JP2007165714A - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
- Publication number
- JP2007165714A JP2007165714A JP2005362068A JP2005362068A JP2007165714A JP 2007165714 A JP2007165714 A JP 2007165714A JP 2005362068 A JP2005362068 A JP 2005362068A JP 2005362068 A JP2005362068 A JP 2005362068A JP 2007165714 A JP2007165714 A JP 2007165714A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- connection plate
- semiconductor device
- lead
- semiconductor chip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
- H01L23/49562—Geometry of the lead-frame for devices being provided for in H01L29/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49517—Additional leads
- H01L23/49524—Additional leads the additional leads being a tape carrier or flat leads
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L24/36—Structure, shape, material or disposition of the strap connectors prior to the connecting process
- H01L24/37—Structure, shape, material or disposition of the strap connectors prior to the connecting process of an individual strap connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L24/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L24/40—Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/84—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a strap connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/0601—Structure
- H01L2224/0603—Bonding areas having different sizes, e.g. different heights or widths
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/061—Disposition
- H01L2224/0618—Disposition being disposed on at least two different sides of the body, e.g. dual array
- H01L2224/06181—On opposite sides of the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/36—Structure, shape, material or disposition of the strap connectors prior to the connecting process
- H01L2224/37—Structure, shape, material or disposition of the strap connectors prior to the connecting process of an individual strap connector
- H01L2224/37001—Core members of the connector
- H01L2224/37099—Material
- H01L2224/371—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/36—Structure, shape, material or disposition of the strap connectors prior to the connecting process
- H01L2224/37—Structure, shape, material or disposition of the strap connectors prior to the connecting process of an individual strap connector
- H01L2224/37001—Core members of the connector
- H01L2224/37099—Material
- H01L2224/371—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/37138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/37147—Copper [Cu] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/36—Structure, shape, material or disposition of the strap connectors prior to the connecting process
- H01L2224/37—Structure, shape, material or disposition of the strap connectors prior to the connecting process of an individual strap connector
- H01L2224/3754—Coating
- H01L2224/37599—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L2224/40—Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
- H01L2224/4005—Shape
- H01L2224/4009—Loop shape
- H01L2224/40095—Kinked
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L2224/40—Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
- H01L2224/401—Disposition
- H01L2224/40151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/40221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/40245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L2224/40—Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
- H01L2224/401—Disposition
- H01L2224/40151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/40221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/40245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/40247—Connecting the strap to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/4501—Shape
