JP2009016808A5 - - Google Patents
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- Publication number
- JP2009016808A5 JP2009016808A5 JP2008146459A JP2008146459A JP2009016808A5 JP 2009016808 A5 JP2009016808 A5 JP 2009016808A5 JP 2008146459 A JP2008146459 A JP 2008146459A JP 2008146459 A JP2008146459 A JP 2008146459A JP 2009016808 A5 JP2009016808 A5 JP 2009016808A5
- Authority
- JP
- Japan
- Prior art keywords
- fiber
- resin
- semiconductor device
- thru
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008146459A JP2009016808A (ja) | 2007-06-07 | 2008-06-04 | 半導体装置 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007151168 | 2007-06-07 | ||
| JP2008146459A JP2009016808A (ja) | 2007-06-07 | 2008-06-04 | 半導体装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012139924A Division JP2012212917A (ja) | 2007-06-07 | 2012-06-21 | 半導体装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2009016808A JP2009016808A (ja) | 2009-01-22 |
| JP2009016808A5 true JP2009016808A5 (enExample) | 2011-07-07 |
Family
ID=39766836
Family Applications (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008146459A Withdrawn JP2009016808A (ja) | 2007-06-07 | 2008-06-04 | 半導体装置 |
| JP2012139924A Withdrawn JP2012212917A (ja) | 2007-06-07 | 2012-06-21 | 半導体装置 |
| JP2014045961A Expired - Fee Related JP5770325B2 (ja) | 2007-06-07 | 2014-03-10 | 半導体装置 |
| JP2015126686A Withdrawn JP2015207785A (ja) | 2007-06-07 | 2015-06-24 | 半導体装置 |
Family Applications After (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012139924A Withdrawn JP2012212917A (ja) | 2007-06-07 | 2012-06-21 | 半導体装置 |
| JP2014045961A Expired - Fee Related JP5770325B2 (ja) | 2007-06-07 | 2014-03-10 | 半導体装置 |
| JP2015126686A Withdrawn JP2015207785A (ja) | 2007-06-07 | 2015-06-24 | 半導体装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7906847B2 (enExample) |
| EP (1) | EP2001047A1 (enExample) |
| JP (4) | JP2009016808A (enExample) |
| KR (1) | KR20080108047A (enExample) |
Families Citing this family (53)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101803008B (zh) | 2007-09-07 | 2012-11-28 | 株式会社半导体能源研究所 | 半导体装置及其制造方法 |
| JP5460108B2 (ja) * | 2008-04-18 | 2014-04-02 | 株式会社半導体エネルギー研究所 | 半導体装置及び半導体装置の作製方法 |
| WO2009131132A1 (en) * | 2008-04-25 | 2009-10-29 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| KR20090114171A (ko) * | 2008-04-29 | 2009-11-03 | 삼성전자주식회사 | 표시 장치 |
| WO2009139282A1 (en) * | 2008-05-12 | 2009-11-19 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
| WO2009142310A1 (en) * | 2008-05-23 | 2009-11-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| EP2297778A1 (en) * | 2008-05-23 | 2011-03-23 | Semiconductor Energy Laboratory Co, Ltd. | Semiconductor device |
| JP5248412B2 (ja) * | 2008-06-06 | 2013-07-31 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| US8053253B2 (en) * | 2008-06-06 | 2011-11-08 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
| CN102057488B (zh) * | 2008-06-06 | 2013-09-18 | 株式会社半导体能源研究所 | 半导体装置的制造方法 |
| JP5473413B2 (ja) * | 2008-06-20 | 2014-04-16 | 株式会社半導体エネルギー研究所 | 配線基板の作製方法、アンテナの作製方法及び半導体装置の作製方法 |
| WO2010005064A1 (en) * | 2008-07-10 | 2010-01-14 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and electronic device |
