CN202103011U - 用于样本物质分析的设备 - Google Patents

用于样本物质分析的设备 Download PDF

Info

Publication number
CN202103011U
CN202103011U CN200890100006.4U CN200890100006U CN202103011U CN 202103011 U CN202103011 U CN 202103011U CN 200890100006 U CN200890100006 U CN 200890100006U CN 202103011 U CN202103011 U CN 202103011U
Authority
CN
China
Prior art keywords
ion
guides part
ion guides
axis
mass analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CN200890100006.4U
Other languages
English (en)
Chinese (zh)
Inventor
克雷格·M·怀特豪斯
戴维·G·韦尔基
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Revvity Health Sciences Inc
Original Assignee
PerkinElmer Health Sciences Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PerkinElmer Health Sciences Inc filed Critical PerkinElmer Health Sciences Inc
Application granted granted Critical
Publication of CN202103011U publication Critical patent/CN202103011U/zh
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN200890100006.4U 2007-05-31 2008-05-28 用于样本物质分析的设备 Expired - Lifetime CN202103011U (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/809,349 2007-05-31
US11/809,349 US8507850B2 (en) 2007-05-31 2007-05-31 Multipole ion guide interface for reduced background noise in mass spectrometry
PCT/US2008/064984 WO2009038825A2 (en) 2007-05-31 2008-05-28 Multipole ion guide interface for reduced background noise in mass spectrometry

Publications (1)

Publication Number Publication Date
CN202103011U true CN202103011U (zh) 2012-01-04

Family

ID=40468701

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200890100006.4U Expired - Lifetime CN202103011U (zh) 2007-05-31 2008-05-28 用于样本物质分析的设备

Country Status (6)

Country Link
US (2) US8507850B2 (enExample)
EP (1) EP2150967A4 (enExample)
JP (2) JP5512512B2 (enExample)
CN (1) CN202103011U (enExample)
CA (1) CA2687965C (enExample)
WO (1) WO2009038825A2 (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102856153A (zh) * 2012-10-08 2013-01-02 复旦大学 一种离子光学偏轴传输系统
CN103854953A (zh) * 2012-11-30 2014-06-11 中国科学院大连化学物理研究所 无光窗式真空紫外灯质谱电离源
CN107004551A (zh) * 2014-12-16 2017-08-01 卡尔蔡司Smt有限责任公司 离子化装置和包含离子化装置的质谱仪
CN110446921A (zh) * 2017-03-16 2019-11-12 株式会社岛津制作所 带电粒子的供给控制方法和装置
CN111668087A (zh) * 2020-06-11 2020-09-15 中国科学院上海应用物理研究所 一种多级真空差分的电喷雾离子源引导装置
CN115315777A (zh) * 2020-03-24 2022-11-08 Dh科技发展私人贸易有限公司 在第三级具有额外去簇的三级大气到真空质谱仪入口
CN116313729A (zh) * 2022-11-25 2023-06-23 中国科学院青岛生物能源与过程研究所 一种大气压下可切换激光剥蚀/电喷雾离子源质谱仪及其使用方法

