JP2010115832A5 - - Google Patents
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- Publication number
- JP2010115832A5 JP2010115832A5 JP2008289806A JP2008289806A JP2010115832A5 JP 2010115832 A5 JP2010115832 A5 JP 2010115832A5 JP 2008289806 A JP2008289806 A JP 2008289806A JP 2008289806 A JP2008289806 A JP 2008289806A JP 2010115832 A5 JP2010115832 A5 JP 2010115832A5
- Authority
- JP
- Japan
- Prior art keywords
- self
- block copolymer
- forming
- pattern
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229920001400 block copolymer Polymers 0.000 claims 13
- 238000000034 method Methods 0.000 claims 9
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 claims 6
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 claims 6
- 230000002209 hydrophobic effect Effects 0.000 claims 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims 4
- KAKZBPTYRLMSJV-UHFFFAOYSA-N Butadiene Chemical compound C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 claims 4
- 239000011261 inert gas Substances 0.000 claims 4
- 238000001338 self-assembly Methods 0.000 claims 4
- 230000001737 promoting effect Effects 0.000 claims 3
- 239000000758 substrate Substances 0.000 claims 3
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 claims 2
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims 2
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 claims 2
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 claims 2
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 claims 2
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 claims 2
- IMROMDMJAWUWLK-UHFFFAOYSA-N Ethenol Chemical compound OC=C IMROMDMJAWUWLK-UHFFFAOYSA-N 0.000 claims 2
- 239000005977 Ethylene Substances 0.000 claims 2
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 claims 2
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Natural products C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 claims 2
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 claims 2
- 238000000137 annealing Methods 0.000 claims 2
- 229910052786 argon Inorganic materials 0.000 claims 2
- 229910052734 helium Inorganic materials 0.000 claims 2
- 239000001307 helium Substances 0.000 claims 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims 2
- 229910052743 krypton Inorganic materials 0.000 claims 2
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 claims 2
- CERQOIWHTDAKMF-UHFFFAOYSA-M methacrylate group Chemical group C(C(=C)C)(=O)[O-] CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 claims 2
- 229910052754 neon Inorganic materials 0.000 claims 2
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 claims 2
- 125000003011 styrenyl group Chemical group [H]\C(*)=C(/[H])C1=C([H])C([H])=C([H])C([H])=C1[H] 0.000 claims 2
- 229910052724 xenon Inorganic materials 0.000 claims 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 claims 2
- 239000008096 xylene Substances 0.000 claims 2
- 238000005530 etching Methods 0.000 claims 1
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008289806A JP2010115832A (ja) | 2008-11-12 | 2008-11-12 | ブロックコポリマーの自己組織化促進方法及びそれを用いたブロックコポリマーの自己組織化パターン形成方法 |
| PCT/JP2009/004217 WO2010055601A1 (ja) | 2008-11-12 | 2009-08-28 | ブロックコポリマーの自己組織化促進方法及びそれを用いたブロックコポリマーの自己組織化パターン形成方法 |
| US13/085,954 US20110186544A1 (en) | 2008-11-12 | 2011-04-13 | Method of accelerating self-assembly of block copolymer and method of forming self-assembled pattern of block copolymer using the accelerating method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008289806A JP2010115832A (ja) | 2008-11-12 | 2008-11-12 | ブロックコポリマーの自己組織化促進方法及びそれを用いたブロックコポリマーの自己組織化パターン形成方法 |
Related Child Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010289550A Division JP4815011B2 (ja) | 2010-12-27 | 2010-12-27 | ブロックコポリマーの自己組織化促進方法及びそれを用いたブロックコポリマーの自己組織化パターン形成方法 |
