JP2008513916A5 - - Google Patents

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Publication number
JP2008513916A5
JP2008513916A5 JP2007531818A JP2007531818A JP2008513916A5 JP 2008513916 A5 JP2008513916 A5 JP 2008513916A5 JP 2007531818 A JP2007531818 A JP 2007531818A JP 2007531818 A JP2007531818 A JP 2007531818A JP 2008513916 A5 JP2008513916 A5 JP 2008513916A5
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JP
Japan
Prior art keywords
disk drive
card
holder
temperature sensor
bay
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Granted
Application number
JP2007531818A
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English (en)
Japanese (ja)
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JP2008513916A (ja
JP4949252B2 (ja
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Priority claimed from PCT/GB2005/003490 external-priority patent/WO2006030185A1/en
Publication of JP2008513916A publication Critical patent/JP2008513916A/ja
Publication of JP2008513916A5 publication Critical patent/JP2008513916A5/ja
Application granted granted Critical
Publication of JP4949252B2 publication Critical patent/JP4949252B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2007531818A 2004-09-17 2005-09-09 ディスクドライブ用筐体および装置 Expired - Fee Related JP4949252B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US61053204P 2004-09-17 2004-09-17
US60/610,532 2004-09-17
PCT/GB2005/003490 WO2006030185A1 (en) 2004-09-17 2005-09-09 Housings and devices for disk drives

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP2012004415A Division JP2012113814A (ja) 2004-09-17 2012-01-12 ディスクドライブ用筐体および装置
JP2012004416A Division JP2012113815A (ja) 2004-09-17 2012-01-12 ディスクドライブ用筐体および装置

Publications (3)

Publication Number Publication Date
JP2008513916A JP2008513916A (ja) 2008-05-01
JP2008513916A5 true JP2008513916A5 (enExample) 2011-04-14
JP4949252B2 JP4949252B2 (ja) 2012-06-06

Family

ID=34956594

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2007531818A Expired - Fee Related JP4949252B2 (ja) 2004-09-17 2005-09-09 ディスクドライブ用筐体および装置
JP2012004415A Pending JP2012113814A (ja) 2004-09-17 2012-01-12 ディスクドライブ用筐体および装置
JP2012004416A Pending JP2012113815A (ja) 2004-09-17 2012-01-12 ディスクドライブ用筐体および装置

Family Applications After (2)

Application Number Title Priority Date Filing Date
JP2012004415A Pending JP2012113814A (ja) 2004-09-17 2012-01-12 ディスクドライブ用筐体および装置
JP2012004416A Pending JP2012113815A (ja) 2004-09-17 2012-01-12 ディスクドライブ用筐体および装置

Country Status (6)

Country Link
US (1) US7729107B2 (enExample)
JP (3) JP4949252B2 (enExample)
KR (1) KR20070062521A (enExample)
CN (1) CN101023490A (enExample)
GB (1) GB2430540B (enExample)
WO (1) WO2006030185A1 (enExample)

