JPS5657925A - Multiwavelength spectrophotometer - Google Patents

Multiwavelength spectrophotometer

Info

Publication number
JPS5657925A
JPS5657925A JP13297379A JP13297379A JPS5657925A JP S5657925 A JPS5657925 A JP S5657925A JP 13297379 A JP13297379 A JP 13297379A JP 13297379 A JP13297379 A JP 13297379A JP S5657925 A JPS5657925 A JP S5657925A
Authority
JP
Japan
Prior art keywords
light
photodetected
photodiodes
sample
spectroscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13297379A
Other languages
Japanese (ja)
Inventor
Shigeru Sonobe
Iwao Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP13297379A priority Critical patent/JPS5657925A/en
Publication of JPS5657925A publication Critical patent/JPS5657925A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36—Investigating two or more bands of a spectrum by separate detectors

Abstract

PURPOSE:To realize a high-accuracy spectrophotometer using a number of photodiodes for the detectors, by providing the stray light detecting photodetectors outside the region of image formation in correspondence to each photodetector for the light to be measured and obtaining the difference of output between both the photodetectors. CONSTITUTION:The light of the light source 1 which emits the white light transmits the sample in the sample cell 3 and enters the spectroscope through the slit 4 to be dispersed by e.g. the concaved diffraction grid 5. The spectrum in a range of the measurement wavelengths lambdaa-lambdan where the images have formed, is photodetected by the photodiodes 7a-7n at the lower side of the semiconductor chips 6a- 6n. The stray light caused by the irregular reflection within the spectroscope is photodetected by the photodiodes 8a-8n at the upper side. Then the difference between the photodetected amounts Ia-In and Ioa-Ion is obtained through the differential amplifiers 9a-9n to be delivered to the terminals 10a-10n as the signals Elambdaa-Elambdan. These output signals receive a logarithm conversion to obtain the spectral absorption factor of the sample.
JP13297379A 1979-10-17 1979-10-17 Multiwavelength spectrophotometer Pending JPS5657925A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13297379A JPS5657925A (en) 1979-10-17 1979-10-17 Multiwavelength spectrophotometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13297379A JPS5657925A (en) 1979-10-17 1979-10-17 Multiwavelength spectrophotometer

Publications (1)

Publication Number Publication Date
JPS5657925A true JPS5657925A (en) 1981-05-20

Family

ID=15093812

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13297379A Pending JPS5657925A (en) 1979-10-17 1979-10-17 Multiwavelength spectrophotometer

Country Status (1)

Country Link
JP (1) JPS5657925A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58102114A (en) * 1981-12-14 1983-06-17 Union Giken:Kk Spectrophotometer device
EP0652423A1 (en) * 1993-11-04 1995-05-10 Matsushita Electric Industrial Co., Ltd. Spectroradiometer
WO2001098740A2 (en) * 2000-06-21 2001-12-27 Otsuka Electronics Co., Ltd. Spectrum measuring instrument
US6801309B1 (en) * 2001-10-16 2004-10-05 Therma-Wave, Inc. Detector array with scattered light correction
JP2009053060A (en) * 2007-08-27 2009-03-12 Konica Minolta Sensing Inc Polychromator and correction method for stray light
JP2010117343A (en) * 2008-10-15 2010-05-27 Otsuka Denshi Co Ltd Optical characteristic measurement device and optical characteristic measurement method
JP2013024600A (en) * 2011-07-15 2013-02-04 Canon Inc Spectral color sensor and image formation apparatus
JP2014048232A (en) * 2012-09-03 2014-03-17 Otsuka Denshi Co Ltd Spectroscopy characteristic measurement device and spectroscopy characteristic measurement method
WO2023228450A1 (en) * 2022-05-27 2023-11-30 浜松ホトニクス株式会社 Spectrometry device

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58102114A (en) * 1981-12-14 1983-06-17 Union Giken:Kk Spectrophotometer device
EP0652423A1 (en) * 1993-11-04 1995-05-10 Matsushita Electric Industrial Co., Ltd. Spectroradiometer
US5497230A (en) * 1993-11-04 1996-03-05 Matsushita Electric Industrial Co., Ltd. Spectroradiometer
WO2001098740A2 (en) * 2000-06-21 2001-12-27 Otsuka Electronics Co., Ltd. Spectrum measuring instrument
WO2001098740A3 (en) * 2000-06-21 2003-06-26 Otsuka Denshi Kk Spectrum measuring instrument
US6801309B1 (en) * 2001-10-16 2004-10-05 Therma-Wave, Inc. Detector array with scattered light correction
JP2009053060A (en) * 2007-08-27 2009-03-12 Konica Minolta Sensing Inc Polychromator and correction method for stray light
JP2010117343A (en) * 2008-10-15 2010-05-27 Otsuka Denshi Co Ltd Optical characteristic measurement device and optical characteristic measurement method
JP2013024600A (en) * 2011-07-15 2013-02-04 Canon Inc Spectral color sensor and image formation apparatus
JP2014048232A (en) * 2012-09-03 2014-03-17 Otsuka Denshi Co Ltd Spectroscopy characteristic measurement device and spectroscopy characteristic measurement method
US9163985B2 (en) 2012-09-03 2015-10-20 Otsuka Electronics Co., Ltd. Spectral characteristic measurement apparatus and spectral characteristic measurement method
WO2023228450A1 (en) * 2022-05-27 2023-11-30 浜松ホトニクス株式会社 Spectrometry device

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