CN101389978A - 用于数字式辐射成像技术的低噪声数据获取 - Google Patents
用于数字式辐射成像技术的低噪声数据获取 Download PDFInfo
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- CN101389978A CN101389978A CNA2006800266687A CN200680026668A CN101389978A CN 101389978 A CN101389978 A CN 101389978A CN A2006800266687 A CNA2006800266687 A CN A2006800266687A CN 200680026668 A CN200680026668 A CN 200680026668A CN 101389978 A CN101389978 A CN 101389978A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/30—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals
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- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Engineering & Computer Science (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/191,537 | 2005-07-28 | ||
| US11/191,537 US7456409B2 (en) | 2005-07-28 | 2005-07-28 | Low noise image data capture for digital radiography |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101389978A true CN101389978A (zh) | 2009-03-18 |
Family
ID=37440806
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA2006800266687A Pending CN101389978A (zh) | 2005-07-28 | 2006-07-14 | 用于数字式辐射成像技术的低噪声数据获取 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7456409B2 (enExample) |
| EP (1) | EP1907883A2 (enExample) |
| JP (1) | JP2009504004A (enExample) |
| KR (1) | KR20080031907A (enExample) |
| CN (1) | CN101389978A (enExample) |
| WO (1) | WO2007015756A2 (enExample) |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102495824A (zh) * | 2011-11-15 | 2012-06-13 | 上海卫星工程研究所 | 在同一模拟输出卡上产生多路不同频率模拟信号的方法 |
| WO2016161544A1 (en) * | 2015-04-07 | 2016-10-13 | Shenzhen Xpectvision Technology Co.,Ltd. | Semiconductor x-ray detector |
| US9915741B2 (en) | 2015-04-07 | 2018-03-13 | Shenzhen Xpectvision Technology Co., Ltd. | Method of making semiconductor X-ray detectors |
| US10007009B2 (en) | 2015-04-07 | 2018-06-26 | Shenzhen Xpectvision Technology Co., Ltd. | Semiconductor X-ray detector |
| US10007007B2 (en) | 2015-09-08 | 2018-06-26 | Shenzhen Xpectvision Technology Co., Ltd. | Methods for making an X-ray detector |
| US10056425B2 (en) | 2015-07-09 | 2018-08-21 | Shenzhen Xpectvision Technology Co., Ltd. | Methods of making semiconductor X-ray detector |
| CN109714551A (zh) * | 2017-10-26 | 2019-05-03 | 普里露尼库斯股份有限公司 | 固体摄像装置、固体摄像装置的驱动方法以及电子设备 |
| CN110393549A (zh) * | 2019-05-27 | 2019-11-01 | 聚融医疗科技(杭州)有限公司 | 一种自动调节超声图像增益的方法及装置 |
| CN110531404A (zh) * | 2019-06-03 | 2019-12-03 | 中国科学技术大学 | 核脉冲电荷时间转换方法与系统 |
| US10539691B2 (en) | 2015-06-10 | 2020-01-21 | Shenzhen Xpectvision Technology Co., Ltd. | Detector for X-ray fluorescence |
| US10705031B2 (en) | 2015-08-27 | 2020-07-07 | Shenzhen Xpectvision Technology Co., Ltd. | X-ray imaging with a detector capable of resolving photon energy |
| CN112291490A (zh) * | 2019-07-24 | 2021-01-29 | 半导体元件工业有限责任公司 | 成像系统及生成具有降低的暗电流噪声的图像信号的方法 |