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7923681B2 (en) * 2007-09-19 2011-04-12 Dh Technologies Pte. Ltd. Collision cell for mass spectrometer
JP2010033735A (ja) * 2008-07-25 2010-02-12 Jeol Ltd 四重極質量分析装置
US20100154568A1 (en) * 2008-11-19 2010-06-24 Roth Michael J Analytical Instruments, Assemblies, and Methods
WO2010141763A1 (en) * 2009-06-03 2010-12-09 Wayne State University Mass spectrometry using laserspray ionization
DE202010017766U1 (de) * 2009-11-17 2012-07-11 Bruker Daltonik Gmbh Nutzung von Gasströmungen in Massenspektrometern
JP5257334B2 (ja) * 2009-11-20 2013-08-07 株式会社島津製作所 質量分析装置
US8324565B2 (en) * 2009-12-17 2012-12-04 Agilent Technologies, Inc. Ion funnel for mass spectrometry
CA2818001A1 (en) 2010-11-26 2012-05-31 Bruker Biosciences Pty Ltd Improvements in or relating to mass spectrometry
CN103329242B (zh) * 2011-01-25 2016-10-19 耶拿分析仪器股份公司 质谱分析设备
CN103858201A (zh) 2011-03-04 2014-06-11 珀金埃尔默健康科学股份有限公司 静电透镜及包括该静电透镜的系统
US8461524B2 (en) * 2011-03-28 2013-06-11 Thermo Finnigan Llc Ion guide with improved gas dynamics and combined noise reduction device
US8803086B2 (en) * 2011-06-28 2014-08-12 Shimadzu Corporation Triple quadrupole mass spectrometer
JP6087056B2 (ja) * 2012-01-06 2017-03-01 アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． 誘導結合プラズマｍｓ／ｍｓ型質量分析装置
DE102012008259B4 (de) * 2012-04-25 2014-06-26 Bruker Daltonik Gmbh Ionenerzeugung in Massenspektrometern durch Clusterbeschuss
US9105438B2 (en) * 2012-05-31 2015-08-11 Fei Company Imaging and processing for plasma ion source
US8791409B2 (en) * 2012-07-27 2014-07-29 Thermo Fisher Scientific (Bremen) Gmbh Method and analyser for analysing ions having a high mass-to-charge ratio
CN104008950B (zh) * 2013-02-25 2017-09-08 株式会社岛津制作所 离子产生装置以及离子产生方法
US9558925B2 (en) * 2014-04-18 2017-01-31 Battelle Memorial Institute Device for separating non-ions from ions
US9558924B2 (en) * 2014-12-09 2017-01-31 Morpho Detection, Llc Systems for separating ions and neutrals and methods of operating the same
GB2534569A (en) * 2015-01-27 2016-08-03 Shimadzu Corp Method of controlling a DC power supply
CN107851550B (zh) * 2015-07-13 2019-06-28 株式会社岛津制作所 闸门
WO2017075470A1 (en) * 2015-10-28 2017-05-04 Duke University Mass spectrometers having segmented electrodes and associated methods
GB2549248B (en) * 2016-01-12 2020-07-22 Thermo Fisher Scient Bremen Gmbh IRMS sample introduction system and method
US9941094B1 (en) 2017-02-01 2018-04-10 Fei Company Innovative source assembly for ion beam production
JP6808669B2 (ja) 2018-03-14 2021-01-06 日本電子株式会社 質量分析装置
WO2020248757A1 (en) 2019-06-14 2020-12-17 Shanghai Polaris Biology Co., Ltd. Systems and methods for single particle analysis
EP4229671A1 (en) * 2020-10-19 2023-08-23 DH Technologies Development Pte. Ltd. Systems and methods for multistage mass spectrometry utilizing an electrostatic ion trap
TW202232096A (zh) * 2021-01-29 2022-08-16 日商亞多納富有限公司 氣體分析裝置及控制方法
EP4298658A1 (en) * 2021-02-25 2024-01-03 DH Technologies Development Pte. Ltd. Bent pcb ion guide for reduction of contamination and noise
CN113237943B (zh) * 2021-05-12 2023-10-20 中国科学技术大学 一种降低质谱探测h2和h2o背景噪声的超高真空装置
JP7729210B2 (ja) 2022-01-05 2025-08-26 株式会社島津製作所 質量分析装置

