CA2687965C - Multipole ion guide interface for reduced background noise in mass spectrometry - Google Patents
Multipole ion guide interface for reduced background noise in mass spectrometry Download PDFInfo
- Publication number
- CA2687965C CA2687965C CA2687965A CA2687965A CA2687965C CA 2687965 C CA2687965 C CA 2687965C CA 2687965 A CA2687965 A CA 2687965A CA 2687965 A CA2687965 A CA 2687965A CA 2687965 C CA2687965 C CA 2687965C
- Authority
- CA
- Canada
- Prior art keywords
- ion guide
- ions
- ion
- vacuum
- axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000005405 multipole Effects 0.000 title claims abstract description 66
- 238000004949 mass spectrometry Methods 0.000 title description 3
- 150000002500 ions Chemical class 0.000 claims abstract description 729
- 239000002245 particle Substances 0.000 claims abstract description 142
- 238000004458 analytical method Methods 0.000 claims abstract description 5
- 238000005192 partition Methods 0.000 claims description 88
- 238000005086 pumping Methods 0.000 claims description 48
- 238000000608 laser ablation Methods 0.000 claims description 6
- 238000005040 ion trap Methods 0.000 claims description 4
- 239000000126 substance Substances 0.000 claims description 4
- 238000000451 chemical ionisation Methods 0.000 claims description 3
- 238000004891 communication Methods 0.000 claims description 2
- 238000003795 desorption Methods 0.000 claims 2
- 239000011159 matrix material Substances 0.000 claims 2
- 230000037427 ion transport Effects 0.000 abstract description 29
- 230000007935 neutral effect Effects 0.000 abstract description 28
- 230000032258 transport Effects 0.000 abstract description 14
- 238000000034 method Methods 0.000 abstract description 11
- 239000000443 aerosol Substances 0.000 abstract description 9
- 238000001819 mass spectrum Methods 0.000 abstract description 6
- 238000006386 neutralization reaction Methods 0.000 abstract description 5
- 230000037361 pathway Effects 0.000 abstract 1
- 238000011144 upstream manufacturing Methods 0.000 description 42
- 238000006243 chemical reaction Methods 0.000 description 18
- 238000000132 electrospray ionisation Methods 0.000 description 16
- 239000012634 fragment Substances 0.000 description 15
- 239000000523 sample Substances 0.000 description 12
- 239000012212 insulator Substances 0.000 description 10
- 238000010884 ion-beam technique Methods 0.000 description 10
- 230000005540 biological transmission Effects 0.000 description 9
- 230000003116 impacting effect Effects 0.000 description 8
- 238000001360 collision-induced dissociation Methods 0.000 description 6
- 230000001133 acceleration Effects 0.000 description 5
- 239000007788 liquid Substances 0.000 description 5
- 230000004048 modification Effects 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- 238000002663 nebulization Methods 0.000 description 5
- 238000000065 atmospheric pressure chemical ionisation Methods 0.000 description 4
- 238000001816 cooling Methods 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 238000009616 inductively coupled plasma Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000000816 matrix-assisted laser desorption--ionisation Methods 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 238000011109 contamination Methods 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 239000011163 secondary particle Substances 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000007786 electrostatic charging Methods 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 238000013467 fragmentation Methods 0.000 description 2