| JP2010041040A (ja) * | 2008-07-10 | 2010-02-18 | Semiconductor Energy Lab Co Ltd | 光電変換装置および光電変換装置の製造方法 |
| TWI475282B (zh) * | 2008-07-10 | 2015-03-01 | Semiconductor Energy Lab | 液晶顯示裝置和其製造方法 |
| JP5216716B2 (ja) | 2008-08-20 | 2013-06-19 | 株式会社半導体エネルギー研究所 | 発光装置及びその作製方法 |
| WO2010032602A1 (en) | 2008-09-18 | 2010-03-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| WO2010032611A1 (en) * | 2008-09-19 | 2010-03-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| WO2010035625A1 (en) * | 2008-09-25 | 2010-04-01 | Semiconductor Energy Laboratory Co., Ltd. | Semi conductor device |
| KR101611643B1 (ko) | 2008-10-01 | 2016-04-11 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| WO2010126876A1 (en) | 2009-04-27 | 2010-11-04 | Drexel University | Transparent conformal polymer antennas for rfid and other wireless communications applications |
| KR101677076B1 (ko) * | 2009-06-05 | 2016-11-17 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 광전 변환 디바이스 및 그 제조 방법 |
| WO2010140539A1 (en) * | 2009-06-05 | 2010-12-09 | Semiconductor Energy Laboratory Co., Ltd. | Photoelectric conversion device and method for manufacturing the same |
| WO2010140522A1 (en) * | 2009-06-05 | 2010-12-09 | Semiconductor Energy Laboratory Co., Ltd. | Photoelectric conversion device and manufacturing method thereof |
| TW201110802A (en) * | 2009-06-24 | 2011-03-16 | Seiko Epson Corp | Electro-optical device, electronic device, and illumination apparatus |
| US8766269B2 (en) | 2009-07-02 | 2014-07-01 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting device, lighting device, and electronic device |
| US8345435B2 (en) * | 2009-08-07 | 2013-01-01 | Semiconductor Energy Laboratory Co., Ltd. | Terminal structure and manufacturing method thereof, and electronic device and manufacturing method thereof |
| TWI517268B (zh) * | 2009-08-07 | 2016-01-11 | 半導體能源研究所股份有限公司 | 端子構造的製造方法和電子裝置的製造方法 |
| KR101801956B1 (ko) | 2009-09-16 | 2017-11-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 및 이의 제조 방법 |
| JP5719560B2 (ja) * | 2009-10-21 | 2015-05-20 | 株式会社半導体エネルギー研究所 | 端子構造の作製方法 |
| KR101617280B1 (ko) * | 2009-10-21 | 2016-05-03 | 엘지디스플레이 주식회사 | 플라스틱 기판을 이용한 표시장치 제조 방법 |
| KR101094292B1 (ko) | 2010-05-28 | 2011-12-19 | 삼성모바일디스플레이주식회사 | 유기 발광 표시 장치 |
| KR101798487B1 (ko) * | 2010-06-01 | 2017-11-17 | 삼성디스플레이 주식회사 | 표시 장치 |
| KR101201720B1 (ko) * | 2010-07-29 | 2012-11-15 | 삼성디스플레이 주식회사 | 표시 장치 및 유기 발광 표시 장치 |
| DE112011105747T5 (de) * | 2011-10-19 | 2014-09-25 | Hewlett-Packard Development Company, L.P. | Material mit Signaldurchlass- und Signalsperrlitzen |
| WO2013108311A1 (ja) * | 2012-01-16 | 2013-07-25 | Necカシオモバイルコミュニケーションズ株式会社 | 携帯端末装置 |
| US8940618B2 (en) * | 2012-03-13 | 2015-01-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and device for cutting semiconductor wafers |
| CN109334132B (zh) | 2012-08-24 | 2022-02-25 | 迪睿合电子材料有限公司 | 各向异性导电膜及其制造方法 |
| KR102208591B1 (ko) * | 2012-08-24 | 2021-01-27 | 데쿠세리아루즈 가부시키가이샤 | 이방성 도전 필름의 제조 방법 및 이방성 도전 필름 |
| KR20140071813A (ko) | 2012-12-04 | 2014-06-12 | 삼성전자주식회사 | 파이버 상에 형성된 저항성 메모리 소자 및 그 제종 방법 |
| WO2014098275A1 (ko) * | 2012-12-17 | 2014-06-26 | 코오롱글로텍주식회사 | 플렉서블 디스플레이를 위한 평탄화 섬유기판의 제조방법 |
| US8688592B1 (en) * | 2013-01-08 | 2014-04-01 | Michael T. Abramson | System and method for processing transactions |