- H01L2224/45012—Cross-sectional shape
- H01L2224/45015—Cross-sectional shape being circular
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/45124—Aluminium (Al) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73219—Layer and TAB connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73221—Strap and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/83801—Soldering or alloying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/84—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a strap connector
- H01L2224/8434—Bonding interfaces of the connector
- H01L2224/84345—Shape, e.g. interlocking features
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/84—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a strap connector
- H01L2224/848—Bonding techniques
- H01L2224/84801—Soldering or alloying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/84—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a strap connector
- H01L2224/848—Bonding techniques
- H01L2224/8485—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01015—Phosphorus [P]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01027—Cobalt [Co]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01047—Silver [Ag]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/2076—Diameter ranges equal to or larger than 100 microns
Abstract
パワートランジスタが組み込まれた半導体装置内部における接続板の移動による導電性接着材の厚さ減少による接続信頼性低下を抑制する。
【解決手段】
リードポストと接続される接続板の薄肉部に段差を設け、この段差とリードポスト先端面が接触することで接続板が係止される。また、接続板の薄肉部に溝を設け、この溝より先端側のみをリードポストと接続することで接続板が係止される。
【選択図】 図6
Description
これは、例えば接着材にはんだを用いる場合、はんだの濡れ拡がり性を考慮して実現可能となる。
(1)第1の電極と第2の電極とを電気的に接続する接続板を有する半導体装置において、前記接続板の前記第1の電極もしくは第2の電極との接続部に段差が設けられ、前記第1の電極もしくは第2の電極と前記段差との間が導電性の接着材で接続され、前記接続板が前記段差により前記第1の電極もしくは第2の電極に係止されていることを特徴とする半導体装置。
(2)第1の電極と第2の電極とを電気的に接続する接続板を有する半導体装置において、前記接続板の前記第1の電極もしくは第2の電極との接続部に溝が設けられ、前期第1の電極もしくは第2の電極と前記溝よりも外側が導電性の接着材で接続され、前記接続板が前記第1の電極もしくは第2の電極に係止されていることを特徴とする半導体装置。
なお、段差22の大きさは、接続板18が係止されればどのような大きさであってもよい。
なお、溝23の大きさは、接続板24が係止されていればどのような大きさであってもよい。
2…支持基板(ヘッダ)
3…封止体
4…ゲートリード
5…ソースリード
6…ドレインリード
7…孔
8…半導体チップ
9…接着材(半導体チップとヘッダ)
10…ワイヤ
11…接続板(従来)
12…厚肉部
13…薄肉部
14…接着材(接続板と半導体チップ)
15…接着材(ソースリードと接続板)
16…リードポスト(ソース)
17…リードポスト(ゲート)
18…接続板(実施例1)
19…ドレイン電極
20…ソース電極
21…ゲート電極
22…段差
23…溝
24…接続板(実施例2)
Claims (9)
- 第1の電極と第2の電極とを電気的に接続する接続板を有する半導体装置において、前記接続板の前記第1の電極もしくは第2の電極との接続部に段差が設けられ、前記第1の電極もしくは第2の電極と前記段差との間が導電性の接着材で接続され、前記接続板が前記段差により前記第1の電極もしくは第2の電極に係止されていることを特徴とする半導体装置。
- 第1の電極と第2の電極とを電気的に接続する接続板を有する半導体装置において、前記接続板の前記第1の電極もしくは第2の電極との接続部に溝が設けられ、前記第1の電極もしくは第2の電極と前記溝よりも外側が導電性の接着材で接続され、前記接続板が前期第1の電極もしくは第2の電極に係止されていることを特徴とする半導体装置。
- 互いに反対側に位置する主面及び裏面と、前記裏面に設けられた第1の電極と、前記主面に設けられた第2の電極とを有する半導体チップと、
第1の接着材を介在して前記半導体チップの第1の電極が接着された支持基板と、
前記半導体チップの周囲に配置されたリードと、
前記半導体チップの第2の電極に第2の接着材を介在して接着され、前記リードに第3の接着材を介在して接着された接続板とを有し、
前記接続板には、前記第3の接着材の濡れ広がり及び凝縮による前記接続板の前記リード側への移動を抑制する段差が設けられていることを特徴とする半導体装置。 - 互いに反対側に位置する主面及び裏面と、前記裏面に設けられた第1の電極と、前記主面に設けられた第2の電極とを有する半導体チップと、
第1の接着材を介在して前記半導体チップの第1の電極が接着された支持基板と、
前記半導体チップの周囲に配置されたリードと、
前記半導体チップの第2の電極に第2の接着材を介在して接着され、前記リードに第3の接着材を介在して接着された接続板とを有し、
前記接続板には、前記第3の接着材の濡れ広がり及び凝縮による前記接続板の前記リード側への移動を抑制する溝が設けられていることを特徴とする半導体装置。 - 請求項3に記載の半導体装置において、
前記接続板は、前記半導体チップの第2の電極と接続される厚肉部と、この厚肉部に連なり、前記リードと接続される薄肉部とを有し、かつ前記厚肉部及び前記薄肉部の上面が平坦になっており、
前記段差は、前記接続板の薄肉部の下面側に設けられていることを特徴とする半導体装置。 - 請求項4に記載の半導体装置において、
前記接続板は、前記半導体チップの第2の電極と接続される厚肉部と、この厚肉部に連なり、前記リードと接続される薄肉部とを有し、かつ前記厚肉部及び前記薄肉部の上面が平坦になっており、
前記溝は、前記接続板の薄肉部の下面側に設けられていることを特徴とする半導体装置。 - 請求項3又は4に記載の半導体装置において、
前記第1乃至第3の接着材は、はんだであることを特徴とする半導体装置。 - 請求項3又は4に記載の半導体装置において、
前記リードの先端は、幅が広いリードポストになり、
前記接続板は、前記リードポストに接続されていることを特徴とする半導体装置。 - 請求項3又は4に記載の半導体装置において、
前記支持板、前記半導体チップ、前記リード、及び前記接続板は、樹脂から成る封止体によって封止され、
前記リードは、前記封止体の側面から突出し、
前記支持板は、前記封止体の下面から露出していることを特徴とする半導体装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005362068A JP2007165714A (ja) | 2005-12-15 | 2005-12-15 | 半導体装置 |
