JP2009524237A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2009524237A5 JP2009524237A5 JP2008551251A JP2008551251A JP2009524237A5 JP 2009524237 A5 JP2009524237 A5 JP 2009524237A5 JP 2008551251 A JP2008551251 A JP 2008551251A JP 2008551251 A JP2008551251 A JP 2008551251A JP 2009524237 A5 JP2009524237 A5 JP 2009524237A5
- Authority
- JP
- Japan
- Prior art keywords
- component
- actuation force
- coupled
- control system
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 claims 8
- 230000001133 acceleration Effects 0.000 claims 5
- 230000000694 effects Effects 0.000 claims 3
- 238000004590 computer program Methods 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/335,081 US7352198B2 (en) | 2006-01-18 | 2006-01-18 | Methods and apparatuses for improved stabilization in a probing system |
| PCT/US2006/042343 WO2007084205A1 (en) | 2006-01-18 | 2006-10-30 | Methods and apparatuses for improved stabilization in a probing system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2009524237A JP2009524237A (ja) | 2009-06-25 |
| JP2009524237A5 true JP2009524237A5 (enExample) | 2010-01-14 |
Family
ID=37875700
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008551251A Pending JP2009524237A (ja) | 2006-01-18 | 2006-10-30 | プロービング・システムにおける改良した安定のための方法及び装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (3) | US7352198B2 (enExample) |
| JP (1) | JP2009524237A (enExample) |
| KR (1) | KR101297262B1 (enExample) |
| CN (1) | CN101297205A (enExample) |
| TW (1) | TWI442067B (enExample) |
| WO (1) | WO2007084205A1 (enExample) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100746364B1 (ko) * | 2006-07-28 | 2007-08-06 | 엠텍비젼 주식회사 | 메모리 공유 방법 및 장치 |
| JP2008219174A (ja) * | 2007-02-28 | 2008-09-18 | Matsushita Electric Ind Co Ltd | 携帯端末装置 |
| US20090206229A1 (en) * | 2008-02-15 | 2009-08-20 | Ivan Nesch | Dual vibration isolation apparatus |
| JP5222038B2 (ja) * | 2008-06-20 | 2013-06-26 | 東京エレクトロン株式会社 | プローブ装置 |
| DE102008038184A1 (de) * | 2008-08-19 | 2010-02-25 | Suss Microtec Test Systems Gmbh | Verfahren und Vorrichtung zur temporären elektrischen Kontaktierung einer Solarzelle |
| DE102008038186A1 (de) * | 2008-08-19 | 2010-02-25 | Suss Microtec Test Systems Gmbh | Sonde zur temporären elektrischen Kontaktierung einer Solarzelle |
| US8120304B2 (en) | 2008-12-12 | 2012-02-21 | Formfactor, Inc. | Method for improving motion times of a stage |
| US8519728B2 (en) * | 2008-12-12 | 2013-08-27 | Formfactor, Inc. | Compliance control methods and apparatuses |
| US8902062B2 (en) * | 2011-01-27 | 2014-12-02 | Honeywell International Inc. | Systems and methods for detection of device displacement and tampering |
| CN102495344B (zh) * | 2011-11-11 | 2014-12-17 | 深圳市矽电半导体设备有限公司 | 一种晶粒探测方法和系统 |
| US9395404B2 (en) * | 2012-12-14 | 2016-07-19 | Infineon Technologies Ag | Method for testing semiconductor chips or semiconductor chip modules |
| US9478237B2 (en) | 2013-09-18 | 2016-10-25 | Seagate Technology Llc | Work piece contact pad with centering feature |
| TWI515442B (zh) * | 2013-12-13 | 2016-01-01 | Mpi Corp | Electrical testing machine |
| US9459886B2 (en) * | 2014-08-06 | 2016-10-04 | Texas Instruments Incorporated | Autonomous sleep mode |
| US10060475B2 (en) * | 2014-12-24 | 2018-08-28 | Teradyne, Inc. | Braking system |