- 238000006062 fragmentation reaction Methods 0.000 description 2
- 238000010348 incorporation Methods 0.000 description 2
- 230000000063 preceeding effect Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 239000012491 analyte Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005094 computer simulation Methods 0.000 description 1
- 230000005686 electrostatic field Effects 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000004969 ion scattering spectroscopy Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000615 nonconductor Substances 0.000 description 1
- 238000005173 quadrupole mass spectroscopy Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000001846 repelling effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
- H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/809,349 | 2007-05-31 | ||
| US11/809,349 US8507850B2 (en) | 2007-05-31 | 2007-05-31 | Multipole ion guide interface for reduced background noise in mass spectrometry |
| PCT/US2008/064984 WO2009038825A2 (en) | 2007-05-31 | 2008-05-28 | Multipole ion guide interface for reduced background noise in mass spectrometry |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2687965A1 CA2687965A1 (en) | 2009-03-26 |
| CA2687965C true CA2687965C (en) | 2015-11-24 |
Family
ID=40468701
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2687965A Active CA2687965C (en) | 2007-05-31 | 2008-05-28 | Multipole ion guide interface for reduced background noise in mass spectrometry |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US8507850B2 (enExample) |
| EP (1) | EP2150967A4 (enExample) |
| JP (2) | JP5512512B2 (enExample) |
| CN (1) | CN202103011U (enExample) |
| CA (1) | CA2687965C (enExample) |
| WO (1) | WO2009038825A2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP4276457A4 (en) * | 2021-01-29 | 2024-12-04 | Atonarp Inc. | GAS ANALYSIS DEVICE AND CONTROL METHOD |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5626889B2 (ja) * | 2007-09-19 | 2014-11-19 | ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド | 質量分析計用衝突セル |
| JP2010033735A (ja) * | 2008-07-25 | 2010-02-12 | Jeol Ltd | 四重極質量分析装置 |
| US20100154568A1 (en) * | 2008-11-19 | 2010-06-24 | Roth Michael J | Analytical Instruments, Assemblies, and Methods |
| CA2760027A1 (en) * | 2009-06-03 | 2010-12-09 | Wayne State University | Mass spectrometry using laserspray ionization |
| WO2011061147A1 (en) * | 2009-11-17 | 2011-05-26 | Bruker Daltonik Gmbh | Utilizing gas flows in mass spectrometers |
| JP5257334B2 (ja) * | 2009-11-20 | 2013-08-07 | 株式会社島津製作所 | 質量分析装置 |
| US8324565B2 (en) * | 2009-12-17 | 2012-12-04 | Agilent Technologies, Inc. | Ion funnel for mass spectrometry |
| AU2011334612A1 (en) * | 2010-11-26 | 2013-05-02 | Bruker Chemical Analysis Bv | Improvements in or relating to mass spectrometry |
| JP2014504784A (ja) * | 2011-01-25 | 2014-02-24 | ブルーカー バイオサイエンシズ プロプライアタリー リミティド | 質量分析装置 |
| CA2828967C (en) | 2011-03-04 | 2018-07-10 | Perkinelmer Health Sciences, Inc. | Electrostatic lenses and systems including the same |
| US8461524B2 (en) * | 2011-03-28 | 2013-06-11 | Thermo Finnigan Llc | Ion guide with improved gas dynamics and combined noise reduction device |
| WO2013001604A1 (ja) * | 2011-06-28 | 2013-01-03 | 株式会社島津製作所 | 三連四重極型質量分析装置 |
| JP6087056B2 (ja) * | 2012-01-06 | 2017-03-01 | アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． | 誘導結合プラズマｍｓ／ｍｓ型質量分析装置 |
| DE102012008259B4 (de) * | 2012-04-25 | 2014-06-26 | Bruker Daltonik Gmbh | Ionenerzeugung in Massenspektrometern durch Clusterbeschuss |
