JP2009530761A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2009530761A5 JP2009530761A5 JP2008558899A JP2008558899A JP2009530761A5 JP 2009530761 A5 JP2009530761 A5 JP 2009530761A5 JP 2008558899 A JP2008558899 A JP 2008558899A JP 2008558899 A JP2008558899 A JP 2008558899A JP 2009530761 A5 JP2009530761 A5 JP 2009530761A5
- Authority
- JP
- Japan
- Prior art keywords
- sector
- electric field
- ions
- electric
- plane
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 150000002500 ions Chemical class 0.000 claims 47
- 230000005684 electric field Effects 0.000 claims 46
- 238000000034 method Methods 0.000 claims 12
- 230000003287 optical effect Effects 0.000 claims 5
- 238000004458 analytical method Methods 0.000 claims 4
- 238000004949 mass spectrometry Methods 0.000 claims 3
- 238000004519 manufacturing process Methods 0.000 claims 1
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0605089.2 | 2006-03-14 | ||
| GBGB0605089.2A GB0605089D0 (en) | 2006-03-14 | 2006-03-14 | Mass spectrometer |
| US78710106P | 2006-03-29 | 2006-03-29 | |
| US60/787,101 | 2006-03-29 | ||
| PCT/GB2007/000905 WO2007104992A2 (en) | 2006-03-14 | 2007-03-14 | Mass spectrometer |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009530761A JP2009530761A (ja) | 2009-08-27 |
| JP2009530761A5 true JP2009530761A5 (enExample) | 2010-04-02 |
| JP5162479B2 JP5162479B2 (ja) | 2013-03-13 |
Family
ID=36292709
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008558899A Expired - Fee Related JP5162479B2 (ja) | 2006-03-14 | 2007-03-14 | 質量分析計 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7863557B2 (enExample) |
| EP (2) | EP2688088B1 (enExample) |
| JP (1) | JP5162479B2 (enExample) |
| CA (2) | CA2645651C (enExample) |
| GB (5) | GB0605089D0 (enExample) |
| WO (1) | WO2007104992A2 (enExample) |
Families Citing this family (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4980583B2 (ja) * | 2004-05-21 | 2012-07-18 | 日本電子株式会社 | 飛行時間型質量分析方法及び装置 |
| CN101669027B (zh) * | 2007-05-09 | 2013-09-25 | 株式会社岛津制作所 | 带电粒子分析装置 |
| CN101158641B (zh) * | 2007-11-21 | 2010-06-02 | 中国科学院武汉物理与数学研究所 | 非共线质量分辨阈值电离光谱仪 |
| GB2455977A (en) | 2007-12-21 | 2009-07-01 | Thermo Fisher Scient | Multi-reflectron time-of-flight mass spectrometer |
| US7932487B2 (en) * | 2008-01-11 | 2011-04-26 | Thermo Finnigan Llc | Mass spectrometer with looped ion path |
| GB2462065B (en) * | 2008-07-17 | 2013-03-27 | Kratos Analytical Ltd | TOF mass spectrometer for stigmatic imaging and associated method |
| JP2010033735A (ja) * | 2008-07-25 | 2010-02-12 | Jeol Ltd | 四重極質量分析装置 |
| WO2010038260A1 (ja) * | 2008-10-02 | 2010-04-08 | 株式会社島津製作所 | 多重周回飛行時間型質量分析装置 |
| WO2010041296A1 (ja) * | 2008-10-09 | 2010-04-15 | 株式会社島津製作所 | 質量分析装置 |
| GB2470599B (en) * | 2009-05-29 | 2014-04-02 | Thermo Fisher Scient Bremen | Charged particle analysers and methods of separating charged particles |
| GB2470600B (en) | 2009-05-29 | 2012-06-13 | Thermo Fisher Scient Bremen | Charged particle analysers and methods of separating charged particles |
| GB2476964A (en) * | 2010-01-15 | 2011-07-20 | Anatoly Verenchikov | Electrostatic trap mass spectrometer |
| GB201118270D0 (en) | 2011-10-21 | 2011-12-07 | Shimadzu Corp | TOF mass analyser with improved resolving power |
| GB201118279D0 (en) | 2011-10-21 | 2011-12-07 | Shimadzu Corp | Mass analyser, mass spectrometer and associated methods |
