JP2010117343A5 - - Google Patents

Download PDF

Info

Publication number
JP2010117343A5
JP2010117343A5 JP2009187734A JP2009187734A JP2010117343A5 JP 2010117343 A5 JP2010117343 A5 JP 2010117343A5 JP 2009187734 A JP2009187734 A JP 2009187734A JP 2009187734 A JP2009187734 A JP 2009187734A JP 2010117343 A5 JP2010117343 A5 JP 2010117343A5
Authority
JP
Japan
Prior art keywords
correction
dark
light detector
corrected
determined
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2009187734A
Other languages
English (en)
Japanese (ja)
Other versions
JP5150939B2 (ja
JP2010117343A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from JP2009187734A external-priority patent/JP5150939B2/ja
Priority to JP2009187734A priority Critical patent/JP5150939B2/ja
Priority to US12/573,140 priority patent/US8169607B2/en
Priority to TW98133802A priority patent/TWI468654B/zh
Priority to KR1020090097472A priority patent/KR101603344B1/ko
Priority to CN2009101781731A priority patent/CN101726361B/zh
Publication of JP2010117343A publication Critical patent/JP2010117343A/ja
Priority to US13/306,941 priority patent/US8169608B2/en
Publication of JP2010117343A5 publication Critical patent/JP2010117343A5/ja
Publication of JP5150939B2 publication Critical patent/JP5150939B2/ja
Application granted granted Critical
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2009187734A 2008-10-15 2009-08-13 光学特性測定装置および光学特性測定方法 Active JP5150939B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2009187734A JP5150939B2 (ja) 2008-10-15 2009-08-13 光学特性測定装置および光学特性測定方法
US12/573,140 US8169607B2 (en) 2008-10-15 2009-10-04 Optical characteristic measurement device and optical characteristic measurement method suitable for spectrum measurement
TW98133802A TWI468654B (zh) 2008-10-15 2009-10-06 適合光譜測定之光學特性測定裝置及光學特性測定方法
KR1020090097472A KR101603344B1 (ko) 2008-10-15 2009-10-14 스펙트럼 측정에 적합한 광학 특성 측정 장치 및 광학 특성 측정 방법
CN2009101781731A CN101726361B (zh) 2008-10-15 2009-10-15 适于光谱测定的光学特性测定装置以及光学特性测定方法
US13/306,941 US8169608B2 (en) 2008-10-15 2011-11-29 Optical characteristic measurement device and optical characteristic measurement method suitable for spectrum measurement

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008266056 2008-10-15
JP2008266056 2008-10-15
JP2009187734A JP5150939B2 (ja) 2008-10-15 2009-08-13 光学特性測定装置および光学特性測定方法

Publications (3)

Publication Number Publication Date
JP2010117343A JP2010117343A (ja) 2010-05-27
JP2010117343A5 true JP2010117343A5 (https=) 2012-09-13
JP5150939B2 JP5150939B2 (ja) 2013-02-27

Family

ID=42098570

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009187734A Active JP5150939B2 (ja) 2008-10-15 2009-08-13 光学特性測定装置および光学特性測定方法

Country Status (5)

Country Link
US (2) US8169607B2 (https=)
JP (1) JP5150939B2 (https=)
KR (1) KR101603344B1 (https=)
CN (1) CN101726361B (https=)
TW (1) TWI468654B (https=)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5769453B2 (ja) 2011-03-10 2015-08-26 大塚電子株式会社 分光特性測定方法および分光特性測定装置
CN102155991B (zh) * 2011-03-18 2012-08-08 杭州远方光电信息股份有限公司 一种高级光谱校正方法
JP5605318B2 (ja) * 2011-06-21 2014-10-15 株式会社島津製作所 分光光度計
CN102445326A (zh) * 2011-09-20 2012-05-09 电子科技大学 基于时域的光谱探测系统
EP2783193A4 (en) 2011-11-03 2015-08-26 Verifood Ltd COST-EFFECTIVE SPECTROMETRIC SYSTEM FOR USER-EATING FOOD ANALYSIS
TWI454679B (zh) * 2012-08-08 2014-10-01 Chroma Ate Inc Optical detection system and optical property detection method
CN102818623B (zh) * 2012-08-31 2014-08-20 广东威创视讯科技股份有限公司 一种亮色度计的校准方法和系统
JP5484537B2 (ja) * 2012-09-03 2014-05-07 大塚電子株式会社 分光特性測定装置および分光特性測定方法
GB2529070B (en) 2013-08-02 2017-07-12 Verifood Ltd Spectrometer comprising a plurality of isolated optical paths
EP3090239A4 (en) 2014-01-03 2018-01-10 Verifood Ltd. Spectrometry systems, methods, and applications
EP3209983A4 (en) 2014-10-23 2018-06-27 Verifood Ltd. Accessories for handheld spectrometer
WO2016125164A2 (en) 2015-02-05 2016-08-11 Verifood, Ltd. Spectrometry system applications
WO2016125165A2 (en) 2015-02-05 2016-08-11 Verifood, Ltd. Spectrometry system with visible aiming beam
WO2016162865A1 (en) 2015-04-07 2016-10-13 Verifood, Ltd. Detector for spectrometry system
KR102433371B1 (ko) 2015-06-24 2022-08-16 삼성전자주식회사 스펙트로미터 및 광차폐 상태 모니터링 장치
JP6613063B2 (ja) * 2015-07-07 2019-11-27 大塚電子株式会社 光学特性測定システム
US10066990B2 (en) 2015-07-09 2018-09-04 Verifood, Ltd. Spatially variable filter systems and methods
JP6441759B2 (ja) * 2015-07-24 2018-12-19 株式会社堀場製作所 分光分析器に用いられる光検出器の出力補正方法
US10203246B2 (en) 2015-11-20 2019-02-12 Verifood, Ltd. Systems and methods for calibration of a handheld spectrometer
EP3184975B1 (en) * 2015-12-23 2023-08-30 Spectricity A spectrometer module
US10254215B2 (en) 2016-04-07 2019-04-09 Verifood, Ltd. Spectrometry system applications
WO2018015951A1 (en) 2016-07-20 2018-01-25 Verifood, Ltd. Accessories for handheld spectrometer
US10791933B2 (en) 2016-07-27 2020-10-06 Verifood, Ltd. Spectrometry systems, methods, and applications
JP6683092B2 (ja) 2016-09-26 2020-04-15 株式会社島津製作所 分光分析装置およびキャリブレーション方法
EP3864384A4 (en) 2018-10-08 2022-06-29 Verifood Ltd. Accessories for optical spectrometers
WO2022185565A1 (ja) * 2021-03-04 2022-09-09 株式会社島津製作所 分光測定装置
CN119256213A (zh) * 2022-05-27 2025-01-03 浜松光子学株式会社 分光测定装置
US20250076115A1 (en) * 2023-08-30 2025-03-06 Htc Corporation Spectrum measurement device