Family Cites Families (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3334225A (en) * 1964-04-24 1967-08-01 California Inst Res Found Quadrupole mass filter with means to generate a noise spectrum exclusive of the resonant frequency of the desired ions to deflect stable ions
US3410997A (en) * 1964-09-08 1968-11-12 Bell & Howell Co Multipole mass filter
US3473020A (en) * 1967-06-19 1969-10-14 Bell & Howell Co Mass analyzer having series aligned curvilinear and rectilinear analyzer sections
EP0237259A3 (en) 1986-03-07 1989-04-05 Finnigan Corporation Mass spectrometer
CA1307859C (en) * 1988-12-12 1992-09-22 Donald James Douglas Mass spectrometer and method with improved ion transmission
US5171990A (en) * 1991-05-17 1992-12-15 Finnigan Corporation Electrospray ion source with reduced neutral noise and method
US5179278A (en) * 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
JP3367719B2 (ja) * 1993-09-20 2003-01-20 株式会社日立製作所 質量分析計および静電レンズ
DK0748249T3 (da) * 1994-02-28 2009-11-09 Analytica Of Branford Inc Multipolionguide for massespektrometri
US7019285B2 (en) * 1995-08-10 2006-03-28 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
US5672868A (en) * 1996-02-16 1997-09-30 Varian Associates, Inc. Mass spectrometer system and method for transporting and analyzing ions
GB9612070D0 (en) * 1996-06-10 1996-08-14 Micromass Ltd Plasma mass spectrometer
JPH1097838A (ja) * 1996-07-30 1998-04-14 Yokogawa Analytical Syst Kk 誘導結合プラズマ質量分析装置
JPH10112280A (ja) * 1996-10-08 1998-04-28 Jeol Ltd イオン源
JPH10289685A (ja) * 1997-04-11 1998-10-27 Yokogawa Analytical Syst Kk 誘導結合プラズマ質量分析装置
US6987264B1 (en) * 1998-01-23 2006-01-17 Analytica Of Branford, Inc. Mass spectrometry with multipole ion guides
US6753523B1 (en) * 1998-01-23 2004-06-22 Analytica Of Branford, Inc. Mass spectrometry with multipole ion guides
US6069355A (en) * 1998-05-14 2000-05-30 Varian, Inc. Ion trap mass pectrometer with electrospray ionization
EP1090412B1 (en) * 1998-05-29 2014-03-05 PerkinElmer Health Sciences, Inc. Mass spectrometry with multipole ion guides
DE69936168T2 (de) * 1998-06-18 2007-09-27 Micromass UK Ltd., Simonsway Mehrfachprobeninlassmassenspektrometer
CA2344446C (en) * 1998-09-23 2008-07-08 Varian Australia Pty. Ltd. Ion optical system for a mass spectrometer
JP2000243347A (ja) * 1999-02-18 2000-09-08 Hitachi Ltd イオントラップ型質量分析装置およびイオントラップ質量分析方法
JP3542918B2 (ja) 1999-03-17 2004-07-14 日本電子株式会社 イオンガイド
US20030038236A1 (en) * 1999-10-29 2003-02-27 Russ Charles W. Atmospheric pressure ion source high pass ion filter
US6809312B1 (en) * 2000-05-12 2004-10-26 Bruker Daltonics, Inc. Ionization source chamber and ion beam delivery system for mass spectrometry
US6593570B2 (en) * 2000-05-24 2003-07-15 Agilent Technologies, Inc. Ion optic components for mass spectrometers
US6417511B1 (en) * 2000-07-17 2002-07-09 Agilent Technologies, Inc. Ring pole ion guide apparatus, systems and method
CN1465077A (zh) * 2001-04-27 2003-12-31 松下电器产业株式会社 电容器及其制造方法
AUPR465101A0 (en) * 2001-04-27 2001-05-24 Varian Australia Pty Ltd "Mass spectrometer"
JP3840417B2 (ja) * 2002-02-20 2006-11-01 株式会社日立ハイテクノロジーズ 質量分析装置
US7034292B1 (en) * 2002-05-31 2006-04-25 Analytica Of Branford, Inc. Mass spectrometry with segmented RF multiple ion guides in various pressure regions
US6872940B1 (en) * 2002-05-31 2005-03-29 Thermo Finnigan Llc Focusing ions using gas dynamics
US6891157B2 (en) * 2002-05-31 2005-05-10 Micromass Uk Limited Mass spectrometer
JP3791479B2 (ja) 2002-09-17 2006-06-28 株式会社島津製作所 イオンガイド
US20040195503A1 (en) * 2003-04-04 2004-10-07 Taeman Kim Ion guide for mass spectrometers
US6730904B1 (en) * 2003-04-30 2004-05-04 Varian, Inc. Asymmetric-field ion guiding devices
WO2005114705A2 (en) * 2004-05-21 2005-12-01 Whitehouse Craig M Rf surfaces and rf ion guides
US7189967B1 (en) * 2004-06-16 2007-03-13 Analytica Of Branford, Inc. Mass spectrometry with multipole ion guides
JP2006032109A (ja) * 2004-07-15 2006-02-02 Jeol Ltd 垂直加速型飛行時間型質量分析装置
DE102004037511B4 (de) * 2004-08-03 2007-08-23 Bruker Daltonik Gmbh Multipole durch Drahterosion
US20060043285A1 (en) * 2004-08-26 2006-03-02 Battelle Memorial Institute Method and apparatus for enhanced sequencing of complex molecules using surface-induced dissociation in conjunction with mass spectrometric analysis
GB0424426D0 (en) * 2004-11-04 2004-12-08 Micromass Ltd Mass spectrometer
US6998622B1 (en) * 2004-11-17 2006-02-14 Agilent Technologies, Inc. On-axis electron impact ion source
DE102005023590A1 (de) * 2005-05-18 2006-11-23 Spectro Analytical Instruments Gmbh & Co. Kg ICP-Massenspektrometer
GB0511333D0 (en) * 2005-06-03 2005-07-13 Micromass Ltd Mass spectrometer
US7372042B2 (en) * 2005-08-31 2008-05-13 Agilent Technologies, Inc. Lens device for introducing a second ion beam into a primary ion path
US7335878B2 (en) * 2005-10-17 2008-02-26 Ut-Battelle Llc Method and apparatus for efficient photodetachment and purification of negative ion beams
US7391019B2 (en) * 2006-07-21 2008-06-24 Thermo Finnigan Llc Electrospray ion source
US7741600B2 (en) * 2006-11-17 2010-06-22 Thermo Finnigan Llc Apparatus and method for providing ions to a mass analyzer
US8853622B2 (en) * 2007-02-07 2014-10-07 Thermo Finnigan Llc Tandem mass spectrometer