| DE102013011462B4 (de) * | 2013-07-10 | 2016-03-31 | Bruker Daltonik Gmbh | Flugzeitmassenspektrometer mit Cassini-Reflektor |
| GB201507363D0 (en) | 2015-04-30 | 2015-06-17 | Micromass Uk Ltd And Leco Corp | Multi-reflecting TOF mass spectrometer |
| GB201519830D0 (en) * | 2015-11-10 | 2015-12-23 | Micromass Ltd | A method of transmitting ions through an aperture |
| GB201520134D0 (en) | 2015-11-16 | 2015-12-30 | Micromass Uk Ltd And Leco Corp | Imaging mass spectrometer |
| GB201520130D0 (en) | 2015-11-16 | 2015-12-30 | Micromass Uk Ltd And Leco Corp | Imaging mass spectrometer |
| GB201520540D0 (en) | 2015-11-23 | 2016-01-06 | Micromass Uk Ltd And Leco Corp | Improved ion mirror and ion-optical lens for imaging |
| DE102015121830A1 (de) * | 2015-12-15 | 2017-06-22 | Ernst-Moritz-Arndt-Universität Greifswald | Breitband-MR-ToF-Massenspektrometer |
| GB201613988D0 (en) | 2016-08-16 | 2016-09-28 | Micromass Uk Ltd And Leco Corp | Mass analyser having extended flight path |
| GB2567794B (en) | 2017-05-05 | 2023-03-08 | Micromass Ltd | Multi-reflecting time-of-flight mass spectrometers |
| GB2563571B (en) | 2017-05-26 | 2023-05-24 | Micromass Ltd | Time of flight mass analyser with spatial focussing |
| US11211238B2 (en) | 2017-08-06 | 2021-12-28 | Micromass Uk Limited | Multi-pass mass spectrometer |
| US11817303B2 (en) | 2017-08-06 | 2023-11-14 | Micromass Uk Limited | Accelerator for multi-pass mass spectrometers |
| EP3662502A1 (en) | 2017-08-06 | 2020-06-10 | Micromass UK Limited | Printed circuit ion mirror with compensation |
| WO2019030472A1 (en) | 2017-08-06 | 2019-02-14 | Anatoly Verenchikov | IONIC MIRROR FOR MULTI-REFLECTION MASS SPECTROMETERS |
| US11081332B2 (en) | 2017-08-06 | 2021-08-03 | Micromass Uk Limited | Ion guide within pulsed converters |
| US11049712B2 (en) | 2017-08-06 | 2021-06-29 | Micromass Uk Limited | Fields for multi-reflecting TOF MS |
| WO2019030476A1 (en) | 2017-08-06 | 2019-02-14 | Anatoly Verenchikov | INJECTION OF IONS IN MULTI-PASSAGE MASS SPECTROMETERS |
| GB201806507D0 (en) | 2018-04-20 | 2018-06-06 | Verenchikov Anatoly | Gridless ion mirrors with smooth fields |
| GB201807605D0 (en) | 2018-05-10 | 2018-06-27 | Micromass Ltd | Multi-reflecting time of flight mass analyser |
| GB201807626D0 (en) | 2018-05-10 | 2018-06-27 | Micromass Ltd | Multi-reflecting time of flight mass analyser |
| GB201808530D0 (en) | 2018-05-24 | 2018-07-11 | Verenchikov Anatoly | TOF MS detection system with improved dynamic range |
| GB201810573D0 (en) * | 2018-06-28 | 2018-08-15 | Verenchikov Anatoly | Multi-pass mass spectrometer with improved duty cycle |
| GB201901411D0 (en) | 2019-02-01 | 2019-03-20 | Micromass Ltd | Electrode assembly for mass spectrometer |
| GB201903779D0 (en) | 2019-03-20 | 2019-05-01 | Micromass Ltd | Multiplexed time of flight mass spectrometer |
| WO2020248757A1 (en) * | 2019-06-14 | 2020-12-17 | Shanghai Polaris Biology Co., Ltd. | Systems and methods for single particle analysis |
| GB2598591A (en) * | 2020-09-03 | 2022-03-09 | HGSG Ltd | Mass spectrometer and method |
| GB2638640A (en) * | 2020-09-03 | 2025-08-27 | HGSG Ltd | Mass spectrometer and method |
| GB2638099A (en) * | 2021-04-07 | 2025-08-13 | HGSG Ltd | Mass spectrometer and method |
