JP2006517054A - 銅裏面金属構造を備えるGaAs薄型ダイ - Google Patents
銅裏面金属構造を備えるGaAs薄型ダイ Download PDFInfo
- Publication number
- JP2006517054A JP2006517054A JP2004557131A JP2004557131A JP2006517054A JP 2006517054 A JP2006517054 A JP 2006517054A JP 2004557131 A JP2004557131 A JP 2004557131A JP 2004557131 A JP2004557131 A JP 2004557131A JP 2006517054 A JP2006517054 A JP 2006517054A
- Authority
- JP
- Japan
- Prior art keywords
- die
- gaas substrate
- backside metal
- copper
- gaas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W40/00—Arrangements for thermal protection or thermal control
- H10W40/70—Fillings or auxiliary members in containers or in encapsulations for thermal protection or control
- H10W40/77—Auxiliary members characterised by their shape
- H10W40/778—Auxiliary members characterised by their shape in encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/352—Materials of die-attach connectors comprising metals or metalloids, e.g. solders
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/59—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/736—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked lead frame, conducting package substrate or heat sink
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/756—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink
Landscapes
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Die Bonding (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/306,834 US6870243B2 (en) | 2002-11-27 | 2002-11-27 | Thin GaAs die with copper back-metal structure |
| PCT/US2003/030861 WO2004051733A1 (en) | 2002-11-27 | 2003-09-30 | Thin gaas die with copper back-metal structure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2006517054A true JP2006517054A (ja) | 2006-07-13 |
| JP2006517054A5 JP2006517054A5 (https=) | 2006-11-24 |
Family
ID=32325776
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004557131A Pending JP2006517054A (ja) | 2002-11-27 | 2003-09-30 | 銅裏面金属構造を備えるGaAs薄型ダイ |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US6870243B2 (https=) |
| JP (1) | JP2006517054A (https=) |
| KR (1) | KR20050085143A (https=) |
| CN (1) | CN1720610B (https=) |
| AU (1) | AU2003277129A1 (https=) |
| TW (1) | TWI339425B (https=) |
| WO (1) | WO2004051733A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008028295A (ja) * | 2006-07-25 | 2008-02-07 | Toyota Central Res & Dev Lab Inc | パワー半導体モジュール及びその製造方法 |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6870243B2 (en) * | 2002-11-27 | 2005-03-22 | Freescale Semiconductor, Inc. | Thin GaAs die with copper back-metal structure |
| US6833289B2 (en) * | 2003-05-12 | 2004-12-21 | Intel Corporation | Fluxless die-to-heat spreader bonding using thermal interface material |
| US20050085084A1 (en) * | 2003-10-16 | 2005-04-21 | Chang Edward Y. | Method of fabricating copper metallization on backside of gallium arsenide devices |
| US7221055B2 (en) * | 2005-05-23 | 2007-05-22 | Texas Instruments Incorporated | System and method for die attach using a backside heat spreader |
| US7923842B2 (en) | 2006-03-16 | 2011-04-12 | Skyworks Solutions, Inc. | GaAs integrated circuit device and method of attaching same |
| CN100449740C (zh) * | 2006-06-19 | 2009-01-07 | 上海集成电路研发中心有限公司 | 降低半导体器件发热的散热方法、相应器件及其制造方法 |
| WO2008060447A2 (en) * | 2006-11-09 | 2008-05-22 | Quantum Leap Packaging, Inc. | Microcircuit package having ductile layer |
| US20090108437A1 (en) * | 2007-10-29 | 2009-04-30 | M/A-Com, Inc. | Wafer scale integrated thermal heat spreader |
