WO2022185565A1 - 分光測定装置 - Google Patents
分光測定装置 Download PDFInfo
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- WO2022185565A1 WO2022185565A1 PCT/JP2021/028735 JP2021028735W WO2022185565A1 WO 2022185565 A1 WO2022185565 A1 WO 2022185565A1 JP 2021028735 W JP2021028735 W JP 2021028735W WO 2022185565 A1 WO2022185565 A1 WO 2022185565A1
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- 238000005259 measurement Methods 0.000 title claims abstract description 168
- 238000001514 detection method Methods 0.000 claims abstract description 21
- 230000010354 integration Effects 0.000 claims description 19
- 238000009825 accumulation Methods 0.000 claims description 5
- 239000006185 dispersion Substances 0.000 claims description 4
- 230000003595 spectral effect Effects 0.000 abstract description 19
- 230000001186 cumulative effect Effects 0.000 abstract 1
- 238000001228 spectrum Methods 0.000 description 40
- 230000003287 optical effect Effects 0.000 description 16
- 238000012545 processing Methods 0.000 description 15
- 238000010586 diagram Methods 0.000 description 8
- 238000012937 correction Methods 0.000 description 5
- 230000000903 blocking effect Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 239000013307 optical fiber Substances 0.000 description 4
- 238000013500 data storage Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 238000007792 addition Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
Definitions
- the present invention relates to a spectrometer.
- the light to be measured is introduced into a spectroscope to be wavelength-dispersed, and the wavelength-dispersed light is introduced into a detector for detection.
- a spectrometer using a Czerny-Turner spectroscope such as that disclosed in Patent Document 1
- the wavelength of light reaching a detector is changed in multiple steps by rotating a diffraction grating included in the spectroscope. , or scanning within a predetermined range.
- the detectors used in these spectrometers output a very small level of detection signal, the so-called dark current signal, even when no light is incident. Therefore, in order to perform accurate spectroscopy, it is necessary to remove the influence of the dark current signal, and it is common to perform correction based on the dark current signal measured with no light incident on the detector. .
- a In most spectrometers, in order to prevent light from entering the detector during dark current measurement, a is provided with a shutter, and when the shutter is closed, the light to be measured is blocked.
- dark measurement In the following description, such dark current signal measurement is referred to as dark measurement, and the dark current signal value is referred to as dark measurement value.
- Non-Patent Document 1 a plurality of measurement conditions are registered in advance as a set of parameters such as the wavelength to be measured and the integration time in the detector, and a predetermined It is possible to simultaneously measure the spectrum of the wavelength width of . In order to improve spectral accuracy in such instruments, accurate dark measurements are required.
- the dark measurement value varies depending on the light-receiving characteristics of individual detectors, as well as the integration time (charge accumulation time) and gain of the detector. Therefore, if the integration time or the like is different as described above, corresponding dark measurement is required, and the spectroscopic measurement apparatus disclosed in Non-Patent Document 1 also incorporates such a function.
- the present invention has been made to solve these problems, and its object is to improve the accuracy of light intensity data and spectrum data by performing dark measurement more accurately. is to provide
- a spectroscopic section including a diffraction grating; a detection unit that detects light wavelength-dispersed by the diffraction grating; a rotating portion that rotates the diffraction grating; a light blocking section that blocks light to be measured that is introduced into the spectroscopic section; a measurement condition setting unit that sets a plurality of measurement conditions each including a wavelength to be measured and at least one parameter value of an integration time, a gain, or the number of times of data accumulation; It is for acquiring a dark measurement value for each of a plurality of measurement conditions set by the measurement condition setting unit, wherein the light to be measured is blocked by the light shielding unit, and under each measurement condition, the light to be measured is a control unit that rotates the diffraction grating to a position corresponding to the wavelength to be measured included in the measurement conditions, and then performs dark measurement under other parameter values included in the measurement
- the above "light to be measured” is the light itself given from the outside.
