JP2004501517A5 - - Google Patents

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Publication number
JP2004501517A5
JP2004501517A5 JP2002504502A JP2002504502A JP2004501517A5 JP 2004501517 A5 JP2004501517 A5 JP 2004501517A5 JP 2002504502 A JP2002504502 A JP 2002504502A JP 2002504502 A JP2002504502 A JP 2002504502A JP 2004501517 A5 JP2004501517 A5 JP 2004501517A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002504502A
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JP2004501517A (ja
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Priority claimed from PCT/US2001/019792 external-priority patent/WO2001098793A2/en
Publication of JP2004501517A publication Critical patent/JP2004501517A/ja
Publication of JP2004501517A5 publication Critical patent/JP2004501517A5/ja
Pending legal-status Critical Current

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JP2002504502A 2000-06-20 2001-06-20 集積回路をテスト及びパッケージングするためのシステム Pending JP2004501517A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US21292300P 2000-06-20 2000-06-20
US21372900P 2000-06-22 2000-06-22
PCT/US2001/019792 WO2001098793A2 (en) 2000-06-20 2001-06-20 Systems for testing integraged circuits during burn-in

Publications (2)

Publication Number Publication Date
JP2004501517A JP2004501517A (ja) 2004-01-15
JP2004501517A5 true JP2004501517A5 (ja) 2008-07-24

Family

ID=26907616

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002504502A Pending JP2004501517A (ja) 2000-06-20 2001-06-20 集積回路をテスト及びパッケージングするためのシステム

Country Status (8)

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US (1) US6791171B2 (ja)
EP (1) EP1292834B1 (ja)
JP (1) JP2004501517A (ja)
KR (1) KR20020026585A (ja)
AT (1) ATE311604T1 (ja)
AU (1) AU2001268630A1 (ja)
DE (1) DE60115437T2 (ja)
WO (1) WO2001098793A2 (ja)

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