JP2003043373A5 - - Google Patents

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Publication number
JP2003043373A5
JP2003043373A5 JP2001225306A JP2001225306A JP2003043373A5 JP 2003043373 A5 JP2003043373 A5 JP 2003043373A5 JP 2001225306 A JP2001225306 A JP 2001225306A JP 2001225306 A JP2001225306 A JP 2001225306A JP 2003043373 A5 JP2003043373 A5 JP 2003043373A5
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JP
Japan
Prior art keywords
microscope
respect
hollow
optical system
optical axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001225306A
Other languages
English (en)
Japanese (ja)
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JP2003043373A (ja
JP4205321B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2001225306A priority Critical patent/JP4205321B2/ja
Priority claimed from JP2001225306A external-priority patent/JP4205321B2/ja
Priority to EP02738702A priority patent/EP1418456A4/en
Priority to US10/484,626 priority patent/US7315412B2/en
Priority to PCT/JP2002/005922 priority patent/WO2003012520A1/ja
Publication of JP2003043373A publication Critical patent/JP2003043373A/ja
Publication of JP2003043373A5 publication Critical patent/JP2003043373A5/ja
Application granted granted Critical
Publication of JP4205321B2 publication Critical patent/JP4205321B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2001225306A 2001-07-26 2001-07-26 顕微鏡等のフォーカス安定性機構 Expired - Lifetime JP4205321B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2001225306A JP4205321B2 (ja) 2001-07-26 2001-07-26 顕微鏡等のフォーカス安定性機構
EP02738702A EP1418456A4 (en) 2001-07-26 2002-06-13 FOCUS STABILIZATION MECHANISM OF A MICROSCOPE OR THE LIKE
US10/484,626 US7315412B2 (en) 2001-07-26 2002-06-13 Focus stabilizing mechanism for microscopes and similar optical instruments
PCT/JP2002/005922 WO2003012520A1 (en) 2001-07-26 2002-06-13 Focus stabilizing mechanism of microscope or the like

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001225306A JP4205321B2 (ja) 2001-07-26 2001-07-26 顕微鏡等のフォーカス安定性機構

Publications (3)

Publication Number Publication Date
JP2003043373A JP2003043373A (ja) 2003-02-13
JP2003043373A5 true JP2003043373A5 (enExample) 2005-07-21
JP4205321B2 JP4205321B2 (ja) 2009-01-07

Family

ID=19058315

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001225306A Expired - Lifetime JP4205321B2 (ja) 2001-07-26 2001-07-26 顕微鏡等のフォーカス安定性機構

Country Status (4)

Country Link
US (1) US7315412B2 (enExample)
EP (1) EP1418456A4 (enExample)
JP (1) JP4205321B2 (enExample)
WO (1) WO2003012520A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004057451A1 (de) * 2004-11-24 2006-06-01 Carl Zeiss Jena Gmbh Objektiv-Tisch-System für Mikroskope
DE102005001102B4 (de) * 2005-01-08 2021-04-29 Carl Zeiss Microscopy Gmbh Temperierbares Objektiv für Mikroskope
US20080174862A1 (en) * 2007-01-22 2008-07-24 Focht Daniel C Specimen Holder For Microscopy
WO2009014108A1 (ja) * 2007-07-20 2009-01-29 Nikon Corporation 対物レンズ、レボルバ及びこれらを備える倒立顕微鏡
US7854524B2 (en) * 2007-09-28 2010-12-21 Anorad Corporation High stiffness low mass supporting structure for a mirror assembly
DE202009010772U1 (de) 2009-08-11 2009-11-26 Deutsches Krebsforschungszentrum Stiftung des öffentlichen Rechts Anordnung zur Abbildungsstabilisierung
DE102010009679B4 (de) 2010-03-01 2020-03-05 Leica Microsystems Cms Gmbh Probenhalterung für ein Mikroskop und Mikroskop
DE102010060841B3 (de) * 2010-11-26 2012-06-06 Leica Microsystems Cms Gmbh Einrichtung zum Fokussieren eines Mikroskopobjektivs auf eine Probe
CN102981259B (zh) * 2012-11-26 2015-06-10 长春迪瑞医疗科技股份有限公司 一种光学成像系统的热膨胀补偿装置和方法
WO2016154200A1 (en) 2015-03-23 2016-09-29 Nanomechanics, Inc. Structure for achieving dimensional stability during temperature changes
JP2017040835A (ja) * 2015-08-21 2017-02-23 株式会社日立ハイテクノロジーズ 光学顕微鏡および電子顕微鏡

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4703181A (en) * 1986-04-07 1987-10-27 Gatan Inc. Anti-drift device for side entry electron microscope specimen holders
JP2883110B2 (ja) 1989-07-27 1999-04-19 オリンパス光学工業株式会社 顕微鏡の準焦装置
US5317153A (en) * 1991-08-08 1994-05-31 Nikon Corporation Scanning probe microscope
DE19530136C1 (de) 1995-08-16 1997-02-13 Leica Mikroskopie & Syst Einrichtung zur Fokusstabilisierung in einem Mikroskop
JP2778573B2 (ja) * 1996-03-22 1998-07-23 日本電気株式会社 加熱ステージ
JPH1090610A (ja) 1996-09-17 1998-04-10 Olympus Optical Co Ltd 走査型プローブ顕微鏡
US5978086A (en) * 1997-03-11 1999-11-02 Wyko Corporation Method and apparatus for correcting shifts between a reference focal point and a reference surface as a result of thermal effects in an interferometric optical objective
US6678089B1 (en) * 2000-04-13 2004-01-13 Leica Microsystems Heidelberg Gmbh Microscope
US6628459B2 (en) * 2000-04-19 2003-09-30 Olympus Optical Co., Ltd. Focus stabilizing apparatus
JP2001305432A (ja) * 2000-04-19 2001-10-31 Olympus Optical Co Ltd フォーカス安定装置
JP4914537B2 (ja) 2000-04-19 2012-04-11 オリンパス株式会社 倒立型顕微鏡に適用される試料支持装置
DE20106834U1 (de) * 2001-04-19 2001-06-28 Leica Microsystems Wetzlar GmbH, 35578 Wetzlar Vorrichtung zur Feinfokussierung
JP2003029162A (ja) 2001-07-11 2003-01-29 Nikon Corp 顕微鏡用対物レンズおよび顕微鏡

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