- the above-mentioned “measured light” means the transmitted light, the reflected light Light, scattered light, fluorescence, and the like.
- the above-mentioned "light to be measured” means the light itself emitted from the light source. is.
- the spectroscopic measurement device when the light to be measured is blocked by the light shielding section, the light introduced into the spectroscopic section is almost zero. Therefore, it is ideal that light does not enter the detection section regardless of the rotational position of the diffraction grating. Therefore, conventionally, when dark measurements are performed under different measurement conditions, for example, including different integration times as parameters, the difference in the wavelength to be measured is not considered, and the diffraction grating position is fixed. However, the inventors have found that the dark measurements are affected by the wavelength to be measured, ie the position of the diffraction grating. FIG.
- FIG. 6 is a diagram showing the results of measuring the relationship between the set wavelength and the dark measurement value in the laser spectrum analyzer disclosed in Non-Patent Document 1.
- the reason why the dark measurement value differs depending on the position of the diffraction grating will be described later, such a difference has not been considered conventionally.
- the diffraction grating is rotated to the position corresponding to the wavelength to be measured determined under each measurement condition even during dark measurement. Therefore, dark measurement values that differ depending on the position of the diffraction grating as shown in FIG. 6 can be obtained with high accuracy.
- FIG. 1 is a block configuration diagram of a spectrum analyzer, which is an embodiment of a spectrometer according to the present invention
- FIG. FIG. 2 is a schematic optical path configuration diagram of a spectrum detector in the spectrum analyzer of the present embodiment
- 4 is a flowchart showing a standard measurement procedure in the spectrum analyzer of this embodiment
- 4 is a flowchart for dark measurement in the spectrum analyzer of the present embodiment
- FIG. 4 is a diagram showing an example of measurement conditions in the spectrum analyzer of this embodiment
- FIG. 4 is a diagram showing an example of the relationship between set wavelengths and dark measurement values in a conventional spectrum analyzer;
- a spectrum analyzer which is one embodiment of the spectroscopic measurement device according to the present invention, will be described in detail below with reference to the accompanying drawings.
- FIG. 1 is a block diagram of the spectrum analyzer of this embodiment.
- FIG. 2 is an optical path configuration diagram centering on the spectral detection section in the spectrum analyzer of this embodiment.
- This spectrum analyzer is, for example, a device having the same function as the laser spectrum analyzer disclosed in Non-Patent Document 1, and measures the spectrum of input light to be measured (generally laser light). .
- the apparatus includes an introduction optical system 1, a spectral detection section 2, a data processing section 3, a control section 4, an input section 5, and a display section 6.
- the introduction optical system 1 includes a light input connector 10 to which an optical fiber for inputting the light to be measured is connected, and a guiding optical system 11 for guiding the introduced light.
- the spectroscopic detection unit 2 includes a Zerny-Turner spectroscope that wavelength-disperses the introduced light to be measured, and a multi-channel detector 25 that detects the wavelength-dispersed light.
- This detector 25 is a linear sensor in which a large number of light receiving elements are arranged in the direction of wavelength dispersion, and can simultaneously detect light with different wavelength widths depending on the central wavelength.
- the spectroscope includes an entrance slit 20, a first concave mirror 21, a diffraction grating 22, a second concave mirror 24, and a diffraction grating 22 that rotates as indicated by arrow A in FIG.
- a diffraction grating rotation driving unit 27 including a motor, a shutter 26 at the entrance of the spectroscope that shields the introduced light, and the shutter 26 between the position indicated by the solid line and the position (26A) indicated by the dotted line in FIG. and a shutter drive unit 28 that moves with.
- these spectral detectors 2 are accommodated in a housing that is almost completely shielded from light so that outside light other than the introduced light does not enter.
- the data processing unit 3 includes, as functional blocks, a spectral data storage unit 30, a dark measurement value storage unit 31, an arithmetic processing unit 32, a display processing unit 33, and the like.
- the control section 4 includes a measurement condition storage section 40 .