US11/640,161 US20070176266A1 (en) | 2005-12-15 | 2006-12-15 | Semiconductor device |
US13/043,319 US20110156274A1 (en) | 2005-12-15 | 2011-03-08 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005362068A JP2007165714A (ja) | 2005-12-15 | 2005-12-15 | 半導体装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011041954A Division JP2011109144A (ja) | 2011-02-28 | 2011-02-28 | 半導体装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2007165714A true JP2007165714A (ja) | 2007-06-28 |
Family
ID=38248246
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005362068A Pending JP2007165714A (ja) | 2005-12-15 | 2005-12-15 | 半導体装置 |
Country Status (2)
Country | Link |
---|---|
US (2) | US20070176266A1 (ja) |
JP (1) | JP2007165714A (ja) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012069640A (ja) * | 2010-09-22 | 2012-04-05 | Toshiba Corp | 半導体装置及び電力用半導体装置 |
JP2014192292A (ja) * | 2013-03-27 | 2014-10-06 | Rohm Co Ltd | 半導体装置および半導体装置の製造方法 |
WO2015125772A1 (ja) * | 2014-02-24 | 2015-08-27 | 三菱電機株式会社 | 電極リードおよび半導体装置 |
US9966327B2 (en) | 2014-11-27 | 2018-05-08 | Shindengen Electric Manufacturing Co., Ltd. | Lead frame, semiconductor device, method for manufacturing lead frame, and method for manufacturing semiconductor device |
CN113113379A (zh) * | 2021-04-13 | 2021-07-13 | 马鞍山市槟城电子有限公司 | 芯片封装结构 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8686554B2 (en) * | 2007-03-13 | 2014-04-01 | International Rectifier Corporation | Vertically mountable semiconductor device package |
JP5947537B2 (ja) | 2011-04-19 | 2016-07-06 | トヨタ自動車株式会社 | 半導体装置及びその製造方法 |
US8847384B2 (en) * | 2012-10-15 | 2014-09-30 | Toyota Motor Engineering & Manufacturing North America, Inc. | Power modules and power module arrays having a modular design |
JP2015144188A (ja) * | 2014-01-31 | 2015-08-06 | 株式会社東芝 | 半導体装置及びその製造方法 |
TWM549451U (zh) * | 2017-05-09 | 2017-09-21 | Taiwan Semiconductor Co Ltd | 具有封裝體卡固結構之晶片封裝元件 |
CN111316428B (zh) * | 2017-10-26 | 2023-10-20 | 新电元工业株式会社 | 半导体装置以及半导体装置的制造方法 |
EP3503179A1 (en) | 2017-12-20 | 2019-06-26 | Nexperia B.V. | Electronic device |
JP2022146340A (ja) * | 2021-03-22 | 2022-10-05 | 株式会社東芝 | 半導体装置 |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63266859A (ja) * | 1987-04-24 | 1988-11-02 | Hitachi Ltd | 電子装置 |
JPH0547975A (ja) * | 1990-09-25 | 1993-02-26 | Sanyo Electric Co Ltd | リードフレームおよび表面実装型半導体装置 |
JPH05235228A (ja) * | 1991-02-28 | 1993-09-10 | Sanken Electric Co Ltd | 電子部品の製造方法 |
JPH09283653A (ja) * | 1996-04-17 | 1997-10-31 | Nec Corp | 半導体容器 |
JP2003046049A (ja) * | 2001-08-02 | 2003-02-14 | Nec Kansai Ltd | 半導体装置 |
JP2003133497A (ja) * | 2001-10-29 | 2003-05-09 | Toshiba Components Co Ltd | 薄型半導体素子 |
JP2004031516A (ja) * | 2002-06-24 | 2004-01-29 | Toshiba Components Co Ltd | コネクター型半導体素子 |
JP2004228461A (ja) * | 2003-01-27 | 2004-08-12 | Mitsubishi Electric Corp | 半導体装置 |
JP2005019948A (ja) * | 2003-06-03 | 2005-01-20 | Himeji Toshiba Ep Corp | リードフレーム及びそれを用いた電子部品 |
JP2005243685A (ja) * | 2004-02-24 | 2005-09-08 | Renesas Technology Corp | 半導体装置 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0837252A (ja) * | 1994-07-22 | 1996-02-06 | Nec Corp | 半導体装置 |
TW451392B (en) * | 2000-05-18 | 2001-08-21 | Siliconix Taiwan Ltd | Leadframe connecting method of power transistor |
US6566164B1 (en) * | 2000-12-07 | 2003-05-20 | Amkor Technology, Inc. | Exposed copper strap in a semiconductor package |
JP3563387B2 (ja) * | 2001-01-23 | 2004-09-08 | Necエレクトロニクス株式会社 | 半導体装置用導電性硬化樹脂及び半導体装置 |
US20020182773A1 (en) * | 2001-06-04 | 2002-12-05 | Walsin Advanced Electronics Ltd | Method for bonding inner leads of leadframe to substrate |
US20040080028A1 (en) * | 2002-09-05 | 2004-04-29 | Kabushiki Kaisha Toshiba | Semiconductor device with semiconductor chip mounted in package |
