JP2009505386A5 - - Google Patents

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Publication number
JP2009505386A5
JP2009505386A5 JP2008525534A JP2008525534A JP2009505386A5 JP 2009505386 A5 JP2009505386 A5 JP 2009505386A5 JP 2008525534 A JP2008525534 A JP 2008525534A JP 2008525534 A JP2008525534 A JP 2008525534A JP 2009505386 A5 JP2009505386 A5 JP 2009505386A5
Authority
JP
Japan
Prior art keywords
layer
formation
partial
substrate
protective layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2008525534A
Other languages
English (en)
Japanese (ja)
Other versions
JP5174664B2 (ja
JP2009505386A (ja
Filing date
Publication date
Priority claimed from DE102005037869A external-priority patent/DE102005037869B4/de
Application filed filed Critical
Publication of JP2009505386A publication Critical patent/JP2009505386A/ja
Publication of JP2009505386A5 publication Critical patent/JP2009505386A5/ja
Application granted granted Critical
Publication of JP5174664B2 publication Critical patent/JP5174664B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2008525534A 2005-08-10 2006-07-28 密閉用のパッケージ及びパッケージの製造方法 Expired - Fee Related JP5174664B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102005037869.2 2005-08-10
DE102005037869A DE102005037869B4 (de) 2005-08-10 2005-08-10 Anordnung zur hermetischen Abdichtung von Bauelementen und Verfahren zu deren Herstellung
PCT/EP2006/064787 WO2007017404A2 (de) 2005-08-10 2006-07-28 Anordnung zur hermetischen abdichtung von bauelementen und verfahren zu deren herstellung

Publications (3)

Publication Number Publication Date
JP2009505386A JP2009505386A (ja) 2009-02-05
JP2009505386A5 true JP2009505386A5 (enExample) 2012-11-15
JP5174664B2 JP5174664B2 (ja) 2013-04-03

Family

ID=37681045

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008525534A Expired - Fee Related JP5174664B2 (ja) 2005-08-10 2006-07-28 密閉用のパッケージ及びパッケージの製造方法

Country Status (4)

Country Link
US (1) US7897881B2 (enExample)
JP (1) JP5174664B2 (enExample)
DE (1) DE102005037869B4 (enExample)
WO (1) WO2007017404A2 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007036045A1 (de) * 2007-08-01 2009-02-05 Siemens Ag Elektronischer Baustein mit zumindest einem Bauelement, insbesondere einem Halbleiterbauelement, und Verfahren zu dessen Herstellung
US20090091005A1 (en) * 2007-10-09 2009-04-09 Huang Chung-Er Shielding structure for semiconductors and manufacturing method therefor
DE102008031231B4 (de) * 2008-07-02 2012-12-27 Siemens Aktiengesellschaft Herstellungsverfahren für planare elektronsche Leistungselektronik-Module für Hochtemperatur-Anwendungen und entsprechendes Leistungselektronik-Modul
EP2161974A1 (de) * 2008-09-09 2010-03-10 Hegutechnik v. Gutwald KG Bifunktionale EMV Beschichtung
US20110270028A1 (en) * 2010-04-30 2011-11-03 Allergan, Inc. Biocompatible and biostable implantable medical device
US20120188727A1 (en) * 2011-01-24 2012-07-26 ADL Engineering Inc. EMI Shielding in a Package Module
US9064883B2 (en) * 2011-08-25 2015-06-23 Intel Mobile Communications GmbH Chip with encapsulated sides and exposed surface
DE102011112476A1 (de) * 2011-09-05 2013-03-07 Epcos Ag Bauelement und Verfahren zum Herstellen eines Bauelements
CN102548239A (zh) * 2012-01-09 2012-07-04 华为终端有限公司 一种电路板的制作方法、电路板和电子设备
US9146207B2 (en) 2012-01-10 2015-09-29 Hzo, Inc. Methods, apparatuses and systems for sensing exposure of electronic devices to moisture
US9071046B2 (en) 2012-01-10 2015-06-30 Hzo, Inc. Methods, apparatuses and systems for monitoring for exposure of electronic devices to moisture and reacting to exposure of electronic devices to moisture
US9894776B2 (en) 2013-01-08 2018-02-13 Hzo, Inc. System for refurbishing or remanufacturing an electronic device
CN104245157B (zh) 2013-01-08 2018-09-18 Hzo股份有限公司 从基底上除去保护性涂层的选定部分
US10449568B2 (en) 2013-01-08 2019-10-22 Hzo, Inc. Masking substrates for application of protective coatings
CN103594434B (zh) * 2013-10-23 2017-12-29 广东明路电力电子有限公司 带复合散热层的功率部件
EP3009774B1 (en) * 2014-10-14 2022-03-02 Carel Industries S.p.A. Control device for refrigeration and conditioning systems
DE102014115565B3 (de) * 2014-10-27 2015-10-22 Semikron Elektronik Gmbh & Co. Kg Verfahren zur Herstellung einer Schalteinrichtung mit einer feuchtigkeitsdichten und elektrisch isolierenden Abdeckung und zur Herstellung einer Anordnung hiermit
JP2019012722A (ja) * 2017-06-29 2019-01-24 株式会社ケーヒン 制御回路装置
US11034068B2 (en) * 2018-04-30 2021-06-15 Raytheon Company Encapsulating electronics in high-performance thermoplastics

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6218739A (ja) 1985-07-18 1987-01-27 Sumitomo Electric Ind Ltd 混成集積回路
US5051275A (en) * 1989-11-09 1991-09-24 At&T Bell Laboratories Silicone resin electronic device encapsulant
US5439849A (en) * 1994-02-02 1995-08-08 At&T Corp. Encapsulation techniques which include forming a thin glass layer onto a polymer layer
US5639989A (en) 1994-04-19 1997-06-17 Motorola Inc. Shielded electronic component assembly and method for making the same
US5811050A (en) * 1994-06-06 1998-09-22 Gabower; John F. Electromagnetic interference shield for electronic devices
JPH1050763A (ja) * 1996-07-30 1998-02-20 Matsushita Electric Ind Co Ltd 電子部品実装方法と電子部品実装基板
FR2799883B1 (fr) * 1999-10-15 2003-05-30 Thomson Csf Procede d'encapsulation de composants electroniques
TW517368B (en) * 2002-01-22 2003-01-11 Via Tech Inc Manufacturing method of the passivation metal on the surface of integrated circuit
JP2003243704A (ja) * 2002-02-07 2003-08-29 Lumileds Lighting Us Llc 発光半導体デバイス及び方法
US6781231B2 (en) * 2002-09-10 2004-08-24 Knowles Electronics Llc Microelectromechanical system package with environmental and interference shield
JP2004193517A (ja) * 2002-12-13 2004-07-08 Seiko Epson Corp 半導体チップ、半導体チップの製造方法、半導体実装基板、電子デバイスおよび電子機器
US7451539B2 (en) * 2005-08-08 2008-11-18 Rf Micro Devices, Inc. Method of making a conformal electromagnetic interference shield
US8004860B2 (en) * 2006-08-29 2011-08-23 Texas Instruments Incorporated Radiofrequency and electromagnetic interference shielding

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