JP2008524594A - テストシステムチャネルとインタフェースをとるための双方向バッファ - Google Patents

テストシステムチャネルとインタフェースをとるための双方向バッファ Download PDF

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Publication number
JP2008524594A
JP2008524594A JP2007546937A JP2007546937A JP2008524594A JP 2008524594 A JP2008524594 A JP 2008524594A JP 2007546937 A JP2007546937 A JP 2007546937A JP 2007546937 A JP2007546937 A JP 2007546937A JP 2008524594 A JP2008524594 A JP 2008524594A
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JP
Japan
Prior art keywords
emitter
voltage
follower transistor
transistor
base
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Pending
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JP2007546937A
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English (en)
Japanese (ja)
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JP2008524594A5 (https=
Inventor
チャールズ エー． ミラー，
Original Assignee
フォームファクター， インコーポレイテッド
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Application filed by フォームファクター， インコーポレイテッド filed Critical フォームファクター， インコーポレイテッド
Publication of JP2008524594A publication Critical patent/JP2008524594A/ja
Publication of JP2008524594A5 publication Critical patent/JP2008524594A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP2007546937A 2004-12-21 2005-12-15 テストシステムチャネルとインタフェースをとるための双方向バッファ Pending JP2008524594A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/018,211 US7262624B2 (en) 2004-12-21 2004-12-21 Bi-directional buffer for interfacing test system channel
PCT/US2005/045610 WO2006068938A2 (en) 2004-12-21 2005-12-15 Bi-directional buffer for interfacing test system channel

Publications (2)

Publication Number Publication Date
JP2008524594A true JP2008524594A (ja) 2008-07-10
JP2008524594A5 JP2008524594A5 (https=) 2009-03-12

Family

ID=36594862

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007546937A Pending JP2008524594A (ja) 2004-12-21 2005-12-15 テストシステムチャネルとインタフェースをとるための双方向バッファ

Country Status (7)

Country Link
US (2) US7262624B2 (https=)
EP (1) EP1836502A4 (https=)
JP (1) JP2008524594A (https=)
KR (1) KR101362485B1 (https=)
CN (1) CN101080641A (https=)
TW (1) TWI418812B (https=)
WO (1) WO2006068938A2 (https=)

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US7262624B2 (en) * 2004-12-21 2007-08-28 Formfactor, Inc. Bi-directional buffer for interfacing test system channel
US8154315B2 (en) * 2008-04-08 2012-04-10 Formfactor, Inc. Self-referencing voltage regulator
EP2180327A1 (en) * 2008-10-21 2010-04-28 Applied Materials, Inc. Apparatus and method for active voltage compensation
US8400173B2 (en) * 2009-06-26 2013-03-19 Formfactor, Inc. Method and apparatus for thermally conditioning probe cards
DE102009027677B4 (de) * 2009-07-14 2019-09-05 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Tastkopf und Verfahren zu seiner Verwendung
DE202012002391U1 (de) * 2012-03-08 2013-06-10 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Vorrichtung zur Messung elektronischer Bauteile
WO2017153847A1 (en) * 2016-03-11 2017-09-14 Analog Devices Global Configurable hardware platform for measurement or control
TWI636260B (zh) * 2017-01-06 2018-09-21 新特系統股份有限公司 探針卡模組
US11165434B2 (en) 2019-03-15 2021-11-02 Analog Devices International Unlimited Company Leakage reduction for multi-function configurable circuit
US11415623B2 (en) * 2019-03-28 2022-08-16 Teradyne, Inc. Test system supporting reverse compliance
KR102133485B1 (ko) * 2019-03-28 2020-07-13 에스케이하이닉스 주식회사 반도체 테스트 시스템
US12228611B2 (en) * 2019-08-28 2025-02-18 Tektronix, Inc. Signal path calibration of a hardware setting in a test and measurement instrument
US11313903B2 (en) * 2020-09-30 2022-04-26 Analog Devices, Inc. Pin driver and test equipment calibration
CN113514758B (zh) * 2021-09-15 2022-02-22 绅克半导体科技(苏州)有限公司 芯片测试方法、测试机及存储介质

Citations (1)

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Publication number Priority date Publication date Assignee Title
US5184029A (en) * 1991-10-15 1993-02-02 Hewlett-Packard Company Driver circuit for circuit tester

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Publication number Priority date Publication date Assignee Title
US5184029A (en) * 1991-10-15 1993-02-02 Hewlett-Packard Company Driver circuit for circuit tester

Also Published As

Publication number Publication date
WO2006068938A3 (en) 2007-04-19
EP1836502A4 (en) 2010-07-21
TW200636259A (en) 2006-10-16
TWI418812B (zh) 2013-12-11
EP1836502A2 (en) 2007-09-26
US20070290676A1 (en) 2007-12-20
KR20070090024A (ko) 2007-09-04
US7262624B2 (en) 2007-08-28
US20060132158A1 (en) 2006-06-22
WO2006068938A2 (en) 2006-06-29
CN101080641A (zh) 2007-11-28
KR101362485B1 (ko) 2014-02-13
US7977958B2 (en) 2011-07-12

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