| JP5103245B2 (ja) * | 2008-03-31 | 2012-12-19 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US8987878B2 (en) * | 2010-10-29 | 2015-03-24 | Alpha And Omega Semiconductor Incorporated | Substrateless power device packages |
| US8415805B2 (en) | 2010-12-17 | 2013-04-09 | Skyworks Solutions, Inc. | Etched wafers and methods of forming the same |
| JP2013098481A (ja) * | 2011-11-04 | 2013-05-20 | Sumitomo Electric Device Innovations Inc | 半導体装置 |
| US8900969B2 (en) | 2012-01-27 | 2014-12-02 | Skyworks Solutions, Inc. | Methods of stress balancing in gallium arsenide wafer processing |
| CN103377914A (zh) * | 2012-04-18 | 2013-10-30 | 稳懋半导体股份有限公司 | 半导体元件背面铜金属的改良结构及其加工方法 |
| US9093506B2 (en) | 2012-05-08 | 2015-07-28 | Skyworks Solutions, Inc. | Process for fabricating gallium arsenide devices with copper contact layer |
| JP2014099547A (ja) * | 2012-11-15 | 2014-05-29 | Mitsubishi Electric Corp | 電力半導体モジュールおよびその製造方法 |
| US9530719B2 (en) | 2014-06-13 | 2016-12-27 | Skyworks Solutions, Inc. | Direct die solder of gallium arsenide integrated circuit dies and methods of manufacturing gallium arsenide wafers |
| TWI660471B (zh) * | 2017-10-06 | 2019-05-21 | 財團法人工業技術研究院 | 晶片封裝 |
| US11133241B2 (en) | 2019-06-28 | 2021-09-28 | Stmicroelectronics, Inc. | Semiconductor package with a cavity in a die pad for reducing voids in the solder |
| CN112989744B (zh) * | 2021-02-08 | 2023-11-17 | 泰凌微电子(上海)股份有限公司 | 一种半导体芯片的封装设计方法以及装置 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04225536A (ja) * | 1990-12-27 | 1992-08-14 | Nikko Kyodo Co Ltd | 化合物半導体装置の製造方法 |
| JPH05243396A (ja) * | 1992-03-02 | 1993-09-21 | Matsushita Electric Ind Co Ltd | 半導体装置及びその製造方法 |
| JPH06244320A (ja) * | 1993-02-16 | 1994-09-02 | Hitachi Ltd | 樹脂封止型半導体装置 |
| JPH09306932A (ja) * | 1996-05-17 | 1997-11-28 | Sanyo Electric Co Ltd | 半導体装置の製造方法 |
| JP2003045875A (ja) * | 2001-07-30 | 2003-02-14 | Nec Kagobutsu Device Kk | 半導体装置およびその製造方法 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3755720A (en) * | 1972-09-25 | 1973-08-28 | Rca Corp | Glass encapsulated semiconductor device |
| US3942186A (en) * | 1973-10-09 | 1976-03-02 | Westinghouse Electric Corporation | High frequency, field-effect transistor |
| US4321099A (en) * | 1979-11-13 | 1982-03-23 | Nasa | Method of fabricating Schottky barrier solar cell |
| US4543442A (en) * | 1983-06-24 | 1985-09-24 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | GaAs Schottky barrier photo-responsive device and method of fabrication |
| JPS61174723A (ja) * | 1985-01-30 | 1986-08-06 | Mitsubishi Electric Corp | 半導体装置の製造方法 |
| US4929516A (en) * | 1985-03-14 | 1990-05-29 | Olin Corporation | Semiconductor die attach system |
| US4872047A (en) * | 1986-11-07 | 1989-10-03 | Olin Corporation | Semiconductor die attach system |
| US4989117A (en) * | 1990-02-12 | 1991-01-29 | Rogers Corporation | Molded integrated circuit package incorporating thin decoupling capacitor |
| US5545289A (en) * | 1994-02-03 | 1996-08-13 | Applied Materials, Inc. | Passivating, stripping and corrosion inhibition of semiconductor substrates |
| IT1274129B (it) * | 1994-11-29 | 1997-07-15 | Soriani & Moser Manufacturers | Giostra di divertimento di tipo perfezionato |
| JP2757805B2 (ja) | 1995-01-27 | 1998-05-25 | 日本電気株式会社 | 半導体装置 |
| US5528076A (en) * | 1995-02-01 | 1996-06-18 | Motorola, Inc. | Leadframe having metal impregnated silicon carbide mounting area |
