 0.000 claims 2
- 238000005040 ion trap Methods 0.000 claims 2
- 238000000608 laser ablation Methods 0.000 claims 2
- 239000011159 matrix material Substances 0.000 claims 2
- 239000000523 sample Substances 0.000 claims 2
- 238000011144 upstream manufacturing Methods 0.000 claims 2
- 238000000451 chemical ionisation Methods 0.000 claims 1
- 239000000126 substance Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/809,349 | 2007-05-31 | ||
| US11/809,349 US8507850B2 (en) | 2007-05-31 | 2007-05-31 | Multipole ion guide interface for reduced background noise in mass spectrometry |
| PCT/US2008/064984 WO2009038825A2 (en) | 2007-05-31 | 2008-05-28 | Multipole ion guide interface for reduced background noise in mass spectrometry |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014064661A Division JP2014112570A (ja) | 2007-05-31 | 2014-03-26 | 質量分析におけるバックグラウンドノイズ低減用の多重極イオンガイドインタフェース |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010531031A JP2010531031A (ja) | 2010-09-16 |
| JP2010531031A5 true JP2010531031A5 (enExample) | 2011-05-26 |
| JP5512512B2 JP5512512B2 (ja) | 2014-06-04 |
Family
ID=40468701
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010510468A Expired - Fee Related JP5512512B2 (ja) | 2007-05-31 | 2008-05-28 | 質量分析におけるバックグラウンドノイズ低減用の多重極イオンガイドインタフェース |
| JP2014064661A Pending JP2014112570A (ja) | 2007-05-31 | 2014-03-26 | 質量分析におけるバックグラウンドノイズ低減用の多重極イオンガイドインタフェース |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014064661A Pending JP2014112570A (ja) | 2007-05-31 | 2014-03-26 | 質量分析におけるバックグラウンドノイズ低減用の多重極イオンガイドインタフェース |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US8507850B2 (enExample) |
| EP (1) | EP2150967A4 (enExample) |
| JP (2) | JP5512512B2 (enExample) |
| CN (1) | CN202103011U (enExample) |
| CA (1) | CA2687965C (enExample) |
| WO (1) | WO2009038825A2 (enExample) |
Families Citing this family (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5626889B2 (ja) * | 2007-09-19 | 2014-11-19 | ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド | 質量分析計用衝突セル |
| JP2010033735A (ja) * | 2008-07-25 | 2010-02-12 | Jeol Ltd | 四重極質量分析装置 |
| US20100154568A1 (en) * | 2008-11-19 | 2010-06-24 | Roth Michael J | Analytical Instruments, Assemblies, and Methods |
| CA2760027A1 (en) * | 2009-06-03 | 2010-12-09 | Wayne State University | Mass spectrometry using laserspray ionization |
| WO2011061147A1 (en) * | 2009-11-17 | 2011-05-26 | Bruker Daltonik Gmbh | Utilizing gas flows in mass spectrometers |
| JP5257334B2 (ja) * | 2009-11-20 | 2013-08-07 | 株式会社島津製作所 | 質量分析装置 |
| US8324565B2 (en) * | 2009-12-17 | 2012-12-04 | Agilent Technologies, Inc. | Ion funnel for mass spectrometry |
| AU2011334612A1 (en) * | 2010-11-26 | 2013-05-02 | Bruker Chemical Analysis Bv | Improvements in or relating to mass spectrometry |
| JP2014504784A (ja) * | 2011-01-25 | 2014-02-24 | ブルーカー バイオサイエンシズ プロプライアタリー リミティド | 質量分析装置 |
| CA2828967C (en) | 2011-03-04 | 2018-07-10 | Perkinelmer Health Sciences, Inc. | Electrostatic lenses and systems including the same |
| US8461524B2 (en) * | 2011-03-28 | 2013-06-11 | Thermo Finnigan Llc | Ion guide with improved gas dynamics and combined noise reduction device |