- the data processing unit 3 and the control unit 4 use a computer (for example, a personal computer) consisting of a CPU as hardware resources, and implement each function by executing software installed in the computer. can be done.
- FIG. 3 is a flow chart showing a standard measurement procedure.
- the diffraction grating 22 can be freely rotated. ) can be measured simultaneously.
- This spectrum analyzer can measure a wide range of laser light from the ultraviolet region to the near-infrared region. For this purpose, a predetermined number (for example, a maximum of 10) of measurement conditions are set in advance, one of the set measurement conditions is selected, and under the selected measurement condition, It is now possible to perform spectral measurements with high mass resolution at .
- the user first performs the initial setting of the measurement conditions by performing a predetermined operation on the input unit 5 (step S1). As initial settings, the number of measurement conditions to be set and the items to be set for each measurement condition are selected.
- FIG. 5 is a diagram showing an example of measurement conditions.
- items such as set wavelength, integration time, gain, and number of times of integration are provided for each measurement condition, and parameter values can be set for each item.
- the set wavelength is the central wavelength of the wavelength width to be measured, and in the case of laser light spectrum measurement, the oscillation wavelength of the laser is generally set as the set wavelength.
- Integration time is the charge accumulation time in detector 25 .
- Gain is the gain of detector 25 .
- the number of times of integration is the number of times to integrate one data obtained by integrating for the “integration time”. In addition to this, it is also possible to add measurement intervals (intervals) of a plurality of measurements when data are integrated, etc. to the items of the measurement conditions.
- the user performs predetermined operations on the input unit 5 to input or select parameter values for each item of the measurement conditions. Further, for example, if a default value is set in advance, the default value may be changed as appropriate (step S2). As a result, the numerical values in the table indicating the measurement conditions shown in FIG. 5 are filled.
- the set parameter values are registered in the measurement condition storage unit 40 in association with identifiers (here, [1], [2], . . . ) that specify the measurement conditions. Incidentally, if the measurement conditions already registered in the measurement condition storage unit 40 are used as they are to perform the measurement, it is of course possible to omit steps S1 and S2.
- the control unit 4 causes the shutter drive unit 28 to close the shutter 26, thereby shielding the light entering the spectroscope. Then, in a light-shielded state, dark measurement is performed to obtain a dark measurement value for each measurement condition (step S3).
- dark measurement is generally performed by blocking light from entering the photodetector (for spectrometers with a built-in light source, the light source may be turned off). ), to obtain the output signal of the photodetector.
- the output signal is affected by the integration time and gain of the photodetector, so if the integration time and gain are different, the dark measurement should be performed for each integration time and gain. , I need to get dark measurements. This is the same for the spectrum analyzer of this embodiment, and since the integrated value and gain may differ (or may be the same) for each measurement condition, it is necessary to obtain the dark measurement value for each measurement condition. .
- the light introduced into the spectrometer is blocked so that the light does not reach the detector in the first place. They shouldn't. Therefore, conventionally, even when performing dark measurement corresponding to each measurement condition, the position of the diffraction grating is fixed to the state before the dark measurement.
- the inventors of the present invention have found through experiments that the dark measurement value is clearly affected by the set wavelength, that is, the rotational position of the diffraction grating 22. . According to FIG. 6, the dark measurement value increases remarkably as the set wavelength increases. The reason is presumed to be as follows.
- the spectral detection unit 2 includes a driving mechanism for rotating the diffraction grating 22.
- various optical sensors such as an optical position sensor and a rotary encoder are used for this driving mechanism.
- Such an optical sensor includes a light source such as an LED, and even if the optical sensor is housed in a case, it is difficult to completely eliminate leakage light from the case.
- light originating from such an optical sensor or the like leaks into the housing of the spectral detection unit 2, it hits various surfaces including the grating surface of the diffraction grating 22, is reflected, and may eventually reach the detector 25 as stray light. be. In that case, the intensity of the stray light reaching the detector 25 changes depending on the rotational position of the diffraction grating 22, that is, the set wavelength at that time.
