CN101023490A - 磁盘驱动器装置及机架 - Google Patents
磁盘驱动器装置及机架 Download PDFInfo
- Publication number
- CN101023490A CN101023490A CNA2005800312981A CN200580031298A CN101023490A CN 101023490 A CN101023490 A CN 101023490A CN A2005800312981 A CNA2005800312981 A CN A2005800312981A CN 200580031298 A CN200580031298 A CN 200580031298A CN 101023490 A CN101023490 A CN 101023490A
- Authority
- CN
- China
- Prior art keywords
- disk drive
- card
- carrier
- test card
- tray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
- G01R13/28—Circuits for simultaneous or sequential presentation of more than one variable
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/02—Cabinets; Cases; Stands; Disposition of apparatus therein or thereon
- G11B33/022—Cases
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/16—Constructional details or arrangements
- G06F1/18—Packaging or power distribution
- G06F1/183—Internal mounting support structures, e.g. for printed circuit boards, internal connecting means
- G06F1/184—Mounting of motherboards
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/16—Constructional details or arrangements
- G06F1/18—Packaging or power distribution
- G06F1/183—Internal mounting support structures, e.g. for printed circuit boards, internal connecting means
- G06F1/187—Mounting of fixed and removable disk drives
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/16—Constructional details or arrangements
- G06F1/20—Cooling means
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/16—Constructional details or arrangements
- G06F1/20—Cooling means
- G06F1/206—Cooling means comprising thermal management
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/02—Cabinets; Cases; Stands; Disposition of apparatus therein or thereon
- G11B33/08—Insulation or absorption of undesired vibrations or sounds
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/12—Disposition of constructional parts in the apparatus, e.g. of power supply, of modules
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/12—Disposition of constructional parts in the apparatus, e.g. of power supply, of modules
- G11B33/125—Disposition of constructional parts in the apparatus, e.g. of power supply, of modules the apparatus comprising a plurality of recording/reproducing devices, e.g. modular arrangements, arrays of disc drives
- G11B33/127—Mounting arrangements of constructional parts onto a chassis
- G11B33/128—Mounting arrangements of constructional parts onto a chassis of the plurality of recording/reproducing devices, e.g. disk drives, onto a chassis
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/14—Reducing influence of physical parameters, e.g. temperature change, moisture, dust
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/14—Reducing influence of physical parameters, e.g. temperature change, moisture, dust
- G11B33/1406—Reducing the influence of the temperature
- G11B33/144—Reducing the influence of the temperature by detection, control, regulation of the temperature
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Human Computer Interaction (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Quality & Reliability (AREA)
- Recording Or Reproducing By Magnetic Means (AREA)
