JP2004134731A5 - - Google Patents
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- JP2004134731A5 JP2004134731A5 JP2003128286A JP2003128286A JP2004134731A5 JP 2004134731 A5 JP2004134731 A5 JP 2004134731A5 JP 2003128286 A JP2003128286 A JP 2003128286A JP 2003128286 A JP2003128286 A JP 2003128286A JP 2004134731 A5 JP2004134731 A5 JP 2004134731A5
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- heated
- substrate
- heating
- reactor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/141517 | 2002-05-08 | ||
| US10/141,517 US6843201B2 (en) | 2002-05-08 | 2002-05-08 | Temperature control for single substrate semiconductor processing reactor |
| US10/410699 | 2003-04-08 | ||
| US10/410,699 US7427329B2 (en) | 2002-05-08 | 2003-04-08 | Temperature control for single substrate semiconductor processing reactor |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004134731A JP2004134731A (ja) | 2004-04-30 |
| JP2004134731A5 true JP2004134731A5 (enExample) | 2006-02-16 |
| JP5054275B2 JP5054275B2 (ja) | 2012-10-24 |
Family
ID=32302116
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003128286A Expired - Lifetime JP5054275B2 (ja) | 2002-05-08 | 2003-05-06 | 枚葉式半導体基板処理リアクタの温度制御 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7427329B2 (enExample) |
| JP (1) | JP5054275B2 (enExample) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005019725A (ja) * | 2003-06-26 | 2005-01-20 | Shinku Jikkenshitsu:Kk | アニール装置及びアニール方法 |
| US7410355B2 (en) * | 2003-10-31 | 2008-08-12 | Asm International N.V. | Method for the heat treatment of substrates |
| US7022627B2 (en) | 2003-10-31 | 2006-04-04 | Asm International N.V. | Method for the heat treatment of substrates |
| US6940047B2 (en) * | 2003-11-14 | 2005-09-06 | Asm International N.V. | Heat treatment apparatus with temperature control system |
| US7217670B2 (en) * | 2004-11-22 | 2007-05-15 | Asm International N.V. | Dummy substrate for thermal reactor |
| US20070125303A1 (en) * | 2005-12-02 | 2007-06-07 | Ward Ruby | High-throughput deposition system for oxide thin film growth by reactive coevaportation |
| JP5228495B2 (ja) | 2008-01-11 | 2013-07-03 | 富士通セミコンダクター株式会社 | 半導体装置の製造方法 |
| US8002463B2 (en) * | 2008-06-13 | 2011-08-23 | Asm International N.V. | Method and device for determining the temperature of a substrate |
| TW201017790A (en) * | 2008-10-17 | 2010-05-01 | Inotera Memories Inc | A furnace temperature flip method for thermal budget balance and minimum electric parameter variation |
| JP2011091386A (ja) * | 2009-09-24 | 2011-05-06 | Semiconductor Energy Lab Co Ltd | 熱処理装置、熱処理方法及び半導体装置の作製方法 |
| US20110097491A1 (en) * | 2009-10-27 | 2011-04-28 | Levy David H | Conveyance system including opposed fluid distribution manifolds |
| CN102543662B (zh) * | 2010-12-30 | 2016-02-03 | 上海微电子装备有限公司 | 热盘及应用其的硅片加热系统 |
| JP5645718B2 (ja) * | 2011-03-07 | 2014-12-24 | 東京エレクトロン株式会社 | 熱処理装置 |