| JP2014209564A (ja) * | 2013-03-28 | 2014-11-06 | 日東電工株式会社 | 熱硬化性封止用シート、及び、セパレータ付き熱硬化性封止用シート |
| KR102086098B1 (ko) * | 2013-07-03 | 2020-03-09 | 삼성디스플레이 주식회사 | 표시 장치 |
| US20150069133A1 (en) * | 2013-09-09 | 2015-03-12 | Zhengfang Qian | Nanotube patterns for chipless rfid tags and methods of making the same |
| WO2016033557A2 (en) * | 2014-08-29 | 2016-03-03 | University Of Virginia | Quasi-vertical diode with integrated ohmic contact base and related method thereof |
| JP6463662B2 (ja) * | 2015-10-06 | 2019-02-06 | 信越化学工業株式会社 | 半導体封止用基材付封止材、半導体封止用基材付封止材の製造方法、及び半導体装置の製造方法 |
| JP2017147537A (ja) * | 2016-02-16 | 2017-08-24 | レノボ・シンガポール・プライベート・リミテッド | 電子機器および電子機器用筐体 |
| JP6686540B2 (ja) * | 2016-03-04 | 2020-04-22 | 三菱瓦斯化学株式会社 | プリント配線基板 |
| KR20180016330A (ko) * | 2016-07-08 | 2018-02-14 | 보에 테크놀로지 그룹 컴퍼니 리미티드 | 박막 트랜지스터, 게이트 드라이브 온 어레이 및 이를 갖는 디스플레이 장치, 및 그 제조 방법 |
| CN112585812B (zh) * | 2018-08-24 | 2023-07-25 | 京瓷株式会社 | 谐振构造体、天线、无线通信模块以及无线通信设备 |
| US10796976B2 (en) * | 2018-10-31 | 2020-10-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device and method of forming the same |
| TWI827809B (zh) * | 2019-04-04 | 2024-01-01 | 丹麥商卡普雷斯股份有限公司 | 測量測試樣本之電性的方法,以及多層測試樣本 |
| JP2021132208A (ja) * | 2020-02-19 | 2021-09-09 | 東レ株式会社 | 半導体装置およびその製造方法、ならびに無線通信装置 |
Family Cites Families (41)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR930003894B1 (ko) | 1989-01-25 | 1993-05-15 | 아사히가세이고오교가부시끼가이샤 | 신규한 프리프레그와 복합 성형체, 및 복합 성형체의 제조방법 |
| DE3907757A1 (de) | 1989-03-10 | 1990-09-13 | Mtu Muenchen Gmbh | Schutzfolie |
| JPH05190999A (ja) * | 1992-01-08 | 1993-07-30 | Ibiden Co Ltd | Icカード用プリント配線板 |
| JPH05190582A (ja) | 1992-01-08 | 1993-07-30 | Oki Electric Ind Co Ltd | 樹脂封止半導体装置及びその製造方法 |
| JPH0794744A (ja) * | 1993-09-20 | 1995-04-07 | Hitachi Ltd | Misトランジスタ |
| EP0682445B1 (en) | 1994-05-11 | 2000-07-05 | Thomson Consumer Electronics, Inc. | Convergence correction |
| TW371285B (en) * | 1994-09-19 | 1999-10-01 | Amp Akzo Linlam Vof | Foiled UD-prepreg and PWB laminate prepared therefrom |
| JP3364081B2 (ja) | 1995-02-16 | 2003-01-08 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP3406727B2 (ja) | 1995-03-10 | 2003-05-12 | 株式会社半導体エネルギー研究所 | 表示装置 |
| US5757456A (en) | 1995-03-10 | 1998-05-26 | Semiconductor Energy Laboratory Co., Ltd. | Display device and method of fabricating involving peeling circuits from one substrate and mounting on other |
| JP3256110B2 (ja) * | 1995-09-28 | 2002-02-12 | シャープ株式会社 | 液晶表示装置 |
| JPH1092980A (ja) | 1996-09-13 | 1998-04-10 | Toshiba Corp | 無線カードおよびその製造方法 |
| US5930139A (en) | 1996-11-13 | 1999-07-27 | Kimberly-Clark Worldwide, Inc. | Process and apparatus for registration control of material printed at machine product length |
| JPH10338809A (ja) * | 1997-04-08 | 1998-12-22 | Sumitomo Chem Co Ltd | 低誘電率樹脂とパラ配向芳香族ポリアミドとからなる複合フィルム、そのプリプレグおよびそれらの用途 |
| JPH11214700A (ja) * | 1998-01-23 | 1999-08-06 | Semiconductor Energy Lab Co Ltd | 半導体表示装置 |
| JPH11317475A (ja) | 1998-02-27 | 1999-11-16 | Canon Inc | 半導体用封止材樹脂および半導体素子 |
| TW484101B (en) | 1998-12-17 | 2002-04-21 | Hitachi Ltd | Semiconductor device and its manufacturing method |
| JP3160586B2 (ja) * | 1999-04-27 | 2001-04-25 | 松下電子工業株式会社 | Cmosインバータ及びそれを用いたスタンダードセル |