| JP2010289544A Division JP4815010B2 (ja) | 2010-12-27 | 2010-12-27 | ブロックコポリマーの自己組織化促進方法及びそれを用いたブロックコポリマーの自己組織化パターン形成方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2010115832A JP2010115832A (ja) | 2010-05-27 |
| JP2010115832A5 true JP2010115832A5 (https=) | 2011-02-17 |
Family
ID=42169748
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008289806A Pending JP2010115832A (ja) | 2008-11-12 | 2008-11-12 | ブロックコポリマーの自己組織化促進方法及びそれを用いたブロックコポリマーの自己組織化パターン形成方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20110186544A1 (https=) |
| JP (1) | JP2010115832A (https=) |
| WO (1) | WO2010055601A1 (https=) |
Families Citing this family (54)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009079241A2 (en) | 2007-12-07 | 2009-06-25 | Wisconsin Alumni Research Foundation | Density multiplication and improved lithography by directed block copolymer assembly |
| JP5300799B2 (ja) * | 2010-07-28 | 2013-09-25 | 株式会社東芝 | パターン形成方法及びポリマーアロイ下地材料 |
| JP5259661B2 (ja) * | 2010-09-07 | 2013-08-07 | 株式会社東芝 | パターン形成方法 |
| JP5112500B2 (ja) * | 2010-11-18 | 2013-01-09 | 株式会社東芝 | パターン形成方法 |
| KR20120126725A (ko) | 2011-05-12 | 2012-11-21 | 에스케이하이닉스 주식회사 | 반도체 소자의 형성 방법 |
| WO2013040483A1 (en) | 2011-09-15 | 2013-03-21 | Wisconsin Alumni Research Foundation | Directed assembly of block copolymer films between a chemically patterned surface and a second surface |
| JP5694109B2 (ja) * | 2011-09-26 | 2015-04-01 | 株式会社東芝 | パターン形成方法 |
| JP2013075984A (ja) | 2011-09-30 | 2013-04-25 | Toshiba Corp | 微細構造体の製造方法 |
| KR20140136933A (ko) | 2012-02-10 | 2014-12-01 | 보드 오브 리전츠, 더 유니버시티 오브 텍사스 시스템 | 블록 공중합체 박막에서 도메인 배향을 조절하기 위해 화학 증착된 필름의 사용 |
| SG11201404414SA (en) | 2012-02-10 | 2014-08-28 | Univ Texas | Anhydride copolymer top coats for orientation control of thin film block copolymers |
| US9314819B2 (en) | 2012-02-10 | 2016-04-19 | Board Of Regents, The University Of Texas System | Anhydride copolymer top coats for orientation control of thin film block copolymers |
| JP6089298B2 (ja) * | 2012-04-10 | 2017-03-08 | 裕司 清野 | パターン形成方法、スチレン系ポリマー薄膜付き基材、表面撥水性材料、パスワード生成装置、培養器、パターン形成剤、及び反転パターン形成方法。 |
| KR101529646B1 (ko) * | 2012-09-10 | 2015-06-17 | 주식회사 엘지화학 | 실리콘 옥사이드의 나노 패턴 형성 방법, 금속 나노 패턴의 형성 방법 및 이를 이용한 정보저장용 자기 기록 매체 |
| JP5752655B2 (ja) * | 2012-09-10 | 2015-07-22 | 株式会社東芝 | パターン形成方法 |
| JP5537628B2 (ja) * | 2012-10-09 | 2014-07-02 | 株式会社東芝 | 自己組織化パターンの形成方法 |
| JP6027912B2 (ja) * | 2013-02-22 | 2016-11-16 | 東京応化工業株式会社 | 相分離構造を含む構造体の製造方法、及びパターン形成方法、並びにトップコート材料 |
| US9666443B2 (en) | 2013-03-15 | 2017-05-30 | Asml Netherlands B.V. | Methods for providing lithography features on a substrate by self-assembly of block copolymers |
| TWI658055B (zh) * | 2013-06-19 | 2019-05-01 | 德州大學董事會 | 用於薄膜嵌段共聚物之定向控制之酸酐共聚物面塗層 |
| JP5981392B2 (ja) | 2013-06-19 | 2016-08-31 | 株式会社東芝 | パターン形成方法 |
| US10490402B2 (en) | 2013-09-04 | 2019-11-26 | Tokyo Electron Limited | UV-assisted stripping of hardened photoresist to create chemical templates for directed self-assembly |
| US9349604B2 (en) | 2013-10-20 | 2016-05-24 | Tokyo Electron Limited | Use of topography to direct assembly of block copolymers in grapho-epitaxial applications |
| US9793137B2 (en) | 2013-10-20 | 2017-10-17 | Tokyo Electron Limited | Use of grapho-epitaxial directed self-assembly applications to precisely cut logic lines |
| EP3101043B1 (en) | 2013-12-06 | 2021-01-27 | LG Chem, Ltd. | Block copolymer |
| WO2015084133A1 (ko) * | 2013-12-06 | 2015-06-11 | 주식회사 엘지화학 | 블록 공중합체 |
| CN105934455B (zh) | 2013-12-06 | 2019-01-18 | 株式会社Lg化学 | 嵌段共聚物 |
| CN105916904B (zh) | 2013-12-06 | 2018-11-09 | 株式会社Lg化学 | 嵌段共聚物 |
