CN108709899A - 基于x射线阵列组合折射透镜的微束x射线荧光分析系统 - Google Patents
基于x射线阵列组合折射透镜的微束x射线荧光分析系统 Download PDFInfo
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- CN108709899A CN108709899A CN201810366527.4A CN201810366527A CN108709899A CN 108709899 A CN108709899 A CN 108709899A CN 201810366527 A CN201810366527 A CN 201810366527A CN 108709899 A CN108709899 A CN 108709899A
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
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- G—PHYSICS
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CN201810366527.4A CN108709899B (zh) | 2018-04-23 | 2018-04-23 | 基于x射线阵列组合折射透镜的微束x射线荧光分析系统 |
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Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06245122A (ja) * | 1993-02-17 | 1994-09-02 | Toshiba Corp | 撮像装置 |
KR20060086076A (ko) * | 2005-01-26 | 2006-07-31 | 최재호 | 엑스선 복합굴절렌즈 시스템 제조 방법 |
CN103454290A (zh) * | 2013-08-19 | 2013-12-18 | 浙江工业大学 | 一种x射线探测和成像系统的双镜式探测分析方法 |
CN103454298A (zh) * | 2013-08-15 | 2013-12-18 | 浙江工业大学 | 一种微束x射线荧光分析方法 |
CN103454070A (zh) * | 2013-08-20 | 2013-12-18 | 浙江工业大学 | 一种基于ccd探测的x射线组合折射透镜聚焦性能测试方法 |
CN103454299A (zh) * | 2013-08-15 | 2013-12-18 | 浙江工业大学 | 便携式微束x射线荧光光谱仪 |
CN103454069A (zh) * | 2013-08-20 | 2013-12-18 | 浙江工业大学 | X射线组合折射透镜聚焦性能测试装置 |
CN208188021U (zh) * | 2018-04-23 | 2018-12-04 | 浙江工业大学 | 基于x射线阵列组合折射透镜的微束x射线荧光分析系统 |
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- 2018-04-23 CN CN201810366527.4A patent/CN108709899B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06245122A (ja) * | 1993-02-17 | 1994-09-02 | Toshiba Corp | 撮像装置 |
KR20060086076A (ko) * | 2005-01-26 | 2006-07-31 | 최재호 | 엑스선 복합굴절렌즈 시스템 제조 방법 |
CN103454298A (zh) * | 2013-08-15 | 2013-12-18 | 浙江工业大学 | 一种微束x射线荧光分析方法 |
CN103454299A (zh) * | 2013-08-15 | 2013-12-18 | 浙江工业大学 | 便携式微束x射线荧光光谱仪 |
CN103454290A (zh) * | 2013-08-19 | 2013-12-18 | 浙江工业大学 | 一种x射线探测和成像系统的双镜式探测分析方法 |
CN103454070A (zh) * | 2013-08-20 | 2013-12-18 | 浙江工业大学 | 一种基于ccd探测的x射线组合折射透镜聚焦性能测试方法 |
CN103454069A (zh) * | 2013-08-20 | 2013-12-18 | 浙江工业大学 | X射线组合折射透镜聚焦性能测试装置 |
CN208188021U (zh) * | 2018-04-23 | 2018-12-04 | 浙江工业大学 | 基于x射线阵列组合折射透镜的微束x射线荧光分析系统 |
Non-Patent Citations (3)
Title |
---|
乐孜纯等: "抛物面型X射线组合折射透镜聚焦性能的理论与实验研究", 《物理学报》 * |
乐孜纯等: "高能X射线组合透镜聚焦性能的实验结果", 《光学学报》 * |
付明磊等: "级联式平面抛物面型X射线组合折射透镜的设计与制作", 《物理学报》 * |
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Application publication date: 20181026 Assignee: Jiaxing beichuang Network Technology Co.,Ltd. Assignor: JIANG University OF TECHNOLOGY Contract record no.: X2023980037561 Denomination of invention: A Microbeam X-ray Fluorescence Analysis System Based on X-ray Array Combined Refractive Lens Granted publication date: 20200630 License type: Common License Record date: 20230705 |
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Application publication date: 20181026 Assignee: Zhejiang Donghao Information Engineering Co.,Ltd. Assignor: JIANG University OF TECHNOLOGY Contract record no.: X2023980037550 Denomination of invention: A Microbeam X-ray Fluorescence Analysis System Based on X-ray Array Combined Refractive Lens Granted publication date: 20200630 License type: Common License Record date: 20230706 Application publication date: 20181026 Assignee: Jiaxing Juteng Information Technology Co.,Ltd. Assignor: JIANG University OF TECHNOLOGY Contract record no.: X2023980037556 Denomination of invention: A Microbeam X-ray Fluorescence Analysis System Based on X-ray Array Combined Refractive Lens Granted publication date: 20200630 License type: Common License Record date: 20230706 |
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