| KR101810046B1 (ko) * | 2012-01-19 | 2017-12-19 | 삼성디스플레이 주식회사 | 기상 증착 장치 및 기상 증착 방법 |
| EP3624175B1 (en) * | 2014-01-21 | 2021-12-22 | Kateeva, Inc. | Method for electronic device encapsulation |
| WO2015194675A1 (ja) * | 2014-06-18 | 2015-12-23 | 東京エレクトロン株式会社 | 加熱装置、加熱方法、温度調整機構及び半導体製造装置 |
| JP6382151B2 (ja) * | 2014-09-25 | 2018-08-29 | 東京エレクトロン株式会社 | 基板熱処理装置、基板熱処理方法、記録媒体及び熱処理状態検知装置 |
| KR102350554B1 (ko) * | 2015-05-29 | 2022-01-17 | 세메스 주식회사 | 웨이퍼 가열 장치 |
| JP7008602B2 (ja) * | 2018-09-27 | 2022-01-25 | 東京エレクトロン株式会社 | 成膜装置および温度制御方法 |
| WO2021150524A1 (en) | 2020-01-22 | 2021-07-29 | Applied Materials, Inc. | In-line monitoring of oled layer thickness and dopant concentration |
| EP4094307A4 (en) * | 2020-01-22 | 2024-02-28 | Applied Materials, Inc. | INLINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION |
| KR102359376B1 (ko) * | 2020-06-03 | 2022-02-08 | 한국고요써모시스템(주) | 기판의 열처리 오븐 |
| CN111705302B (zh) * | 2020-08-18 | 2020-11-10 | 上海陛通半导体能源科技股份有限公司 | 可实现晶圆平稳升降的气相沉积设备 |
| CN113878773B (zh) * | 2021-10-22 | 2022-08-09 | 中国原子能科学研究院 | 树脂基中子屏蔽材料及其制备方法 |
| CN115505897B (zh) * | 2022-09-22 | 2023-10-31 | 江苏第三代半导体研究院有限公司 | 一种用于制备外延片的转盘式反应器、制备方法及用途 |
| CN117524930B (zh) * | 2023-11-07 | 2025-05-06 | 拓荆创益(沈阳)半导体设备有限公司 | 一种半导体腔室双加热盘的温度控制系统和方法 |
Family Cites Families (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3947236A (en) | 1971-11-29 | 1976-03-30 | Lasch Jr Cecil A | Fluid bearing transfer and heat treating apparatus and method |
| US3836751A (en) | 1973-07-26 | 1974-09-17 | Applied Materials Inc | Temperature controlled profiling heater |
| JPS6074626A (ja) | 1983-09-30 | 1985-04-26 | Fujitsu Ltd | ウエハー処理方法及び装置 |
| JPS61198735A (ja) * | 1985-02-28 | 1986-09-03 | Fujitsu Ltd | フラツシユランプアニ−ル装置 |
| FR2596070A1 (fr) | 1986-03-21 | 1987-09-25 | Labo Electronique Physique | Dispositif comprenant un suscepteur plan tournant parallelement a un plan de reference autour d'un axe perpendiculaire a ce plan |
| JPS63136532A (ja) | 1986-11-27 | 1988-06-08 | Nec Kyushu Ltd | 半導体基板熱処理装置 |
| US4975561A (en) | 1987-06-18 | 1990-12-04 | Epsilon Technology Inc. | Heating system for substrates |
| JPH0234915A (ja) * | 1988-07-25 | 1990-02-05 | Mitsubishi Electric Corp | 半導体熱処理装置 |
| JP2704309B2 (ja) | 1990-06-12 | 1998-01-26 | 大日本スクリーン製造株式会社 | 基板処理装置及び基板の熱処理方法 |
| US5294778A (en) | 1991-09-11 | 1994-03-15 | Lam Research Corporation | CVD platen heater system utilizing concentric electric heating elements |
| JPH05102166A (ja) * | 1991-10-08 | 1993-04-23 | Mitsubishi Electric Corp | 半導体製造装置 |
| US5332442A (en) | 1991-11-15 | 1994-07-26 | Tokyo Electron Kabushiki Kaisha | Surface processing apparatus |
| US5650082A (en) | 1993-10-29 | 1997-07-22 | Applied Materials, Inc. | Profiled substrate heating |
| JPH08236533A (ja) | 1995-02-24 | 1996-09-13 | Toshiba Corp | ウエハ加熱冷却装置 |
| JP3824675B2 (ja) | 1995-03-03 | 2006-09-20 | 有限会社デジタル・ウェーブ | 結晶製造装置 |
| JPH098049A (ja) * | 1995-06-21 | 1997-01-10 | Dainippon Screen Mfg Co Ltd | 基板加熱装置 |