- Feeding And Guiding Record Carriers (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US61053204P | 2004-09-17 | 2004-09-17 | |
| US60/610,532 | 2004-09-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101023490A true CN101023490A (zh) | 2007-08-22 |
Family
ID=34956594
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA2005800312981A Pending CN101023490A (zh) | 2004-09-17 | 2005-09-09 | 磁盘驱动器装置及机架 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7729107B2 (enExample) |
| JP (3) | JP4949252B2 (enExample) |
| KR (1) | KR20070062521A (enExample) |
| CN (1) | CN101023490A (enExample) |
| GB (1) | GB2430540B (enExample) |
| WO (1) | WO2006030185A1 (enExample) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102244995A (zh) * | 2010-05-11 | 2011-11-16 | 鸿富锦精密工业(深圳)有限公司 | 电子装置壳体 |
| CN102265168A (zh) * | 2008-04-17 | 2011-11-30 | 泰拉丁公司 | 向存储装置测试系统批量输送存储装置 |
| CN102460580A (zh) * | 2009-06-05 | 2012-05-16 | 齐拉泰克斯技术有限公司 | 用于支撑磁盘驱动器的设备和磁盘驱动器测试设备 |
| CN104934053A (zh) * | 2014-03-18 | 2015-09-23 | Hgst荷兰公司 | 用于接收电子部件的成形的底板 |
| TWI793759B (zh) * | 2021-09-13 | 2023-02-21 | 英業達股份有限公司 | 硬碟升級讀寫測試系統及其方法 |
Families Citing this family (57)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7612996B2 (en) * | 2003-09-08 | 2009-11-03 | Xyratex Technology Limited | Temperature control device, disk drive unit test apparatus, and a method of testing or operating a plurality of disk drive units |
| CN101223604B (zh) * | 2005-09-16 | 2011-01-19 | 齐拉泰克斯技术有限公司 | 在生产过程中用于控制磁盘驱动器温度的方法和装置 |
| TWM331692U (en) * | 2007-05-10 | 2008-05-01 | Lite On Technology Corp | Fastening structure |
| US20090139972A1 (en) * | 2007-10-23 | 2009-06-04 | Psion Teklogix Inc. | Docking connector |
| US9084375B2 (en) * | 2007-11-26 | 2015-07-14 | Seagate Technology Llc | Airflow module and data storage device enclosure |
| US8549912B2 (en) * | 2007-12-18 | 2013-10-08 | Teradyne, Inc. | Disk drive transport, clamping and testing |
| US7996174B2 (en) | 2007-12-18 | 2011-08-09 | Teradyne, Inc. | Disk drive testing |
| US20090153993A1 (en) * | 2007-12-18 | 2009-06-18 | Teradyne, Inc. | Disk Drive Testing |
| US8305751B2 (en) * | 2008-04-17 | 2012-11-06 | Teradyne, Inc. | Vibration isolation within disk drive testing systems |
| US8160739B2 (en) | 2008-04-17 | 2012-04-17 | Teradyne, Inc. | Transferring storage devices within storage device testing systems |
| US8117480B2 (en) | 2008-04-17 | 2012-02-14 | Teradyne, Inc. | Dependent temperature control within disk drive testing systems |
| US8102173B2 (en) | 2008-04-17 | 2012-01-24 | Teradyne, Inc. | Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit |
| US8095234B2 (en) | 2008-04-17 | 2012-01-10 | Teradyne, Inc. | Transferring disk drives within disk drive testing systems |
| US8238099B2 (en) * | 2008-04-17 | 2012-08-07 | Teradyne, Inc. | Enclosed operating area for disk drive testing systems |
| US7848106B2 (en) * | 2008-04-17 | 2010-12-07 | Teradyne, Inc. | Temperature control within disk drive testing systems |
| US7945424B2 (en) * | 2008-04-17 | 2011-05-17 | Teradyne, Inc. | Disk drive emulator and method of use thereof |
| US20090262455A1 (en) * | 2008-04-17 | 2009-10-22 | Teradyne, Inc. | Temperature Control Within Disk Drive Testing Systems |
| MY149779A (en) | 2008-06-03 | 2013-10-14 | Teradyne Inc | Processing storage devices |
