JP2008151814A - フィルムの欠陥検査装置およびフィルムの欠陥検査方法 - Google Patents

フィルムの欠陥検査装置およびフィルムの欠陥検査方法 Download PDF

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Publication number
JP2008151814A
JP2008151814A JP2008071132A JP2008071132A JP2008151814A JP 2008151814 A JP2008151814 A JP 2008151814A JP 2008071132 A JP2008071132 A JP 2008071132A JP 2008071132 A JP2008071132 A JP 2008071132A JP 2008151814 A JP2008151814 A JP 2008151814A
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film
inspected
defect inspection
defect
polarizer
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JP2008071132A
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Japanese (ja)
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JP2008151814A5 (enExample
Inventor
Kazuhiro Shimoda
一弘 下田
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Fujifilm Corp
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Fujifilm Corp
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Priority to JP2008071132A priority Critical patent/JP2008151814A/ja
Publication of JP2008151814A publication Critical patent/JP2008151814A/ja
Publication of JP2008151814A5 publication Critical patent/JP2008151814A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Liquid Crystal (AREA)
JP2008071132A 2000-03-08 2008-03-19 フィルムの欠陥検査装置およびフィルムの欠陥検査方法 Pending JP2008151814A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008071132A JP2008151814A (ja) 2000-03-08 2008-03-19 フィルムの欠陥検査装置およびフィルムの欠陥検査方法

Applications Claiming Priority (2)

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JP2000063027 2000-03-08
JP2008071132A JP2008151814A (ja) 2000-03-08 2008-03-19 フィルムの欠陥検査装置およびフィルムの欠陥検査方法

Related Parent Applications (1)

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JP2001059713A Division JP4440485B2 (ja) 2000-03-08 2001-03-05 フィルムの欠陥検査装置、欠陥検査システムおよび欠陥検査方法ならびに複屈折特性を有するフィルムの製造方法

Related Child Applications (1)

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JP2012084234A Division JP2012137502A (ja) 2000-03-08 2012-04-02 複屈折特性を有する部材の検査方法および複屈折特性を有する部材の製造方法

Publications (2)

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JP2008151814A true JP2008151814A (ja) 2008-07-03
JP2008151814A5 JP2008151814A5 (enExample) 2009-09-03

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JP2008071132A Pending JP2008151814A (ja) 2000-03-08 2008-03-19 フィルムの欠陥検査装置およびフィルムの欠陥検査方法
JP2012084234A Abandoned JP2012137502A (ja) 2000-03-08 2012-04-02 複屈折特性を有する部材の検査方法および複屈折特性を有する部材の製造方法

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JP2012084234A Abandoned JP2012137502A (ja) 2000-03-08 2012-04-02 複屈折特性を有する部材の検査方法および複屈折特性を有する部材の製造方法

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US (1) US6650410B2 (enExample)
JP (2) JP2008151814A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013089028A1 (ja) * 2011-12-14 2013-06-20 シャープ株式会社 液晶表示パネルの検査方法および検査装置

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7113627B1 (en) * 2000-08-09 2006-09-26 Eastman Kodak Company Location of extended linear defects
TW200506375A (en) * 2003-05-16 2005-02-16 Tokyo Electron Ltd Inspection apparatus
US20050264585A1 (en) * 2004-05-26 2005-12-01 Trombley Michael G Visual display transformation
JP4869053B2 (ja) * 2006-01-11 2012-02-01 日東電工株式会社 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置
JP4960026B2 (ja) * 2006-06-09 2012-06-27 富士フイルム株式会社 フイルムの欠陥検査装置及びフイルムの製造方法
JP5248052B2 (ja) * 2006-10-11 2013-07-31 日東電工株式会社 光学フィルムを有するシート状製品の欠点検査装置、その検査データ処理装置、その切断装置及びその製造システム
JP5258349B2 (ja) * 2008-03-28 2013-08-07 富士フイルム株式会社 欠陥検出装置及び方法
KR101676333B1 (ko) * 2008-03-28 2016-11-15 후지필름 가부시키가이샤 결함 검출 방법 및 장치
KR101291843B1 (ko) * 2008-12-19 2013-07-31 엘지디스플레이 주식회사 액정표시장치의 검사장치 및 그의 검사방법
WO2011148790A1 (ja) * 2010-05-25 2011-12-01 東レ株式会社 フィルムの欠陥検査装置、欠陥検査方法および離型フィルム
CN101881848B (zh) * 2010-07-01 2012-07-18 深圳超多维光电子有限公司 一种双折射透镜光栅的制造及检测装置以及方法
KR101294220B1 (ko) * 2011-11-21 2013-08-07 동우 화인켐 주식회사 패턴화 리타더의 영상 획득 장치
JP2013205091A (ja) * 2012-03-27 2013-10-07 Dainippon Printing Co Ltd フィルム検査システム、フィルム検査方法
CN105866986B (zh) * 2016-05-26 2019-09-20 明基材料有限公司 检测装置及检测方法
CN106597700A (zh) * 2016-12-06 2017-04-26 惠科股份有限公司 检测方法及其应用的检测设备
JP6924645B2 (ja) * 2017-07-31 2021-08-25 日東電工株式会社 偏光フィルムの撮像装置、及び検査装置、並びに検査方法
TWI629665B (zh) * 2017-11-24 2018-07-11 住華科技股份有限公司 缺陷檢查方法及缺陷檢測系統
CN108507953B (zh) * 2018-04-02 2021-01-29 凌云光技术股份有限公司 一种带膜组件自有缺陷检测方法及装置
CN114096833B (zh) * 2019-07-16 2024-05-10 柯尼卡美能达株式会社 相位差膜的取向不均缺陷检测方法以及取向不均缺陷检测装置
KR20220023874A (ko) * 2020-08-20 2022-03-03 삼성디스플레이 주식회사 표시 장치 광학 성능 테스트용 광학 검사 기기 및 이를 이용한 광학 검사 방법

