JP2009504004A - デジタル放射線撮影での低雑音データ取り込み - Google Patents

デジタル放射線撮影での低雑音データ取り込み Download PDF

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JP2009504004A
JP2009504004A JP2008523927A JP2008523927A JP2009504004A JP 2009504004 A JP2009504004 A JP 2009504004A JP 2008523927 A JP2008523927 A JP 2008523927A JP 2008523927 A JP2008523927 A JP 2008523927A JP 2009504004 A JP2009504004 A JP 2009504004A
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JP2009504004A5 (enExample
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スリーラム デュアジャティ
ティモシー ジョン ウォジシック
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ケアストリーム ヘルス インク
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/30—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
JP2008523927A 2005-07-28 2006-07-14 デジタル放射線撮影での低雑音データ取り込み Pending JP2009504004A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/191,537 US7456409B2 (en) 2005-07-28 2005-07-28 Low noise image data capture for digital radiography
PCT/US2006/027377 WO2007015756A2 (en) 2005-07-28 2006-07-14 Low noise data capture for digital radiography

Publications (2)

Publication Number Publication Date
JP2009504004A true JP2009504004A (ja) 2009-01-29
JP2009504004A5 JP2009504004A5 (enExample) 2009-08-20

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JP2008523927A Pending JP2009504004A (ja) 2005-07-28 2006-07-14 デジタル放射線撮影での低雑音データ取り込み

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Country Link
US (1) US7456409B2 (enExample)
EP (1) EP1907883A2 (enExample)
JP (1) JP2009504004A (enExample)
KR (1) KR20080031907A (enExample)
CN (1) CN101389978A (enExample)
WO (1) WO2007015756A2 (enExample)

Cited By (2)

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JP2020516878A (ja) * 2017-04-06 2020-06-11 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． パルス整形器
JP2023534229A (ja) * 2019-07-23 2023-08-08 サイバー メディカル イメージング，インコーポレイテッド 単一ダイ直接捕捉歯科ｘ線撮像センサを製作するための表面パターニングの使用

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US7477727B1 (en) * 2006-01-26 2009-01-13 Karl Adolf Malashanko Digital X-ray image detector array
US8679293B2 (en) * 2007-05-04 2014-03-25 Centre De Recherche Industrielle Du Quebec System and method for optimizing lignocellulosic granular matter refining
US7639073B2 (en) * 2007-11-16 2009-12-29 Omnivision Technologies, Inc. Switched-capacitor amplifier with improved reset phase
KR101006916B1 (ko) * 2008-06-13 2011-01-10 한국 천문 연구원 시간-디지털 변환기에 적용되는 ｘ－선 영상검출기용시뮬레이터
KR100943237B1 (ko) * 2009-04-20 2010-02-18 실리콘 디스플레이 (주) 이미지 센서 및 그의 구동 방법
EP2651119B1 (en) * 2010-12-09 2017-02-22 Rigaku Corporation Radiation detector
IL212289A (en) * 2011-04-13 2016-08-31 Semi-Conductor Devices - An Elbit Systems - Rafael Partnership Detector pixel signal readout circuit and an imaging method thereof
DE102011080656B4 (de) * 2011-08-09 2013-11-14 Siemens Aktiengesellschaft Verfahren zur Homogenisierung der Schwellenwerte eines mehrkanaligen quantenzählenden Strahlungsdetektors
CN102495824B (zh) * 2011-11-15 2015-03-18 上海卫星工程研究所 在同一模拟输出卡上产生多路不同频率模拟信号的方法
US8643168B1 (en) * 2012-10-16 2014-02-04 Lattice Semiconductor Corporation Integrated circuit package with input capacitance compensation
KR20150053159A (ko) * 2013-11-07 2015-05-15 삼성전자주식회사 서로 다른 시점에 입력된 전하 패킷에 기초하여 전압을 획득하는 방법 및 장치
EP3059613A1 (en) * 2015-02-23 2016-08-24 Institut de Física d'Altes Energies Photon counting
US10007009B2 (en) 2015-04-07 2018-06-26 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor X-ray detector
EP3281039B1 (en) 2015-04-07 2020-03-11 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor x-ray detector
CN107533145B (zh) 2015-04-07 2019-03-19 深圳帧观德芯科技有限公司 制作半导体x射线检测器的方法
EP3320371B1 (en) 2015-06-10 2025-05-21 Shenzhen Xpectvision Technology Co., Ltd. A detector for x-ray fluorescence
WO2017004824A1 (en) 2015-07-09 2017-01-12 Shenzhen Xpectvision Technology Co., Ltd. Methods of making semiconductor x-ray detector
CN108449982B (zh) 2015-08-27 2020-12-15 深圳帧观德芯科技有限公司 利用能够分辨光子能量的检测器的x射线成像
US10007007B2 (en) 2015-09-08 2018-06-26 Shenzhen Xpectvision Technology Co., Ltd. Methods for making an X-ray detector
CN107224293B (zh) * 2016-03-25 2020-08-18 群创光电股份有限公司 X射线图像检测系统及其控制方法
JP2017223525A (ja) * 2016-06-15 2017-12-21 コニカミノルタ株式会社 放射線画像撮影装置
JP6987603B2 (ja) * 2017-10-26 2022-01-05 ブリルニクス シンガポール プライベート リミテッド 固体撮像装置、固体撮像装置の駆動方法、および電子機器
EP3704514A4 (en) * 2017-10-30 2021-04-21 Shenzhen Xpectvision Technology Co., Ltd. DARK NOISE COMPENSATION IN A RADIATION DETECTOR
WO2020010594A1 (en) * 2018-07-12 2020-01-16 Shenzhen Xpectvision Technology Co., Ltd. A lidar with high time resolution
CN110393549A (zh) * 2019-05-27 2019-11-01 聚融医疗科技(杭州)有限公司 一种自动调节超声图像增益的方法及装置
CN110531404B (zh) * 2019-06-03 2021-07-09 中国科学技术大学 核脉冲电荷时间转换方法与系统
US11064141B2 (en) * 2019-07-24 2021-07-13 Semiconductor Components Industries, Llc Imaging systems and methods for reducing dark signal non-uniformity across pixels
TWI750027B (zh) * 2020-02-06 2021-12-11 聯詠科技股份有限公司 讀出積體電路