| US8499611B2 (en) * | 2008-10-06 | 2013-08-06 | Teradyne, Inc. | Disk drive emulator and method of use thereof |
| US7995349B2 (en) * | 2009-07-15 | 2011-08-09 | Teradyne, Inc. | Storage device temperature sensing |
| US8466699B2 (en) | 2009-07-15 | 2013-06-18 | Teradyne, Inc. | Heating storage devices in a testing system |
| US7920380B2 (en) | 2009-07-15 | 2011-04-05 | Teradyne, Inc. | Test slot cooling system for a storage device testing system |
| US8547123B2 (en) * | 2009-07-15 | 2013-10-01 | Teradyne, Inc. | Storage device testing system with a conductive heating assembly |
| US8116079B2 (en) * | 2009-07-15 | 2012-02-14 | Teradyne, Inc. | Storage device testing system cooling |
| US8628239B2 (en) * | 2009-07-15 | 2014-01-14 | Teradyne, Inc. | Storage device temperature sensing |
| US8687356B2 (en) * | 2010-02-02 | 2014-04-01 | Teradyne, Inc. | Storage device testing system cooling |
| CN201628920U (zh) * | 2010-02-05 | 2010-11-10 | 鸿富锦精密工业(深圳)有限公司 | 电子装置壳体 |
| US8331084B2 (en) * | 2010-05-13 | 2012-12-11 | General Electric Company | Apparatus for securing electronic equipment |
| US9779780B2 (en) | 2010-06-17 | 2017-10-03 | Teradyne, Inc. | Damping vibrations within storage device testing systems |
| US20110318146A1 (en) * | 2010-06-29 | 2011-12-29 | Christopher James Bruno | Removing bays of a test system |
| US8687349B2 (en) | 2010-07-21 | 2014-04-01 | Teradyne, Inc. | Bulk transfer of storage devices using manual loading |
| US9001456B2 (en) | 2010-08-31 | 2015-04-07 | Teradyne, Inc. | Engaging test slots |
| US8717694B1 (en) | 2011-12-19 | 2014-05-06 | Western Digital Technologies, Inc. | Identifying defective slots in a disk drive tester |
| WO2013148093A1 (en) * | 2012-03-28 | 2013-10-03 | Teradyne, Inc. | Managing energy transmission |
| US9564178B2 (en) | 2013-03-26 | 2017-02-07 | Seagate Technology Llc | Apparatus and method for supporting storage devices during manufacture |
| US9459312B2 (en) | 2013-04-10 | 2016-10-04 | Teradyne, Inc. | Electronic assembly test system |
| JP6172029B2 (ja) | 2014-03-31 | 2017-08-02 | 株式会社デンソー | 接着剤で互いに固定された複数の部品を有する製品 |
| US9933454B2 (en) | 2014-06-06 | 2018-04-03 | Advantest Corporation | Universal test floor system |
| US9854695B1 (en) * | 2015-09-29 | 2017-12-26 | Cisco Technology, Inc. | Single rack unit storage blade with redundant controllers |
| US10198047B2 (en) * | 2015-11-19 | 2019-02-05 | Dell Products, Lp | Data storage device connector with integrated temperature sensor |
| US9921625B1 (en) * | 2016-09-21 | 2018-03-20 | Aic Inc. | Chassis structure capable of sensing temperature of media storage device |
| RU2673235C2 (ru) * | 2016-10-05 | 2018-11-23 | ЭйАйСи ИНК. | Конструкция монтажной панели, выполненная с возможностью измерения температуры устройства хранения данных |
| US10178798B1 (en) * | 2016-11-23 | 2019-01-08 | Pure Storage, Inc. | Electronics enclosure with airflow management |
| JP6973847B2 (ja) * | 2017-03-08 | 2021-12-01 | Necプラットフォームズ株式会社 | 記録ディスクトレー、ストレージ装置およびストレージシステム |
| US9875773B1 (en) * | 2017-05-05 | 2018-01-23 | Dell Products, L.P. | Acoustic hard drive surrogate |
| US10845410B2 (en) | 2017-08-28 | 2020-11-24 | Teradyne, Inc. | Automated test system having orthogonal robots |
| US10948534B2 (en) | 2017-08-28 | 2021-03-16 | Teradyne, Inc. | Automated test system employing robotics |