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01169343A (ja) * 1987-12-25 1989-07-04 Nippon Sheet Glass Co Ltd ガラス板の切口欠点検出装置
JPH0339715A (ja) * 1989-07-06 1991-02-20 Matsushita Electric Ind Co Ltd 液晶表示装置
JPH0357943A (ja) * 1989-07-27 1991-03-13 Mitsubishi Electric Corp 疵検出装置
JPH04364446A (ja) * 1991-06-12 1992-12-16 Sekisui Chem Co Ltd 欠陥検査装置
JPH09166518A (ja) * 1995-10-11 1997-06-24 Asahi Optical Co Ltd 光学部材検査装置
JPH10333139A (ja) * 1997-05-27 1998-12-18 Nippon Oil Co Ltd 液晶表示素子
JP2000028546A (ja) * 1998-07-08 2000-01-28 Fuji Photo Film Co Ltd 光学補償フィルムの欠陥検査方法及び装置

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JPS6428547A (en) * 1987-07-23 1989-01-31 Kobe Steel Ltd Surface flaw detection for material to be detected
JPH0412257A (ja) * 1990-04-27 1992-01-16 Kawasaki Steel Corp 鋼板の線状疵の検出方法及びその装置
JPH0611710A (ja) * 1992-04-27 1994-01-21 Kanegafuchi Chem Ind Co Ltd 液晶表示素子
JP2565644B2 (ja) 1992-11-18 1996-12-18 富士写真フイルム株式会社 光学異方素子及びその製造方法
JPH0915586A (ja) * 1995-06-29 1997-01-17 Nec Corp 液晶表示装置
JPH0970568A (ja) * 1995-09-04 1997-03-18 Fuji Photo Film Co Ltd 長尺状光学補償シートの製造方法
US5948487A (en) * 1997-09-05 1999-09-07 3M Innovative Properties Company Anisotropic retardation layers for display devices

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01169343A (ja) * 1987-12-25 1989-07-04 Nippon Sheet Glass Co Ltd ガラス板の切口欠点検出装置
JPH0339715A (ja) * 1989-07-06 1991-02-20 Matsushita Electric Ind Co Ltd 液晶表示装置
JPH0357943A (ja) * 1989-07-27 1991-03-13 Mitsubishi Electric Corp 疵検出装置
JPH04364446A (ja) * 1991-06-12 1992-12-16 Sekisui Chem Co Ltd 欠陥検査装置
JPH09166518A (ja) * 1995-10-11 1997-06-24 Asahi Optical Co Ltd 光学部材検査装置
JPH10333139A (ja) * 1997-05-27 1998-12-18 Nippon Oil Co Ltd 液晶表示素子
JP2000028546A (ja) * 1998-07-08 2000-01-28 Fuji Photo Film Co Ltd 光学補償フィルムの欠陥検査方法及び装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013089028A1 (ja) * 2011-12-14 2013-06-20 シャープ株式会社 液晶表示パネルの検査方法および検査装置

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US20010021016A1 (en) 2001-09-13
JP2012137502A (ja) 2012-07-19
US6650410B2 (en) 2003-11-18

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