JP2008524594A5 - - Google Patents

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Publication number
JP2008524594A5
JP2008524594A5 JP2007546937A JP2007546937A JP2008524594A5 JP 2008524594 A5 JP2008524594 A5 JP 2008524594A5 JP 2007546937 A JP2007546937 A JP 2007546937A JP 2007546937 A JP2007546937 A JP 2007546937A JP 2008524594 A5 JP2008524594 A5 JP 2008524594A5
Authority
JP
Japan
Prior art keywords
amplifier
voltage
emitter
follower transistor
probe card
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2007546937A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008524594A (ja
Filing date
Publication date
Priority claimed from US11/018,211 external-priority patent/US7262624B2/en
Application filed filed Critical
Publication of JP2008524594A publication Critical patent/JP2008524594A/ja
Publication of JP2008524594A5 publication Critical patent/JP2008524594A5/ja
Pending legal-status Critical Current

Links

JP2007546937A 2004-12-21 2005-12-15 テストシステムチャネルとインタフェースをとるための双方向バッファ Pending JP2008524594A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/018,211 US7262624B2 (en) 2004-12-21 2004-12-21 Bi-directional buffer for interfacing test system channel
PCT/US2005/045610 WO2006068938A2 (en) 2004-12-21 2005-12-15 Bi-directional buffer for interfacing test system channel

Publications (2)

Publication Number Publication Date
JP2008524594A JP2008524594A (ja) 2008-07-10
JP2008524594A5 true JP2008524594A5 (https=) 2009-03-12

Family

ID=36594862

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007546937A Pending JP2008524594A (ja) 2004-12-21 2005-12-15 テストシステムチャネルとインタフェースをとるための双方向バッファ

Country Status (7)

Country Link
US (2) US7262624B2 (https=)
EP (1) EP1836502A4 (https=)
JP (1) JP2008524594A (https=)
KR (1) KR101362485B1 (https=)
CN (1) CN101080641A (https=)
TW (1) TWI418812B (https=)
WO (1) WO2006068938A2 (https=)

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US7262624B2 (en) * 2004-12-21 2007-08-28 Formfactor, Inc. Bi-directional buffer for interfacing test system channel
US8154315B2 (en) * 2008-04-08 2012-04-10 Formfactor, Inc. Self-referencing voltage regulator
EP2180327A1 (en) * 2008-10-21 2010-04-28 Applied Materials, Inc. Apparatus and method for active voltage compensation
US8400173B2 (en) * 2009-06-26 2013-03-19 Formfactor, Inc. Method and apparatus for thermally conditioning probe cards
DE102009027677B4 (de) * 2009-07-14 2019-09-05 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Tastkopf und Verfahren zu seiner Verwendung
DE202012002391U1 (de) * 2012-03-08 2013-06-10 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Vorrichtung zur Messung elektronischer Bauteile
WO2017153847A1 (en) * 2016-03-11 2017-09-14 Analog Devices Global Configurable hardware platform for measurement or control
TWI636260B (zh) * 2017-01-06 2018-09-21 新特系統股份有限公司 探針卡模組
US11165434B2 (en) 2019-03-15 2021-11-02 Analog Devices International Unlimited Company Leakage reduction for multi-function configurable circuit
US11415623B2 (en) * 2019-03-28 2022-08-16 Teradyne, Inc. Test system supporting reverse compliance
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US11313903B2 (en) * 2020-09-30 2022-04-26 Analog Devices, Inc. Pin driver and test equipment calibration
CN113514758B (zh) * 2021-09-15 2022-02-22 绅克半导体科技(苏州)有限公司 芯片测试方法、测试机及存储介质

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US7262624B2 (en) * 2004-12-21 2007-08-28 Formfactor, Inc. Bi-directional buffer for interfacing test system channel

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