| WO2013001604A1 (ja) * | 2011-06-28 | 2013-01-03 | 株式会社島津製作所 | 三連四重極型質量分析装置 |
| JP6087056B2 (ja) * | 2012-01-06 | 2017-03-01 | アジレント・テクノロジーズ・インクAgilent Technologies, Inc. | 誘導結合プラズマms/ms型質量分析装置 |
| DE102012008259B4 (de) * | 2012-04-25 | 2014-06-26 | Bruker Daltonik Gmbh | Ionenerzeugung in Massenspektrometern durch Clusterbeschuss |
| US9105438B2 (en) | 2012-05-31 | 2015-08-11 | Fei Company | Imaging and processing for plasma ion source |
| US8791409B2 (en) * | 2012-07-27 | 2014-07-29 | Thermo Fisher Scientific (Bremen) Gmbh | Method and analyser for analysing ions having a high mass-to-charge ratio |
| CN102856153A (zh) * | 2012-10-08 | 2013-01-02 | 复旦大学 | 一种离子光学偏轴传输系统 |
| CN103854953A (zh) * | 2012-11-30 | 2014-06-11 | 中国科学院大连化学物理研究所 | 无光窗式真空紫外灯质谱电离源 |
| CN104008950B (zh) * | 2013-02-25 | 2017-09-08 | 株式会社岛津制作所 | 离子产生装置以及离子产生方法 |
| US9558925B2 (en) * | 2014-04-18 | 2017-01-31 | Battelle Memorial Institute | Device for separating non-ions from ions |
| US9558924B2 (en) * | 2014-12-09 | 2017-01-31 | Morpho Detection, Llc | Systems for separating ions and neutrals and methods of operating the same |
| DE102014226039A1 (de) | 2014-12-16 | 2016-06-16 | Carl Zeiss Smt Gmbh | Ionisierungseinrichtung und Massenspektrometer damit |
| GB2534569A (en) * | 2015-01-27 | 2016-08-03 | Shimadzu Corp | Method of controlling a DC power supply |
| CN107851550B (zh) * | 2015-07-13 | 2019-06-28 | 株式会社岛津制作所 | 闸门 |
| US11081331B2 (en) | 2015-10-28 | 2021-08-03 | Duke University | Mass spectrometers having segmented electrodes and associated methods |
| GB2549248B (en) | 2016-01-12 | 2020-07-22 | Thermo Fisher Scient Bremen Gmbh | IRMS sample introduction system and method |
| US9941094B1 (en) | 2017-02-01 | 2018-04-10 | Fei Company | Innovative source assembly for ion beam production |
| JP6806235B2 (ja) * | 2017-03-16 | 2021-01-06 | 株式会社島津製作所 | 荷電粒子の供給制御方法及び装置 |
| JP6808669B2 (ja) | 2018-03-14 | 2021-01-06 | 日本電子株式会社 | 質量分析装置 |
| AU2020292464A1 (en) | 2019-06-14 | 2021-12-09 | Shanghai Polaris Biology Co., Ltd. | Systems and methods for single particle analysis |
| US12394613B2 (en) | 2020-03-24 | 2025-08-19 | Dh Technologies Development Pte. Ltd. | Three stage atmosphere to vacuum mass spectrometer inlet with additional declustering in the third stage |
| CN111668087B (zh) * | 2020-06-11 | 2023-10-27 | 中国科学院上海应用物理研究所 | 一种多级真空差分的电喷雾离子源引导装置 |
| WO2022084764A1 (en) * | 2020-10-19 | 2022-04-28 | Dh Technologies Development Pte. Ltd. | Systems and methods for multistage mass spectrometry utilizing an electrostatic ion trap |
| CN116783481B (zh) * | 2021-01-29 | 2024-11-19 | Atonarp株式会社 | 气体分析装置和控制方法 |
| WO2022180550A1 (en) * | 2021-02-25 | 2022-09-01 | Dh Technologies Development Pte. Ltd. | Bent pcb ion guide for reduction of contamination and noise |
| CN113237943B (zh) * | 2021-05-12 | 2023-10-20 | 中国科学技术大学 | 一种降低质谱探测h2和h2o背景噪声的超高真空装置 |
| JP7729210B2 (ja) | 2022-01-05 | 2025-08-26 | 株式会社島津製作所 | 質量分析装置 |
| CN116313729A (zh) * | 2022-11-25 | 2023-06-23 | 中国科学院青岛生物能源与过程研究所 | 一种大气压下可切换激光剥蚀/电喷雾离子源质谱仪及其使用方法 |
Family Cites Families (50)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3334225A (en) | 1964-04-24 | 1967-08-01 | California Inst Res Found | Quadrupole mass filter with means to generate a noise spectrum exclusive of the resonant frequency of the desired ions to deflect stable ions |
