JP2006500898A - フィボナッチ数増倍を有する電荷ポンプ - Google Patents
フィボナッチ数増倍を有する電荷ポンプ Download PDFInfo
- Publication number
- JP2006500898A JP2006500898A JP2004540118A JP2004540118A JP2006500898A JP 2006500898 A JP2006500898 A JP 2006500898A JP 2004540118 A JP2004540118 A JP 2004540118A JP 2004540118 A JP2004540118 A JP 2004540118A JP 2006500898 A JP2006500898 A JP 2006500898A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- capacitor
- stage
- capacitors
- stages
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000003990 capacitor Substances 0.000 claims abstract description 279
- 238000000034 method Methods 0.000 claims description 10
- 238000010586 diagram Methods 0.000 description 5
- 230000000295 complement effect Effects 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
- H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
- H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
- H02M3/06—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
- H02M3/07—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Dc-Dc Converters (AREA)
Abstract
Description
Claims (17)
- 電荷ポンプにおいて、
第1の複数の電圧ステージであって、各電圧ステージはコンデンサを含み、前記電圧ステージは、コンデンサを充電し、かつ第1の電圧ステージのコンデンサの正端子が第2の電圧ステージのコンデンサの負端子に接続されるなどのようにコンデンサを直列に接続するように構成され、さらにコンデンサは充電され、1より大きい整数kに対して、第k番目の電圧ステージのコンデンサにかかる電圧が実質的にその負端子の電圧と第(k−1)番目の電圧ステージのコンデンサにかかる電圧とに等しくなるように直列に接続された第1の複数の電圧ステージを含む電荷ポンプ。 - 第2の複数の電圧ステージであって、第2の複数の電圧ステージのうちの各電圧ステージはコンデンサを含み、これらの電圧ステージは、コンデンサを充電し、かつ第1の電圧ステージのコンデンサの正端子が第2の電圧ステージのコンデンサの負端子に接続されるなどのように充電されたコンデンサを直列に接続するように構成され、さらにコンデンサは充電され、1より大きい整数mに対して、第m番目の電圧ステージのコンデンサにかかる電圧が実質的にその負端子の電圧と第(m−1)番目の電圧ステージのコンデンサにかかる電圧とに等しくなるように直列に接続される第2の複数の電圧ステージをさらに含む請求項1記載の電荷ポンプ。
- 第1の複数の電圧ステージのコンデンサの直列接続は、クロック信号の第1相の間に行なわれる請求項2記載の電荷ポンプ。
- 第2の複数の電圧ステージのコンデンサの直列接続は、クロック信号の第2相の間に行なわれる請求項3記載の電荷ポンプ。
- クロック信号の第1相の間、第2の複数の電圧ステージのうちの電圧ステージのコンデンサは、第1の複数の電圧ステージの直列に接続されたコンデンサの正端子の電圧から充電される請求項4記載の電荷ポンプ。
- クロック信号の第1相の間、第1の複数の電圧ステージのうちの第1の電圧ステージのコンデンサの正端子の電圧は第2の複数の電圧ステージのうちの第1の電圧ステージのコンデンサを充電し、第1の複数の電圧ステージのうちの第2の電圧ステージのコンデンサの正端子の電圧は第2の複数の電圧ステージのうちの第2の電圧ステージのコンデンサを充電するなどのように充電する請求項5記載の電荷ポンプ。
- クロック信号の第2相の間、第1の複数の電圧ステージのうちの第1の電圧ステージは電源電圧VCCから充電し、第2の複数の電圧ステージのうちの第1の電圧ステージのコンデンサの正端子の電圧は第1の複数の電圧ステージのうちの第2の電圧ステージのコンデンサを充電し、第2の複数の電圧ステージのうちの第2の電圧ステージのコンデンサの正端子の電圧は第1の複数の電圧ステージのうちの第3の電圧ステージのコンデンサを充電するなどのように充電する請求項6記載の電荷ポンプ。
- 第1の複数の電圧ステージのうちの最終電圧ステージのコンデンサの正端子の電圧は、第2の複数の電圧ステージのうちの最終電圧ステージのコンデンサを充電するように、ダイオードとして接続されたトランジスタを通して接続される請求項7記載の電荷ポンプ。
- 第1および第2の複数の電圧ステージはN個の電圧ステージをそれぞれ有し、複数の電圧ステージは別の電圧ステージとそれぞれ関連し、別の電圧ステージの各々はコンデンサを含み、さらにクロック信号の第1相の間、第1の複数の電圧ステージの第N番目の電圧ステージのコンデンサの正端子は第1の複数の電圧ステージと関連する前記別の電圧ステージのコンデンサの負端子に接続し、クロック信号の第2相の間、第2の複数の電圧ステージの第N番目の電圧ステージのコンデンサの正端子は第2の複数の電圧ステージと関連する前記別の電圧ステージのコンデンサの負端子に接続する請求項7記載の電荷ポンプ。
- クロック信号の第1相の間、第1の複数の電圧ステージの第N番目の電圧ステージのコンデンサの正端子の電圧が第2の複数の電圧ステージと関連する前記別の電圧ステージのコンデンサを充電する請求項9記載の電荷ポンプ。
- クロック信号の第2相の間、第2の複数の電圧ステージの第(N−1)番目の電圧ステージのコンデンサの正端子の電圧が第1の複数の電圧ステージと関連する前記別の電圧ステージのコンデンサを充電する請求項10記載の電荷ポンプ。
- 複数のコンデンサと、
前記複数のコンデンサを充電する手段と、
複数のコンデンサの第1のコンデンサの負端子が電源電圧VCCに接続し、第1のコンデンサの正端子が複数のコンデンサの第2のコンデンサの負端子に接続するなどのように充電されたコンデンサを直列に接続する手段であって、前記複数のコンデンサを充電する手段は、複数のコンデンサが直列に接続されたとき1より大きい整数kに対して、第k番目のコンデンサにかかる電圧がその負端子の電圧と第(k−1)番目のコンデンサにかかる電圧とに等しくなるようにコンデンサを充電するように構成される電荷ポンプ。 - 前記複数のコンデンサを充電する手段は、クロック信号の第1相の間、複数のコンデンサを充電するように構成される請求項12記載の電荷ポンプ。
- 前記充電されたコンデンサを直列に接続する手段は、クロック信号の第2相の間、充電されたコンデンサをに直列に接続するように構成される請求項13記載の電荷ポンプ。