| US10239980B2 (en) | 2013-12-06 | 2019-03-26 | Lg Chem, Ltd. | Block copolymer |
| JP6483693B2 (ja) | 2013-12-06 | 2019-03-13 | エルジー・ケム・リミテッド | ブロック共重合体 |
| CN105934454B (zh) | 2013-12-06 | 2019-01-18 | 株式会社Lg化学 | 嵌段共聚物 |
| CN105980342B (zh) | 2013-12-06 | 2019-02-15 | 株式会社Lg化学 | 单体和嵌段共聚物 |
| CN105899557B (zh) | 2013-12-06 | 2018-10-26 | 株式会社Lg化学 | 嵌段共聚物 |
| CN105873969B (zh) | 2013-12-06 | 2018-09-04 | 株式会社Lg化学 | 嵌段共聚物 |
| US10227436B2 (en) | 2013-12-06 | 2019-03-12 | Lg Chem, Ltd. | Block copolymer |
| US10202480B2 (en) | 2013-12-06 | 2019-02-12 | Lg Chem, Ltd. | Block copolymer |
| US10087276B2 (en) | 2013-12-06 | 2018-10-02 | Lg Chem, Ltd. | Block copolymer |
| JP6496318B2 (ja) | 2013-12-06 | 2019-04-03 | エルジー・ケム・リミテッド | ブロック共重合体 |
| KR101768291B1 (ko) | 2013-12-06 | 2017-08-17 | 주식회사 엘지화학 | 블록 공중합체 |
| JP6524220B2 (ja) | 2014-09-30 | 2019-06-05 | エルジー・ケム・リミテッド | ブロック共重合体 |
| WO2016053000A1 (ko) | 2014-09-30 | 2016-04-07 | 주식회사 엘지화학 | 블록 공중합체 |
| CN107075054B (zh) | 2014-09-30 | 2020-05-05 | 株式会社Lg化学 | 嵌段共聚物 |
| EP3202802B1 (en) | 2014-09-30 | 2022-11-23 | LG Chem, Ltd. | Block copolymer |
| WO2016052994A1 (ko) | 2014-09-30 | 2016-04-07 | 주식회사 엘지화학 | 블록 공중합체 |
| JP6538159B2 (ja) * | 2014-09-30 | 2019-07-03 | エルジー・ケム・リミテッド | ブロック共重合体 |
| WO2016053007A1 (ko) | 2014-09-30 | 2016-04-07 | 주식회사 엘지화학 | 패턴화 기판의 제조 방법 |
| CN107075055B (zh) * | 2014-09-30 | 2019-08-27 | 株式会社Lg化学 | 嵌段共聚物 |
| EP3202798B1 (en) | 2014-09-30 | 2022-01-12 | LG Chem, Ltd. | Block copolymer |
| WO2016053011A1 (ko) * | 2014-09-30 | 2016-04-07 | 주식회사 엘지화학 | 블록 공중합체 |
| KR20160038701A (ko) * | 2014-09-30 | 2016-04-07 | 주식회사 엘지화학 | 패턴화 기판의 제조 방법 |
| EP3203496B1 (en) | 2014-09-30 | 2021-12-29 | LG Chem, Ltd. | Method for producing patterned substrate |
| US9947597B2 (en) | 2016-03-31 | 2018-04-17 | Tokyo Electron Limited | Defectivity metrology during DSA patterning |
| US10303049B2 (en) * | 2017-03-22 | 2019-05-28 | Canon Kabushiki Kaisha | Reducing electric charge in imprint lithography |
| TWI805617B (zh) | 2017-09-15 | 2023-06-21 | 南韓商Lg化學股份有限公司 | 層壓板 |
| JP7528580B2 (ja) * | 2020-07-10 | 2024-08-06 | Toppanホールディングス株式会社 | パターン膜及びその形成方法 |
| JP7552110B2 (ja) * | 2020-07-10 | 2024-09-18 | Toppanホールディングス株式会社 | パターン膜の形成方法及びパターン膜 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4455645B2 (ja) * | 2001-12-28 | 2010-04-21 | 株式会社東芝 | 発光素子 |
| TW576864B (en) * | 2001-12-28 | 2004-02-21 | Toshiba Corp | Method for manufacturing a light-emitting device |
| EP1866064A4 (en) * | 2005-03-09 | 2009-08-19 | Univ California | NANOCOMPOSITE MEMBRANES AND METHOD FOR THE PRODUCTION AND USE THEREOF |
| US20070093587A1 (en) * | 2005-10-25 | 2007-04-26 | Starfire Systems | Silicon carbide precursors and uses thereof |
| JP4673266B2 (ja) * | 2006-08-03 | 2011-04-20 | 日本電信電話株式会社 | パターン形成方法及びモールド |
| US20080038467A1 (en) * | 2006-08-11 | 2008-02-14 | Eastman Kodak Company | Nanostructured pattern method of manufacture |
| US8097175B2 (en) * | 2008-10-28 | 2012-01-17 | Micron Technology, Inc. | Method for selectively permeating a self-assembled block copolymer, method for forming metal oxide structures, method for forming a metal oxide pattern, and method for patterning a semiconductor structure |
| US8101261B2 (en) * | 2008-02-13 | 2012-01-24 | Micron Technology, Inc. | One-dimensional arrays of block copolymer cylinders and applications thereof |
| JP4654279B2 (ja) * | 2008-08-28 | 2011-03-16 | 株式会社日立製作所 | 微細構造を有する高分子薄膜およびパターン基板の製造方法 |
-
2008
- 2008-11-12 JP JP2008289806A patent/JP2010115832A/ja active Pending
-
2009
- 2009-08-28 WO PCT/JP2009/004217 patent/WO2010055601A1/ja not_active Ceased
-
2011
- 2011-04-13 US US13/085,954 patent/US20110186544A1/en not_active Abandoned
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