JP4001100B2 - 質量分析装置 - Google Patents
質量分析装置 Download PDFInfo
- Publication number
- JP4001100B2 JP4001100B2 JP2003384621A JP2003384621A JP4001100B2 JP 4001100 B2 JP4001100 B2 JP 4001100B2 JP 2003384621 A JP2003384621 A JP 2003384621A JP 2003384621 A JP2003384621 A JP 2003384621A JP 4001100 B2 JP4001100 B2 JP 4001100B2
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- Prior art keywords
- ions
- electrode
- flight
- cylindrical
- trajectory
- Prior art date
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Description
a)筒形状の飛行空間を形成するために、周方向に複数に分割された同心円状の内側電極と外側電極とを一対とする円筒電極が所定間隔離して配置されて成る第1電極部と、
b)前記第1電極部の隣接する円筒電極の間に設けられ、イオンの飛行軌道を前記円筒電極の軸方向にずらすべく偏向電場を形成するための第2電極部と、
c)第2電極部に印加する電圧を制御する手段であって、第2電極部を通過するイオンを前記円筒電極の軸方向にずらすことで螺旋状の飛行軌道を形成するような電圧を印加する第1モードと、第2電極部を通過するイオンを前記円筒電極の軸方向にずらさずに略同一の周回軌道を形成するような電圧を印加する第2モードとの切り替えを行う飛行制御手段と、
を備えることを特徴としている。
2…入射側ゲート電極
3…飛行空間
4…出射側ゲート電極
5…検出器
6…飛行軌道用電圧発生部
7…偏向電圧発生部
8…制御部
11〜16…円筒電極
11a、12a…内側電極
11b、12b…外側電極
20〜23…偏向電極
E1〜E6…円筒電場
Claims (1)
- a)筒形状の飛行空間を形成するために、周方向に複数に分割された同心円状の内側電極と外側電極とを一対とする円筒電極が所定間隔離して配置されて成る第1電極部と、
b)前記第1電極部の隣接する円筒電極の間に設けられ、イオンの飛行軌道を前記円筒電極の軸方向にずらすべく偏向電場を形成するための第2電極部と、
c)第2電極部に印加する電圧を制御する手段であって、第2電極部を通過するイオンを前記円筒電極の軸方向にずらすことで螺旋状の飛行軌道を形成するような電圧を印加する第1モードと、第2電極部を通過するイオンを前記円筒電極の軸方向にずらさずに略同一の周回軌道を形成するような電圧を印加する第2モードとの切り替えを行う飛行制御手段と、
を備えることを特徴とする質量分析装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003384621A JP4001100B2 (ja) | 2003-11-14 | 2003-11-14 | 質量分析装置 |
US10/983,571 US6949738B2 (en) | 2003-11-14 | 2004-11-09 | Mass spectrometer and method of determining mass-to-charge ratio of ion |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003384621A JP4001100B2 (ja) | 2003-11-14 | 2003-11-14 | 質量分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005149869A JP2005149869A (ja) | 2005-06-09 |
JP4001100B2 true JP4001100B2 (ja) | 2007-10-31 |
Family
ID=34567339
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003384621A Expired - Fee Related JP4001100B2 (ja) | 2003-11-14 | 2003-11-14 | 質量分析装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US6949738B2 (ja) |
JP (1) | JP4001100B2 (ja) |
Families Citing this family (40)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4182843B2 (ja) * | 2003-09-02 | 2008-11-19 | 株式会社島津製作所 | 飛行時間型質量分析装置 |
JP4182844B2 (ja) * | 2003-09-03 | 2008-11-19 | 株式会社島津製作所 | 質量分析装置 |
JP4033133B2 (ja) * | 2004-01-13 | 2008-01-16 | 株式会社島津製作所 | 質量分析装置 |
JP2005322429A (ja) * | 2004-05-06 | 2005-11-17 | Shimadzu Corp | 質量分析装置 |
JP4980583B2 (ja) * | 2004-05-21 | 2012-07-18 | 日本電子株式会社 | 飛行時間型質量分析方法及び装置 |
GB0513047D0 (en) * | 2005-06-27 | 2005-08-03 | Thermo Finnigan Llc | Electronic ion trap |
JP4645424B2 (ja) * | 2005-11-24 | 2011-03-09 | 株式会社島津製作所 | 飛行時間型質量分析装置 |
GB0524972D0 (en) * | 2005-12-07 | 2006-01-18 | Micromass Ltd | Mass spectrometer |
GB0605089D0 (en) * | 2006-03-14 | 2006-04-26 | Micromass Ltd | Mass spectrometer |
US7858929B2 (en) | 2006-04-13 | 2010-12-28 | Thermo Fisher Scientific (Bremen) Gmbh | Ion energy spread reduction for mass spectrometer |
GB0607542D0 (en) | 2006-04-13 | 2006-05-24 | Thermo Finnigan Llc | Mass spectrometer |
JP4743125B2 (ja) * | 2007-01-22 | 2011-08-10 | 株式会社島津製作所 | 質量分析装置 |
EP2157600B1 (en) * | 2007-05-22 | 2017-11-08 | Shimadzu Corporation | Mass spectrometer |
US7932487B2 (en) * | 2008-01-11 | 2011-04-26 | Thermo Finnigan Llc | Mass spectrometer with looped ion path |
GB2470599B (en) | 2009-05-29 | 2014-04-02 | Thermo Fisher Scient Bremen | Charged particle analysers and methods of separating charged particles |
GB2470600B (en) | 2009-05-29 | 2012-06-13 | Thermo Fisher Scient Bremen | Charged particle analysers and methods of separating charged particles |
US8604423B2 (en) | 2010-04-05 | 2013-12-10 | Indiana University Research And Technology Corporation | Method for enhancement of mass resolution over a limited mass range for time-of-flight spectrometry |