- 電圧を発生する方法において、
(a)第1の複数のコンデンサを充電するステップと、
(b)第1の複数のコンデンサの中で、充電された第1のコンデンサの正端子が充電された第2のコンデンサの負端子に接続するなどのように第1の充電された複数のコンデンサを直列に接続するステップと、
(c)第1の充電され、直列に接続された複数のコンデンサによって作り出された電圧から第2の複数のコンデンサを充電するステップと、
(d)第2の複数のコンデンサの中で、充電された第1のコンデンサの正端子が充電された第2のコンデンサの負端子に接続するなどのように第2の充電された複数のコンデンサを直列に接続するステップであって、前記第1の複数のコンデンサを充電するステップは第2の直列に接続された複数のコンデンサによって作り出された電圧を用い、動作(b)の間、1より大きい整数kに対して、第1の複数のコンデンサの第k番目のコンデンサにかかる電圧がその負端子の電圧と第1の複数のコンデンサの第(k−1)番目のコンデンサにかかる電圧とに等しいものである複数のコンデンサを直列に接続するステップと、
を含む電圧を発生する方法。 - 動作(d)の間、整数kに対して、第2の複数のコンデンサの第k番目のコンデンサにかかる電圧は、その負端子の電圧と第2の複数のコンデンサの第(k−1)番目のコンデンサにかかる電圧とに等しい請求項15記載の方法。
- 動作(b)および(c)は、クロック信号の第1相の間に行なわれ、動作(a)および(d)はクロック信号の第2相の間に行なわれる請求項16記載の方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/260,115 US6861894B2 (en) | 2002-09-27 | 2002-09-27 | Charge pump with Fibonacci number multiplication |
PCT/US2003/029503 WO2004030192A1 (en) | 2002-09-27 | 2003-09-19 | Charge pump with fibonacci series |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006500898A true JP2006500898A (ja) | 2006-01-05 |
JP4477500B2 JP4477500B2 (ja) | 2010-06-09 |
Family
ID=32029613
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004540118A Expired - Fee Related JP4477500B2 (ja) | 2002-09-27 | 2003-09-19 | フィボナッチ数増倍を有する電荷ポンプ |
Country Status (8)
Country | Link |
---|---|
US (2) | US6861894B2 (ja) |
EP (1) | EP1543605A1 (ja) |
JP (1) | JP4477500B2 (ja) |
KR (1) | KR101106483B1 (ja) |
CN (1) | CN1701495B (ja) |
AU (1) | AU2003272567A1 (ja) |
TW (1) | TWI320259B (ja) |
WO (1) | WO2004030192A1 (ja) |
Families Citing this family (66)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6734718B1 (en) * | 2002-12-23 | 2004-05-11 | Sandisk Corporation | High voltage ripple reduction |
US6922096B2 (en) | 2003-08-07 | 2005-07-26 | Sandisk Corporation | Area efficient charge pump |
JP2005235315A (ja) * | 2004-02-19 | 2005-09-02 | Elpida Memory Inc | 昇圧回路 |
JP2006158132A (ja) * | 2004-11-30 | 2006-06-15 | Renesas Technology Corp | チャージポンプ方式電源回路 |
US7397299B2 (en) * | 2004-12-28 | 2008-07-08 | The Hong Kong University Of Science And Technology | N-stage exponential charge pumps, charging stages therefor and methods of operation thereof |
JP2008159736A (ja) * | 2006-12-22 | 2008-07-10 | Elpida Memory Inc | 半導体装置及びその電源供給方法 |
US20090058507A1 (en) * | 2007-08-28 | 2009-03-05 | Prajit Nandi | Bottom Plate Regulated Charge Pump |
US8044705B2 (en) | 2007-08-28 | 2011-10-25 | Sandisk Technologies Inc. | Bottom plate regulation of charge pumps |
US7586363B2 (en) * | 2007-12-12 | 2009-09-08 | Sandisk Corporation | Diode connected regulation of charge pumps |
US7586362B2 (en) * | 2007-12-12 | 2009-09-08 | Sandisk Corporation | Low voltage charge pump with regulation |
US7969235B2 (en) | 2008-06-09 | 2011-06-28 | Sandisk Corporation | Self-adaptive multi-stage charge pump |
US20090302930A1 (en) * | 2008-06-09 | 2009-12-10 | Feng Pan | Charge Pump with Vt Cancellation Through Parallel Structure |
US8710907B2 (en) | 2008-06-24 | 2014-04-29 | Sandisk Technologies Inc. | Clock generator circuit for a charge pump |
US7683700B2 (en) * | 2008-06-25 | 2010-03-23 | Sandisk Corporation | Techniques of ripple reduction for charge pumps |
US7795952B2 (en) * | 2008-12-17 | 2010-09-14 | Sandisk Corporation | Regulation of recovery rates in charge pumps |