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102856153A (zh) * 2012-10-08 2013-01-02 复旦大学 一种离子光学偏轴传输系统
CN103854953A (zh) * 2012-11-30 2014-06-11 中国科学院大连化学物理研究所 无光窗式真空紫外灯质谱电离源
CN107004551A (zh) * 2014-12-16 2017-08-01 卡尔蔡司Smt有限责任公司 离子化装置和包含离子化装置的质谱仪
CN107004551B (zh) * 2014-12-16 2018-09-25 卡尔蔡司Smt有限责任公司 离子化装置和包含离子化装置的质谱仪
US10236169B2 (en) 2014-12-16 2019-03-19 Carl Zeiss Smt Gmbh Ionization device with mass spectrometer therewith
CN110446921A (zh) * 2017-03-16 2019-11-12 株式会社岛津制作所 带电粒子的供给控制方法和装置
CN115315777A (zh) * 2020-03-24 2022-11-08 Dh科技发展私人贸易有限公司 在第三级具有额外去簇的三级大气到真空质谱仪入口
US12394613B2 (en) 2020-03-24 2025-08-19 Dh Technologies Development Pte. Ltd. Three stage atmosphere to vacuum mass spectrometer inlet with additional declustering in the third stage
CN111668087A (zh) * 2020-06-11 2020-09-15 中国科学院上海应用物理研究所 一种多级真空差分的电喷雾离子源引导装置
CN111668087B (zh) * 2020-06-11 2023-10-27 中国科学院上海应用物理研究所 一种多级真空差分的电喷雾离子源引导装置
CN116313729A (zh) * 2022-11-25 2023-06-23 中国科学院青岛生物能源与过程研究所 一种大气压下可切换激光剥蚀/电喷雾离子源质谱仪及其使用方法

Also Published As

Publication number Publication date
JP5512512B2 (ja) 2014-06-04
JP2010531031A (ja) 2010-09-16
US8723107B2 (en) 2014-05-13
CA2687965A1 (en) 2009-03-26
US20140008530A1 (en) 2014-01-09
EP2150967A2 (en) 2010-02-10
AU2008302733A1 (en) 2009-03-26
JP2014112570A (ja) 2014-06-19
WO2009038825A3 (en) 2009-05-14
US20090218486A1 (en) 2009-09-03
WO2009038825A2 (en) 2009-03-26
CA2687965C (en) 2015-11-24
US8507850B2 (en) 2013-08-13
EP2150967A4 (en) 2012-12-05

Similar Documents

Publication Publication Date Title
CN202103011U (zh) 用于样本物质分析的设备
CN102067273B (zh) 质量分析装置
CN105308714B (zh) 离子输送装置以及使用该装置的质量分析装置
US8921803B2 (en) Electrostatic lenses and systems including the same
CN104517796B (zh) 用于从气体流中分离离子的射频装置以及其方法
US9773656B2 (en) Ion transport apparatus and mass spectrometer using the same
US10692712B2 (en) Ion transfer from electron ionization sources
CN103155091A (zh) 用于质谱分析的离子源
US7462822B2 (en) Apparatus and method for the transport of ions into a vacuum
JP4193734B2 (ja) 質量分析装置
US7582861B2 (en) Mass spectrometer
JP7127701B2 (ja) 質量分析装置
US9396920B2 (en) Ionization chamber
JP2015512510A (ja) 質量分析計用イオンデフレクター
AU2013224762B2 (en) Multipole ion guide interface for reduced background noise in mass spectrometry
CN112640034A (zh) 四极质量分析装置
AU2008302733B2 (en) Multipole ion guide interface for reduced background noise in mass spectrometry
JP2023016583A (ja) 直交加速飛行時間型質量分析装置

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CX01 Expiry of patent term

Granted publication date: 20120104

CX01 Expiry of patent term