JP2010182404A - 偽造に耐えられる固定記憶のオプションをもつ不揮発性記憶装置 - Google Patents
偽造に耐えられる固定記憶のオプションをもつ不揮発性記憶装置 Download PDFInfo
- Publication number
- JP2010182404A JP2010182404A JP2010021072A JP2010021072A JP2010182404A JP 2010182404 A JP2010182404 A JP 2010182404A JP 2010021072 A JP2010021072 A JP 2010021072A JP 2010021072 A JP2010021072 A JP 2010021072A JP 2010182404 A JP2010182404 A JP 2010182404A
- Authority
- JP
- Japan
- Prior art keywords
- access
- receiving
- current
- access change
- storage unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000015654 memory Effects 0.000 title claims description 25
- 230000008859 change Effects 0.000 claims abstract description 44
- 230000004044 response Effects 0.000 claims abstract description 12
- 238000000034 method Methods 0.000 claims description 12
- 230000009849 deactivation Effects 0.000 claims description 8
- 230000005684 electric field Effects 0.000 claims description 5
- 230000004913 activation Effects 0.000 claims description 4
- 230000004048 modification Effects 0.000 claims description 4
- 238000012986 modification Methods 0.000 claims description 4
- 230000001066 destructive effect Effects 0.000 claims description 3
- 230000003213 activating effect Effects 0.000 claims description 2
- 230000002427 irreversible effect Effects 0.000 claims 1
- 210000004027 cell Anatomy 0.000 description 12
- 230000006870 function Effects 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 230000002085 persistent effect Effects 0.000 description 3
- 150000004770 chalcogenides Chemical class 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 206010039203 Road traffic accident Diseases 0.000 description 1
- 229910002110 ceramic alloy Inorganic materials 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 230000002779 inactivation Effects 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 210000000352 storage cell Anatomy 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/22—Safety or protection circuits preventing unauthorised or accidental access to memory cells
- G11C16/225—Preventing erasure, programming or reading when power supply voltages are outside the required ranges
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/24—Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells
Landscapes
- Engineering & Computer Science (AREA)
- Computer Security & Cryptography (AREA)
- Computer Hardware Design (AREA)
- Read Only Memory (AREA)
- Storage Device Security (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP09305108A EP2221825A1 (en) | 2009-02-05 | 2009-02-05 | Non-volatile storage device with forgery-proof permanent storage option |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2010182404A true JP2010182404A (ja) | 2010-08-19 |
| JP2010182404A5 JP2010182404A5 (https=) | 2013-01-24 |
Family
ID=40727251
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010021072A Pending JP2010182404A (ja) | 2009-02-05 | 2010-02-02 | 偽造に耐えられる固定記憶のオプションをもつ不揮発性記憶装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20100199028A1 (https=) |
| EP (2) | EP2221825A1 (https=) |
| JP (1) | JP2010182404A (https=) |
| KR (1) | KR20100090214A (https=) |
| CN (1) | CN101800080A (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9620203B2 (en) | 2014-09-17 | 2017-04-11 | Kabushiki Kaisha Toshiba | Nonvolatile memory integrated circuit with built-in redundancy |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6236800A (ja) * | 1985-08-09 | 1987-02-17 | Hitachi Ltd | Icメモリ装置 |
| JPH01155595A (ja) * | 1987-12-11 | 1989-06-19 | Toshiba Corp | 不揮発性半導体記憶装置 |
| JP2000268584A (ja) * | 1999-03-15 | 2000-09-29 | Nec Corp | 不揮発性半導体記憶装置およびその製造方法 |
| JP2000293996A (ja) * | 1999-02-03 | 2000-10-20 | Seiko Instruments Inc | メモリ回路 |
| JP2003059283A (ja) * | 2001-08-10 | 2003-02-28 | Sony Corp | 半導体記憶装置 |
| JP2008140018A (ja) * | 2006-11-30 | 2008-06-19 | Denso Corp | 電子制御装置 |
| JP2013069379A (ja) * | 2011-09-22 | 2013-04-18 | Toshiba Corp | 不揮発性半導体記憶装置 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4796235A (en) * | 1987-07-22 | 1989-01-03 | Motorola, Inc. | Write protect mechanism for non-volatile memory |
| US5890191A (en) * | 1996-05-10 | 1999-03-30 | Motorola, Inc. | Method and apparatus for providing erasing and programming protection for electrically erasable programmable read only memory |
| FR2771839B1 (fr) * | 1997-11-28 | 2000-01-28 | Sgs Thomson Microelectronics | Memoire non volatile programmable et effacable electriquement |
| KR100268947B1 (ko) * | 1998-04-03 | 2000-10-16 | 김영환 | 비휘발성 강유전체 메모리 및 그의 제어회로 |
| US5999477A (en) | 1998-06-23 | 1999-12-07 | Vanguard International Semiconductor Corporation | Distributed array activation arrangement |
| US6208542B1 (en) * | 1998-06-30 | 2001-03-27 | Sandisk Corporation | Techniques for storing digital data in an analog or multilevel memory |