US8154334B2 (en) * | 2009-07-21 | 2012-04-10 | Intersil America Inc. | System and method for pre-charging a bootstrap capacitor in a switching regulator with high pre-bias voltage |
US7973592B2 (en) | 2009-07-21 | 2011-07-05 | Sandisk Corporation | Charge pump with current based regulation |
US8339183B2 (en) | 2009-07-24 | 2012-12-25 | Sandisk Technologies Inc. | Charge pump with reduced energy consumption through charge sharing and clock boosting suitable for high voltage word line in flash memories |
US20110148509A1 (en) | 2009-12-17 | 2011-06-23 | Feng Pan | Techniques to Reduce Charge Pump Overshoot |
US8514630B2 (en) | 2010-07-09 | 2013-08-20 | Sandisk Technologies Inc. | Detection of word-line leakage in memory arrays: current based approach |
US8432732B2 (en) | 2010-07-09 | 2013-04-30 | Sandisk Technologies Inc. | Detection of word-line leakage in memory arrays |
US8305807B2 (en) | 2010-07-09 | 2012-11-06 | Sandisk Technologies Inc. | Detection of broken word-lines in memory arrays |
US8106701B1 (en) | 2010-09-30 | 2012-01-31 | Sandisk Technologies Inc. | Level shifter with shoot-through current isolation |
US8294509B2 (en) | 2010-12-20 | 2012-10-23 | Sandisk Technologies Inc. | Charge pump systems with reduction in inefficiencies due to charge sharing between capacitances |
US8339185B2 (en) | 2010-12-20 | 2012-12-25 | Sandisk 3D Llc | Charge pump system that dynamically selects number of active stages |
US8581658B2 (en) * | 2011-04-08 | 2013-11-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Charge pump |
US8537593B2 (en) | 2011-04-28 | 2013-09-17 | Sandisk Technologies Inc. | Variable resistance switch suitable for supplying high voltage to drive load |
US8379454B2 (en) | 2011-05-05 | 2013-02-19 | Sandisk Technologies Inc. | Detection of broken word-lines in memory arrays |
US8750042B2 (en) | 2011-07-28 | 2014-06-10 | Sandisk Technologies Inc. | Combined simultaneous sensing of multiple wordlines in a post-write read (PWR) and detection of NAND failures |
US8775901B2 (en) | 2011-07-28 | 2014-07-08 | SanDisk Technologies, Inc. | Data recovery for defective word lines during programming of non-volatile memory arrays |
US8726104B2 (en) | 2011-07-28 | 2014-05-13 | Sandisk Technologies Inc. | Non-volatile memory and method with accelerated post-write read using combined verification of multiple pages |
US8699247B2 (en) | 2011-09-09 | 2014-04-15 | Sandisk Technologies Inc. | Charge pump system dynamically reconfigurable for read and program |
US8400212B1 (en) | 2011-09-22 | 2013-03-19 | Sandisk Technologies Inc. | High voltage charge pump regulation system with fine step adjustment |
US8514628B2 (en) | 2011-09-22 | 2013-08-20 | Sandisk Technologies Inc. | Dynamic switching approach to reduce area and power consumption of high voltage charge pumps |
US8395434B1 (en) | 2011-10-05 | 2013-03-12 | Sandisk Technologies Inc. | Level shifter with negative voltage capability |
US8730722B2 (en) | 2012-03-02 | 2014-05-20 | Sandisk Technologies Inc. | Saving of data in cases of word-line to word-line short in memory arrays |
US8710909B2 (en) | 2012-09-14 | 2014-04-29 | Sandisk Technologies Inc. | Circuits for prevention of reverse leakage in Vth-cancellation charge pumps |