| CN113221623A (zh) * | 2020-02-06 | 2021-08-06 | 联咏科技股份有限公司 | 读出集成电路 |
| CN111226136B (zh) * | 2017-10-30 | 2023-07-18 | 深圳帧观德芯科技有限公司 | 辐射检测器中的暗噪声补偿 |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4041040B2 (ja) * | 2003-09-08 | 2008-01-30 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | 放射線断層撮影装置 |
| US7825370B2 (en) * | 2005-06-23 | 2010-11-02 | General Electric Company | Method and system for calibrating a computed tomography system |
| PT103370B (pt) * | 2005-10-20 | 2009-01-19 | Univ Do Minho | Matriz de imagem de raios-x com guias de luz e sensores de pixel inteligentes, dispositivos detectores de radiação ou de partículas de alta energia que a contém, seu processo de fabrico e sua utilização |
| US7477727B1 (en) * | 2006-01-26 | 2009-01-13 | Karl Adolf Malashanko | Digital X-ray image detector array |
| WO2008134885A1 (en) * | 2007-05-04 | 2008-11-13 | Centre De Recherche Industrielle Du Quebec | System and method for optimizing lignocellulosic granular matter refining |
| US7639073B2 (en) * | 2007-11-16 | 2009-12-29 | Omnivision Technologies, Inc. | Switched-capacitor amplifier with improved reset phase |
| KR101006916B1 (ko) * | 2008-06-13 | 2011-01-10 | 한국 천문 연구원 | 시간-디지털 변환기에 적용되는 x-선 영상검출기용시뮬레이터 |
| KR100943237B1 (ko) * | 2009-04-20 | 2010-02-18 | 실리콘 디스플레이 (주) | 이미지 센서 및 그의 구동 방법 |
| WO2012077217A1 (ja) * | 2010-12-09 | 2012-06-14 | 株式会社リガク | 放射線検出器 |
| IL212289A (en) * | 2011-04-13 | 2016-08-31 | Semi-Conductor Devices - An Elbit Systems - Rafael Partnership | Detector pixel signal readout circuit and an imaging method thereof |
| DE102011080656B4 (de) * | 2011-08-09 | 2013-11-14 | Siemens Aktiengesellschaft | Verfahren zur Homogenisierung der Schwellenwerte eines mehrkanaligen quantenzählenden Strahlungsdetektors |
| US8643168B1 (en) * | 2012-10-16 | 2014-02-04 | Lattice Semiconductor Corporation | Integrated circuit package with input capacitance compensation |
| KR20150053159A (ko) * | 2013-11-07 | 2015-05-15 | 삼성전자주식회사 | 서로 다른 시점에 입력된 전하 패킷에 기초하여 전압을 획득하는 방법 및 장치 |
| EP3059613A1 (en) * | 2015-02-23 | 2016-08-24 | Institut de Física d'Altes Energies | Photon counting |
| CN107224293B (zh) * | 2016-03-25 | 2020-08-18 | 群创光电股份有限公司 | X射线图像检测系统及其控制方法 |
| JP2017223525A (ja) * | 2016-06-15 | 2017-12-21 | コニカミノルタ株式会社 | 放射線画像撮影装置 |
| EP3385756A1 (en) * | 2017-04-06 | 2018-10-10 | Koninklijke Philips N.V. | Pulse shaper |
| CN112368602B (zh) | 2018-07-12 | 2023-03-14 | 深圳帧观德芯科技有限公司 | 具有高时间分辨率的光学雷达 |
| US10910432B1 (en) * | 2019-07-23 | 2021-02-02 | Cyber Medical Imaging, Inc. | Use of surface patterning for fabricating a single die direct capture dental X-ray imaging sensor |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3679826A (en) * | 1970-07-06 | 1972-07-25 | Philips Corp | Solid state image sensing device |