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JPH02236485A (ja) * 1989-03-10 1990-09-19 Jeol Ltd 放射線検出器用波高検出回路
JPH0548460A (ja) * 1991-06-05 1993-02-26 Matsushita Electric Ind Co Ltd Ａ／ｄ変換器とこれを用いたセンサ及び３次元集積回路
JPH07221260A (ja) * 1994-02-02 1995-08-18 Fujitsu Ltd 集積回路装置とその製造方法
JPH09294229A (ja) * 1996-02-26 1997-11-11 Canon Inc 光電変換装置及び該装置の駆動方法
JPH1168033A (ja) * 1997-08-15 1999-03-09 Matsushita Electric Ind Co Ltd マルチチップモジュール
JP2002232785A (ja) * 2001-01-30 2002-08-16 Nippon Telegr & Teleph Corp <Ntt> データ変換・出力装置
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JPH02236485A (ja) * 1989-03-10 1990-09-19 Jeol Ltd 放射線検出器用波高検出回路
JPH0548460A (ja) * 1991-06-05 1993-02-26 Matsushita Electric Ind Co Ltd Ａ／ｄ変換器とこれを用いたセンサ及び３次元集積回路
JPH07221260A (ja) * 1994-02-02 1995-08-18 Fujitsu Ltd 集積回路装置とその製造方法
JPH09294229A (ja) * 1996-02-26 1997-11-11 Canon Inc 光電変換装置及び該装置の駆動方法
JPH1168033A (ja) * 1997-08-15 1999-03-09 Matsushita Electric Ind Co Ltd マルチチップモジュール
JP2002232785A (ja) * 2001-01-30 2002-08-16 Nippon Telegr & Teleph Corp <Ntt> データ変換・出力装置
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020516878A (ja) * 2017-04-06 2020-06-11 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． パルス整形器
JP2023534229A (ja) * 2019-07-23 2023-08-08 サイバー メディカル イメージング，インコーポレイテッド 単一ダイ直接捕捉歯科ｘ線撮像センサを製作するための表面パターニングの使用

Also Published As

Publication number Publication date
US20070023668A1 (en) 2007-02-01
WO2007015756A2 (en) 2007-02-08
EP1907883A2 (en) 2008-04-09
US7456409B2 (en) 2008-11-25
WO2007015756A3 (en) 2007-04-12
CN101389978A (zh) 2009-03-18
KR20080031907A (ko) 2008-04-11

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