| JP7616649B2 (ja) * | 2021-05-18 | 2025-01-17 | 国立大学法人東北大学 | 電子分光器 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3571566B2 (ja) * | 1999-02-19 | 2004-09-29 | 日本電子株式会社 | 飛行時間型質量分析計のイオン光学系 |
| JP3761752B2 (ja) | 1999-11-10 | 2006-03-29 | 日本電子株式会社 | 周回軌道を有する飛行時間型質量分析装置 |
| KR20020073953A (ko) * | 2001-03-17 | 2002-09-28 | 이토마토투자자문 주식회사 | 인터넷 상에서 실시간 주식 종목별 매매 지표 제공방법 |
| US6867414B2 (en) * | 2002-09-24 | 2005-03-15 | Ciphergen Biosystems, Inc. | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
| AU2003276409A1 (en) * | 2002-11-15 | 2004-06-15 | Micromass Uk Limited | Mass spectrometer |
| KR100478103B1 (ko) * | 2002-11-28 | 2005-03-25 | 문해령 | % 이격율을 이용한 기술적 주식 지표 제공 방법 |
| JP4182844B2 (ja) * | 2003-09-03 | 2008-11-19 | 株式会社島津製作所 | 質量分析装置 |
| JP4001100B2 (ja) * | 2003-11-14 | 2007-10-31 | 株式会社島津製作所 | 質量分析装置 |
| EP1866951B1 (en) * | 2005-03-22 | 2018-01-17 | Leco Corporation | Multi-reflecting time-of-flight mass spectrometer with isochronous curved ion interface |
-
2006
- 2006-03-14 GB GBGB0605089.2A patent/GB0605089D0/en not_active Ceased
-
2007
- 2007-03-14 GB GB0900459A patent/GB2453468B/en not_active Expired - Fee Related
- 2007-03-14 EP EP13188863.8A patent/EP2688088B1/en not_active Not-in-force
- 2007-03-14 JP JP2008558899A patent/JP5162479B2/ja not_active Expired - Fee Related
- 2007-03-14 CA CA2645651A patent/CA2645651C/en not_active Expired - Fee Related
- 2007-03-14 CA CA2821097A patent/CA2821097C/en not_active Expired - Fee Related
- 2007-03-14 GB GB0905773A patent/GB2456089B/en not_active Expired - Fee Related
- 2007-03-14 GB GB0808829A patent/GB2447160B/en not_active Expired - Fee Related
- 2007-03-14 GB GB0704925A patent/GB2437609B/en not_active Expired - Fee Related
- 2007-03-14 US US12/282,394 patent/US7863557B2/en active Active
- 2007-03-14 WO PCT/GB2007/000905 patent/WO2007104992A2/en not_active Ceased
- 2007-03-14 EP EP07712900.5A patent/EP2002461B1/en not_active Not-in-force
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2009530761A5 (enExample) | ||
| CN112703579B (zh) | 用于高通量电荷检测质谱分析的离子阱阵列 | |
| US9429543B2 (en) | Ion mobility analyzer, combination device thereof, and ion mobility analysis method | |
| JP6817201B2 (ja) | 不要イオンを抑制するシステム及び方法 | |
| CN104011831B (zh) | 使用飞行时间中无场区的一阶和二阶聚焦 | |
| CN113228226B (zh) | 利用静电线性离子阱同时分析多个离子的设备和方法 | |
| JP2010531031A5 (enExample) | ||
| CN108352292B (zh) | 用于成像的改进的离子镜和离子光学透镜 | |
| CN114667590B (zh) | 用于脉冲模式电荷检测质谱法的设备和方法 | |
| US20110180705A1 (en) | Mass Spectrometer | |
| CN103460331B (zh) | 飞行时间型质量分析装置 | |
| CN103380371B (zh) | 利用离子迁移率光谱技术检测和鉴别气体的方法及装置 | |
| WO2004100209A3 (en) | Asymmetric-field ion guiding devices | |
| US7372042B2 (en) | Lens device for introducing a second ion beam into a primary ion path | |
| US20230039701A1 (en) | Charge filter arrangement and applications thereof | |
| EP3201616A1 (en) | Duel mode ion mobility spectrometer | |
| KR102036259B1 (ko) | 질량분석기용 이온가이드 및 이를 이용한 이온소스 | |
| US7928372B2 (en) | Mass spectrometer | |
| JP2013532893A5 (enExample) | ||
| CN107112193A (zh) | 用于确定大分子组装体的结构的方法 | |
| WO2013067902A1 (zh) | 宽带离子束分析器 | |
| JP6278895B2 (ja) | 周期場微分型電気移動度分析装置 | |
| CN104412356B (zh) | 一种供质谱仪使用的离子偏转器 | |
| Kalkal et al. | Measurements and coupled reaction channels analysis of one-and two-proton transfer reactions for the 28 Si+ 90, 94 Zr systems | |
| US9431228B2 (en) | Ion lens for reducing contaminant effects in an ion guide of a mass spectrometer |