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5657925A (en) * 1979-10-17 1981-05-20 Hitachi Ltd Multiwavelength spectrophotometer
JPS58158528A (ja) * 1982-03-16 1983-09-20 Union Giken:Kk 測光装置
JPS60239649A (ja) * 1984-05-15 1985-11-28 Shimadzu Corp デンシトメ−タにおける測光信号処理方法
ES2035985T3 (es) * 1989-05-20 1993-05-01 Hewlett-Packard Gmbh Metodo de funcionamiento de un espectometro de fotodiodos y espectrometro de fotodiodos correspondiente.
JPH07128144A (ja) * 1993-11-04 1995-05-19 Matsushita Electric Ind Co Ltd 分光測定装置
JPH1130552A (ja) 1997-07-10 1999-02-02 Otsuka Denshi Kk 迷光補正方法
JP3927702B2 (ja) * 1998-09-24 2007-06-13 キヤノン株式会社 画像処理装置、自動焦点検出装置、補正装置、補正方法及び記憶媒体
JP4372314B2 (ja) * 2000-06-21 2009-11-25 大塚電子株式会社 スペクトル測定装置
JP2002195884A (ja) * 2000-12-22 2002-07-10 Ando Electric Co Ltd 光検出装置、暗出力補正方法および光スペクトラムアナライザ
JP2002318190A (ja) * 2001-04-20 2002-10-31 Hitachi Ltd 医用光度計
US6594010B2 (en) * 2001-07-06 2003-07-15 Praxair Technology, Inc. Emission spectrometer having a charge coupled device detector
US20070258001A1 (en) * 2004-01-30 2007-11-08 Alexei Stanco Method for Producing High Signal to Noise Spectral Measurements in Optical Dectector Arrays
CN201051012Y (zh) * 2007-06-15 2008-04-23 杭州远方光电信息有限公司 低杂散光快速光谱仪
WO2009128338A1 (ja) * 2008-04-15 2009-10-22 株式会社トプコン 測光装置
US9098562B2 (en) * 2009-03-30 2015-08-04 The Boeing Company Computer architectures using shared storage

Similar Documents

Publication Publication Date Title
JP2010117343A5 (https=)
JP2015536459A5 (https=)
JP2014528579A5 (https=)
JP2020509395A5 (https=)
CN103234647B (zh) 一种嵌入式系统的温度校准方法及系统
JP2016028504A5 (https=)
ATE499588T1 (de) Verfahren zur abschnittsweisen bestimmung eines parameterabhängigen korrekturwertnäherungsverlaufs und sensoranordnung
JP2017152950A5 (https=)
SG157350A1 (en) Lithographic apparatus and device manufacturing method
EP4578467A3 (en) METHOD FOR OBTAINING VALIDATED STERILIZATION PROCESS MEASURES
WO2010126698A3 (en) Modeling critical-dimension (cd) scanning-electron-microscopy (cd-sem) cd extraction
EP2241899A4 (en) Measurement error correcting method and electronic part characteristic measuring instrument
ATE467272T1 (de) Effiziente taktkalibration in elektronischen geräten
WO2007149488A3 (en) Rheometer torque calibration fixture
JP2012200267A5 (https=)
DE602006002615D1 (de) Relative Kalibrierung für dosimetrische Einrichtungen
BR112014022364A8 (pt) Método para calibragem de um transdutor de corrente do tipo rogowski e transdutor de corrente do tipo rogowski
JP2006324311A5 (https=)
JP2018081308A5 (https=)
TW200644078A (en) Measurement method, measurement system, inspection method, inspection system, exposure method, and exposure system
EP2498129A4 (en) Focus test mask, focus measuring method, exposure apparatus, and exposure method
MX361270B (es) Método para medir un parámetro fisiológico tal como un ritmo biológico, con base en al menos dos sensores - dispositivo de medición asociado.
WO2010140769A3 (ko) 재현성 향상을 위한 알고리즘을 사용하는 생체 데이터 측정장치 및 생체 데이터 측정방법
TWI456358B (zh) 從曝光結果改進光學鄰近模擬的方法
JP2010203915A5 (https=)