| KR102544684B1 (ko) * | 2016-01-30 | 2023-06-19 | 일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드 | 시스템 아이솔레이션 및 광학계 베이 실링 |
| US11125814B2 (en) * | 2017-02-22 | 2021-09-21 | Sintokogio, Ltd. | Test system |
| CN109451763B (zh) | 2018-05-16 | 2019-11-08 | 长江存储科技有限责任公司 | 用于晶圆键合对准补偿的方法和系统 |
| US20240094261A1 (en) * | 2020-08-12 | 2024-03-21 | Microfabrica Inc. | Probe Arrays and Improved Methods for Making and Using Longitudinal Deformation of Probe Preforms |
| KR102819345B1 (ko) | 2020-11-17 | 2025-06-11 | 세메스 주식회사 | 주행 장치 및 이를 이용한 약액 토출 장치 |
| EP4027150A1 (en) * | 2021-01-07 | 2022-07-13 | Afore Oy | Testing device and method for reducing vibration in a testing device |
| CN114000192B (zh) * | 2021-10-29 | 2023-10-13 | 北京北方华创微电子装备有限公司 | 半导体工艺设备以及晶圆位置状态的监测方法 |
| TWI794002B (zh) * | 2022-01-28 | 2023-02-21 | 緯創資通股份有限公司 | 多媒體系統以及多媒體操作方法 |
| KR102766445B1 (ko) * | 2022-05-19 | 2025-02-12 | 주식회사 쎄믹스 | 프로버 진단 시스템 |
| KR102725022B1 (ko) * | 2024-01-23 | 2024-11-01 | 주식회사 프로이천 | 3축방향 회전의 구속에 의해 프로브블록의 흔들림이 방지된 프로브 검사장치 |
Family Cites Families (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01284793A (ja) * | 1988-05-11 | 1989-11-16 | Canon Inc | 基板支持装置 |
| JP3219844B2 (ja) * | 1992-06-01 | 2001-10-15 | 東京エレクトロン株式会社 | プローブ装置 |
| JPH07111215B2 (ja) * | 1992-08-26 | 1995-11-29 | 鹿島建設株式会社 | 除振装置 |
| JP2963603B2 (ja) | 1993-05-31 | 1999-10-18 | 東京エレクトロン株式会社 | プローブ装置のアライメント方法 |
| US5473698A (en) * | 1993-11-23 | 1995-12-05 | Garnjost; Kenneth D. | Method of controlling the application of counter-vibration to a structure |
| US5644245A (en) | 1993-11-24 | 1997-07-01 | Tokyo Electron Limited | Probe apparatus for inspecting electrical characteristics of a microelectronic element |
| US5550483A (en) * | 1994-11-18 | 1996-08-27 | International Business Machines | High speed test probe positioning system |
| EP0789160B1 (en) * | 1995-08-11 | 2003-10-29 | Ebara Corporation | Magnetically levitated vibration damping apparatus |
| US5814733A (en) * | 1996-09-12 | 1998-09-29 | Motorola, Inc. | Method of characterizing dynamics of a workpiece handling system |
| US6040700A (en) | 1997-09-15 | 2000-03-21 | Credence Systems Corporation | Semiconductor tester system including test head supported by wafer prober frame |
| US6111421A (en) * | 1997-10-20 | 2000-08-29 | Tokyo Electron Limited | Probe method and apparatus for inspecting an object |
| JPH11162828A (ja) * | 1997-11-21 | 1999-06-18 | Nikon Corp | 投影露光装置及び投影露光方法 |
| US6096567A (en) * | 1997-12-01 | 2000-08-01 | Electroglas, Inc. | Method and apparatus for direct probe sensing |
| JP3781541B2 (ja) * | 1997-12-26 | 2006-05-31 | 株式会社日本マイクロニクス | マニュアルプローバ |
| JP3808618B2 (ja) * | 1998-03-02 | 2006-08-16 | 株式会社日本マイクロニクス | マニュアルプローバの位置合わせ方法 |
| AT408787B (de) * | 1998-05-29 | 2002-03-25 | Linzer Elek Zitaets Fernwaerme | Ölversorgungssystem für eine gasturbine |
| US6213442B1 (en) * | 1998-10-08 | 2001-04-10 | Lord Corporation | Isolation system for isolation tables and the like |
| JP2000216084A (ja) * | 1998-11-19 | 2000-08-04 | Nikon Corp | 投影露光装置 |
| JP3407192B2 (ja) | 1998-12-31 | 2003-05-19 | 株式会社ダイトー | テストハンドの制御方法及び計測制御システム |
| US6690284B2 (en) | 1998-12-31 | 2004-02-10 | Daito Corporation | Method of controlling IC handler and control system using the same |
| JP2001102279A (ja) * | 1999-09-27 | 2001-04-13 | Nikon Corp | ステージ装置および露光装置 |
| JP2001110717A (ja) * | 1999-10-13 | 2001-04-20 | Nikon Corp | ステージ装置およびステージ制御方法並びに露光装置 |