| US9105438B2 (en) | 2012-05-31 | 2015-08-11 | Fei Company | Imaging and processing for plasma ion source |
| US8791409B2 (en) * | 2012-07-27 | 2014-07-29 | Thermo Fisher Scientific (Bremen) Gmbh | Method and analyser for analysing ions having a high mass-to-charge ratio |
| CN102856153A (zh) * | 2012-10-08 | 2013-01-02 | 复旦大学 | 一种离子光学偏轴传输系统 |
| CN103854953A (zh) * | 2012-11-30 | 2014-06-11 | 中国科学院大连化学物理研究所 | 无光窗式真空紫外灯质谱电离源 |
| CN104008950B (zh) * | 2013-02-25 | 2017-09-08 | 株式会社岛津制作所 | 离子产生装置以及离子产生方法 |
| US9558925B2 (en) * | 2014-04-18 | 2017-01-31 | Battelle Memorial Institute | Device for separating non-ions from ions |
| US9558924B2 (en) * | 2014-12-09 | 2017-01-31 | Morpho Detection, Llc | Systems for separating ions and neutrals and methods of operating the same |
| DE102014226039A1 (de) | 2014-12-16 | 2016-06-16 | Carl Zeiss Smt Gmbh | Ionisierungseinrichtung und Massenspektrometer damit |
| GB2534569A (en) * | 2015-01-27 | 2016-08-03 | Shimadzu Corp | Method of controlling a DC power supply |
| CN107851550B (zh) * | 2015-07-13 | 2019-06-28 | 株式会社岛津制作所 | 闸门 |
| US11081331B2 (en) | 2015-10-28 | 2021-08-03 | Duke University | Mass spectrometers having segmented electrodes and associated methods |
| GB2549248B (en) | 2016-01-12 | 2020-07-22 | Thermo Fisher Scient Bremen Gmbh | IRMS sample introduction system and method |
| US9941094B1 (en) | 2017-02-01 | 2018-04-10 | Fei Company | Innovative source assembly for ion beam production |
| JP6806235B2 (ja) * | 2017-03-16 | 2021-01-06 | 株式会社島津製作所 | 荷電粒子の供給制御方法及び装置 |
| JP6808669B2 (ja) | 2018-03-14 | 2021-01-06 | 日本電子株式会社 | 質量分析装置 |
| AU2020292464A1 (en) | 2019-06-14 | 2021-12-09 | Shanghai Polaris Biology Co., Ltd. | Systems and methods for single particle analysis |
| US12394613B2 (en) | 2020-03-24 | 2025-08-19 | Dh Technologies Development Pte. Ltd. | Three stage atmosphere to vacuum mass spectrometer inlet with additional declustering in the third stage |
| CN111668087B (zh) * | 2020-06-11 | 2023-10-27 | 中国科学院上海应用物理研究所 | 一种多级真空差分的电喷雾离子源引导装置 |
| WO2022084764A1 (en) * | 2020-10-19 | 2022-04-28 | Dh Technologies Development Pte. Ltd. | Systems and methods for multistage mass spectrometry utilizing an electrostatic ion trap |
| WO2022180550A1 (en) * | 2021-02-25 | 2022-09-01 | Dh Technologies Development Pte. Ltd. | Bent pcb ion guide for reduction of contamination and noise |
| CN113237943B (zh) * | 2021-05-12 | 2023-10-20 | 中国科学技术大学 | 一种降低质谱探测h2和h2o背景噪声的超高真空装置 |
| JP7729210B2 (ja) | 2022-01-05 | 2025-08-26 | 株式会社島津製作所 | 質量分析装置 |
| CN116313729A (zh) * | 2022-11-25 | 2023-06-23 | 中国科学院青岛生物能源与过程研究所 | 一种大气压下可切换激光剥蚀/电喷雾离子源质谱仪及其使用方法 |
Family Cites Families (50)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3334225A (en) | 1964-04-24 | 1967-08-01 | California Inst Res Found | Quadrupole mass filter with means to generate a noise spectrum exclusive of the resonant frequency of the desired ions to deflect stable ions |
| US3410997A (en) | 1964-09-08 | 1968-11-12 | Bell & Howell Co | Multipole mass filter |
| US3473020A (en) | 1967-06-19 | 1969-10-14 | Bell & Howell Co | Mass analyzer having series aligned curvilinear and rectilinear analyzer sections |
| EP0237259A3 (en) | 1986-03-07 | 1989-04-05 | Finnigan Corporation | Mass spectrometer |
| CA1307859C (en) | 1988-12-12 | 1992-09-22 | Donald James Douglas | Mass spectrometer and method with improved ion transmission |
| US5171990A (en) | 1991-05-17 | 1992-12-15 | Finnigan Corporation | Electrospray ion source with reduced neutral noise and method |