| US11226390B2 (en) | 2017-08-28 | 2022-01-18 | Teradyne, Inc. | Calibration process for an automated test system |
| US10725091B2 (en) | 2017-08-28 | 2020-07-28 | Teradyne, Inc. | Automated test system having multiple stages |
| US10983145B2 (en) | 2018-04-24 | 2021-04-20 | Teradyne, Inc. | System for testing devices inside of carriers |
| US10775408B2 (en) | 2018-08-20 | 2020-09-15 | Teradyne, Inc. | System for testing devices inside of carriers |
| US11899042B2 (en) | 2020-10-22 | 2024-02-13 | Teradyne, Inc. | Automated test system |
| US11754596B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Test site configuration in an automated test system |
| US11754622B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Thermal control system for an automated test system |
| US11953519B2 (en) | 2020-10-22 | 2024-04-09 | Teradyne, Inc. | Modular automated test system |
| US11867749B2 (en) | 2020-10-22 | 2024-01-09 | Teradyne, Inc. | Vision system for an automated test system |
| US12007411B2 (en) | 2021-06-22 | 2024-06-11 | Teradyne, Inc. | Test socket having an automated lid |
Family Cites Families (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2542185B2 (de) * | 1975-09-22 | 1979-01-18 | Geraetewerk Lahr Gmbh, 7630 Lahr | Vorrichtung zur Aufhängung bzw. Abstützung eines Chassis eines Aufzeichnungs- und/oder Wiedergabegerätes |
| JPS5850601A (ja) | 1981-09-21 | 1983-03-25 | Clarion Co Ltd | 車載用テ−ププレ−ヤの防振構造 |
| JPS6183193U (enExample) * | 1984-11-07 | 1986-06-02 | ||
| JPS62175482U (enExample) * | 1986-04-24 | 1987-11-07 | ||
| JPH0679434B2 (ja) * | 1988-02-10 | 1994-10-05 | 日本電気株式会社 | カートリッジ式ハードディスクドライブ |
| US4967155A (en) * | 1988-04-08 | 1990-10-30 | Micropolis Corporation | Environmentally controlled media defect detection system for Winchester disk drives |
| GB2241042B (en) * | 1990-02-16 | 1994-01-05 | Pioneer Electronic Corp | Damper filled with oil |
| JP2956146B2 (ja) | 1990-07-10 | 1999-10-04 | ソニー株式会社 | ディスクカートリッジ並びに記録及び/又は再生装置 |
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| JPH0757449A (ja) * | 1993-08-11 | 1995-03-03 | Ricoh Co Ltd | 外部記憶装置 |
| JPH08106774A (ja) * | 1994-08-11 | 1996-04-23 | Sony Corp | ディスクドライブ装置 |
| KR100224820B1 (ko) | 1995-12-15 | 1999-10-15 | 윤종용 | 진동을 흡수하는 댐퍼와 이 댐퍼를 사용하는 광디스크드라이브 |
| US5851143A (en) * | 1996-05-10 | 1998-12-22 | Thermal Industries | Disk drive test chamber |
| KR100214308B1 (ko) * | 1996-05-11 | 1999-08-02 | 윤종용 | 하드디스크 드라이브의 테스트장치 |
| JPH10112176A (ja) * | 1996-10-04 | 1998-04-28 | Sony Corp | 記録再生装置 |
| US5903163A (en) * | 1996-12-24 | 1999-05-11 | Micron Technology, Inc. | Apparatus and method of controlling the environmental temperature near semiconductor devices under test |
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| JP2000114759A (ja) * | 1998-10-02 | 2000-04-21 | Toshiba Corp | 磁気ディスク装置もしくは同装置内蔵の電子機器筐体 |
| JP2000187975A (ja) * | 1998-12-22 | 2000-07-04 | Nec Corp | ディスクアレイ装置 |
| US6526841B1 (en) * | 1999-08-02 | 2003-03-04 | Pemstar, Inc. | Environmental test chamber and a carrier for use therein |
| GB9928211D0 (en) * | 1999-11-29 | 2000-01-26 | Havant International Ltd | Disk drive kit |
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| US6683745B1 (en) * | 1999-12-27 | 2004-01-27 | Hitachi Global Storage Technologies Netherlands B.V. | Rotationally free mount system for disk drive having a rotary actuator |
