JP2005532685A5 - - Google Patents
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- Publication number
- JP2005532685A5 JP2005532685A5 JP2004519093A JP2004519093A JP2005532685A5 JP 2005532685 A5 JP2005532685 A5 JP 2005532685A5 JP 2004519093 A JP2004519093 A JP 2004519093A JP 2004519093 A JP2004519093 A JP 2004519093A JP 2005532685 A5 JP2005532685 A5 JP 2005532685A5
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor material
- electronic device
- atoms
- tft
- metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000463 material Substances 0.000 claims 15
- 239000004065 semiconductor Substances 0.000 claims 15
- 229910052751 metal Inorganic materials 0.000 claims 11
- 239000002184 metal Substances 0.000 claims 11
- 238000000034 method Methods 0.000 claims 11
- 238000000137 annealing Methods 0.000 claims 3
- 238000002425 crystallisation Methods 0.000 claims 3
- 230000008025 crystallization Effects 0.000 claims 3
- 239000011159 matrix material Substances 0.000 claims 2
- 229910052759 nickel Inorganic materials 0.000 claims 2
- 150000002815 nickel Chemical group 0.000 claims 2
- 230000001737 promoting effect Effects 0.000 claims 2
- 238000000151 deposition Methods 0.000 claims 1
- 238000005530 etching Methods 0.000 claims 1
- 238000002513 implantation Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 239000007769 metal material Substances 0.000 claims 1
- 229910021332 silicide Inorganic materials 0.000 claims 1
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0215566A GB0215566D0 (en) | 2002-07-05 | 2002-07-05 | Electronic devices and their manufacture |
| GB0309977 | 2003-05-01 | ||
| PCT/IB2003/002883 WO2004006339A1 (en) | 2002-07-05 | 2003-06-25 | Tft electronic devices and their manufacture |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005532685A JP2005532685A (ja) | 2005-10-27 |
| JP2005532685A5 true JP2005532685A5 (enExample) | 2006-08-17 |
Family
ID=30117094
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004519093A Pending JP2005532685A (ja) | 2002-07-05 | 2003-06-25 | Tft電子装置とその製造 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20060049428A1 (enExample) |
| EP (1) | EP1522104A1 (enExample) |
| JP (1) | JP2005532685A (enExample) |
| CN (1) | CN1666347A (enExample) |
| AU (1) | AU2003244945A1 (enExample) |
| TW (1) | TW200408136A (enExample) |
| WO (1) | WO2004006339A1 (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100928490B1 (ko) * | 2003-06-28 | 2009-11-26 | 엘지디스플레이 주식회사 | 액정표시패널 및 그 제조 방법 |
| KR101043338B1 (ko) * | 2004-04-19 | 2011-06-21 | 삼성전자주식회사 | 편광자, 이를 갖는 표시장치, 이의 제조방법 및 이의제조장비 |
| KR100613170B1 (ko) * | 2004-10-12 | 2006-08-17 | 삼성전자주식회사 | 매트릭스 스위치를 이용한 온도 측정 장치, 반도체 패키지및 냉각 시스템 |
| TWI253759B (en) * | 2004-11-22 | 2006-04-21 | Au Optronics Corp | Method and apparatus for forming thin film transistor |
| KR100864884B1 (ko) * | 2006-12-28 | 2008-10-22 | 삼성에스디아이 주식회사 | 박막트랜지스터, 그의 제조방법 및 이를 구비한유기전계발광표시장치 |
| KR101282897B1 (ko) * | 2008-07-08 | 2013-07-05 | 엘지디스플레이 주식회사 | 폴리실리콘 박막트랜지스터 및 그 제조방법 |
| CN102339835A (zh) * | 2011-07-14 | 2012-02-01 | 友达光电股份有限公司 | 半导体组件及电致发光组件及其制作方法 |
| TWI476935B (zh) * | 2012-10-03 | 2015-03-11 | Nat Applied Res Laboratories | 薄膜電晶體製造方法 |
| CN109326676B (zh) * | 2017-07-31 | 2020-12-11 | 上海耕岩智能科技有限公司 | 一种光侦测薄膜、器件、显示装置、制备方法 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW241377B (enExample) * | 1993-03-12 | 1995-02-21 | Semiconductor Energy Res Co Ltd | |
| CN1095204C (zh) * | 1993-03-12 | 2002-11-27 | 株式会社半导体能源研究所 | 半导体器件和晶体管 |
| JP3535465B2 (ja) * | 1993-03-22 | 2004-06-07 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP2762215B2 (ja) * | 1993-08-12 | 1998-06-04 | 株式会社半導体エネルギー研究所 | 薄膜トランジスタおよび半導体装置の作製方法 |
| JP2814049B2 (ja) * | 1993-08-27 | 1998-10-22 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法 |
| JP3378078B2 (ja) * | 1994-02-23 | 2003-02-17 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP4130237B2 (ja) * | 1995-01-28 | 2008-08-06 | 株式会社半導体エネルギー研究所 | 結晶性珪素膜の作製方法及び半導体装置の作製方法 |
| JP3295346B2 (ja) * | 1997-07-14 | 2002-06-24 | 株式会社半導体エネルギー研究所 | 結晶性珪素膜の作製方法及びそれを用いた薄膜トランジスタ |
| JPH11214699A (ja) * | 1998-01-23 | 1999-08-06 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
| US6346437B1 (en) * | 1998-07-16 | 2002-02-12 | Sharp Laboratories Of America, Inc. | Single crystal TFT from continuous transition metal delivery method |
| JP3454467B2 (ja) * | 1999-01-29 | 2003-10-06 | シャープ株式会社 | 半導体装置およびその製造方法 |
| KR100473997B1 (ko) * | 2000-10-06 | 2005-03-07 | 엘지.필립스 엘시디 주식회사 | 박막 트랜지스터 제조방법 |
| JP4678933B2 (ja) * | 2000-11-07 | 2011-04-27 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
-
2002
- 2002-06-25 US US10/520,229 patent/US20060049428A1/en not_active Abandoned
-
2003
- 2003-06-25 WO PCT/IB2003/002883 patent/WO2004006339A1/en not_active Ceased
- 2003-06-25 JP JP2004519093A patent/JP2005532685A/ja active Pending
- 2003-06-25 CN CN03815752.7A patent/CN1666347A/zh active Pending
- 2003-06-25 EP EP03738419A patent/EP1522104A1/en not_active Withdrawn
- 2003-06-25 AU AU2003244945A patent/AU2003244945A1/en not_active Abandoned
- 2003-07-02 TW TW092118089A patent/TW200408136A/zh unknown
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