| US5179278A (en) | 1991-08-23 | 1993-01-12 | Mds Health Group Limited | Multipole inlet system for ion traps |
| JP3367719B2 (ja) * | 1993-09-20 | 2003-01-20 | 株式会社日立製作所 | 質量分析計および静電レンズ |
| EP0748249B1 (en) | 1994-02-28 | 2009-07-08 | Analytica Of Branford, Inc. | Multipole ion guide for mass spectrometry |
| US7019285B2 (en) * | 1995-08-10 | 2006-03-28 | Analytica Of Branford, Inc. | Ion storage time-of-flight mass spectrometer |
| US5672868A (en) * | 1996-02-16 | 1997-09-30 | Varian Associates, Inc. | Mass spectrometer system and method for transporting and analyzing ions |
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| JPH10289685A (ja) * | 1997-04-11 | 1998-10-27 | Yokogawa Analytical Syst Kk | 誘導結合プラズマ質量分析装置 |
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| US6410915B1 (en) * | 1998-06-18 | 2002-06-25 | Micromass Limited | Multi-inlet mass spectrometer for analysis of liquid samples by electrospray or atmospheric pressure ionization |
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| JP2000243347A (ja) * | 1999-02-18 | 2000-09-08 | Hitachi Ltd | イオントラップ型質量分析装置およびイオントラップ質量分析方法 |
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| US20030038236A1 (en) * | 1999-10-29 | 2003-02-27 | Russ Charles W. | Atmospheric pressure ion source high pass ion filter |
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| DE102005023590A1 (de) | 2005-05-18 | 2006-11-23 | Spectro Analytical Instruments Gmbh & Co. Kg | ICP-Massenspektrometer |
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| US7372042B2 (en) * | 2005-08-31 | 2008-05-13 | Agilent Technologies, Inc. | Lens device for introducing a second ion beam into a primary ion path |
| US7335878B2 (en) * | 2005-10-17 | 2008-02-26 | Ut-Battelle Llc | Method and apparatus for efficient photodetachment and purification of negative ion beams |
| US7391019B2 (en) * | 2006-07-21 | 2008-06-24 | Thermo Finnigan Llc | Electrospray ion source |
| US7741600B2 (en) * | 2006-11-17 | 2010-06-22 | Thermo Finnigan Llc | Apparatus and method for providing ions to a mass analyzer |
| US8853622B2 (en) * | 2007-02-07 | 2014-10-07 | Thermo Finnigan Llc | Tandem mass spectrometer |
-
2007
- 2007-05-31 US US11/809,349 patent/US8507850B2/en not_active Expired - Fee Related
-
2008
- 2008-05-28 WO PCT/US2008/064984 patent/WO2009038825A2/en not_active Ceased
- 2008-05-28 CA CA2687965A patent/CA2687965C/en active Active
- 2008-05-28 JP JP2010510468A patent/JP5512512B2/ja not_active Expired - Fee Related
- 2008-05-28 EP EP08831810A patent/EP2150967A4/en not_active Ceased
- 2008-05-28 CN CN200890100006.4U patent/CN202103011U/zh not_active Expired - Lifetime
-
2013
- 2013-07-01 US US13/932,716 patent/US8723107B2/en active Active
-
2014
- 2014-03-26 JP JP2014064661A patent/JP2014112570A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP4276457A4 (en) * | 2021-01-29 | 2024-12-04 | Atonarp Inc. | GAS ANALYSIS DEVICE AND CONTROL METHOD |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2009038825A3 (en) | 2009-05-14 |
| JP2014112570A (ja) | 2014-06-19 |
| US8723107B2 (en) | 2014-05-13 |
| EP2150967A2 (en) | 2010-02-10 |
| US20090218486A1 (en) | 2009-09-03 |
| WO2009038825A2 (en) | 2009-03-26 |
| US8507850B2 (en) | 2013-08-13 |
| CA2687965A1 (en) | 2009-03-26 |
| EP2150967A4 (en) | 2012-12-05 |
| AU2008302733A1 (en) | 2009-03-26 |
| JP2010531031A (ja) | 2010-09-16 |
| US20140008530A1 (en) | 2014-01-09 |
| CN202103011U (zh) | 2012-01-04 |
| JP5512512B2 (ja) | 2014-06-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request |
Effective date: 20130430 |