| US6224965B1 (en) | 1999-06-25 | 2001-05-01 | Honeywell International Inc. | Microfiber dielectrics which facilitate laser via drilling |
| JP4423779B2 (ja) | 1999-10-13 | 2010-03-03 | 味の素株式会社 | エポキシ樹脂組成物並びに該組成物を用いた接着フィルム及びプリプレグ、及びこれらを用いた多層プリント配線板及びその製造法 |
| JP4027740B2 (ja) | 2001-07-16 | 2007-12-26 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| US8415208B2 (en) | 2001-07-16 | 2013-04-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and peeling off method and method of manufacturing semiconductor device |
| KR100430001B1 (ko) | 2001-12-18 | 2004-05-03 | 엘지전자 주식회사 | 다층기판의 제조방법, 그 다층기판의 패드 형성방법 및 그다층기판을 이용한 반도체 패키지의 제조방법 |
| JP4137460B2 (ja) * | 2002-02-08 | 2008-08-20 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP3949599B2 (ja) * | 2002-03-22 | 2007-07-25 | 株式会社半導体エネルギー研究所 | 半導体記憶装置 |
| JP4526772B2 (ja) * | 2002-03-26 | 2010-08-18 | 株式会社半導体エネルギー研究所 | 半導体装置及び半導体装置の作製方法 |
| US7485489B2 (en) | 2002-06-19 | 2009-02-03 | Bjoersell Sten | Electronics circuit manufacture |
| AU2003253227A1 (en) | 2002-06-19 | 2004-01-06 | Sten Bjorsell | Electronics circuit manufacture |
| US7132311B2 (en) | 2002-07-26 | 2006-11-07 | Intel Corporation | Encapsulation of a stack of semiconductor dice |
| WO2004107452A1 (ja) * | 2003-05-30 | 2004-12-09 | Matsushita Electric Industrial Co., Ltd. | 半導体装置およびその製造方法 |
| JP4828088B2 (ja) | 2003-06-05 | 2011-11-30 | 凸版印刷株式会社 | Icタグ |
| US20050233122A1 (en) | 2004-04-19 | 2005-10-20 | Mikio Nishimura | Manufacturing method of laminated substrate, and manufacturing apparatus of semiconductor device for module and laminated substrate for use therein |
| JP2005327900A (ja) * | 2004-05-14 | 2005-11-24 | Sanyo Electric Co Ltd | 半導体装置 |
| US7161199B2 (en) * | 2004-08-24 | 2007-01-09 | Freescale Semiconductor, Inc. | Transistor structure with stress modification and capacitive reduction feature in a width direction and method thereof |
| JP5072208B2 (ja) * | 2004-09-24 | 2012-11-14 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| WO2006090445A1 (ja) * | 2005-02-23 | 2006-08-31 | Fujitsu Limited | 半導体回路装置及びその半導体回路装置の製造方法 |
| US7727859B2 (en) * | 2005-06-30 | 2010-06-01 | Semiconductor Energy Laboratory Co., Ltd | Semiconductor device and manufacturing method thereof |
| JP2007059821A (ja) | 2005-08-26 | 2007-03-08 | Shinko Electric Ind Co Ltd | 配線基板の製造方法 |
| TWI431726B (zh) | 2006-06-01 | 2014-03-21 | Semiconductor Energy Lab | 非揮發性半導體記憶體裝置 |
| CN101479747B (zh) | 2006-06-26 | 2011-05-18 | 株式会社半导体能源研究所 | 包括半导体器件的纸及其制造方法 |
| EP1970951A3 (en) * | 2007-03-13 | 2009-05-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
-
2008
- 2008-05-16 EP EP08009111A patent/EP2001047A1/en not_active Withdrawn
- 2008-05-29 US US12/155,055 patent/US7906847B2/en not_active Expired - Fee Related
- 2008-06-04 JP JP2008146459A patent/JP2009016808A/ja not_active Withdrawn
- 2008-06-05 KR KR1020080053282A patent/KR20080108047A/ko not_active Ceased
-
2012
- 2012-06-21 JP JP2012139924A patent/JP2012212917A/ja not_active Withdrawn
-
2014
- 2014-03-10 JP JP2014045961A patent/JP5770325B2/ja not_active Expired - Fee Related
-
2015
- 2015-06-24 JP JP2015126686A patent/JP2015207785A/ja not_active Withdrawn
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