| US3410997A (en) | 1964-09-08 | 1968-11-12 | Bell & Howell Co | Multipole mass filter |
| US3473020A (en) | 1967-06-19 | 1969-10-14 | Bell & Howell Co | Mass analyzer having series aligned curvilinear and rectilinear analyzer sections |
| EP0237259A3 (en) | 1986-03-07 | 1989-04-05 | Finnigan Corporation | Mass spectrometer |
| CA1307859C (en) | 1988-12-12 | 1992-09-22 | Donald James Douglas | Mass spectrometer and method with improved ion transmission |
| US5171990A (en) | 1991-05-17 | 1992-12-15 | Finnigan Corporation | Electrospray ion source with reduced neutral noise and method |
| US5179278A (en) | 1991-08-23 | 1993-01-12 | Mds Health Group Limited | Multipole inlet system for ion traps |
| JP3367719B2 (ja) * | 1993-09-20 | 2003-01-20 | 株式会社日立製作所 | 質量分析計および静電レンズ |
| EP0748249B1 (en) | 1994-02-28 | 2009-07-08 | Analytica Of Branford, Inc. | Multipole ion guide for mass spectrometry |
| US7019285B2 (en) * | 1995-08-10 | 2006-03-28 | Analytica Of Branford, Inc. | Ion storage time-of-flight mass spectrometer |
| US5672868A (en) * | 1996-02-16 | 1997-09-30 | Varian Associates, Inc. | Mass spectrometer system and method for transporting and analyzing ions |
| GB9612070D0 (en) * | 1996-06-10 | 1996-08-14 | Micromass Ltd | Plasma mass spectrometer |
| JPH1097838A (ja) * | 1996-07-30 | 1998-04-14 | Yokogawa Analytical Syst Kk | 誘導結合プラズマ質量分析装置 |
| JPH10112280A (ja) * | 1996-10-08 | 1998-04-28 | Jeol Ltd | イオン源 |
| JPH10289685A (ja) * | 1997-04-11 | 1998-10-27 | Yokogawa Analytical Syst Kk | 誘導結合プラズマ質量分析装置 |
| US6987264B1 (en) * | 1998-01-23 | 2006-01-17 | Analytica Of Branford, Inc. | Mass spectrometry with multipole ion guides |
| US6753523B1 (en) * | 1998-01-23 | 2004-06-22 | Analytica Of Branford, Inc. | Mass spectrometry with multipole ion guides |
| US6069355A (en) * | 1998-05-14 | 2000-05-30 | Varian, Inc. | Ion trap mass pectrometer with electrospray ionization |
| CA2626383C (en) | 1998-05-29 | 2011-07-19 | Craig M. Whitehouse | Mass spectrometry with multipole ion guides |
| US6410915B1 (en) * | 1998-06-18 | 2002-06-25 | Micromass Limited | Multi-inlet mass spectrometer for analysis of liquid samples by electrospray or atmospheric pressure ionization |
| CA2344446C (en) | 1998-09-23 | 2008-07-08 | Varian Australia Pty. Ltd. | Ion optical system for a mass spectrometer |
| JP2000243347A (ja) * | 1999-02-18 | 2000-09-08 | Hitachi Ltd | イオントラップ型質量分析装置およびイオントラップ質量分析方法 |
| JP3542918B2 (ja) | 1999-03-17 | 2004-07-14 | 日本電子株式会社 | イオンガイド |
| US20030038236A1 (en) * | 1999-10-29 | 2003-02-27 | Russ Charles W. | Atmospheric pressure ion source high pass ion filter |
| US6809312B1 (en) * | 2000-05-12 | 2004-10-26 | Bruker Daltonics, Inc. | Ionization source chamber and ion beam delivery system for mass spectrometry |
| US6593570B2 (en) | 2000-05-24 | 2003-07-15 | Agilent Technologies, Inc. | Ion optic components for mass spectrometers |
| US6417511B1 (en) | 2000-07-17 | 2002-07-09 | Agilent Technologies, Inc. | Ring pole ion guide apparatus, systems and method |
| JPWO2002089161A1 (ja) * | 2001-04-27 | 2004-08-19 | 松下電器産業株式会社 | コンデンサおよびその製造方法 |
