JP2005164338A - 制御装置の検査装置、パターン信号作成装置及び検査プログラム生成装置 - Google Patents

制御装置の検査装置、パターン信号作成装置及び検査プログラム生成装置 Download PDF

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Publication number
JP2005164338A
JP2005164338A JP2003402159A JP2003402159A JP2005164338A JP 2005164338 A JP2005164338 A JP 2005164338A JP 2003402159 A JP2003402159 A JP 2003402159A JP 2003402159 A JP2003402159 A JP 2003402159A JP 2005164338 A JP2005164338 A JP 2005164338A
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Japan
Prior art keywords
pattern signal
inspection
control device
signal
pattern
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Pending
Application number
JP2003402159A
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English (en)
Japanese (ja)
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JP2005164338A5 (https=
Inventor
Masahito Ishio
雅人 石尾
Shigeyuki Hisai
茂幸 久井
Taketomo Amie
岳朋 網江
Koji Uchihashi
浩二 内橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denso Ten Ltd
Original Assignee
Denso Ten Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denso Ten Ltd filed Critical Denso Ten Ltd
Priority to JP2003402159A priority Critical patent/JP2005164338A/ja
Priority to PCT/JP2004/017970 priority patent/WO2005054883A1/ja
Priority to US10/596,118 priority patent/US20080281549A1/en
Publication of JP2005164338A publication Critical patent/JP2005164338A/ja
Publication of JP2005164338A5 publication Critical patent/JP2005164338A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G01R31/2848—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms using simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Debugging And Monitoring (AREA)
JP2003402159A 2003-12-01 2003-12-01 制御装置の検査装置、パターン信号作成装置及び検査プログラム生成装置 Pending JP2005164338A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2003402159A JP2005164338A (ja) 2003-12-01 2003-12-01 制御装置の検査装置、パターン信号作成装置及び検査プログラム生成装置
PCT/JP2004/017970 WO2005054883A1 (ja) 2003-12-01 2004-11-26 制御装置の検査装置、パターン信号作成装置及び検査プログラム生成装置
US10/596,118 US20080281549A1 (en) 2003-12-01 2004-11-26 Test Apparatus for Control Unit, Pattern Signal Creating Apparatus, and Test Program Generating Apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003402159A JP2005164338A (ja) 2003-12-01 2003-12-01 制御装置の検査装置、パターン信号作成装置及び検査プログラム生成装置

Publications (2)

Publication Number Publication Date
JP2005164338A true JP2005164338A (ja) 2005-06-23
JP2005164338A5 JP2005164338A5 (https=) 2007-01-25

Family

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Family Applications (1)

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JP2003402159A Pending JP2005164338A (ja) 2003-12-01 2003-12-01 制御装置の検査装置、パターン信号作成装置及び検査プログラム生成装置

Country Status (3)

Country Link
US (1) US20080281549A1 (https=)
JP (1) JP2005164338A (https=)
WO (1) WO2005054883A1 (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007171100A (ja) * 2005-12-26 2007-07-05 Fujitsu Ten Ltd 信号パターン作成装置
JP2017118188A (ja) * 2015-12-21 2017-06-29 アンリツ株式会社 シーケンス発生装置、それを用いた誤り率測定装置、及びシーケンス発生方法
JP2020524862A (ja) * 2018-12-12 2020-08-20 三菱電機株式会社 ソフトウェア試験装置、ソフトウェア試験方法、および、ソフトウェア試験プログラム

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5052519B2 (ja) * 2006-09-29 2012-10-17 富士通テン株式会社 シミュレーション装置、シミュレーションシステム及びシミュレーション方法
US20120192013A1 (en) * 2010-11-22 2012-07-26 Certon Software Inc. Verification of Signal Processing Using Intelligent Points
CN112131063B (zh) * 2020-09-29 2023-10-24 中国银行股份有限公司 重试方法及装置、计算机设备及计算机可读存储介质

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0416782A (ja) * 1990-05-11 1992-01-21 Fujitsu Ltd Ｌｓｉ試験方法とその試験装置
JP2003114254A (ja) * 2001-10-04 2003-04-18 Matsushita Electric Ind Co Ltd 検査方法および検査装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4954948A (en) * 1986-12-29 1990-09-04 Motorola, Inc. Microprocessor operating system for sequentially executing subtasks
JPH0224584A (ja) * 1988-07-13 1990-01-26 Nec Corp テストパターン作成方法
US5307290A (en) * 1988-10-18 1994-04-26 Fiat Auto S.P.A. System for the automatic testing, preferably on a bench, of electronic control systems which are intended to be fitted in vehicles
JPH0432784A (ja) * 1990-05-29 1992-02-04 Mitsubishi Electric Corp テストプログラムジエネレータ
DE4121637C2 (de) * 1991-06-29 1997-04-24 Bosch Gmbh Robert Verfahren zur Prüfung von Steuergeräten und Prüfeinrichtung zur Durchführung des Verfahrens
JPH07129645A (ja) * 1993-10-29 1995-05-19 Nec Corp タイムチャートの波形表示方法
US5438513A (en) * 1993-11-19 1995-08-01 Chrysler Corporation Automotive electronics test system
US5442738A (en) * 1993-12-03 1995-08-15 Motorola, Inc. Computer display representing structure
JP4439046B2 (ja) * 1999-10-22 2010-03-24 クラリオン株式会社 オーディオ機器自動測定装置、ネットワークシステム、オーディオ機器自動測定用データ処理・制御装置、自動測定処理・制御用プログラムの記録媒体
JP2003270300A (ja) * 2002-03-14 2003-09-25 Ricoh Co Ltd 検査装置および方法
JP4247517B2 (ja) * 2002-11-15 2009-04-02 富士通テン株式会社 波形編集用プログラム、波形編集装置、及び波形編集方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0416782A (ja) * 1990-05-11 1992-01-21 Fujitsu Ltd Ｌｓｉ試験方法とその試験装置
JP2003114254A (ja) * 2001-10-04 2003-04-18 Matsushita Electric Ind Co Ltd 検査方法および検査装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007171100A (ja) * 2005-12-26 2007-07-05 Fujitsu Ten Ltd 信号パターン作成装置
JP2017118188A (ja) * 2015-12-21 2017-06-29 アンリツ株式会社 シーケンス発生装置、それを用いた誤り率測定装置、及びシーケンス発生方法
JP2020524862A (ja) * 2018-12-12 2020-08-20 三菱電機株式会社 ソフトウェア試験装置、ソフトウェア試験方法、および、ソフトウェア試験プログラム

Also Published As

Publication number Publication date
WO2005054883A1 (ja) 2005-06-16
US20080281549A1 (en) 2008-11-13

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