US8648295B2 (en) | 2010-05-04 | 2014-02-11 | Christie G. Enke | Combined distance-of-flight and time-of-flight mass spectrometer |
WO2012142565A1 (en) * | 2011-04-14 | 2012-10-18 | Indiana University Research And Technology Corporation | Resolution and mass range performance in distance-of-flight mass spectrometry with a multichannel focal-plane camera detector |
GB201507363D0 (en) | 2015-04-30 | 2015-06-17 | Micromass Uk Ltd And Leco Corp | Multi-reflecting TOF mass spectrometer |
GB201520130D0 (en) | 2015-11-16 | 2015-12-30 | Micromass Uk Ltd And Leco Corp | Imaging mass spectrometer |
GB201520134D0 (en) | 2015-11-16 | 2015-12-30 | Micromass Uk Ltd And Leco Corp | Imaging mass spectrometer |
GB201520540D0 (en) | 2015-11-23 | 2016-01-06 | Micromass Uk Ltd And Leco Corp | Improved ion mirror and ion-optical lens for imaging |
GB201613988D0 (en) | 2016-08-16 | 2016-09-28 | Micromass Uk Ltd And Leco Corp | Mass analyser having extended flight path |
GB201617668D0 (en) * | 2016-10-19 | 2016-11-30 | Micromass Uk Limited | Dual mode mass spectrometer |
GB2567794B (en) | 2017-05-05 | 2023-03-08 | Micromass Ltd | Multi-reflecting time-of-flight mass spectrometers |
GB2563571B (en) | 2017-05-26 | 2023-05-24 | Micromass Ltd | Time of flight mass analyser with spatial focussing |
US11049712B2 (en) | 2017-08-06 | 2021-06-29 | Micromass Uk Limited | Fields for multi-reflecting TOF MS |
WO2019030471A1 (en) | 2017-08-06 | 2019-02-14 | Anatoly Verenchikov | ION GUIDE INSIDE PULSED CONVERTERS |
EP3662503A1 (en) | 2017-08-06 | 2020-06-10 | Micromass UK Limited | Ion injection into multi-pass mass spectrometers |
WO2019030477A1 (en) | 2017-08-06 | 2019-02-14 | Anatoly Verenchikov | ACCELERATOR FOR MASS SPECTROMETERS WITH MULTIPASSES |
US11239067B2 (en) | 2017-08-06 | 2022-02-01 | Micromass Uk Limited | Ion mirror for multi-reflecting mass spectrometers |
US11295944B2 (en) | 2017-08-06 | 2022-04-05 | Micromass Uk Limited | Printed circuit ion mirror with compensation |
US11211238B2 (en) | 2017-08-06 | 2021-12-28 | Micromass Uk Limited | Multi-pass mass spectrometer |
GB201806507D0 (en) | 2018-04-20 | 2018-06-06 | Verenchikov Anatoly | Gridless ion mirrors with smooth fields |
GB201807605D0 (en) | 2018-05-10 | 2018-06-27 | Micromass Ltd | Multi-reflecting time of flight mass analyser |
GB201807626D0 (en) | 2018-05-10 | 2018-06-27 | Micromass Ltd | Multi-reflecting time of flight mass analyser |
GB201808530D0 (en) | 2018-05-24 | 2018-07-11 | Verenchikov Anatoly | TOF MS detection system with improved dynamic range |
GB201810573D0 (en) | 2018-06-28 | 2018-08-15 | Verenchikov Anatoly | Multi-pass mass spectrometer with improved duty cycle |
GB201901411D0 (en) | 2019-02-01 | 2019-03-20 | Micromass Ltd | Electrode assembly for mass spectrometer |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6469295B1 (en) * | 1997-05-30 | 2002-10-22 | Bruker Daltonics Inc. | Multiple reflection time-of-flight mass spectrometer |
JP4151926B2 (ja) | 1997-10-28 | 2008-09-17 | 日本電子株式会社 | 飛行時間型質量分析計のイオン光学系 |
JPH11135060A (ja) * | 1997-10-31 | 1999-05-21 | Jeol Ltd | 飛行時間型質量分析計 |
JP3571566B2 (ja) | 1999-02-19 | 2004-09-29 | 日本電子株式会社 | 飛行時間型質量分析計のイオン光学系 |
JP3773430B2 (ja) | 2001-09-12 | 2006-05-10 | 日本電子株式会社 | 飛行時間型質量分析計のイオン光学系 |
US6917036B2 (en) * | 2002-02-08 | 2005-07-12 | Ionalytics Corporation | FAIMS with non-destructive detection of selectively transmitted ions |
US6867414B2 (en) * | 2002-09-24 | 2005-03-15 | Ciphergen Biosystems, Inc. | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
-
2003
- 2003-11-14 JP JP2003384621A patent/JP4001100B2/ja not_active Expired - Fee Related
-
2004
- 2004-11-09 US US10/983,571 patent/US6949738B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP2005149869A (ja) | 2005-06-09 |
US6949738B2 (en) | 2005-09-27 |
US20050103992A1 (en) | 2005-05-19 |
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