US9810723B2 (en) | 2012-09-27 | 2017-11-07 | Sandisk Technologies Llc | Charge pump based over-sampling ADC for current detection |
US9164526B2 (en) | 2012-09-27 | 2015-10-20 | Sandisk Technologies Inc. | Sigma delta over-sampling charge pump analog-to-digital converter |
US8836412B2 (en) | 2013-02-11 | 2014-09-16 | Sandisk 3D Llc | Charge pump with a power-controlled clock buffer to reduce power consumption and output voltage ripple |
US8981835B2 (en) | 2013-06-18 | 2015-03-17 | Sandisk Technologies Inc. | Efficient voltage doubler |
US9024680B2 (en) | 2013-06-24 | 2015-05-05 | Sandisk Technologies Inc. | Efficiency for charge pumps with low supply voltages |
US9077238B2 (en) | 2013-06-25 | 2015-07-07 | SanDisk Technologies, Inc. | Capacitive regulation of charge pumps without refresh operation interruption |
US9007046B2 (en) | 2013-06-27 | 2015-04-14 | Sandisk Technologies Inc. | Efficient high voltage bias regulation circuit |
US9165683B2 (en) | 2013-09-23 | 2015-10-20 | Sandisk Technologies Inc. | Multi-word line erratic programming detection |
US9083231B2 (en) | 2013-09-30 | 2015-07-14 | Sandisk Technologies Inc. | Amplitude modulation for pass gate to improve charge pump efficiency |
US9154027B2 (en) | 2013-12-09 | 2015-10-06 | Sandisk Technologies Inc. | Dynamic load matching charge pump for reduced current consumption |
US9460809B2 (en) | 2014-07-10 | 2016-10-04 | Sandisk Technologies Llc | AC stress mode to screen out word line to word line shorts |
US9484086B2 (en) | 2014-07-10 | 2016-11-01 | Sandisk Technologies Llc | Determination of word line to local source line shorts |
US9443612B2 (en) | 2014-07-10 | 2016-09-13 | Sandisk Technologies Llc | Determination of bit line to low voltage signal shorts |
US9514835B2 (en) | 2014-07-10 | 2016-12-06 | Sandisk Technologies Llc | Determination of word line to word line shorts between adjacent blocks |
US9330776B2 (en) | 2014-08-14 | 2016-05-03 | Sandisk Technologies Inc. | High voltage step down regulator with breakdown protection |
US9202593B1 (en) | 2014-09-02 | 2015-12-01 | Sandisk Technologies Inc. | Techniques for detecting broken word lines in non-volatile memories |
US9240249B1 (en) | 2014-09-02 | 2016-01-19 | Sandisk Technologies Inc. | AC stress methods to screen out bit line defects |
US9449694B2 (en) | 2014-09-04 | 2016-09-20 | Sandisk Technologies Llc | Non-volatile memory with multi-word line select for defect detection operations |
KR101603120B1 (ko) * | 2015-05-27 | 2016-03-14 | (주)멜파스 | 전하 펌프 |
US9917507B2 (en) | 2015-05-28 | 2018-03-13 | Sandisk Technologies Llc | Dynamic clock period modulation scheme for variable charge pump load currents |
US9647536B2 (en) | 2015-07-28 | 2017-05-09 | Sandisk Technologies Llc | High voltage generation using low voltage devices |
US9659666B2 (en) | 2015-08-31 | 2017-05-23 | Sandisk Technologies Llc | Dynamic memory recovery at the sub-block level |
US9520776B1 (en) | 2015-09-18 | 2016-12-13 | Sandisk Technologies Llc | Selective body bias for charge pump transfer switches |
US9698676B1 (en) | 2016-03-11 | 2017-07-04 | Sandisk Technologies Llc | Charge pump based over-sampling with uniform step size for current detection |
CN106374738B (zh) * | 2016-10-11 | 2019-02-26 | 北京大学深圳研究生院 | 一种Fibonacci电荷泵 |
CN108448890B (zh) * | 2018-04-12 | 2019-07-23 | 武汉新芯集成电路制造有限公司 | 电荷泵 |
