JP2008513742A5 - - Google Patents

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Publication number
JP2008513742A5
JP2008513742A5 JP2007531555A JP2007531555A JP2008513742A5 JP 2008513742 A5 JP2008513742 A5 JP 2008513742A5 JP 2007531555 A JP2007531555 A JP 2007531555A JP 2007531555 A JP2007531555 A JP 2007531555A JP 2008513742 A5 JP2008513742 A5 JP 2008513742A5
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JP
Japan
Prior art keywords
image
collimated light
akiranakadachi
light beam
medium
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2007531555A
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English (en)
Japanese (ja)
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JP2008513742A (ja
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Application filed filed Critical
Priority claimed from PCT/CA2005/001421 external-priority patent/WO2006029536A1/en
Publication of JP2008513742A publication Critical patent/JP2008513742A/ja
Publication of JP2008513742A5 publication Critical patent/JP2008513742A5/ja
Pending legal-status Critical Current

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JP2007531555A 2004-09-17 2005-09-19 直接像の技術を使用した平面の媒質の光学検査 Pending JP2008513742A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US61060504P 2004-09-17 2004-09-17
PCT/CA2005/001421 WO2006029536A1 (en) 2004-09-17 2005-09-19 Optical inspection of flat media using direct image technology

Publications (2)

Publication Number Publication Date
JP2008513742A JP2008513742A (ja) 2008-05-01
JP2008513742A5 true JP2008513742A5 (enExample) 2012-01-12

Family

ID=36059685

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007531555A Pending JP2008513742A (ja) 2004-09-17 2005-09-19 直接像の技術を使用した平面の媒質の光学検査

Country Status (6)

Country Link
US (1) US8040502B2 (enExample)
EP (1) EP1794577A4 (enExample)
JP (1) JP2008513742A (enExample)
KR (1) KR20070085258A (enExample)
CA (1) CA2580551A1 (enExample)
WO (1) WO2006029536A1 (enExample)

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CN109613004A (zh) * 2018-12-13 2019-04-12 武汉精立电子技术有限公司 一种背光检中缺陷显示方法
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