JP2007248460A5 - - Google Patents

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Publication number
JP2007248460A5
JP2007248460A5 JP2007045642A JP2007045642A JP2007248460A5 JP 2007248460 A5 JP2007248460 A5 JP 2007248460A5 JP 2007045642 A JP2007045642 A JP 2007045642A JP 2007045642 A JP2007045642 A JP 2007045642A JP 2007248460 A5 JP2007248460 A5 JP 2007248460A5
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JP
Japan
Prior art keywords
terminal
dut
lead
engaged
test
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Granted
Application number
JP2007045642A
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English (en)
Japanese (ja)
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JP5219383B2 (ja
JP2007248460A (ja
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Publication date
Priority claimed from US11/677,870 external-priority patent/US7639026B2/en
Application filed filed Critical
Publication of JP2007248460A publication Critical patent/JP2007248460A/ja
Publication of JP2007248460A5 publication Critical patent/JP2007248460A5/ja
Application granted granted Critical
Publication of JP5219383B2 publication Critical patent/JP5219383B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2007045642A 2006-02-24 2007-02-26 電子装置のテストセット Active JP5219383B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US77665406P 2006-02-24 2006-02-24
US60/776,654 2006-02-24
US11/677,870 US7639026B2 (en) 2006-02-24 2007-02-22 Electronic device test set and contact used therein
US11/677,870 2007-02-22

Publications (3)

Publication Number Publication Date
JP2007248460A JP2007248460A (ja) 2007-09-27
JP2007248460A5 true JP2007248460A5 (enExample) 2010-04-15
JP5219383B2 JP5219383B2 (ja) 2013-06-26

Family

ID=38110606

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007045642A Active JP5219383B2 (ja) 2006-02-24 2007-02-26 電子装置のテストセット

Country Status (8)

Country Link
US (1) US7639026B2 (enExample)
EP (2) EP1826575B1 (enExample)
JP (1) JP5219383B2 (enExample)
KR (1) KR101522027B1 (enExample)
CA (1) CA2579697A1 (enExample)
MY (1) MY154288A (enExample)
SG (1) SG135138A1 (enExample)
TW (1) TWI429913B (enExample)

