JP2004294565A - 反射防止膜 - Google Patents
反射防止膜 Download PDFInfo
- Publication number
- JP2004294565A JP2004294565A JP2003083917A JP2003083917A JP2004294565A JP 2004294565 A JP2004294565 A JP 2004294565A JP 2003083917 A JP2003083917 A JP 2003083917A JP 2003083917 A JP2003083917 A JP 2003083917A JP 2004294565 A JP2004294565 A JP 2004294565A
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- metal oxide
- fine voids
- refractive index
- amorphous
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/11—Anti-reflection coatings
- G02B1/113—Anti-reflection coatings using inorganic layer materials only
- G02B1/115—Multilayers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/11—Anti-reflection coatings
- G02B1/113—Anti-reflection coatings using inorganic layer materials only
- G02B1/115—Multilayers
- G02B1/116—Multilayers including electrically conducting layers
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Surface Treatment Of Optical Elements (AREA)
- Surface Treatment Of Glass (AREA)
- Laminated Bodies (AREA)
- Oxygen, Ozone, And Oxides In General (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
- Liquid Crystal (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003083917A JP2004294565A (ja) | 2003-03-25 | 2003-03-25 | 反射防止膜 |
| PCT/JP2004/004160 WO2004086104A1 (ja) | 2003-03-25 | 2004-03-25 | 反射防止膜 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003083917A JP2004294565A (ja) | 2003-03-25 | 2003-03-25 | 反射防止膜 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004294565A true JP2004294565A (ja) | 2004-10-21 |
| JP2004294565A5 JP2004294565A5 (https=) | 2006-05-11 |
Family
ID=33094978
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003083917A Withdrawn JP2004294565A (ja) | 2003-03-25 | 2003-03-25 | 反射防止膜 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP2004294565A (https=) |
| WO (1) | WO2004086104A1 (https=) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008522931A (ja) * | 2004-12-06 | 2008-07-03 | コロロッビア イタリア ソシエタ ペル アチオニ | ナノ微粒子形状のTiO2分散の調製方法、並びにこの方法により得られる分散及びTiO2分散利用による表面特性変化 |
| JP2009237306A (ja) * | 2008-03-27 | 2009-10-15 | Seiko Epson Corp | 光学物品およびその製造方法 |
| WO2011043018A1 (ja) * | 2009-10-09 | 2011-04-14 | 国立大学法人信州大学 | 高屈折率材料の製造方法および当該材料と高分子材料との複合体 |
| JP2011119739A (ja) * | 2009-12-03 | 2011-06-16 | Lg Innotek Co Ltd | 発光装置及びその製造方法 |
| US10473823B2 (en) | 2012-07-04 | 2019-11-12 | Canon Kabushiki Kaisha | Fine structure, optical member, antireflection film, water-repellent film, substrate for mass spectrometry, phase plate, process for producing fine structure, and process for producing antireflection film |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1773729B1 (en) | 2004-07-12 | 2007-11-07 | Cardinal CG Company | Low-maintenance coatings |
| WO2007121215A1 (en) | 2006-04-11 | 2007-10-25 | Cardinal Cg Company | Photocatalytic coatings having improved low-maintenance properties |
| US20080011599A1 (en) | 2006-07-12 | 2008-01-17 | Brabender Dennis M | Sputtering apparatus including novel target mounting and/or control |
| KR101512166B1 (ko) | 2007-09-14 | 2015-04-14 | 카디날 씨지 컴퍼니 | 관리가 용이한 코팅 기술 |
| WO2011139856A2 (en) | 2010-04-29 | 2011-11-10 | Battelle Memorial Institute | High refractive index composition |
| WO2018093985A1 (en) | 2016-11-17 | 2018-05-24 | Cardinal Cg Company | Static-dissipative coating technology |
| KR102692564B1 (ko) * | 2018-09-21 | 2024-08-06 | 삼성전자주식회사 | 다층 박막 구조물 및 이를 이용한 위상 변환 소자 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3387204B2 (ja) * | 1993-04-15 | 2003-03-17 | セイコーエプソン株式会社 | 偏光板、偏光板の製造方法および液晶表示装置 |
| JP2001310423A (ja) * | 2000-02-23 | 2001-11-06 | Fuji Photo Film Co Ltd | 耐傷性透明支持体、および反射防止膜 |
-
2003
- 2003-03-25 JP JP2003083917A patent/JP2004294565A/ja not_active Withdrawn
-
2004
- 2004-03-25 WO PCT/JP2004/004160 patent/WO2004086104A1/ja not_active Ceased
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008522931A (ja) * | 2004-12-06 | 2008-07-03 | コロロッビア イタリア ソシエタ ペル アチオニ | ナノ微粒子形状のTiO2分散の調製方法、並びにこの方法により得られる分散及びTiO2分散利用による表面特性変化 |
| JP2009237306A (ja) * | 2008-03-27 | 2009-10-15 | Seiko Epson Corp | 光学物品およびその製造方法 |
| WO2011043018A1 (ja) * | 2009-10-09 | 2011-04-14 | 国立大学法人信州大学 | 高屈折率材料の製造方法および当該材料と高分子材料との複合体 |
| JP2011080007A (ja) * | 2009-10-09 | 2011-04-21 | Shinshu Univ | 高屈折率材料の製造方法および当該材料と高分子材料との複合体 |
| JP2011119739A (ja) * | 2009-12-03 | 2011-06-16 | Lg Innotek Co Ltd | 発光装置及びその製造方法 |
| US10473823B2 (en) | 2012-07-04 | 2019-11-12 | Canon Kabushiki Kaisha | Fine structure, optical member, antireflection film, water-repellent film, substrate for mass spectrometry, phase plate, process for producing fine structure, and process for producing antireflection film |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2004086104A1 (ja) | 2004-10-07 |
| WO2004086104A8 (ja) | 2006-06-29 |
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Legal Events
| Date | Code | Title | Description |
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| A621 | Written request for application examination |
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| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080222 |
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| A761 | Written withdrawal of application |
Free format text: JAPANESE INTERMEDIATE CODE: A761 Effective date: 20080417 |