JP2008226423A - ライトトレーニング機能を持つ半導体メモリ装置 - Google Patents

ライトトレーニング機能を持つ半導体メモリ装置 Download PDF

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Publication number
JP2008226423A
JP2008226423A JP2007226808A JP2007226808A JP2008226423A JP 2008226423 A JP2008226423 A JP 2008226423A JP 2007226808 A JP2007226808 A JP 2007226808A JP 2007226808 A JP2007226808 A JP 2007226808A JP 2008226423 A JP2008226423 A JP 2008226423A
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JP
Japan
Prior art keywords
write
data
signal
semiconductor memory
memory device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2007226808A
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English (en)
Japanese (ja)
Other versions
JP2008226423A5 (enExample
Inventor
Sang-Sic Yoon
相 植 尹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SK Hynix Inc
Original Assignee
Hynix Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hynix Semiconductor Inc filed Critical Hynix Semiconductor Inc
Publication of JP2008226423A publication Critical patent/JP2008226423A/ja
Publication of JP2008226423A5 publication Critical patent/JP2008226423A5/ja
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/023—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in clock generator or timing circuitry
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C29/50012—Marginal testing, e.g. race, voltage or current testing of timing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22—Control and timing of internal memory operations
    • G11C2207/2254—Calibration

Landscapes

  • Dram (AREA)
  • Static Random-Access Memory (AREA)
JP2007226808A 2007-03-09 2007-08-31 ライトトレーニング機能を持つ半導体メモリ装置 Ceased JP2008226423A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020070023486A KR100821584B1 (ko) 2007-03-09 2007-03-09 라이트 트래이닝 기능을 갖는 반도체 메모리 장치

Publications (2)

Publication Number Publication Date
JP2008226423A true JP2008226423A (ja) 2008-09-25
JP2008226423A5 JP2008226423A5 (enExample) 2010-09-24

Family

ID=39534633

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007226808A Ceased JP2008226423A (ja) 2007-03-09 2007-08-31 ライトトレーニング機能を持つ半導体メモリ装置

Country Status (3)

Country Link
US (1) US7692982B2 (enExample)
JP (1) JP2008226423A (enExample)
KR (1) KR100821584B1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009117025A (ja) * 2007-11-02 2009-05-28 Hynix Semiconductor Inc 半導体メモリ装置、半導体メモリ装置を備えるシステム、および、半導体メモリ装置の動作方法
KR20190004398A (ko) * 2017-07-03 2019-01-14 삼성전자주식회사 스토리지 장치의 데이터 트레이닝 방법

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100891301B1 (ko) * 2007-09-03 2009-04-06 주식회사 하이닉스반도체 고속으로 데이터 송신할 수 있는 반도체 메모리 장치
KR100903368B1 (ko) * 2007-11-02 2009-06-23 주식회사 하이닉스반도체 고속으로 데이터 송신할 수 있는 반도체 메모리 장치
KR100942953B1 (ko) * 2008-06-30 2010-02-17 주식회사 하이닉스반도체 데이터 전달 회로 및 그를 포함하는 반도체 메모리 장치
US8578086B2 (en) * 2009-09-25 2013-11-05 Intel Corporation Memory link initialization
KR101791456B1 (ko) * 2010-10-11 2017-11-21 삼성전자주식회사 라이트 트레이닝 방법 및 이를 수행하는 반도체 장치
US9570182B1 (en) 2015-09-02 2017-02-14 Kabushiki Kaisha Toshiba Semiconductor memory device and memory system
KR102392055B1 (ko) 2017-08-09 2022-04-28 삼성전자주식회사 리트레이닝 동작의 수행 여부를 효율적으로 결정하기 위한 메모리 장치 및 이를 포함하는 메모리 시스템
US11604714B2 (en) 2017-08-09 2023-03-14 Samsung Electronics Co, Ltd. Memory device for efficiently determining whether to perform re-training operation and memory system including the same

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001337862A (ja) * 2000-05-29 2001-12-07 Fujitsu Ltd メモリシステム及びそのセットアップ方法
WO2006121874A2 (en) * 2005-05-06 2006-11-16 Micron Technology, Inc. Memory device and method having a data bypass path to allow rapid testing and calibration
JP2007012166A (ja) * 2005-06-30 2007-01-18 Alaxala Networks Corp 半導体装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2982875B2 (ja) * 1987-12-28 1999-11-29 株式会社日立製作所 スレーブ制御装置
JP3756231B2 (ja) 1995-12-19 2006-03-15 株式会社ルネサステクノロジ 同期型半導体記憶装置
KR100543925B1 (ko) * 2003-06-27 2006-01-23 주식회사 하이닉스반도체 지연 고정 루프 및 지연 고정 루프에서의 클럭 지연 고정방법
US7370170B2 (en) * 2004-04-27 2008-05-06 Nvidia Corporation Data mask as write-training feedback flag
US7783954B2 (en) * 2006-09-11 2010-08-24 Globalfoundries Inc. System for controlling high-speed bidirectional communication
US7411862B2 (en) * 2006-11-15 2008-08-12 Qimonda Ag Control signal training

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001337862A (ja) * 2000-05-29 2001-12-07 Fujitsu Ltd メモリシステム及びそのセットアップ方法
WO2006121874A2 (en) * 2005-05-06 2006-11-16 Micron Technology, Inc. Memory device and method having a data bypass path to allow rapid testing and calibration
JP2008542955A (ja) * 2005-05-06 2008-11-27 マイクロン テクノロジー， インク． 高速なテストと較正を可能にするデータバイパス経路を備えるメモリ装置と方法
JP2007012166A (ja) * 2005-06-30 2007-01-18 Alaxala Networks Corp 半導体装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009117025A (ja) * 2007-11-02 2009-05-28 Hynix Semiconductor Inc 半導体メモリ装置、半導体メモリ装置を備えるシステム、および、半導体メモリ装置の動作方法
US9058437B2 (en) 2007-11-02 2015-06-16 Hynix Semiconductor Inc. Semiconductor memory device with high-speed data transmission capability, system having the same, and method for operating the same
KR20190004398A (ko) * 2017-07-03 2019-01-14 삼성전자주식회사 스토리지 장치의 데이터 트레이닝 방법
KR102353027B1 (ko) 2017-07-03 2022-01-20 삼성전자주식회사 스토리지 장치의 데이터 트레이닝 방법

Also Published As

Publication number Publication date
US20080219064A1 (en) 2008-09-11
US7692982B2 (en) 2010-04-06
KR100821584B1 (ko) 2008-04-15

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