| DE3635687A1 (de) * | 1986-10-21 | 1988-05-05 | Messerschmitt Boelkow Blohm | Bildaufnahmesensor |
| JPS63127622A (ja) * | 1986-11-18 | 1988-05-31 | Jeol Ltd | A/d変換器 |
| JP2566006B2 (ja) * | 1989-03-10 | 1996-12-25 | 日本電子株式会社 | 放射線検出器用波高検出回路 |
| US5084639A (en) * | 1990-09-17 | 1992-01-28 | General Electric Company | Low frequency noise canceling photodetector preamplifier useful for computerized tomography |
| JPH0548460A (ja) * | 1991-06-05 | 1993-02-26 | Matsushita Electric Ind Co Ltd | A/d変換器とこれを用いたセンサ及び3次元集積回路 |
| US5466892A (en) * | 1993-02-03 | 1995-11-14 | Zycon Corporation | Circuit boards including capacitive coupling for signal transmission and methods of use and manufacture |
| JPH07221260A (ja) * | 1994-02-02 | 1995-08-18 | Fujitsu Ltd | 集積回路装置とその製造方法 |
| US5461425A (en) * | 1994-02-15 | 1995-10-24 | Stanford University | CMOS image sensor with pixel level A/D conversion |
| US5962856A (en) * | 1995-04-28 | 1999-10-05 | Sunnybrook Hospital | Active matrix X-ray imaging array |
| JP3893181B2 (ja) * | 1996-02-26 | 2007-03-14 | キヤノン株式会社 | 放射線撮像装置及び該装置の駆動方法 |
| JPH1168033A (ja) * | 1997-08-15 | 1999-03-09 | Matsushita Electric Ind Co Ltd | マルチチップモジュール |
| EP0936660A1 (en) | 1998-02-10 | 1999-08-18 | Interuniversitair Microelektronica Centrum Vzw | An imager or particle or radiation detector and method of manufacturing the same |
| US6271785B1 (en) * | 1998-04-29 | 2001-08-07 | Texas Instruments Incorporated | CMOS imager with an A/D per pixel convertor |
| US6292529B1 (en) * | 1999-12-15 | 2001-09-18 | Analogic Corporation | Two-dimensional X-ray detector array for CT applications |
| FI111759B (fi) | 2000-03-14 | 2003-09-15 | Planmed Oy | Anturijärjestelmä ja menetelmä digitaalisessa röntgenkuvantamisessa |
| JP3549841B2 (ja) * | 2001-01-30 | 2004-08-04 | 日本電信電話株式会社 | データ変換・出力装置 |
| US6741198B2 (en) * | 2001-06-20 | 2004-05-25 | R3 Logic, Inc. | High resolution, low power, wide dynamic range imager with embedded pixel processor and DRAM storage |
| DE10140863A1 (de) | 2001-08-21 | 2003-03-13 | Siemens Ag | CT-Datenaufnehmer |
| JP2004239708A (ja) * | 2003-02-05 | 2004-08-26 | Mitsubishi Electric Corp | 赤外線検出装置およびその製造方法 |
| DE10307752B4 (de) | 2003-02-14 | 2007-10-11 | Siemens Ag | Röntgendetektor |
| US20060011853A1 (en) * | 2004-07-06 | 2006-01-19 | Konstantinos Spartiotis | High energy, real time capable, direct radiation conversion X-ray imaging system for Cd-Te and Cd-Zn-Te based cameras |
-
2005
- 2005-07-28 US US11/191,537 patent/US7456409B2/en not_active Expired - Fee Related
-
2006
- 2006-07-14 CN CNA2006800266687A patent/CN101389978A/zh active Pending
- 2006-07-14 WO PCT/US2006/027377 patent/WO2007015756A2/en not_active Ceased
- 2006-07-14 EP EP06787305A patent/EP1907883A2/en not_active Withdrawn