US7394150B2 (en) * | 2004-11-23 | 2008-07-01 | Siliconix Incorporated | Semiconductor package including die interposed between cup-shaped lead frame and lead frame having mesas and valleys |
US20070057368A1 (en) * | 2005-09-13 | 2007-03-15 | Yueh-Se Ho | Semiconductor package having plate interconnections |
-
2005
- 2005-12-15 JP JP2005362068A patent/JP2007165714A/ja active Pending
-
2006
- 2006-12-15 US US11/640,161 patent/US20070176266A1/en not_active Abandoned
-
2011
- 2011-03-08 US US13/043,319 patent/US20110156274A1/en not_active Abandoned
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63266859A (ja) * | 1987-04-24 | 1988-11-02 | Hitachi Ltd | 電子装置 |
JPH0547975A (ja) * | 1990-09-25 | 1993-02-26 | Sanyo Electric Co Ltd | リードフレームおよび表面実装型半導体装置 |
JPH05235228A (ja) * | 1991-02-28 | 1993-09-10 | Sanken Electric Co Ltd | 電子部品の製造方法 |
JPH09283653A (ja) * | 1996-04-17 | 1997-10-31 | Nec Corp | 半導体容器 |
JP2003046049A (ja) * | 2001-08-02 | 2003-02-14 | Nec Kansai Ltd | 半導体装置 |
JP2003133497A (ja) * | 2001-10-29 | 2003-05-09 | Toshiba Components Co Ltd | 薄型半導体素子 |
JP2004031516A (ja) * | 2002-06-24 | 2004-01-29 | Toshiba Components Co Ltd | コネクター型半導体素子 |
JP2004228461A (ja) * | 2003-01-27 | 2004-08-12 | Mitsubishi Electric Corp | 半導体装置 |
JP2005019948A (ja) * | 2003-06-03 | 2005-01-20 | Himeji Toshiba Ep Corp | リードフレーム及びそれを用いた電子部品 |
JP2005243685A (ja) * | 2004-02-24 | 2005-09-08 | Renesas Technology Corp | 半導体装置 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012069640A (ja) * | 2010-09-22 | 2012-04-05 | Toshiba Corp | 半導体装置及び電力用半導体装置 |
JP2014192292A (ja) * | 2013-03-27 | 2014-10-06 | Rohm Co Ltd | 半導体装置および半導体装置の製造方法 |
WO2015125772A1 (ja) * | 2014-02-24 | 2015-08-27 | 三菱電機株式会社 | 電極リードおよび半導体装置 |
US9966327B2 (en) | 2014-11-27 | 2018-05-08 | Shindengen Electric Manufacturing Co., Ltd. | Lead frame, semiconductor device, method for manufacturing lead frame, and method for manufacturing semiconductor device |
CN113113379A (zh) * | 2021-04-13 | 2021-07-13 | 马鞍山市槟城电子有限公司 | 芯片封装结构 |
Also Published As
Publication number | Publication date |
---|---|
US20070176266A1 (en) | 2007-08-02 |
US20110156274A1 (en) | 2011-06-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP2007165714A (ja) | 半導体装置 | |
JP3868777B2 (ja) | 半導体装置 | |
JP5558714B2 (ja) | 半導体パッケージ | |
JP6686691B2 (ja) | 電子装置 | |
US9935074B2 (en) | Semiconductor device and method for manufacturing same | |
KR100536115B1 (ko) | 전력 반도체장치 | |
EP3690938B1 (en) | Semiconductor device and production method therefor | |
JP6206494B2 (ja) | 半導体装置 | |
JPWO2013171946A1 (ja) | 半導体装置の製造方法および半導体装置 | |
JP6086055B2 (ja) | 半導体装置 | |
JP2007073782A (ja) | 大電力用半導体装置 | |
CN109698179B (zh) | 半导体装置及半导体装置的制造方法 | |
JP5869285B2 (ja) | 半導体装置 | |
US9161479B2 (en) | Power module package and method for manufacturing the same | |
JP2005243685A (ja) | 半導体装置 | |
CN111354709B (zh) | 半导体装置及其制造方法 | |
JP2011109144A (ja) | 半導体装置 | |
JP2022143167A (ja) | 半導体装置 | |
JP4861200B2 (ja) | パワーモジュール | |
JP2009164511A (ja) | 半導体装置およびその製造方法 | |
JP2002076259A (ja) | パワーモジュール | |
US20230074352A1 (en) | Semiconductor device | |
JP2022143166A (ja) | 半導体装置 | |
JP2022143168A (ja) | 半導体装置 | |
JP2023028804A (ja) | 半導体装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20080129 |
|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A712 Effective date: 20100511 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100907 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20101108 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20101130 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20110228 |
|
A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20110309 |
|
A912 | Re-examination (zenchi) completed and case transferred to appeal board |
Free format text: JAPANESE INTERMEDIATE CODE: A912 Effective date: 20110401 |