JP2005514595A5 - - Google Patents
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- Publication number
- JP2005514595A5 JP2005514595A5 JP2003555220A JP2003555220A JP2005514595A5 JP 2005514595 A5 JP2005514595 A5 JP 2005514595A5 JP 2003555220 A JP2003555220 A JP 2003555220A JP 2003555220 A JP2003555220 A JP 2003555220A JP 2005514595 A5 JP2005514595 A5 JP 2005514595A5
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- input
- reference voltage
- transistor
- output signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/016,513 US6545510B1 (en) | 2001-12-10 | 2001-12-10 | Input buffer and method for voltage level detection |
| PCT/US2002/039176 WO2003054560A1 (en) | 2001-12-10 | 2002-12-06 | Input buffer and method for voltage level detection |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008081963A Division JP5191260B2 (ja) | 2001-12-10 | 2008-03-26 | 電圧レベル検出のための入力バッファおよび方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005514595A JP2005514595A (ja) | 2005-05-19 |
| JP2005514595A5 true JP2005514595A5 (enExample) | 2006-01-05 |
| JP4414763B2 JP4414763B2 (ja) | 2010-02-10 |
Family
ID=21777508
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003555220A Expired - Lifetime JP4414763B2 (ja) | 2001-12-10 | 2002-12-06 | 電圧レベル検出のための入力バッファおよび方法 |
| JP2008081963A Expired - Lifetime JP5191260B2 (ja) | 2001-12-10 | 2008-03-26 | 電圧レベル検出のための入力バッファおよび方法 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008081963A Expired - Lifetime JP5191260B2 (ja) | 2001-12-10 | 2008-03-26 | 電圧レベル検出のための入力バッファおよび方法 |
Country Status (10)
| Country | Link |
|---|---|
| US (2) | US6545510B1 (enExample) |
| EP (1) | EP1456675B1 (enExample) |
| JP (2) | JP4414763B2 (enExample) |
| KR (1) | KR100652253B1 (enExample) |
| CN (1) | CN100507582C (enExample) |
| AT (1) | ATE305141T1 (enExample) |
| AU (1) | AU2002359642A1 (enExample) |
| DE (1) | DE60206299T2 (enExample) |
| TW (1) | TW580795B (enExample) |
| WO (1) | WO2003054560A1 (enExample) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6545510B1 (en) * | 2001-12-10 | 2003-04-08 | Micron Technology, Inc. | Input buffer and method for voltage level detection |
| ITRM20020322A1 (it) * | 2002-06-07 | 2003-12-09 | Micron Technology Inc | Rivelatore di bassa tensione di alimentazione. |
| US7026646B2 (en) * | 2002-06-20 | 2006-04-11 | Micron Technology, Inc. | Isolation circuit |
| US6967348B2 (en) * | 2002-06-20 | 2005-11-22 | Micron Technology, Inc. | Signal sharing circuit with microelectric die isolation features |
| KR100891322B1 (ko) * | 2002-09-25 | 2009-03-31 | 삼성전자주식회사 | 데이터 입력 마진을 개선할 수 있는 동시 양방향 입출력회로 |
| US6879534B2 (en) * | 2002-11-01 | 2005-04-12 | Hewlett-Packard Development Company, L.P. | Method and system for minimizing differential amplifier power supply sensitivity |
| US6930534B1 (en) * | 2003-05-16 | 2005-08-16 | Transmeta Corporation | Temperature compensated integrated circuits |
| US20050075809A1 (en) * | 2003-09-18 | 2005-04-07 | Ewc Controls Incorporated | Apparatus and method for detecting, filtering and conditioning AC voltage signals |
| US7088139B1 (en) * | 2003-12-31 | 2006-08-08 | National Semiconductor Corporation | Low power tri-level decoder circuit |
| FR2868629B1 (fr) * | 2004-04-05 | 2006-08-25 | Atmel Corp | Detecteur de tension de seuil differentiel |
| US7206234B2 (en) * | 2005-06-21 | 2007-04-17 | Micron Technology, Inc. | Input buffer for low voltage operation |
| KR100907930B1 (ko) * | 2007-07-03 | 2009-07-16 | 주식회사 하이닉스반도체 | 테스트 시간을 줄일 수 있는 반도체 메모리 장치 |
| TW200908553A (en) * | 2007-08-07 | 2009-02-16 | Univ Chung Yuan Christian | Multi-level comparator for fix power consumption |
| US7804334B2 (en) * | 2008-07-29 | 2010-09-28 | Qualcomm Incorporated | High signal level compliant input/output circuits |
| US8593203B2 (en) | 2008-07-29 | 2013-11-26 | Qualcomm Incorporated | High signal level compliant input/output circuits |
| TWI440313B (zh) | 2010-09-03 | 2014-06-01 | Mstar Semiconductor Inc | 多態信號指示器 |
| CN102401850B (zh) * | 2010-09-08 | 2014-07-16 | 晨星软件研发(深圳)有限公司 | 多态信号指示器 |
| TWI473428B (zh) * | 2011-08-16 | 2015-02-11 | Himax Analogic Inc | 高壓元件電路及其電壓過低鎖定電路 |
| TW201516418A (zh) * | 2013-10-22 | 2015-05-01 | Sunbeen Technology Inc | 電壓檢測方法及使用該方法的電壓檢測裝置 |