Families Citing this family (62)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7612996B2 (en) * 2003-09-08 2009-11-03 Xyratex Technology Limited Temperature control device, disk drive unit test apparatus, and a method of testing or operating a plurality of disk drive units
CN101223604B (zh) * 2005-09-16 2011-01-19 齐拉泰克斯技术有限公司 在生产过程中用于控制磁盘驱动器温度的方法和装置
TWM331692U (en) * 2007-05-10 2008-05-01 Lite On Technology Corp Fastening structure
US20090139972A1 (en) * 2007-10-23 2009-06-04 Psion Teklogix Inc. Docking connector
US9084375B2 (en) * 2007-11-26 2015-07-14 Seagate Technology Llc Airflow module and data storage device enclosure
US8549912B2 (en) * 2007-12-18 2013-10-08 Teradyne, Inc. Disk drive transport, clamping and testing
US7996174B2 (en) 2007-12-18 2011-08-09 Teradyne, Inc. Disk drive testing
US20090153993A1 (en) * 2007-12-18 2009-06-18 Teradyne, Inc. Disk Drive Testing
US8305751B2 (en) * 2008-04-17 2012-11-06 Teradyne, Inc. Vibration isolation within disk drive testing systems
US8160739B2 (en) 2008-04-17 2012-04-17 Teradyne, Inc. Transferring storage devices within storage device testing systems
US8117480B2 (en) 2008-04-17 2012-02-14 Teradyne, Inc. Dependent temperature control within disk drive testing systems
US8102173B2 (en) 2008-04-17 2012-01-24 Teradyne, Inc. Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit
US8095234B2 (en) 2008-04-17 2012-01-10 Teradyne, Inc. Transferring disk drives within disk drive testing systems
US8238099B2 (en) * 2008-04-17 2012-08-07 Teradyne, Inc. Enclosed operating area for disk drive testing systems
US7848106B2 (en) * 2008-04-17 2010-12-07 Teradyne, Inc. Temperature control within disk drive testing systems
US7945424B2 (en) * 2008-04-17 2011-05-17 Teradyne, Inc. Disk drive emulator and method of use thereof
US20090262455A1 (en) * 2008-04-17 2009-10-22 Teradyne, Inc. Temperature Control Within Disk Drive Testing Systems
US8041449B2 (en) * 2008-04-17 2011-10-18 Teradyne, Inc. Bulk feeding disk drives to disk drive testing systems
MY149779A (en) 2008-06-03 2013-10-14 Teradyne Inc Processing storage devices
US8499611B2 (en) * 2008-10-06 2013-08-06 Teradyne, Inc. Disk drive emulator and method of use thereof
CN102460580A (zh) * 2009-06-05 2012-05-16 齐拉泰克斯技术有限公司 用于支撑磁盘驱动器的设备和磁盘驱动器测试设备
US7995349B2 (en) * 2009-07-15 2011-08-09 Teradyne, Inc. Storage device temperature sensing
US8466699B2 (en) 2009-07-15 2013-06-18 Teradyne, Inc. Heating storage devices in a testing system
US7920380B2 (en) 2009-07-15 2011-04-05 Teradyne, Inc. Test slot cooling system for a storage device testing system
US8547123B2 (en) * 2009-07-15 2013-10-01 Teradyne, Inc. Storage device testing system with a conductive heating assembly
US8116079B2 (en) * 2009-07-15 2012-02-14 Teradyne, Inc. Storage device testing system cooling
US8628239B2 (en) * 2009-07-15 2014-01-14 Teradyne, Inc. Storage device temperature sensing
US8687356B2 (en) * 2010-02-02 2014-04-01 Teradyne, Inc. Storage device testing system cooling
CN201628920U (zh) * 2010-02-05 2010-11-10 鸿富锦精密工业(深圳)有限公司 电子装置壳体
CN102244995A (zh) * 2010-05-11 2011-11-16 鸿富锦精密工业(深圳)有限公司 电子装置壳体
US8331084B2 (en) * 2010-05-13 2012-12-11 General Electric Company Apparatus for securing electronic equipment