CN109004824B (zh) * | 2018-07-23 | 2020-02-14 | 中车青岛四方机车车辆股份有限公司 | 信号输出控制电路 |
KR102174233B1 (ko) | 2018-12-27 | 2020-11-04 | 연세대학교 산학협력단 | 저전력 환경에서 동작하는 고효율 전하 펌프 회로 |
EP4262969A1 (en) * | 2020-12-18 | 2023-10-25 | Medtronic, Inc. | Device with switched capacitor charge pump sensing circuitry |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1364618A (en) * | 1971-12-03 | 1974-08-21 | Seiko Instr & Electronics | Voltage boosters |
US5051881A (en) * | 1990-07-05 | 1991-09-24 | Motorola, Inc. | Voltage multiplier |
US5397931A (en) * | 1993-03-31 | 1995-03-14 | Texas Instruments Deutschland Gmbh | Voltage multiplier |
NL9300836A (nl) | 1993-05-14 | 1994-12-01 | Catena Microelect Bv | Integreerbare spanningsvermenigvuldiger voor hoge vermenigvuldigingsfactoren. |
US5436857A (en) * | 1993-11-22 | 1995-07-25 | Ncr Corporation | Personal computer module system and method of using |
US5436587A (en) | 1993-11-24 | 1995-07-25 | Sundisk Corporation | Charge pump circuit with exponetral multiplication |
US5491623A (en) * | 1994-09-23 | 1996-02-13 | Fluke Corporation | Voltage multiplier using switched capacitance technique |
US5508971A (en) | 1994-10-17 | 1996-04-16 | Sandisk Corporation | Programmable power generation circuit for flash EEPROM memory systems |
US5493486A (en) * | 1995-03-17 | 1996-02-20 | Motorola, Inc. | High efficiency compact low power voltage doubler circuit |
US5606491A (en) * | 1995-06-05 | 1997-02-25 | Analog Devices, Inc. | Multiplying and inverting charge pump |
US5596532A (en) | 1995-10-18 | 1997-01-21 | Sandisk Corporation | Flash EEPROM self-adaptive voltage generation circuit operative within a continuous voltage source range |
US5856918A (en) * | 1995-11-08 | 1999-01-05 | Sony Corporation | Internal power supply circuit |
FR2742942B1 (fr) * | 1995-12-26 | 1998-01-16 | Sgs Thomson Microelectronics | Generateur de creneaux de haute tension |
JPH09312968A (ja) * | 1996-05-22 | 1997-12-02 | Nec Corp | チャージポンプ回路 |
JP3385960B2 (ja) * | 1998-03-16 | 2003-03-10 | 日本電気株式会社 | 負電圧チャージポンプ回路 |
JP3316468B2 (ja) * | 1999-03-11 | 2002-08-19 | セイコーエプソン株式会社 | 昇圧回路、昇圧方法および電子機器 |
DE19915644C2 (de) | 1999-04-07 | 2001-05-17 | Texas Instruments Deutschland | Ladungspumpe |
JP3480423B2 (ja) | 2000-05-25 | 2003-12-22 | 松下電器産業株式会社 | 電源回路 |
US6466489B1 (en) * | 2001-05-18 | 2002-10-15 | International Business Machines Corporation | Use of source/drain asymmetry MOSFET devices in dynamic and analog circuits |
-
2002
- 2002-09-27 US US10/260,115 patent/US6861894B2/en not_active Expired - Lifetime
-
2003
- 2003-09-19 KR KR1020057005364A patent/KR101106483B1/ko not_active IP Right Cessation
- 2003-09-19 JP JP2004540118A patent/JP4477500B2/ja not_active Expired - Fee Related
- 2003-09-19 EP EP03754754A patent/EP1543605A1/en not_active Withdrawn
- 2003-09-19 WO PCT/US2003/029503 patent/WO2004030192A1/en not_active Application Discontinuation
- 2003-09-19 CN CN038246821A patent/CN1701495B/zh not_active Expired - Fee Related
- 2003-09-19 AU AU2003272567A patent/AU2003272567A1/en not_active Abandoned
- 2003-09-22 TW TW092126115A patent/TWI320259B/zh not_active IP Right Cessation
-
2005
- 2005-02-28 US US11/069,660 patent/US7135910B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
CN1701495B (zh) | 2010-11-10 |