| US5997588A (en) | 1995-10-13 | 1999-12-07 | Advanced Semiconductor Materials America, Inc. | Semiconductor processing system with gas curtain |
| KR100486158B1 (ko) | 1996-01-31 | 2005-11-08 | 에이에스엠 아메리카, 인코포레이티드 | 열처리의모델베이스예측제어 |
| WO1997031389A1 (en) | 1996-02-23 | 1997-08-28 | Tokyo Electron Limited | Heat treatment device |
| KR20000016137A (ko) | 1996-05-31 | 2000-03-25 | 피터 무몰라 | 웨이퍼형 제품용 비접촉 홀더 |
| US6183565B1 (en) | 1997-07-08 | 2001-02-06 | Asm International N.V | Method and apparatus for supporting a semiconductor wafer during processing |
| US5891251A (en) | 1996-08-07 | 1999-04-06 | Macleish; Joseph H. | CVD reactor having heated process chamber within isolation chamber |
| JPH10321505A (ja) | 1997-05-20 | 1998-12-04 | Sony Corp | フォトレジスト膜の硬化方法およびその装置 |
| JP3665826B2 (ja) | 1997-05-29 | 2005-06-29 | Smc株式会社 | 基板熱処理装置 |
| JP3911071B2 (ja) * | 1997-06-13 | 2007-05-09 | サイエンステクノロジー株式会社 | 高速ランプ加熱処理装置及び高速ランプ加熱処理方法 |
| US6222990B1 (en) * | 1997-12-03 | 2001-04-24 | Steag Rtp Systems | Heating element for heating the edges of wafers in thermal processing chambers |
| US6179924B1 (en) * | 1998-04-28 | 2001-01-30 | Applied Materials, Inc. | Heater for use in substrate processing apparatus to deposit tungsten |
| US6064799A (en) | 1998-04-30 | 2000-05-16 | Applied Materials, Inc. | Method and apparatus for controlling the radial temperature gradient of a wafer while ramping the wafer temperature |
| JP3764278B2 (ja) * | 1998-07-13 | 2006-04-05 | 株式会社東芝 | 基板加熱装置、基板加熱方法及び基板処理方法 |
| JP2000036469A (ja) * | 1998-07-21 | 2000-02-02 | Dainippon Screen Mfg Co Ltd | 基板熱処理装置 |
| US6300600B1 (en) * | 1998-08-12 | 2001-10-09 | Silicon Valley Group, Inc. | Hot wall rapid thermal processor |
| JP3453069B2 (ja) * | 1998-08-20 | 2003-10-06 | 東京エレクトロン株式会社 | 基板温調装置 |
| NL1011017C2 (nl) | 1999-01-13 | 2000-07-31 | Asm Int | Inrichting voor het positioneren van een wafer. |
| NL1011856C2 (nl) | 1999-04-21 | 2000-10-24 | Asm Internat B V | Floating wafer reactor alsmede werkwijze voor het regelen van de temperatuur daarvan. |
| NL1012004C2 (nl) | 1999-05-07 | 2000-11-13 | Asm Int | Werkwijze voor het verplaatsen van wafers alsmede ring. |
| US6239304B1 (en) * | 1999-05-24 | 2001-05-29 | Shin-Etsu Chemical Co., Ltd. | Process for preparing organohalosilanes |
| KR100700764B1 (ko) | 1999-09-03 | 2007-03-27 | 동경 엘렉트론 주식회사 | 기판처리장치 및 기판처리방법 |
| WO2001024581A1 (en) * | 1999-09-29 | 2001-04-05 | Tokyo Electron Limited | Multi-zone resistance heater |
| US7037797B1 (en) | 2000-03-17 | 2006-05-02 | Mattson Technology, Inc. | Localized heating and cooling of substrates |
| TW522292B (en) * | 2001-02-06 | 2003-03-01 | Asml Us Inc | Inertial temperature control system and method |
-
2003
- 2003-04-08 US US10/410,699 patent/US7427329B2/en not_active Expired - Lifetime
- 2003-05-06 JP JP2003128286A patent/JP5054275B2/ja not_active Expired - Lifetime
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