US9779780B2 (en) 2010-06-17 2017-10-03 Teradyne, Inc. Damping vibrations within storage device testing systems
US20110318146A1 (en) * 2010-06-29 2011-12-29 Christopher James Bruno Removing bays of a test system
US8687349B2 (en) 2010-07-21 2014-04-01 Teradyne, Inc. Bulk transfer of storage devices using manual loading
US9001456B2 (en) 2010-08-31 2015-04-07 Teradyne, Inc. Engaging test slots
US8717694B1 (en) 2011-12-19 2014-05-06 Western Digital Technologies, Inc. Identifying defective slots in a disk drive tester
WO2013148093A1 (en) * 2012-03-28 2013-10-03 Teradyne, Inc. Managing energy transmission
US9564178B2 (en) 2013-03-26 2017-02-07 Seagate Technology Llc Apparatus and method for supporting storage devices during manufacture
US9459312B2 (en) 2013-04-10 2016-10-04 Teradyne, Inc. Electronic assembly test system
US9513677B2 (en) * 2014-03-18 2016-12-06 Western Digital Technologies, Inc. Shaped backplane for receiving electrical components
JP6172029B2 (ja) 2014-03-31 2017-08-02 株式会社デンソー 接着剤で互いに固定された複数の部品を有する製品
US9933454B2 (en) 2014-06-06 2018-04-03 Advantest Corporation Universal test floor system
US9854695B1 (en) * 2015-09-29 2017-12-26 Cisco Technology, Inc. Single rack unit storage blade with redundant controllers
US10198047B2 (en) * 2015-11-19 2019-02-05 Dell Products, Lp Data storage device connector with integrated temperature sensor
US9921625B1 (en) * 2016-09-21 2018-03-20 Aic Inc. Chassis structure capable of sensing temperature of media storage device
RU2673235C2 (ru) * 2016-10-05 2018-11-23 ЭйАйСи ИНК. Конструкция монтажной панели, выполненная с возможностью измерения температуры устройства хранения данных
US10178798B1 (en) * 2016-11-23 2019-01-08 Pure Storage, Inc. Electronics enclosure with airflow management
JP6973847B2 (ja) * 2017-03-08 2021-12-01 Necプラットフォームズ株式会社 記録ディスクトレー、ストレージ装置およびストレージシステム
US9875773B1 (en) * 2017-05-05 2018-01-23 Dell Products, L.P. Acoustic hard drive surrogate
US10845410B2 (en) 2017-08-28 2020-11-24 Teradyne, Inc. Automated test system having orthogonal robots
US10948534B2 (en) 2017-08-28 2021-03-16 Teradyne, Inc. Automated test system employing robotics
US11226390B2 (en) 2017-08-28 2022-01-18 Teradyne, Inc. Calibration process for an automated test system
US10725091B2 (en) 2017-08-28 2020-07-28 Teradyne, Inc. Automated test system having multiple stages
US10983145B2 (en) 2018-04-24 2021-04-20 Teradyne, Inc. System for testing devices inside of carriers
US10775408B2 (en) 2018-08-20 2020-09-15 Teradyne, Inc. System for testing devices inside of carriers
US11899042B2 (en) 2020-10-22 2024-02-13 Teradyne, Inc. Automated test system
US11754596B2 (en) 2020-10-22 2023-09-12 Teradyne, Inc. Test site configuration in an automated test system
US11754622B2 (en) 2020-10-22 2023-09-12 Teradyne, Inc. Thermal control system for an automated test system
US11953519B2 (en) 2020-10-22 2024-04-09 Teradyne, Inc. Modular automated test system
US11867749B2 (en) 2020-10-22 2024-01-09 Teradyne, Inc. Vision system for an automated test system
US12007411B2 (en) 2021-06-22 2024-06-11 Teradyne, Inc. Test socket having an automated lid
TWI793759B (zh) * 2021-09-13 2023-02-21 英業達股份有限公司 硬碟升級讀寫測試系統及其方法