- FIG. 4 is a flowchart for dark measurement in the spectrum analyzer of this embodiment.
- the control unit 4 when the dark measurement is started, the control unit 4 first controls the shutter driving unit 28 to close the shutter 26 (step S30). As a result, the introduction of external light into the spectral detection unit 2 is blocked. Next, the control unit 4 initializes the number (identifier) n of the measurement condition to 1 (step S31), and sets the parameter value associated with the measurement condition [n], that is, the measurement condition [1] to the measurement condition. Acquired from the storage unit 40 (step S32).
- the control unit 4 controls the diffraction grating rotation driving unit 27 to rotate the diffraction grating 22 to the rotation position corresponding to the set wavelength a in the measurement condition [1] (step S33). Then, the control unit 4 performs the dark measurement under the parameter values of the items other than the set wavelength in the measurement condition [1], and acquires the dark measurement value by the detector 25 (step S34).
- the dark measurement value at this time is a dark spectrum with a predetermined wavelength width corresponding to the set wavelength.
- the data processing unit 3 associates the obtained dark measurement value with the measurement condition [1] and stores it in the dark measurement value storage unit 31 (step S35).
- the control unit 4 increments the value of n (step S36), and determines whether or not the measurement condition [n] is registered in the measurement condition storage unit 40 (step S37).
- n is updated from 1 to 2, and it is determined whether measurement condition [2] is registered in measurement condition storage unit 40 or not.
- the process returns from step S37 to S32, and the parameter value of each item in the measurement condition [2] is acquired from the measurement condition storage unit 40.
- the dark measurement value corresponding to the measurement condition [2] is stored in the dark measurement value storage unit 31 by executing the processing of steps S33 to S37 as described above.
- step S37 When the dark measurement values for all pre-registered measurement conditions [n] are obtained by repeating steps S32 to S37, a determination of No is made in step S37, and the dark measurement ends. In this way, dark measurement values reflecting the rotational position of the diffraction grating 22 corresponding to each set wavelength can be obtained for all measurement conditions registered in advance. That is, as shown in FIG. 6, highly accurate dark measurement values that differ depending on the set wavelength can be obtained.
- the target light to be measured that is, the main measurement is performed (step S4).
- an optical fiber for inputting the light to be measured is attached to the light input connector 10 .
- the control section 4 acquires parameter values under the selected measurement conditions from the measurement condition storage section 40 .
- the diffraction grating rotation driving section 27 is operated so that the diffraction grating 22 is rotated to a position corresponding to the set wavelength included in the measurement conditions.
- the diffraction surface of diffraction grating 22 forms a predetermined angle with respect to first concave mirror 21 .
- the light to be measured hits the first concave mirror 21, is reflected, and travels toward the diffraction surface of the diffraction grating 22.
- the light to be measured at this time is substantially parallel light.
- the light to be measured that hits the diffraction surface of the diffraction grating 22 is wavelength-dispersed and sent to the second concave mirror 24 .
- the wavelength-dispersed light that hits the second concave mirror 24 is reflected while being converged, and reaches each light-receiving element of the detector 25 .
- Light with different wavelengths reaches each light receiving element of the detector 25 within a predetermined wavelength width.
- Each light receiving element outputs a detection signal corresponding to the intensity of the incident light. This detection signal corresponds to the spectrum of light with a predetermined wavelength width.
- the spectral data storage unit 30 in the data processing unit 3 sequentially stores the acquired spectral data. Further, the arithmetic processing unit 32 performs correction processing using the dark measurement values stored in the dark measurement value storage unit 31 for each wavelength from the obtained spectral data, thereby performing dark correction spectral data. Calculate The display processing unit 33 creates a spectrum based on the spectrum data after the dark correction, and displays it on the screen of the display unit 6 through the control unit 4 . Thereby, the spectrum of the incident light to be measured can be displayed on the screen of the display unit 6 in real time.
