KR20080031907A - 디지털 방사선용의 저 잡음 전자 데이터 캡쳐 및 리드아웃시스템과 이미징 패널 동작 방법 - Google Patents

디지털 방사선용의 저 잡음 전자 데이터 캡쳐 및 리드아웃시스템과 이미징 패널 동작 방법 Download PDF

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KR20080031907A
KR20080031907A KR1020087002078A KR20087002078A KR20080031907A KR 20080031907 A KR20080031907 A KR 20080031907A KR 1020087002078 A KR1020087002078 A KR 1020087002078A KR 20087002078 A KR20087002078 A KR 20087002078A KR 20080031907 A KR20080031907 A KR 20080031907A
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스리람 드허제티
티모씨 존 워직
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케어스트림 헬스 인코포레이티드
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/30—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measurement Of Radiation (AREA)
KR1020087002078A 2005-07-28 2006-07-14 디지털 방사선용의 저 잡음 전자 데이터 캡쳐 및 리드아웃시스템과 이미징 패널 동작 방법 Ceased KR20080031907A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/191,537 2005-07-28
US11/191,537 US7456409B2 (en) 2005-07-28 2005-07-28 Low noise image data capture for digital radiography

Publications (1)

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KR20080031907A true KR20080031907A (ko) 2008-04-11

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Country Link
US (1) US7456409B2 (enExample)
EP (1) EP1907883A2 (enExample)
JP (1) JP2009504004A (enExample)
KR (1) KR20080031907A (enExample)
CN (1) CN101389978A (enExample)
WO (1) WO2007015756A2 (enExample)

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KR100943237B1 (ko) * 2009-04-20 2010-02-18 실리콘 디스플레이 (주) 이미지 센서 및 그의 구동 방법
KR101006916B1 (ko) * 2008-06-13 2011-01-10 한국 천문 연구원 시간-디지털 변환기에 적용되는 ｘ－선 영상검출기용시뮬레이터
KR20120116873A (ko) * 2011-04-13 2012-10-23 세미-컨덕터 디바이스-언 엘벗 시스템즈-라파엘 파트너쉽 검출기 픽셀 신호 리드아웃 회로 및 상기 회로의 이미징 방법

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JP4041040B2 (ja) * 2003-09-08 2008-01-30 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線断層撮影装置
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PT103370B (pt) * 2005-10-20 2009-01-19 Univ Do Minho Matriz de imagem de raios-x com guias de luz e sensores de pixel inteligentes, dispositivos detectores de radiação ou de partículas de alta energia que a contém, seu processo de fabrico e sua utilização
US7477727B1 (en) * 2006-01-26 2009-01-13 Karl Adolf Malashanko Digital X-ray image detector array
WO2008134885A1 (en) * 2007-05-04 2008-11-13 Centre De Recherche Industrielle Du Quebec System and method for optimizing lignocellulosic granular matter refining
US7639073B2 (en) * 2007-11-16 2009-12-29 Omnivision Technologies, Inc. Switched-capacitor amplifier with improved reset phase
WO2012077217A1 (ja) * 2010-12-09 2012-06-14 株式会社リガク 放射線検出器
DE102011080656B4 (de) * 2011-08-09 2013-11-14 Siemens Aktiengesellschaft Verfahren zur Homogenisierung der Schwellenwerte eines mehrkanaligen quantenzählenden Strahlungsdetektors
CN102495824B (zh) * 2011-11-15 2015-03-18 上海卫星工程研究所 在同一模拟输出卡上产生多路不同频率模拟信号的方法
US8643168B1 (en) * 2012-10-16 2014-02-04 Lattice Semiconductor Corporation Integrated circuit package with input capacitance compensation
KR20150053159A (ko) * 2013-11-07 2015-05-15 삼성전자주식회사 서로 다른 시점에 입력된 전하 패킷에 기초하여 전압을 획득하는 방법 및 장치
EP3059613A1 (en) * 2015-02-23 2016-08-24 Institut de Física d'Altes Energies Photon counting
CN107533145B (zh) 2015-04-07 2019-03-19 深圳帧观德芯科技有限公司 制作半导体x射线检测器的方法
CN108271415B (zh) 2015-04-07 2019-03-05 深圳帧观德芯科技有限公司 半导体x射线检测器
US10007009B2 (en) 2015-04-07 2018-06-26 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor X-ray detector
EP3320371B1 (en) 2015-06-10 2025-05-21 Shenzhen Xpectvision Technology Co., Ltd. A detector for x-ray fluorescence
EP3320374B1 (en) 2015-07-09 2020-05-20 Shenzhen Xpectvision Technology Co., Ltd. Methods of making semiconductor x-ray detector
WO2017031740A1 (en) 2015-08-27 2017-03-02 Shenzhen Xpectvision Technology Co., Ltd. X-ray imaging with a detector capable of resolving photon energy
EP3347741B1 (en) 2015-09-08 2020-05-20 Shenzhen Xpectvision Technology Co., Ltd. Methods for making an x-ray detector
CN107224293B (zh) * 2016-03-25 2020-08-18 群创光电股份有限公司 X射线图像检测系统及其控制方法
JP2017223525A (ja) * 2016-06-15 2017-12-21 コニカミノルタ株式会社 放射線画像撮影装置
EP3385756A1 (en) * 2017-04-06 2018-10-10 Koninklijke Philips N.V. Pulse shaper
JP6987603B2 (ja) * 2017-10-26 2022-01-05 ブリルニクス シンガポール プライベート リミテッド 固体撮像装置、固体撮像装置の駆動方法、および電子機器
EP3704514A4 (en) * 2017-10-30 2021-04-21 Shenzhen Xpectvision Technology Co., Ltd. DARK NOISE COMPENSATION IN A RADIATION DETECTOR
CN112368602B (zh) 2018-07-12 2023-03-14 深圳帧观德芯科技有限公司 具有高时间分辨率的光学雷达
CN110393549A (zh) * 2019-05-27 2019-11-01 聚融医疗科技(杭州)有限公司 一种自动调节超声图像增益的方法及装置
CN110531404B (zh) * 2019-06-03 2021-07-09 中国科学技术大学 核脉冲电荷时间转换方法与系统
US10910432B1 (en) * 2019-07-23 2021-02-02 Cyber Medical Imaging, Inc. Use of surface patterning for fabricating a single die direct capture dental X-ray imaging sensor
US11064141B2 (en) * 2019-07-24 2021-07-13 Semiconductor Components Industries, Llc Imaging systems and methods for reducing dark signal non-uniformity across pixels
CN113221622B (zh) * 2020-02-06 2025-07-25 联咏科技股份有限公司 读出集成电路

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101006916B1 (ko) * 2008-06-13 2011-01-10 한국 천문 연구원 시간-디지털 변환기에 적용되는 ｘ－선 영상검출기용시뮬레이터
KR100943237B1 (ko) * 2009-04-20 2010-02-18 실리콘 디스플레이 (주) 이미지 센서 및 그의 구동 방법
KR20120116873A (ko) * 2011-04-13 2012-10-23 세미-컨덕터 디바이스-언 엘벗 시스템즈-라파엘 파트너쉽 검출기 픽셀 신호 리드아웃 회로 및 상기 회로의 이미징 방법

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Publication number Publication date
WO2007015756A2 (en) 2007-02-08
CN101389978A (zh) 2009-03-18
EP1907883A2 (en) 2008-04-09
US20070023668A1 (en) 2007-02-01
JP2009504004A (ja) 2009-01-29
WO2007015756A3 (en) 2007-04-12
US7456409B2 (en) 2008-11-25

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