| US5622305A (en) * | 1995-05-10 | 1997-04-22 | Lucent Technologies Inc. | Bonding scheme using group VB metallic layer |
| US6105865A (en) * | 1998-07-17 | 2000-08-22 | Hardesty; Laurence Daniel | Financial transaction system with retirement saving benefit |
| US6010966A (en) * | 1998-08-07 | 2000-01-04 | Applied Materials, Inc. | Hydrocarbon gases for anisotropic etching of metal-containing layers |
| JP3690171B2 (ja) * | 1999-03-16 | 2005-08-31 | 株式会社日立製作所 | 複合材料とその製造方法及び用途 |
| US6609106B1 (en) * | 1999-05-07 | 2003-08-19 | Steven C. Robertson | System and method for providing electronic multi-merchant gift registry services over a distributed network |
| US6211550B1 (en) * | 1999-06-24 | 2001-04-03 | Intersil Corporation | Backmetal drain terminal with low stress and thermal resistance |
| US6426289B1 (en) * | 2000-03-24 | 2002-07-30 | Micron Technology, Inc. | Method of fabricating a barrier layer associated with a conductor layer in damascene structures |
| TWI248384B (en) * | 2000-06-12 | 2006-02-01 | Hitachi Ltd | Electronic device |
| US6551852B2 (en) * | 2001-06-11 | 2003-04-22 | Micron Technology Inc. | Method of forming a recessed magnetic storage element |
| US6583500B1 (en) * | 2002-02-11 | 2003-06-24 | Texas Instruments Incorporated | Thin tin preplated semiconductor leadframes |
| US6787910B2 (en) * | 2002-07-23 | 2004-09-07 | National Chiao Tung University | Schottky structure in GaAs semiconductor device |
| US6870243B2 (en) * | 2002-11-27 | 2005-03-22 | Freescale Semiconductor, Inc. | Thin GaAs die with copper back-metal structure |
| US20040146138A1 (en) * | 2003-01-23 | 2004-07-29 | Motorola, Inc. | Large flat panel gallium arsenide arrays on silicon substrate for low dose X-ray digital imaging |
-
2002
- 2002-11-27 US US10/306,834 patent/US6870243B2/en not_active Expired - Lifetime
-
2003
- 2003-09-30 AU AU2003277129A patent/AU2003277129A1/en not_active Abandoned
- 2003-09-30 JP JP2004557131A patent/JP2006517054A/ja active Pending
- 2003-09-30 WO PCT/US2003/030861 patent/WO2004051733A1/en not_active Ceased
- 2003-09-30 KR KR1020057009331A patent/KR20050085143A/ko not_active Ceased
- 2003-09-30 CN CN038254352A patent/CN1720610B/zh not_active Expired - Fee Related
- 2003-11-27 TW TW092133454A patent/TWI339425B/zh not_active IP Right Cessation
-
2005
- 2005-02-03 US US11/050,079 patent/US7092890B2/en not_active Expired - Lifetime
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04225536A (ja) * | 1990-12-27 | 1992-08-14 | Nikko Kyodo Co Ltd | 化合物半導体装置の製造方法 |
| JPH05243396A (ja) * | 1992-03-02 | 1993-09-21 | Matsushita Electric Ind Co Ltd | 半導体装置及びその製造方法 |
| JPH06244320A (ja) * | 1993-02-16 | 1994-09-02 | Hitachi Ltd | 樹脂封止型半導体装置 |
| JPH09306932A (ja) * | 1996-05-17 | 1997-11-28 | Sanyo Electric Co Ltd | 半導体装置の製造方法 |
| JP2003045875A (ja) * | 2001-07-30 | 2003-02-14 | Nec Kagobutsu Device Kk | 半導体装置およびその製造方法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008028295A (ja) * | 2006-07-25 | 2008-02-07 | Toyota Central Res & Dev Lab Inc | パワー半導体モジュール及びその製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| AU2003277129A1 (en) | 2004-06-23 |
| US20050127480A1 (en) | 2005-06-16 |
| WO2004051733A1 (en) | 2004-06-17 |
| CN1720610B (zh) | 2010-10-13 |
| TW200416970A (en) | 2004-09-01 |
| US7092890B2 (en) | 2006-08-15 |
| TWI339425B (en) | 2011-03-21 |
| US6870243B2 (en) | 2005-03-22 |
| US20040099932A1 (en) | 2004-05-27 |
| CN1720610A (zh) | 2006-01-11 |
| KR20050085143A (ko) | 2005-08-29 |
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