KR101522027B1 - 전자 장치 테스트 세트 및 그 내에 사용되는 컨택트 - Google Patents

전자 장치 테스트 세트 및 그 내에 사용되는 컨택트 Download PDF

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Publication number
KR101522027B1
KR101522027B1 KR1020070019224A KR20070019224A KR101522027B1 KR 101522027 B1 KR101522027 B1 KR 101522027B1 KR 1020070019224 A KR1020070019224 A KR 1020070019224A KR 20070019224 A KR20070019224 A KR 20070019224A KR 101522027 B1 KR101522027 B1 KR 101522027B1
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South Korea
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contact
contacts
dut
lead
engaged
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Korean (ko)
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KR20070088404A (ko
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비. 쉘 데니스
엘 질크 매튜
이. 로페즈 조세
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죤스테크 인터내셔날 코오포레이션
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020070019224A 2006-02-24 2007-02-26 전자 장치 테스트 세트 및 그 내에 사용되는 컨택트 Active KR101522027B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US77665406P 2006-02-24 2006-02-24
US60/776,654 2006-02-24
US11/677,870 2007-02-22
US11/677,870 US7639026B2 (en) 2006-02-24 2007-02-22 Electronic device test set and contact used therein

Publications (2)

Publication Number Publication Date
KR20070088404A KR20070088404A (ko) 2007-08-29
KR101522027B1 true KR101522027B1 (ko) 2015-05-20

Family

ID=38110606

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020070019224A Active KR101522027B1 (ko) 2006-02-24 2007-02-26 전자 장치 테스트 세트 및 그 내에 사용되는 컨택트

Country Status (8)

Country Link
US (1) US7639026B2 (enExample)
EP (2) EP1826575B1 (enExample)
JP (1) JP5219383B2 (enExample)
KR (1) KR101522027B1 (enExample)
CA (1) CA2579697A1 (enExample)
MY (1) MY154288A (enExample)
SG (1) SG135138A1 (enExample)
TW (1) TWI429913B (enExample)

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US8988090B2 (en) 2009-04-21 2015-03-24 Johnstech International Corporation Electrically conductive kelvin contacts for microcircuit tester
US9069011B2 (en) * 2009-09-11 2015-06-30 Exelon Generation Company, Llc Electrical terminal test point and methods of use
US9651568B2 (en) 2009-11-23 2017-05-16 Cyvek, Inc. Methods and systems for epi-fluorescent monitoring and scanning for microfluidic assays
US10065403B2 (en) 2009-11-23 2018-09-04 Cyvek, Inc. Microfluidic assay assemblies and methods of manufacture
WO2013134741A2 (en) 2012-03-08 2013-09-12 Cyvek, Inc. Methods and systems for manufacture of microarray assay systems, conducting microfluidic assays, and monitoring and scanning to obtain microfluidic assay results
US9855735B2 (en) 2009-11-23 2018-01-02 Cyvek, Inc. Portable microfluidic assay devices and methods of manufacture and use
US9500645B2 (en) 2009-11-23 2016-11-22 Cyvek, Inc. Micro-tube particles for microfluidic assays and methods of manufacture
US9229001B2 (en) 2009-11-23 2016-01-05 Cyvek, Inc. Method and apparatus for performing assays
US9759718B2 (en) 2009-11-23 2017-09-12 Cyvek, Inc. PDMS membrane-confined nucleic acid and antibody/antigen-functionalized microlength tube capture elements, and systems employing them, and methods of their use
US9700889B2 (en) 2009-11-23 2017-07-11 Cyvek, Inc. Methods and systems for manufacture of microarray assay systems, conducting microfluidic assays, and monitoring and scanning to obtain microfluidic assay results
WO2011145916A1 (en) * 2010-05-21 2011-11-24 Jf Microtechnology Sdn. Bhd. An electrical interconnect assembly and a test contact for an electrical interconnect assembly
USD668625S1 (en) * 2010-07-22 2012-10-09 Titan Semiconductor Tool, LLC Integrated circuit socket connector
WO2012165936A1 (en) * 2011-05-27 2012-12-06 Jf Microtechnology Sdn. Bhd. An electrical interconnect assembly
KR200455379Y1 (ko) * 2011-06-13 2011-09-01 나경화 반도체 칩 테스트용 핀 및 그를 포함한 반도체 칩 테스트용 소켓
US9274141B1 (en) * 2013-01-22 2016-03-01 Johnstech International Corporation Low resistance low wear test pin for test contactor
US10794933B1 (en) 2013-03-15 2020-10-06 Johnstech International Corporation Integrated circuit contact test apparatus with and method of construction
JP6234441B2 (ja) * 2013-04-11 2017-11-22 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
TWI500222B (zh) * 2013-07-12 2015-09-11 Ccp Contact Probes Co Ltd 連接器組合
US10114039B1 (en) * 2015-04-24 2018-10-30 Johnstech International Corporation Selectively geometric shaped contact pin for electronic component testing and method of fabrication
US9343830B1 (en) * 2015-06-08 2016-05-17 Xcerra Corporation Integrated circuit chip tester with embedded micro link
US10436819B1 (en) 2015-07-07 2019-10-08 Johnstech International Corporation Constant pressure pin tip for testing integrated circuit chips
US9958499B1 (en) 2015-07-07 2018-05-01 Johnstech International Corporation Constant stress pin tip for testing integrated circuit chips
US10228367B2 (en) 2015-12-01 2019-03-12 ProteinSimple Segmented multi-use automated assay cartridge
JP2018091643A (ja) * 2016-11-30 2018-06-14 矢崎総業株式会社 磁界検出センサ
US11002760B1 (en) 2017-02-06 2021-05-11 Johnstech International Corporation High isolation housing for testing integrated circuits
MX2020007325A (es) 2017-09-25 2021-01-29 Johnstech Int Corp Contactor de alto grado de aislamiento con clavija de prueba y carcasa para probar circuitos integrados.
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
US11906576B1 (en) 2021-05-04 2024-02-20 Johnstech International Corporation Contact assembly array and testing system having contact assembly array
US11867752B1 (en) 2021-05-13 2024-01-09 Johnstech International Corporation Contact assembly and kelvin testing system having contact assembly
KR20240104127A (ko) 2021-11-03 2024-07-04 존스테크 인터내셔널 코포레이션 수직 백스톱을 갖는 하우징
USD1042345S1 (en) 2022-04-05 2024-09-17 Johnstech International Corporation Test pin
USD1042346S1 (en) 2022-04-05 2024-09-17 Johnstech International Corporation Contact pin for integrated circuit testing
USD1075695S1 (en) 2022-04-05 2025-05-20 Johnstech International Corporation Contact pin for integrated circuit testing
JP2024064692A (ja) * 2022-10-28 2024-05-14 株式会社日本マイクロニクス コンタクトピンおよび電気的接続装置

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KR20000057821A (ko) * 1999-01-29 2000-09-25 가부시키가이샤 어드밴티스트 컨택트 구조물의 패키징 및 상호 접속부
KR20000076017A (ko) * 1997-03-06 2000-12-26 플라둥, 만프레드 케이블을 테이크 업 또는 스토잉하기 위한 장치
US20040248448A1 (en) * 2003-04-23 2004-12-09 Gilk Mathew L. Small contactor pin

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KR20000076017A (ko) * 1997-03-06 2000-12-26 플라둥, 만프레드 케이블을 테이크 업 또는 스토잉하기 위한 장치
KR20000057821A (ko) * 1999-01-29 2000-09-25 가부시키가이샤 어드밴티스트 컨택트 구조물의 패키징 및 상호 접속부
US20040248448A1 (en) * 2003-04-23 2004-12-09 Gilk Mathew L. Small contactor pin

Also Published As

Publication number Publication date
JP5219383B2 (ja) 2013-06-26
EP2463666A3 (en) 2012-08-29
KR20070088404A (ko) 2007-08-29
EP1826575A3 (en) 2009-06-03
EP1826575A2 (en) 2007-08-29
EP1826575B1 (en) 2012-02-08
JP2007248460A (ja) 2007-09-27
TW200741210A (en) 2007-11-01
MY154288A (en) 2015-05-29
EP2463666A2 (en) 2012-06-13
US7639026B2 (en) 2009-12-29
SG135138A1 (en) 2007-09-28
TWI429913B (zh) 2014-03-11
US20070236236A1 (en) 2007-10-11
CA2579697A1 (en) 2007-08-24

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