JP2005527833A - 元素別ｘ線蛍光顕微鏡および動作の方法 - Google Patents

元素別ｘ線蛍光顕微鏡および動作の方法 Download PDF

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Publication number
JP2005527833A
JP2005527833A JP2004509399A JP2004509399A JP2005527833A JP 2005527833 A JP2005527833 A JP 2005527833A JP 2004509399 A JP2004509399 A JP 2004509399A JP 2004509399 A JP2004509399 A JP 2004509399A JP 2005527833 A JP2005527833 A JP 2005527833A
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imaging
ray fluorescence
fluorescence microscope
radiation
interest
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JP2005527833A5 (https=
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ユン，ウェンビング
ニル，ケネス・ダブリュ
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Carl Zeiss X Ray Microscopy Inc
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Xradia Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/062—Devices having a multilayer structure
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2004509399A 2002-05-29 2003-05-29 元素別ｘ線蛍光顕微鏡および動作の方法 Pending JP2005527833A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/157,089 US7245696B2 (en) 2002-05-29 2002-05-29 Element-specific X-ray fluorescence microscope and method of operation
PCT/US2003/016913 WO2003102564A2 (en) 2002-05-29 2003-05-29 Element-specific x-ray fluorescence microscope using multiple imaging systems comprising a zone plate

Publications (2)

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JP2005527833A true JP2005527833A (ja) 2005-09-15
JP2005527833A5 JP2005527833A5 (https=) 2006-06-01

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US (2) US7245696B2 (https=)
EP (1) EP1511994A2 (https=)
JP (1) JP2005527833A (https=)
KR (1) KR20050010835A (https=)
CN (1) CN1656373B (https=)
AU (1) AU2003232417A1 (https=)
WO (1) WO2003102564A2 (https=)

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JP2020106383A (ja) * 2018-12-27 2020-07-09 株式会社堀場製作所 分析装置、分析方法、及びプログラム
JP2022535447A (ja) * 2019-06-06 2022-08-08 アイカーン スクール オブ メディシン アット マウント サイナイ 金属代謝の周期的変動に関連する生物学的障害の診断のためのシステムおよび方法

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JP2022535447A (ja) * 2019-06-06 2022-08-08 アイカーン スクール オブ メディシン アット マウント サイナイ 金属代謝の周期的変動に関連する生物学的障害の診断のためのシステムおよび方法
JP7564832B2 (ja) 2019-06-06 2024-10-09 アイカーン スクール オブ メディシン アット マウント サイナイ 金属代謝の周期的変動に関連する生物学的障害の診断のためのシステムおよび方法

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AU2003232417A1 (en) 2003-12-19
CN1656373B (zh) 2010-06-02
CN1656373A (zh) 2005-08-17
KR20050010835A (ko) 2005-01-28
US7183547B2 (en) 2007-02-27
WO2003102564A2 (en) 2003-12-11
EP1511994A2 (en) 2005-03-09
WO2003102564A3 (en) 2004-03-18

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