| US6388878B1 (en) * | 2000-08-14 | 2002-05-14 | Cheng-Chun Chang | Measuring device in a mobile rack for hard disk |
| CN1513106A (zh) * | 2001-04-25 | 2004-07-14 | �����ʩ���عɷݹ�˾ | 硬盘驱动器的试验固定装置 |
| US6567266B2 (en) | 2001-05-16 | 2003-05-20 | Hewlett-Packard Development Company, L.P. | Foam systems for protecting disk drives from mechanical disturbances |
| EP1428217B1 (en) | 2001-08-29 | 2006-10-25 | Xyratex Technology Limited | Mounting for disk drive unit and method of handling |
| JP2003316473A (ja) * | 2002-04-25 | 2003-11-07 | Matsushita Electric Ind Co Ltd | 携帯型情報処理装置 |
| US7164579B2 (en) * | 2002-07-05 | 2007-01-16 | Xyratex Technology Limited | Mounting device for a disk drive unit, releasable fastener and method of testing a disk drive unit |
| CN101159138B (zh) | 2003-06-16 | 2010-09-08 | 克西拉特克斯技术有限公司 | 用于将盘驱动器夹持到基板的夹持组件 |
| US7612996B2 (en) * | 2003-09-08 | 2009-11-03 | Xyratex Technology Limited | Temperature control device, disk drive unit test apparatus, and a method of testing or operating a plurality of disk drive units |
| US7729112B2 (en) | 2003-09-08 | 2010-06-01 | Xyratex Technology Limited | Mounting for disk drive unit, retaining device and method of loading a disk drive unit |
| DE102004013876A1 (de) | 2004-03-20 | 2005-10-06 | Intergraph (Deutschland) Gmbh | Vorrichtung zur Halterung eines Speichermediums |
| JP2006085865A (ja) * | 2004-09-17 | 2006-03-30 | Fujitsu Ltd | ディスク試験装置、ディスク試験方法およびディスク装置 |
| US7165462B2 (en) * | 2004-11-29 | 2007-01-23 | Hitachi Global Storage Technologies Netherlands B.V. | Individual slider testing |
-
2005
- 2005-09-09 GB GB0700541A patent/GB2430540B/en not_active Expired - Fee Related
- 2005-09-09 KR KR1020077006180A patent/KR20070062521A/ko not_active Ceased
- 2005-09-09 US US11/662,776 patent/US7729107B2/en active Active
- 2005-09-09 WO PCT/GB2005/003490 patent/WO2006030185A1/en not_active Ceased
- 2005-09-09 JP JP2007531818A patent/JP4949252B2/ja not_active Expired - Fee Related
- 2005-09-09 CN CNA2005800312981A patent/CN101023490A/zh active Pending
-
2012
- 2012-01-12 JP JP2012004415A patent/JP2012113814A/ja active Pending
- 2012-01-12 JP JP2012004416A patent/JP2012113815A/ja active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102265168A (zh) * | 2008-04-17 | 2011-11-30 | 泰拉丁公司 | 向存储装置测试系统批量输送存储装置 |
| CN102460580A (zh) * | 2009-06-05 | 2012-05-16 | 齐拉泰克斯技术有限公司 | 用于支撑磁盘驱动器的设备和磁盘驱动器测试设备 |
| CN102244995A (zh) * | 2010-05-11 | 2011-11-16 | 鸿富锦精密工业(深圳)有限公司 | 电子装置壳体 |
| CN104934053A (zh) * | 2014-03-18 | 2015-09-23 | Hgst荷兰公司 | 用于接收电子部件的成形的底板 |
| CN104934053B (zh) * | 2014-03-18 | 2017-11-03 | Hgst荷兰公司 | 用于接收电子部件的成形的底板及形成底板的方法 |
| TWI793759B (zh) * | 2021-09-13 | 2023-02-21 | 英業達股份有限公司 | 硬碟升級讀寫測試系統及其方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2008513916A (ja) | 2008-05-01 |
| WO2006030185A1 (en) | 2006-03-23 |
| HK1096193A1 (zh) | 2007-05-25 |
| JP2012113815A (ja) | 2012-06-14 |
| GB2430540B (en) | 2009-07-15 |
| US7729107B2 (en) | 2010-06-01 |
| GB2430540A (en) | 2007-03-28 |
| GB0700541D0 (en) | 2007-02-21 |
| JP4949252B2 (ja) | 2012-06-06 |
| KR20070062521A (ko) | 2007-06-15 |
| US20070253157A1 (en) | 2007-11-01 |
| JP2012113814A (ja) | 2012-06-14 |
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