KR20070085258A - 다이렉트 이미지 기술을 사용하는 평판 매체의 광학적 검사 - Google Patents

다이렉트 이미지 기술을 사용하는 평판 매체의 광학적 검사 Download PDF

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Publication number
KR20070085258A
KR20070085258A KR1020077008594A KR20077008594A KR20070085258A KR 20070085258 A KR20070085258 A KR 20070085258A KR 1020077008594 A KR1020077008594 A KR 1020077008594A KR 20077008594 A KR20077008594 A KR 20077008594A KR 20070085258 A KR20070085258 A KR 20070085258A
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KR
South Korea
Prior art keywords
transparent medium
scanning
light
glass
array
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Ceased
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KR1020077008594A
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English (en)
Korean (ko)
Inventor
데이비드 피. 토마스
아담 웨이스
Original Assignee
디.바이스 사이언티픽 인코포레이티드
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Publication of KR20070085258A publication Critical patent/KR20070085258A/ko
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020077008594A 2004-09-17 2005-09-19 다이렉트 이미지 기술을 사용하는 평판 매체의 광학적 검사 Ceased KR20070085258A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US61060504P 2004-09-17 2004-09-17
US60/610,605 2004-09-17

Publications (1)

Publication Number Publication Date
KR20070085258A true KR20070085258A (ko) 2007-08-27

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ID=36059685

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KR1020077008594A Ceased KR20070085258A (ko) 2004-09-17 2005-09-19 다이렉트 이미지 기술을 사용하는 평판 매체의 광학적 검사

Country Status (6)

Country Link
US (1) US8040502B2 (enExample)
EP (1) EP1794577A4 (enExample)
JP (1) JP2008513742A (enExample)
KR (1) KR20070085258A (enExample)
CA (1) CA2580551A1 (enExample)
WO (1) WO2006029536A1 (enExample)

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WO2015100068A1 (en) * 2013-12-23 2015-07-02 Corning Incorporated Non-imaging coherent line scanner systems and methods for optical inspection
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WO2016183210A1 (en) * 2015-05-11 2016-11-17 Board Of Regents, The University Of Texas System Optical-coherence-tomography guided additive manufacturing and laser ablation of 3d-printed parts
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CN106596580A (zh) * 2016-06-14 2017-04-26 艾悌亚信息技术（上海）有限公司 可提高触摸屏玻屏aoi检测良品率的aoi算法/工艺方法
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CN110073203B (zh) 2016-11-02 2022-07-08 康宁股份有限公司 检查透明基材上的缺陷的方法和设备
US10480935B2 (en) 2016-12-02 2019-11-19 Alliance For Sustainable Energy, Llc Thickness mapping using multispectral imaging
KR101937187B1 (ko) * 2017-05-11 2019-01-14 주식회사 에이치비테크놀러지 필름표면의 불량 검출 장치
EP3668649B1 (en) * 2017-08-15 2022-03-02 The General Hospital Corporation Microfluidic device
US10402963B2 (en) * 2017-08-24 2019-09-03 Kla-Tencor Corporation Defect detection on transparent or translucent wafers
US11415528B2 (en) * 2017-10-10 2022-08-16 Wdi Wise Device Inc. Method and apparatus for automated in-line inspection of optically transparent materials
JP7208233B2 (ja) * 2017-11-15 2023-01-18 コーニング インコーポレイテッド ガラスシートの表面欠陥の検出方法および装置
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CN108445022B (zh) * 2018-03-19 2020-11-03 无锡尚实电子科技有限公司 一种玻璃残才去除检测方式
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CN109686157B (zh) * 2018-12-10 2021-04-30 武汉精立电子技术有限公司 一种兼具复判与考试功能的面板复检系统
CN109613004A (zh) * 2018-12-13 2019-04-12 武汉精立电子技术有限公司 一种背光检中缺陷显示方法
CN109558562B (zh) * 2018-12-14 2021-05-18 武汉精立电子技术有限公司 一种用于aoi复判的管理方法与系统
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Also Published As

Publication number Publication date
US20080062422A1 (en) 2008-03-13
EP1794577A1 (en) 2007-06-13
CA2580551A1 (en) 2006-03-23
US8040502B2 (en) 2011-10-18
JP2008513742A (ja) 2008-05-01
EP1794577A4 (en) 2010-10-06
WO2006029536A1 (en) 2006-03-23

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