- the diffraction grating 22 When performing spectroscopic measurements one after another according to different measurement conditions, the diffraction grating 22 is rotated in steps corresponding to the set wavelength included in the measurement conditions, and the diffraction grating 22 is temporarily stopped. The operation of obtaining spectrum data of a predetermined wavelength width by the detector 25 at the position where the wavelength is set to 0 is repeated.
- the items included in the measurement conditions shown in FIG. 5 may include at least the set wavelength and any one of the integration time, the gain, and the number of times of integration.
- the spectroscope is not limited to the Czerny-Turner type, and any spectroscope that can change the measurement wavelength by rotating the diffraction grating can be used.
- the position of the shutter 26 is not limited to the position shown in FIG. 2, but it is desirable to have a configuration in which external light is prevented from entering the spectral detection section 2 as much as possible when the light is shielded.
- an optical or electronic shutter capable of blocking light in a similar manner may be used.
- the present invention can also be applied to a spectrometer for acquiring spectra and the like.
- the present invention can be applied to any device provided with a spectroscope configured to rotate a diffraction grating to change the wavelength or wavelength range to be measured.
- One aspect of the spectrometer according to the present invention is a spectroscopic section including a diffraction grating; a detection unit that detects light wavelength-dispersed by the diffraction grating; a rotating portion that rotates the diffraction grating; a light blocking section that blocks light to be measured that is introduced into the spectroscopic section; a measurement condition setting unit that sets a plurality of measurement conditions each including a wavelength to be measured and at least one parameter value of an integration time, a gain, or the number of times of data accumulation; It is for acquiring a dark measurement value for each of a plurality of measurement conditions set by the measurement condition setting unit, wherein the light to be measured is blocked by the light shielding unit, and under each measurement condition, the light to be measured is a control unit that rotates the diffraction grating to a position corresponding to the wavelength to be measured included in the measurement conditions, and then performs dark measurement under other parameter values included in the measurement conditions; Prepare.
- the spectroscopic measurement device described in the first item it is possible to accurately obtain dark measurement values that differ depending on the set wavelength, that is, the position of the diffraction grating, as shown in FIG. As a result, it is possible to obtain not only parameters such as integration time, but also highly accurate dark measurement values corresponding to each wavelength to be measured. It performs well and can provide highly accurate light intensities and spectra.