| US6937144B2 (en) * | 2001-07-05 | 2005-08-30 | Drakes & Christ, Llc | Remote tire pressure monitoring system |
| US6832143B2 (en) * | 2001-07-30 | 2004-12-14 | Hadley Products | Drive train vibration control system |
| EP1376995A3 (en) * | 2002-06-21 | 2004-03-17 | Samsung Electronics Co., Ltd. | Device and method for displaying data in a mobile terminal equipped with a camera |
| JP2004152916A (ja) * | 2002-10-29 | 2004-05-27 | Nec Corp | 半導体デバイス検査装置及び検査方法 |
| US7245945B2 (en) * | 2002-11-05 | 2007-07-17 | Intel Corporation | Portable computing device adapted to update display information while in a low power mode |
| JP2004265895A (ja) | 2003-01-20 | 2004-09-24 | Tokyo Electron Ltd | 光学的測長器を備えたプローブ装置及びプローブ検査方法 |
| JP2005072143A (ja) | 2003-08-21 | 2005-03-17 | Tokyo Seimitsu Co Ltd | プローブ装置 |
| GB2406369B (en) * | 2003-09-24 | 2007-05-09 | Ultra Electronics Ltd | Active vibration absorber and method |
| US7446433B2 (en) * | 2004-01-23 | 2008-11-04 | American Power Conversion Corporation | Methods and apparatus for providing uninterruptible power |
| US7643731B2 (en) * | 2004-01-23 | 2010-01-05 | Osamu Kobayashi | Low power DVD playback in a portable computing system |
| JP2005300381A (ja) * | 2004-04-13 | 2005-10-27 | Seiko Epson Corp | プローブ検査装置及びプローブ検査装置本体 |
| KR100698140B1 (ko) * | 2004-10-05 | 2007-03-26 | 엘지전자 주식회사 | 방송 수신이 가능한 이동 단말기의 전원 패스 장치 |
| DE102004057776B4 (de) | 2004-11-30 | 2011-08-18 | Multitest elektronische Systeme GmbH, 83026 | Lagekorrektureinrichtung zur Korrektur der Position eines Bauelementehalters für elektronische Bauelemente |
-
2006
- 2006-01-18 US US11/335,081 patent/US7352198B2/en not_active Expired - Fee Related
- 2006-10-30 KR KR1020087015437A patent/KR101297262B1/ko not_active Expired - Fee Related
- 2006-10-30 JP JP2008551251A patent/JP2009524237A/ja active Pending
- 2006-10-30 CN CNA2006800395461A patent/CN101297205A/zh active Pending
- 2006-10-30 WO PCT/US2006/042343 patent/WO2007084205A1/en not_active Ceased
- 2006-11-13 TW TW095141940A patent/TWI442067B/zh not_active IP Right Cessation
-
2007
- 2007-10-18 US US11/874,837 patent/US7622939B2/en not_active Expired - Fee Related
-
2009
- 2009-12-01 US US12/628,864 patent/US7877528B2/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2009524237A5 (enExample) | ||
| JP5963883B2 (ja) | 試験装置 | |
| JP5639934B2 (ja) | 表面性状測定機 | |
| JP2006032788A5 (enExample) | ||
| US7614291B2 (en) | Test bed and method for aerodynamic measurements on an object | |
| JP2010537184A5 (enExample) | ||
| JP2011122898A5 (enExample) | ||
| JP2014056352A (ja) | 位置決め装置及び計測装置 | |
| JP2007315918A5 (enExample) | ||
| JP2014238376A (ja) | 測定装置 | |
| JP2009252809A (ja) | ステージ装置及びステージ装置におけるステージの位置決め制御方法 | |
| JP5265976B2 (ja) | 測定機 | |
| JP2016161526A (ja) | 接触型プローブ | |
| KR101409313B1 (ko) | 자동차 파워시트의 내구 및 성능 시험에 사용되는 6축 로봇을 이용한 자동차 파워시트의 스위치 구동장치 | |
| JP2009524238A5 (enExample) | ||
| JP2016017862A5 (enExample) | ||
| CN103134733B (zh) | 耐久试验装置 | |
| US8434214B2 (en) | Vehicle body assembly apparatus having triaxial position sensing | |
| JP2008078499A5 (enExample) | ||
| JP5353767B2 (ja) | 耐久試験装置 | |
| JP2013188859A (ja) | アクチュエータの制御装置 | |
| JP2009271783A (ja) | 精密位置決め装置 | |
| JP6681714B2 (ja) | 運転模擬試験装置 | |
| JP4056384B2 (ja) | アクティブダンパー制御装置、制振装置及びアクティブダンパー制御方法 | |
| JP2004251698A (ja) | 硬さ試験機 |