| US11125454B2 (en) * | 2014-05-19 | 2021-09-21 | Lennox Industries Inc. | HVAC controller having multiplexed input signal detection and method of operation thereof |
| US10175272B2 (en) * | 2014-08-26 | 2019-01-08 | Intersil Americas LLC | Remote differential voltage sensing |
| JP6779277B2 (ja) * | 2015-07-29 | 2020-11-04 | アンペア・コンピューティング・エルエルシー | 電圧変化をモニターするためのシステム、その方法、および電力モニターシステム |
| US10859610B2 (en) | 2016-04-27 | 2020-12-08 | The University Of Bristol | Voltage detector and voltage detector system |
| US20210143808A1 (en) * | 2017-06-22 | 2021-05-13 | Minima Processor Oy | Timing event detection |
| CN109921783B (zh) * | 2017-12-12 | 2023-07-07 | 华润微集成电路(无锡)有限公司 | 三态输入解码电路及其解码方法 |
| KR102487430B1 (ko) * | 2018-05-10 | 2023-01-11 | 에스케이하이닉스 주식회사 | 기준전압 생성 회로, 이를 이용하는 버퍼, 반도체 장치 및 반도체 시스템 |
| KR102697884B1 (ko) * | 2019-10-04 | 2024-08-22 | 에스케이하이닉스 주식회사 | 전압 생성 회로 및 이를 포함하는 입력 버퍼 |
| US11829169B2 (en) * | 2020-05-14 | 2023-11-28 | Texas Instruments Incorporated | USB power delivery management |
| CN112485654B (zh) * | 2020-11-16 | 2023-07-21 | 上海唯捷创芯电子技术有限公司 | 一种芯片端口状态检测电路、芯片及通信终端 |
| CN112787654B (zh) * | 2021-01-06 | 2025-05-23 | 深圳市紫光同创电子股份有限公司 | 差分输入缓冲电路、差分信号缓冲电路及fpga芯片 |
| CN115267304B (zh) * | 2021-04-30 | 2025-09-02 | 脸萌有限公司 | 供电电压检测器、供电电压检测装置、系统和介质 |
| CN113572468B (zh) * | 2021-07-09 | 2024-06-11 | 力神(青岛)新能源有限公司 | 一种双输入信号同步检测电路 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3806915A (en) * | 1972-09-05 | 1974-04-23 | Us Navy | Multithreshold analog to digital converter |
| JPS5329767A (en) * | 1976-09-01 | 1978-03-20 | Hitachi Ltd | Control circuit |
| JPS62254072A (ja) * | 1986-02-20 | 1987-11-05 | Fujitsu Ltd | 多値電圧レベル比較回路 |
| DE4131417C1 (enExample) | 1991-09-20 | 1993-04-22 | Braun Ag, 6000 Frankfurt, De | |
| CN2155572Y (zh) * | 1993-03-12 | 1994-02-09 | 成都供电局 | 中央信号装置 |
| US5381054A (en) * | 1993-12-07 | 1995-01-10 | Rockwell International Corporation | Multiple input comparator circuit for a switched resistive network |
| US5572147A (en) | 1995-09-08 | 1996-11-05 | United Microelectronics Corporation | Power supply voltage detector |
| JPH09265797A (ja) | 1996-03-29 | 1997-10-07 | Nec Corp | 高電圧検出回路 |
| FR2749939B1 (fr) | 1996-06-13 | 1998-07-31 | Sgs Thomson Microelectronics | Detecteur de gamme de tension d'alimentation dans un circuit integre |
| KR100186344B1 (ko) * | 1996-10-18 | 1999-04-15 | 문정환 | 히스테리시스 입력버퍼 |
| US5995426A (en) | 1997-11-04 | 1999-11-30 | Micron Technology, Inc. | Testing parameters of an electronic device |
| US6037762A (en) | 1997-12-19 | 2000-03-14 | Texas Instruments Incorporated | Voltage detector having improved characteristics |
| US5959929A (en) | 1997-12-29 | 1999-09-28 | Micron Technology, Inc. | Method for writing to multiple banks of a memory device |
| US6289476B1 (en) | 1998-06-10 | 2001-09-11 | Micron Technology, Inc. | Method and apparatus for testing the timing of integrated circuits |
| US6028456A (en) * | 1998-08-18 | 2000-02-22 | Toko, Inc. | Dual-threshold comparator circuit utilizing a single input pin |
| US6133753A (en) * | 1998-11-25 | 2000-10-17 | Analog Devices, Inc. | Tri-state input detection circuit |
| US6545510B1 (en) * | 2001-12-10 | 2003-04-08 | Micron Technology, Inc. | Input buffer and method for voltage level detection |
-
2001
- 2001-12-10 US US10/016,513 patent/US6545510B1/en not_active Expired - Lifetime
-
2002
- 2002-12-06 JP JP2003555220A patent/JP4414763B2/ja not_active Expired - Lifetime
- 2002-12-06 EP EP02794194A patent/EP1456675B1/en not_active Expired - Lifetime
- 2002-12-06 AU AU2002359642A patent/AU2002359642A1/en not_active Abandoned
- 2002-12-06 CN CNB028276051A patent/CN100507582C/zh not_active Expired - Lifetime
- 2002-12-06 AT AT02794194T patent/ATE305141T1/de not_active IP Right Cessation
- 2002-12-06 WO PCT/US2002/039176 patent/WO2003054560A1/en not_active Ceased
- 2002-12-06 DE DE60206299T patent/DE60206299T2/de not_active Expired - Lifetime
- 2002-12-06 KR KR1020047008879A patent/KR100652253B1/ko not_active Expired - Lifetime
- 2002-12-09 TW TW091135530A patent/TW580795B/zh not_active IP Right Cessation
-
2003
- 2003-02-19 US US10/371,374 patent/US6700416B2/en not_active Expired - Lifetime
-
2008
- 2008-03-26 JP JP2008081963A patent/JP5191260B2/ja not_active Expired - Lifetime
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