- the detection section is a multi-channel detection section in which a plurality of light receiving elements are arranged in a wavelength dispersion direction, and It is possible to simultaneously obtain the light intensity distribution of the wavelength width.
- the light intensity distribution of a predetermined wavelength width that is, the spectrum can be immediately obtained with the diffraction grating fixed at a certain rotational position. Thereby, it is possible to observe the spectrum of the light to be measured in real time.
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Abstract
Description
回折格子を含む分光部と、
前記回折格子で波長分散された光を検出する検出部と、
前記回折格子を回動させる回動部と、
前記分光部に導入される被測定光を遮光する遮光部と、
測定対象の波長と、積分時間、ゲイン、又はデータ積算回数のうちの少なくとも一つのパラメーター値とをセットとして含む測定条件を、複数設定する測定条件設定部と、
前記測定条件設定部において設定された複数の測定条件のそれぞれに対するダーク測定値を取得するためのものであって、前記遮光部により被測定光を遮光し、各測定条件において、前記回動部により、当該測定条件に含まれる測定対象波長に対応した位置まで前記回折格子を回動させたうえで、該測定条件に含まれる他のパラメーター値の下でのダーク測定を実行する制御部と、
を備える。
このスペクトラムアナライザーは、例えば非特許文献1に開示されているレーザースペクトラムアナライザーと同様の機能を有する装置であり、入力された被測定光(一般的にはレーザー光)のスペクトルを測定するものである。
分光検出部2は、導入された被測定光を波長分散するツェル二ターナー型の分光器と、波長分散光を検出するマルチチャンネル型の検出器25と、を含む。この検出器25は、波長分散方向に多数の受光素子が配置されたリニアセンサーであり、その中心波長に応じて相違する波長幅の光を一斉に検出可能である。
なお、測定条件記憶部40に既に登録されている測定条件をそのまま用いて測定を実施する場合には、ステップS1、S2を省くことができることは当然である。
上述した例示的な実施形態は、以下の態様の具体例であることが当業者により理解される。
回折格子を含む分光部と、
前記回折格子で波長分散された光を検出する検出部と、
前記回折格子を回動させる回動部と、
前記分光部に導入される被測定光を遮光する遮光部と、
測定対象の波長と、積分時間、ゲイン、又はデータ積算回数のうちの少なくとも一つのパラメーター値とをセットとして含む測定条件を、複数設定する測定条件設定部と、
前記測定条件設定部において設定された複数の測定条件のそれぞれに対するダーク測定値を取得するためのものであって、前記遮光部により被測定光を遮光し、各測定条件において、前記回動部により、当該測定条件に含まれる測定対象波長に対応した位置まで前記回折格子を回動させたうえで、該測定条件に含まれる他のパラメーター値の下でのダーク測定を実行する制御部と、
を備える。
10…光入力用コネクタ
11…案内光学系
2…分光検出部
20…入射スリット
21…第1凹面鏡
22…回折格子
24…第2凹面鏡
25…検出器
26…シャッター
27…回折格子回転駆動部
28…シャッター駆動部
3…データ処理部
30…スペクトルデータ記憶部
31…ダーク測定値記憶部
32…演算処理部
33…表示処理部
4…制御部
40…測定条件記憶部
5…入力部
6…表示部
Claims (2)
- 回折格子を含む分光部と、
前記回折格子で波長分散された光を検出する検出部と、
前記回折格子を回動させる回動部と、
前記分光部に導入される被測定光を遮光する遮光部と、
測定対象の波長と、積分時間、ゲイン、又はデータ積算回数のうちの少なくとも一つのパラメーター値とをセットとして含む測定条件を、複数設定する測定条件設定部と、
前記測定条件設定部において設定された複数の測定条件のそれぞれに対するダーク測定値を取得するためのものであって、前記遮光部により被測定光を遮光し、各測定条件において、前記回動部により、当該測定条件に含まれる測定対象波長に対応した位置まで前記回折格子を回動させたうえで、該測定条件に含まれる他のパラメーター値の下でのダーク測定を実行する制御部と、
を備える分光測定装置。 - 前記検出部は、波長分散方向に複数の受光素子が配置されたマルチチャンネル型の検出部であって、前記測定対象の波長に応じた波長幅の光強度分布を同時に取得可能である、請求項1に記載の分光測定装置。
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JP2000074742A (ja) * | 1998-08-31 | 2000-03-14 | Yokogawa Electric Corp | 分光器および光スペクトラムアナライザ |
JP2000298067A (ja) * | 1999-04-14 | 2000-10-24 | Yokogawa Electric Corp | 分光器およびそれを用いた光スペクトラムアナライザ |
JP2007205784A (ja) * | 2006-01-31 | 2007-08-16 | Yokogawa Electric Corp | 光スペクトラムアナライザ |
JP2008268019A (ja) * | 2007-04-20 | 2008-11-06 | Hitachi Ltd | 化学発光計測装置 |
JP2010117343A (ja) * | 2008-10-15 | 2010-05-27 | Otsuka Denshi Co Ltd | 光学特性測定装置および光学特性測定方法 |
JP2010151449A (ja) * | 2008-12-24 | 2010-07-08 | Yokogawa Electric Corp | 光スペクトラムアナライザ |
JP2014048232A (ja) * | 2012-09-03 | 2014-03-17 | Otsuka Denshi Co Ltd | 分光特性測定装置および分光特性測定方法 |
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JPWO2022185565A1 (ja) | 2022-09-09 |
CN116601468A (zh) | 2023-08-15 |
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