| AUPR465101A0 (en) * | 2001-04-27 | 2001-05-24 | Varian Australia Pty Ltd | "Mass spectrometer" |
| JP3840417B2 (ja) * | 2002-02-20 | 2006-11-01 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
| US6891157B2 (en) * | 2002-05-31 | 2005-05-10 | Micromass Uk Limited | Mass spectrometer |
| US7034292B1 (en) * | 2002-05-31 | 2006-04-25 | Analytica Of Branford, Inc. | Mass spectrometry with segmented RF multiple ion guides in various pressure regions |
| US6872940B1 (en) * | 2002-05-31 | 2005-03-29 | Thermo Finnigan Llc | Focusing ions using gas dynamics |
| JP3791479B2 (ja) | 2002-09-17 | 2006-06-28 | 株式会社島津製作所 | イオンガイド |
| US20040195503A1 (en) * | 2003-04-04 | 2004-10-07 | Taeman Kim | Ion guide for mass spectrometers |
| US6730904B1 (en) * | 2003-04-30 | 2004-05-04 | Varian, Inc. | Asymmetric-field ion guiding devices |
| EP1759402B1 (en) * | 2004-05-21 | 2015-07-08 | Craig M. Whitehouse | Rf surfaces and rf ion guides |
| US7189967B1 (en) * | 2004-06-16 | 2007-03-13 | Analytica Of Branford, Inc. | Mass spectrometry with multipole ion guides |
| JP2006032109A (ja) * | 2004-07-15 | 2006-02-02 | Jeol Ltd | 垂直加速型飛行時間型質量分析装置 |
| DE102004037511B4 (de) * | 2004-08-03 | 2007-08-23 | Bruker Daltonik Gmbh | Multipole durch Drahterosion |
| US20060043285A1 (en) * | 2004-08-26 | 2006-03-02 | Battelle Memorial Institute | Method and apparatus for enhanced sequencing of complex molecules using surface-induced dissociation in conjunction with mass spectrometric analysis |
| GB0424426D0 (en) * | 2004-11-04 | 2004-12-08 | Micromass Ltd | Mass spectrometer |
| US6998622B1 (en) * | 2004-11-17 | 2006-02-14 | Agilent Technologies, Inc. | On-axis electron impact ion source |
| DE102005023590A1 (de) | 2005-05-18 | 2006-11-23 | Spectro Analytical Instruments Gmbh & Co. Kg | ICP-Massenspektrometer |
| GB0511333D0 (en) * | 2005-06-03 | 2005-07-13 | Micromass Ltd | Mass spectrometer |
| US7372042B2 (en) * | 2005-08-31 | 2008-05-13 | Agilent Technologies, Inc. | Lens device for introducing a second ion beam into a primary ion path |
| US7335878B2 (en) * | 2005-10-17 | 2008-02-26 | Ut-Battelle Llc | Method and apparatus for efficient photodetachment and purification of negative ion beams |
| US7391019B2 (en) * | 2006-07-21 | 2008-06-24 | Thermo Finnigan Llc | Electrospray ion source |
| US7741600B2 (en) * | 2006-11-17 | 2010-06-22 | Thermo Finnigan Llc | Apparatus and method for providing ions to a mass analyzer |
| US8853622B2 (en) * | 2007-02-07 | 2014-10-07 | Thermo Finnigan Llc | Tandem mass spectrometer |
-
2007
- 2007-05-31 US US11/809,349 patent/US8507850B2/en not_active Expired - Fee Related
-
2008
- 2008-05-28 WO PCT/US2008/064984 patent/WO2009038825A2/en not_active Ceased
- 2008-05-28 CA CA2687965A patent/CA2687965C/en active Active
- 2008-05-28 JP JP2010510468A patent/JP5512512B2/ja not_active Expired - Fee Related
- 2008-05-28 EP EP08831810A patent/EP2150967A4/en not_active Ceased
- 2008-05-28 CN CN200890100006.4U patent/CN202103011U/zh not_active Expired - Lifetime
-
2013
- 2013-07-01 US US13/932,716 patent/US8723107B2/en active Active
-
2014
- 2014-03-26 JP JP2014064661A patent/JP2014112570A/ja active Pending
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