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2542185B2 (de) * 1975-09-22 1979-01-18 Geraetewerk Lahr Gmbh, 7630 Lahr Vorrichtung zur Aufhängung bzw. Abstützung eines Chassis eines Aufzeichnungs- und/oder Wiedergabegerätes
JPS5850601A (ja) 1981-09-21 1983-03-25 Clarion Co Ltd 車載用テ−ププレ−ヤの防振構造
JPS6183193U (enExample) * 1984-11-07 1986-06-02
JPS62175482U (enExample) * 1986-04-24 1987-11-07
JPH0679434B2 (ja) * 1988-02-10 1994-10-05 日本電気株式会社 カートリッジ式ハードディスクドライブ
US4967155A (en) * 1988-04-08 1990-10-30 Micropolis Corporation Environmentally controlled media defect detection system for Winchester disk drives
GB2241042B (en) * 1990-02-16 1994-01-05 Pioneer Electronic Corp Damper filled with oil
JP2956146B2 (ja) 1990-07-10 1999-10-04 ソニー株式会社 ディスクカートリッジ並びに記録及び/又は再生装置
US5169272A (en) * 1990-11-01 1992-12-08 Asyst Technologies, Inc. Method and apparatus for transferring articles between two controlled environments
EP0488679A3 (en) * 1990-11-30 1993-08-04 Fujitsu Limited Storage disk module and storage disk device having a plurality of storage disk modules
US5414591A (en) * 1991-04-15 1995-05-09 Hitachi, Ltd. Magnetic disk storage system
JPH0757449A (ja) * 1993-08-11 1995-03-03 Ricoh Co Ltd 外部記憶装置
JPH08106774A (ja) * 1994-08-11 1996-04-23 Sony Corp ディスクドライブ装置
KR100224820B1 (ko) 1995-12-15 1999-10-15 윤종용 진동을 흡수하는 댐퍼와 이 댐퍼를 사용하는 광디스크드라이브
US5851143A (en) * 1996-05-10 1998-12-22 Thermal Industries Disk drive test chamber
KR100214308B1 (ko) * 1996-05-11 1999-08-02 윤종용 하드디스크 드라이브의 테스트장치
JPH10112176A (ja) * 1996-10-04 1998-04-28 Sony Corp 記録再生装置
US5903163A (en) * 1996-12-24 1999-05-11 Micron Technology, Inc. Apparatus and method of controlling the environmental temperature near semiconductor devices under test
US6467153B2 (en) * 1997-06-11 2002-10-22 Western Digital Technologies, Inc. Method for manufacturing a disk drive
WO1998057323A1 (en) * 1997-06-13 1998-12-17 Seagate Technology, Inc. Temperature dependent disc drive parametric configuration
US6434498B1 (en) * 1998-06-26 2002-08-13 Seagate Technology Llc Hard disc drive verification tester
JP2000114759A (ja) * 1998-10-02 2000-04-21 Toshiba Corp 磁気ディスク装置もしくは同装置内蔵の電子機器筐体
JP2000187975A (ja) * 1998-12-22 2000-07-04 Nec Corp ディスクアレイ装置
US6526841B1 (en) * 1999-08-02 2003-03-04 Pemstar, Inc. Environmental test chamber and a carrier for use therein
GB9928211D0 (en) * 1999-11-29 2000-01-26 Havant International Ltd Disk drive kit
JP2001168568A (ja) * 1999-12-10 2001-06-22 Nec Corp 非接触式放熱構造および非接触放熱方法
US6683745B1 (en) * 1999-12-27 2004-01-27 Hitachi Global Storage Technologies Netherlands B.V. Rotationally free mount system for disk drive having a rotary actuator
US6388878B1 (en) * 2000-08-14 2002-05-14 Cheng-Chun Chang Measuring device in a mobile rack for hard disk
CN1513106A (zh) * 2001-04-25 2004-07-14 �����ʩ���عɷݹ�˾ 硬盘驱动器的试验固定装置
US6567266B2 (en) 2001-05-16 2003-05-20 Hewlett-Packard Development Company, L.P. Foam systems for protecting disk drives from mechanical disturbances
EP1428217B1 (en) 2001-08-29 2006-10-25 Xyratex Technology Limited Mounting for disk drive unit and method of handling
JP2003316473A (ja) * 2002-04-25 2003-11-07 Matsushita Electric Ind Co Ltd 携帯型情報処理装置
US7164579B2 (en) * 2002-07-05 2007-01-16 Xyratex Technology Limited Mounting device for a disk drive unit, releasable fastener and method of testing a disk drive unit
CN101159138B (zh) 2003-06-16 2010-09-08 克西拉特克斯技术有限公司 用于将盘驱动器夹持到基板的夹持组件
US7612996B2 (en) * 2003-09-08 2009-11-03 Xyratex Technology Limited Temperature control device, disk drive unit test apparatus, and a method of testing or operating a plurality of disk drive units
US7729112B2 (en) 2003-09-08 2010-06-01 Xyratex Technology Limited Mounting for disk drive unit, retaining device and method of loading a disk drive unit
DE102004013876A1 (de) 2004-03-20 2005-10-06 Intergraph (Deutschland) Gmbh Vorrichtung zur Halterung eines Speichermediums
JP2006085865A (ja) * 2004-09-17 2006-03-30 Fujitsu Ltd ディスク試験装置、ディスク試験方法およびディスク装置
US7165462B2 (en) * 2004-11-29 2007-01-23 Hitachi Global Storage Technologies Netherlands B.V. Individual slider testing

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