| JP3734408B2 (ja) * | 2000-07-03 | 2006-01-11 | シャープ株式会社 | 半導体記憶装置 |
| US6731536B1 (en) * | 2001-03-05 | 2004-05-04 | Advanced Micro Devices, Inc. | Password and dynamic protection of flash memory data |
| DE10126281A1 (de) * | 2001-05-29 | 2002-12-12 | Infineon Technologies Ag | Programmgesteuerte Einheit |
| DE10162308A1 (de) * | 2001-12-19 | 2003-07-03 | Philips Intellectual Property | Verfahren und Anordnung zur Zugriffssteuerung auf EEPROMs sowie ein entsprechendes Computerprogrammprodukt und eine entsprechendes computerlesbares Speichermedium |
| JP4133166B2 (ja) * | 2002-09-25 | 2008-08-13 | 株式会社ルネサステクノロジ | 不揮発性半導体記憶装置 |
| US6948041B2 (en) * | 2002-10-24 | 2005-09-20 | Micron Technology, Inc. | Permanent memory block protection in a flash memory device |
| US6944083B2 (en) * | 2003-11-17 | 2005-09-13 | Sony Corporation | Method for detecting and preventing tampering with one-time programmable digital devices |
| US7283384B1 (en) * | 2004-03-24 | 2007-10-16 | Silicon Magnetic Systems | Magnetic memory array architecture |
| US7046570B1 (en) * | 2004-06-02 | 2006-05-16 | Xilinx, Inc. | Programmable logic devices optionally convertible to one time programmable devices |
-
2009
- 2009-02-05 EP EP09305108A patent/EP2221825A1/en not_active Withdrawn
-
2010
- 2010-01-26 US US12/657,708 patent/US20100199028A1/en not_active Abandoned
- 2010-01-28 EP EP10151981A patent/EP2221824A1/en not_active Withdrawn
- 2010-02-02 JP JP2010021072A patent/JP2010182404A/ja active Pending
- 2010-02-04 KR KR1020100010555A patent/KR20100090214A/ko not_active Withdrawn
- 2010-02-05 CN CN201010114050A patent/CN101800080A/zh active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6236800A (ja) * | 1985-08-09 | 1987-02-17 | Hitachi Ltd | Icメモリ装置 |
| JPH01155595A (ja) * | 1987-12-11 | 1989-06-19 | Toshiba Corp | 不揮発性半導体記憶装置 |
| JP2000293996A (ja) * | 1999-02-03 | 2000-10-20 | Seiko Instruments Inc | メモリ回路 |
| JP2000268584A (ja) * | 1999-03-15 | 2000-09-29 | Nec Corp | 不揮発性半導体記憶装置およびその製造方法 |
| JP2003059283A (ja) * | 2001-08-10 | 2003-02-28 | Sony Corp | 半導体記憶装置 |
| JP2008140018A (ja) * | 2006-11-30 | 2008-06-19 | Denso Corp | 電子制御装置 |
| JP2013069379A (ja) * | 2011-09-22 | 2013-04-18 | Toshiba Corp | 不揮発性半導体記憶装置 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9620203B2 (en) | 2014-09-17 | 2017-04-11 | Kabushiki Kaisha Toshiba | Nonvolatile memory integrated circuit with built-in redundancy |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101800080A (zh) | 2010-08-11 |
| US20100199028A1 (en) | 2010-08-05 |
| EP2221825A1 (en) | 2010-08-25 |
| KR20100090214A (ko) | 2010-08-13 |
| EP2221824A1 (en) | 2010-08-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8711628B2 (en) | Use of emerging non-volatile memory elements with flash memory | |
| KR100813629B1 (ko) | 향상된 섹터 보호 스킴 | |
| TW200845007A (en) | Flash memory with improved programming precision | |
| US10956622B2 (en) | Thermal hardware-based data security device that permanently erases data by using local heat generation phenomenon and method thereof | |
| CN101430929B (zh) | 用于对非易失性存储单元进行不可逆编程和读取的方法和设备 | |
| JP2011514568A (ja) | ライトワンスメモリデバイスおよびライトメニーメモリデバイスを備えるコンピュータのストレージサブシステムおよび関連する方法 | |
| JP2012203919A (ja) | 半導体記憶装置およびその制御方法 | |
| US20210295880A1 (en) | Non-volatile memory devices and systems with volatile memory features and methods for operating the same | |
| KR101795417B1 (ko) | 비휘발성 메모리 셀 어레이 및 비휘발성 메모리 장치 | |
| JP2008225672A (ja) | 半導体メモリ装置 | |
| TW201135730A (en) | Rewritable memory device with multi-level, write-once memory cells | |
| JP2010182404A (ja) | 偽造に耐えられる固定記憶のオプションをもつ不揮発性記憶装置 | |
| KR20140056657A (ko) | 메인 메모리를 구비한 컴퓨터 시스템 및 그것의 제어 방법 | |
| JP2011134389A (ja) | 不揮発性メモリの制御装置および制御方法 | |
| US9368217B2 (en) | Voltage generator, integrated circuit, and voltage generating method | |
| JP2003331575A (ja) | 高速ランダムアクセス可能な不揮発性メモリの制御回路 | |
| JP4661369B2 (ja) | メモリコントローラ | |
| US20110173379A1 (en) | Semiconductor device with double program prohibition control | |
| US8423705B2 (en) | Semiconductor device and method for controlling thereof | |
| US20260010469A1 (en) | Data erasure system | |
| TWI906743B (zh) | 多次可程式化記憶體裝置及方法 | |
| US9218858B2 (en) | Data storage device and operating method thereof | |
| JP2004206821A (ja) | 半導体記憶装置 | |
| JP2010182404A5 (https=) | ||
| KR20180055296A (ko) | 컴퓨터 시스템, 및 컴퓨터 시스템의 동작 방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20121130 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20121130 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20130625 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130709 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20131008 |
|
| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20131011 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20140408 |