US20040061548A1 (en) | 2004-04-01 |
AU2003272567A1 (en) | 2004-04-19 |
TWI320259B (en) | 2010-02-01 |
KR20050084606A (ko) | 2005-08-26 |
EP1543605A1 (en) | 2005-06-22 |
TW200409444A (en) | 2004-06-01 |
CN1701495A (zh) | 2005-11-23 |
US7135910B2 (en) | 2006-11-14 |
JP4477500B2 (ja) | 2010-06-09 |
US20050168267A1 (en) | 2005-08-04 |
WO2004030192A1 (en) | 2004-04-08 |
US6861894B2 (en) | 2005-03-01 |
KR101106483B1 (ko) | 2012-01-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4477500B2 (ja) | フィボナッチ数増倍を有する電荷ポンプ | |
US6922096B2 (en) | Area efficient charge pump | |
US7046076B2 (en) | High efficiency, low cost, charge pump circuit | |
US6008690A (en) | Booster circuit | |
CN109274263B (zh) | 操作用于同时生成正电压和负电压的多级电荷泵电路 | |
US6184594B1 (en) | Multi-stage charge pump having high-voltage pump control feedback and method of operating same | |
US20070285150A1 (en) | Method and system for providing a charge pump very low voltage applications | |
US20060145748A1 (en) | N-stage exponential charge pumps, charging stages therefor and methods of operation thereof | |
EP0404124B1 (en) | Charge pump having pull-up circuit operating with two clock pulse sequences | |
JP2003033007A (ja) | チャージポンプ回路の制御方法 | |
JP2010119226A (ja) | チャージポンプ回路 | |
US7683699B2 (en) | Charge pump | |
US6838928B2 (en) | Boosting circuit configured with plurality of boosting circuit units in series | |
US20090309650A1 (en) | Booster circuit | |
US20010015672A1 (en) | Electronic charge pump device | |
KR100573780B1 (ko) | 전하펌프 | |
JPH11503261A (ja) | 電圧増倍のための装置 | |
CN113746327B (zh) | 电荷泵电路、电荷泵系统及集成电路芯片 | |
JPH07322604A (ja) | 昇圧回路 | |
JPH11341789A (ja) | スイッチトキャパシタ変成器およびその制御方法 | |
JPH11113249A (ja) | スイッチトキャパシタ変成器 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20060823 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090217 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090515 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20091013 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20091112 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20100216 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20100311 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4477500 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130319 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130319 Year of fee payment: 3 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313113 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130319 Year of fee payment: 3 |
|
R360 | Written notification for declining of transfer of rights |
Free format text: JAPANESE INTERMEDIATE CODE: R360 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130319 Year of fee payment: 3 |
|
R370 | Written measure of declining of transfer procedure |
Free format text: JAPANESE INTERMEDIATE CODE: R370 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313113 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130319 Year of fee payment: 3 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130319 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140319 Year of fee payment: 4 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
S533 | Written request for registration of change of name |
Free format text: JAPANESE INTERMEDIATE CODE: R313533 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |