MX2020007325A - Contactor de alto grado de aislamiento con clavija de prueba y carcasa para probar circuitos integrados. - Google Patents

Contactor de alto grado de aislamiento con clavija de prueba y carcasa para probar circuitos integrados.

Info

Publication number
MX2020007325A
MX2020007325A MX2020007325A MX2020007325A MX2020007325A MX 2020007325 A MX2020007325 A MX 2020007325A MX 2020007325 A MX2020007325 A MX 2020007325A MX 2020007325 A MX2020007325 A MX 2020007325A MX 2020007325 A MX2020007325 A MX 2020007325A
Authority
MX
Mexico
Prior art keywords
integrated circuit
pin
housing
test pin
circuit testing
Prior art date
Application number
MX2020007325A
Other languages
English (en)
Inventor
Jeffrey Sherry
Michael Andres
Original Assignee
Johnstech Int Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johnstech Int Corporation filed Critical Johnstech Int Corporation
Publication of MX2020007325A publication Critical patent/MX2020007325A/es

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/7076—Coupling devices for connection between PCB and component, e.g. display
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/82—Coupling devices connected with low or zero insertion force
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2435—Contacts for co-operating by abutting resilient; resiliently-mounted with opposite contact points, e.g. C beam
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Abstract

Un socket de prueba para una prueba de un circuito integrado con la impedancia controlada, mientras que se mantiene la integridad estructural de las clavijas de prueba. La clavija puede tener una pared lateral con una porción gruesa y una porción más delgada a lo largo de la longitud de la clavija. La clavija puede tener proyecciones que proporcionan un saliente desde la ranura. Las paredes laterales por sí mismas pueden tener proyecciones o tierras que se extienden en la ranura y que proporcionan estabilidad para la clavija.
MX2020007325A 2017-09-25 2018-09-25 Contactor de alto grado de aislamiento con clavija de prueba y carcasa para probar circuitos integrados. MX2020007325A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762562705P 2017-09-25 2017-09-25
PCT/US2018/052577 WO2019060877A1 (en) 2017-09-25 2018-09-25 HIGH TEST PIN INSULATION SWITCH AND INTEGRATED CIRCUIT TEST HOUSING

Publications (1)

Publication Number Publication Date
MX2020007325A true MX2020007325A (es) 2021-01-29

Family

ID=65808075

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2020007325A MX2020007325A (es) 2017-09-25 2018-09-25 Contactor de alto grado de aislamiento con clavija de prueba y carcasa para probar circuitos integrados.

Country Status (8)

Country Link
US (2) US10686269B2 (es)
EP (1) EP3688476A4 (es)
CN (1) CN111164434B (es)
MX (1) MX2020007325A (es)
PH (1) PH12020500438A1 (es)
SG (1) SG11202000790YA (es)
TW (1) TWI805621B (es)
WO (1) WO2019060877A1 (es)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102466454B1 (ko) * 2019-08-29 2022-11-14 주식회사 아이에스시 검사용 소켓
MY197431A (en) * 2020-06-11 2023-06-17 Jf Microtechnology Sdn Bhd Short interconnect assembly with strip elastomer
IL301693A (en) * 2020-10-02 2023-05-01 Johnstech Int Corporation A house with anti-disposal capability
CN116030053B (zh) * 2023-03-27 2023-06-16 中江立江电子有限公司 一种连接器引脚缺陷检测方法、装置、设备及介质

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US4607907A (en) * 1984-08-24 1986-08-26 Burndy Corporation Electrical connector requiring low mating force
JP2784570B2 (ja) * 1987-06-09 1998-08-06 日本テキサス・インスツルメンツ 株式会社 ソケツト
US5207584A (en) * 1991-01-09 1993-05-04 Johnson David A Electrical interconnect contact system
US5069629A (en) * 1991-01-09 1991-12-03 Johnson David A Electrical interconnect contact system
JPH0734378B2 (ja) * 1991-03-15 1995-04-12 山一電機株式会社 載接形コンタクト
US5192215A (en) * 1991-10-17 1993-03-09 Amp Incorporated Electrical socket for leaded chip carriers
US5511984A (en) * 1994-02-08 1996-04-30 Berg Technology, Inc. Electrical connector
US5609489A (en) * 1994-12-21 1997-03-11 Hewlett-Packard Company Socket for contacting an electronic circuit during testing
CN1087511C (zh) 1995-02-07 2002-07-10 约翰国际有限公司 在电接触中提供可控阻抗的设备
US6203329B1 (en) * 1995-07-07 2001-03-20 Johnstech International Corporation Impedance controlled interconnection device
JP3838381B2 (ja) * 1995-11-22 2006-10-25 株式会社アドバンテスト プローブカード
US6529025B1 (en) * 1997-09-18 2003-03-04 Johnstech International Corporation Electrical continuity enhancement for sockets/contactors
JP3443687B2 (ja) * 2001-02-19 2003-09-08 株式会社エンプラス 電気部品用ソケット
JP4721580B2 (ja) * 2001-09-11 2011-07-13 株式会社センサータ・テクノロジーズジャパン ソケット
JP4721582B2 (ja) * 2001-09-14 2011-07-13 株式会社センサータ・テクノロジーズジャパン ソケット
US6936917B2 (en) * 2001-09-26 2005-08-30 Molex Incorporated Power delivery connector for integrated circuits utilizing integrated capacitors
JP3566691B2 (ja) * 2001-12-17 2004-09-15 日本テキサス・インスツルメンツ株式会社 半導体装置用ソケットおよび半導体装置のソケットへの取付け方法
US7059866B2 (en) * 2003-04-23 2006-06-13 Johnstech International Corporation integrated circuit contact to test apparatus
DE10343256B4 (de) * 2003-09-17 2006-08-10 Infineon Technologies Ag Anordnung zur Herstellung einer elektrischen Verbindung zwischen einem BGA-Package und einer Signalquelle, sowie Verfahren zum Herstellen einer solchen Verbindung
JP2005327628A (ja) * 2004-05-14 2005-11-24 Three M Innovative Properties Co Ｉｃソケット
US7625219B2 (en) * 2005-04-21 2009-12-01 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus
US7445465B2 (en) * 2005-07-08 2008-11-04 Johnstech International Corporation Test socket
US7347740B2 (en) * 2005-11-21 2008-03-25 Fci Americas Technology, Inc. Mechanically robust lead frame assembly for an electrical connector
US7639026B2 (en) 2006-02-24 2009-12-29 Johnstech International Corporation Electronic device test set and contact used therein
US7737708B2 (en) * 2006-05-11 2010-06-15 Johnstech International Corporation Contact for use in testing integrated circuits
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Also Published As

Publication number Publication date
TW201932860A (zh) 2019-08-16
US20190097333A1 (en) 2019-03-28
PH12020500438A1 (en) 2021-01-25
SG11202000790YA (en) 2020-02-27
EP3688476A4 (en) 2021-08-04
US20200313322A1 (en) 2020-10-01
CN111164434B (zh) 2022-10-28
EP3688476A1 (en) 2020-08-05
US10686269B2 (en) 2020-06-16
TWI805621B (zh) 2023-06-21
CN111164434A (zh) 2020-05-15
US11183783B2 (en) 2021-11-23
WO2019060877A1 (en) 2019-03-28

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