- 2006-07-14 KR KR1020087002078A patent/KR20080031907A/ko not_active Ceased
- 2006-07-14 JP JP2008523927A patent/JP2009504004A/ja active Pending
Cited By (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102495824B (zh) * | 2011-11-15 | 2015-03-18 | 上海卫星工程研究所 | 在同一模拟输出卡上产生多路不同频率模拟信号的方法 |
| CN102495824A (zh) * | 2011-11-15 | 2012-06-13 | 上海卫星工程研究所 | 在同一模拟输出卡上产生多路不同频率模拟信号的方法 |
| US10514472B2 (en) | 2015-04-07 | 2019-12-24 | Shenzhen Xpectvision Technology Co., Ltd. | Semiconductor X-ray detector |
| WO2016161544A1 (en) * | 2015-04-07 | 2016-10-13 | Shenzhen Xpectvision Technology Co.,Ltd. | Semiconductor x-ray detector |
| US9915741B2 (en) | 2015-04-07 | 2018-03-13 | Shenzhen Xpectvision Technology Co., Ltd. | Method of making semiconductor X-ray detectors |
| US10007009B2 (en) | 2015-04-07 | 2018-06-26 | Shenzhen Xpectvision Technology Co., Ltd. | Semiconductor X-ray detector |
| CN108271415A (zh) * | 2015-04-07 | 2018-07-10 | 深圳帧观德芯科技有限公司 | 半导体x射线检测器 |
| US10061038B2 (en) | 2015-04-07 | 2018-08-28 | Shenzhen Xpectvision Technology Co., Ltd. | Semiconductor X-ray detector |
| CN108271415B (zh) * | 2015-04-07 | 2019-03-05 | 深圳帧观德芯科技有限公司 | 半导体x射线检测器 |
| US10539691B2 (en) | 2015-06-10 | 2020-01-21 | Shenzhen Xpectvision Technology Co., Ltd. | Detector for X-ray fluorescence |
| US10056425B2 (en) | 2015-07-09 | 2018-08-21 | Shenzhen Xpectvision Technology Co., Ltd. | Methods of making semiconductor X-ray detector |
| US10705031B2 (en) | 2015-08-27 | 2020-07-07 | Shenzhen Xpectvision Technology Co., Ltd. | X-ray imaging with a detector capable of resolving photon energy |
| US10007007B2 (en) | 2015-09-08 | 2018-06-26 | Shenzhen Xpectvision Technology Co., Ltd. | Methods for making an X-ray detector |
| CN109714551A (zh) * | 2017-10-26 | 2019-05-03 | 普里露尼库斯股份有限公司 | 固体摄像装置、固体摄像装置的驱动方法以及电子设备 |
| CN109714551B (zh) * | 2017-10-26 | 2021-01-01 | 普里露尼库斯股份有限公司 | 固体摄像装置、固体摄像装置的驱动方法以及电子设备 |
| CN111226136B (zh) * | 2017-10-30 | 2023-07-18 | 深圳帧观德芯科技有限公司 | 辐射检测器中的暗噪声补偿 |
| CN110393549A (zh) * | 2019-05-27 | 2019-11-01 | 聚融医疗科技(杭州)有限公司 | 一种自动调节超声图像增益的方法及装置 |
| CN110531404A (zh) * | 2019-06-03 | 2019-12-03 | 中国科学技术大学 | 核脉冲电荷时间转换方法与系统 |
| CN112291490A (zh) * | 2019-07-24 | 2021-01-29 | 半导体元件工业有限责任公司 | 成像系统及生成具有降低的暗电流噪声的图像信号的方法 |
| CN112291490B (zh) * | 2019-07-24 | 2024-04-05 | 半导体元件工业有限责任公司 | 成像系统及使用图像像素生成具有降低的暗电流噪声的图像信号的方法 |
| CN113221623A (zh) * | 2020-02-06 | 2021-08-06 | 联咏科技股份有限公司 | 读出集成电路 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2007015756A2 (en) | 2007-02-08 |
| EP1907883A2 (en) | 2008-04-09 |
| US20070023668A1 (en) | 2007-02-01 |
| KR20080031907A (ko) | 2008-04-11 |
| JP2009504004A (ja) | 2009-01-29 |
| WO2007015756A3 (en) | 2007-04-12 |
| US7456409B2 (en) | 2008-11-25 |
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Application publication date: 20090318 |