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JP2009043591A (ja) * 2007-08-09 2009-02-26 Yamaichi Electronics Co Ltd Ｉｃソケット
US8278955B2 (en) 2008-03-24 2012-10-02 Interconnect Devices, Inc. Test interconnect
US20090267629A1 (en) * 2008-04-23 2009-10-29 J. Foong Technologies Sdn. Bhd. Contact for interconnect system in a test socket
US20090289647A1 (en) 2008-05-01 2009-11-26 Interconnect Devices, Inc. Interconnect system
MY155348A (en) 2008-06-12 2015-10-15 Multitest Elektronische Syst Contact base
JP5029969B2 (ja) * 2008-11-12 2012-09-19 山一電機株式会社 電気接続装置
TW201027849A (en) 2009-01-13 2010-07-16 Yi-Zhi Yang Connector
US9329204B2 (en) 2009-04-21 2016-05-03 Johnstech International Corporation Electrically conductive Kelvin contacts for microcircuit tester
US8558554B2 (en) 2009-04-21 2013-10-15 Johnstech International Corporation Electrically conductive Kelvin contacts for microcircuit tester
US8988090B2 (en) 2009-04-21 2015-03-24 Johnstech International Corporation Electrically conductive kelvin contacts for microcircuit tester
US9069011B2 (en) * 2009-09-11 2015-06-30 Exelon Generation Company, Llc Electrical terminal test point and methods of use
US9855735B2 (en) 2009-11-23 2018-01-02 Cyvek, Inc. Portable microfluidic assay devices and methods of manufacture and use
US9759718B2 (en) 2009-11-23 2017-09-12 Cyvek, Inc. PDMS membrane-confined nucleic acid and antibody/antigen-functionalized microlength tube capture elements, and systems employing them, and methods of their use
WO2013133899A1 (en) 2012-03-08 2013-09-12 Cyvek, Inc Microfluidic assay systems employing micro-particles and methods of manufacture
US9500645B2 (en) 2009-11-23 2016-11-22 Cyvek, Inc. Micro-tube particles for microfluidic assays and methods of manufacture
US10022696B2 (en) 2009-11-23 2018-07-17 Cyvek, Inc. Microfluidic assay systems employing micro-particles and methods of manufacture
US9700889B2 (en) 2009-11-23 2017-07-11 Cyvek, Inc. Methods and systems for manufacture of microarray assay systems, conducting microfluidic assays, and monitoring and scanning to obtain microfluidic assay results
US10065403B2 (en) 2009-11-23 2018-09-04 Cyvek, Inc. Microfluidic assay assemblies and methods of manufacture
CN102713621B (zh) 2009-11-23 2016-10-19 西维克公司 用于施行化验的方法和设备
WO2011145916A1 (en) * 2010-05-21 2011-11-24 Jf Microtechnology Sdn. Bhd. An electrical interconnect assembly and a test contact for an electrical interconnect assembly
USD668625S1 (en) * 2010-07-22 2012-10-09 Titan Semiconductor Tool, LLC Integrated circuit socket connector
JP2014516158A (ja) 2011-05-27 2014-07-07 ジェイエフ マイクロテクノロジ・スンディリアン・ブルハド 電気相互接続アッセンブリー
KR200455379Y1 (ko) * 2011-06-13 2011-09-01 나경화 반도체 칩 테스트용 핀 및 그를 포함한 반도체 칩 테스트용 소켓
US9274141B1 (en) * 2013-01-22 2016-03-01 Johnstech International Corporation Low resistance low wear test pin for test contactor
US10794933B1 (en) 2013-03-15 2020-10-06 Johnstech International Corporation Integrated circuit contact test apparatus with and method of construction
EP2985614A4 (en) * 2013-04-11 2016-12-21 Renesas Electronics Corp METHOD OF MANUFACTURING A SEMICONDUCTOR COMPONENT
TWI500222B (zh) * 2013-07-12 2015-09-11 Ccp Contact Probes Co Ltd 連接器組合
US10114039B1 (en) * 2015-04-24 2018-10-30 Johnstech International Corporation Selectively geometric shaped contact pin for electronic component testing and method of fabrication
US9343830B1 (en) * 2015-06-08 2016-05-17 Xcerra Corporation Integrated circuit chip tester with embedded micro link
US9958499B1 (en) 2015-07-07 2018-05-01 Johnstech International Corporation Constant stress pin tip for testing integrated circuit chips
US10436819B1 (en) 2015-07-07 2019-10-08 Johnstech International Corporation Constant pressure pin tip for testing integrated circuit chips
US10228367B2 (en) 2015-12-01 2019-03-12 ProteinSimple Segmented multi-use automated assay cartridge
JP2018091643A (ja) * 2016-11-30 2018-06-14 矢崎総業株式会社 磁界検出センサ
US11002760B1 (en) 2017-02-06 2021-05-11 Johnstech International Corporation High isolation housing for testing integrated circuits
CN111164434B (zh) 2017-09-25 2022-10-28 约翰国际有限公司 用于集成电路测试的具有测试引脚和壳体的高隔离接触器
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
US11906576B1 (en) 2021-05-04 2024-02-20 Johnstech International Corporation Contact assembly array and testing system having contact assembly array
US11867752B1 (en) 2021-05-13 2024-01-09 Johnstech International Corporation Contact assembly and kelvin testing system having contact assembly
KR20240104127A (ko) * 2021-11-03 2024-07-04 존스테크 인터내셔널 코포레이션 수직 백스톱을 갖는 하우징
USD1042345S1 (en) 2022-04-05 2024-09-17 Johnstech International Corporation Test pin
USD1042346S1 (en) 2022-04-05 2024-09-17 Johnstech International Corporation Contact pin for integrated circuit testing
USD1075695S1 (en) 2022-04-05 2025-05-20 Johnstech International Corporation Contact pin for integrated circuit testing
JP2024064692A (ja) * 2022-10-28 2024-05-14 株式会社日本マイクロニクス コンタクトピンおよび電気的接続装置

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US5207584A (en) * 1991-01-09 1993-05-04 Johnson David A Electrical interconnect contact system
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US5781022A (en) * 1991-06-04 1998-07-14 Micron Technology, Inc. Substrate having self limiting contacts for establishing an electrical connection with a semiconductor die
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JP3675989B2 (ja) * 1995-11-17 2005-07-27 株式会社テセック 電子部品用コネクタ
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JP2000228262A (ja) * 1999-02-08 2000-08-15 Mitsubishi Electric Corp テストソケットのピン及び溝形成方法
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JP2002093541A (ja) * 2000-09-19 2002-03-29 Miyazaki Oki Electric Co Ltd Ｉｃソケット
KR100351676B1 (ko) 2000-10-12 2002-09-05 주식회사 우영 콘택핀 및 이것을 구비한 집적회로 패키지 테스트용 소켓
US6854981B2 (en) * 2002-06-03 2005-02-15 Johnstech International Corporation Small pin connecters
US7059866B2 (en) * 2003-04-23 2006-06-13 Johnstech International Corporation integrated circuit contact to test apparatus
SG129245A1 (en) * 2003-04-29 2007-02-26 Tan Yin Leong Improved probe for integrated circuit test socket
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