JP2003270537A5 - - Google Patents
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- Publication number
- JP2003270537A5 JP2003270537A5 JP2002073455A JP2002073455A JP2003270537A5 JP 2003270537 A5 JP2003270537 A5 JP 2003270537A5 JP 2002073455 A JP2002073455 A JP 2002073455A JP 2002073455 A JP2002073455 A JP 2002073455A JP 2003270537 A5 JP2003270537 A5 JP 2003270537A5
- Authority
- JP
- Japan
- Prior art keywords
- optical system
- optical
- imaging
- support
- shape
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims 15
- 238000003384 imaging method Methods 0.000 claims 6
- 230000005540 biological transmission Effects 0.000 claims 2
- 238000005286 illumination Methods 0.000 claims 2
- 230000010287 polarization Effects 0.000 claims 2
- 238000010276 construction Methods 0.000 claims 1
- 238000006073 displacement reaction Methods 0.000 claims 1
- 238000000407 epitaxy Methods 0.000 claims 1
- 230000005484 gravity Effects 0.000 claims 1
- 239000002184 metal Substances 0.000 claims 1
- 238000012576 optical tweezer Methods 0.000 claims 1
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002073455A JP4084061B2 (ja) | 2002-03-18 | 2002-03-18 | 高安定性光学顕微鏡 |
| EP02772834A EP1486810B1 (en) | 2002-03-18 | 2002-09-03 | High-stability optical microscope |
| US10/506,107 US7307784B2 (en) | 2002-03-18 | 2002-09-03 | High-stability optical microscope |
| CNB028285794A CN100559228C (zh) | 2002-03-18 | 2002-09-03 | 高稳定性光学显微镜 |
| PCT/JP2002/008935 WO2003079089A1 (fr) | 2002-03-18 | 2002-09-03 | Microscope optique a haute stabilite |
| DE60232196T DE60232196D1 (de) | 2002-03-18 | 2002-09-03 | Hochstabiles optisches mikroskop |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002073455A JP4084061B2 (ja) | 2002-03-18 | 2002-03-18 | 高安定性光学顕微鏡 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2003270537A JP2003270537A (ja) | 2003-09-25 |
| JP2003270537A5 true JP2003270537A5 (enExample) | 2005-07-21 |
| JP4084061B2 JP4084061B2 (ja) | 2008-04-30 |
Family
ID=28035240
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002073455A Expired - Fee Related JP4084061B2 (ja) | 2002-03-18 | 2002-03-18 | 高安定性光学顕微鏡 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7307784B2 (enExample) |
| EP (1) | EP1486810B1 (enExample) |
| JP (1) | JP4084061B2 (enExample) |
| CN (1) | CN100559228C (enExample) |
| DE (1) | DE60232196D1 (enExample) |
| WO (1) | WO2003079089A1 (enExample) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4558366B2 (ja) * | 2004-03-30 | 2010-10-06 | オリンパス株式会社 | システム顕微鏡 |
| DE102005001102B4 (de) * | 2005-01-08 | 2021-04-29 | Carl Zeiss Microscopy Gmbh | Temperierbares Objektiv für Mikroskope |
| EP1915607A1 (en) * | 2005-07-19 | 2008-04-30 | Physical Sciences, Inc. | Side view imaging microwell array |
| US7854524B2 (en) * | 2007-09-28 | 2010-12-21 | Anorad Corporation | High stiffness low mass supporting structure for a mirror assembly |
| EP2246725A3 (en) * | 2009-04-30 | 2011-01-26 | Olympus Corporation | Microscope with fixed imaging unit and movable objective lens |
| DE202009010772U1 (de) | 2009-08-11 | 2009-11-26 | Deutsches Krebsforschungszentrum Stiftung des öffentlichen Rechts | Anordnung zur Abbildungsstabilisierung |
| US9195043B2 (en) * | 2010-08-27 | 2015-11-24 | The Board Of Trustees Of The Leland Stanford Junior University | Microscopy imaging device with advanced imaging properties |
| US9428384B2 (en) * | 2011-01-18 | 2016-08-30 | Jizhong He | Inspection instrument |
| WO2015029032A1 (en) | 2013-08-26 | 2015-03-05 | Parasight Ltd. | Digital microscopy systems, methods and computer program products |
| JP6849405B2 (ja) * | 2016-11-14 | 2021-03-24 | 浜松ホトニクス株式会社 | 分光計測装置及び分光計測システム |
| CN108414446A (zh) * | 2018-03-30 | 2018-08-17 | 广东顺德墨赛生物科技有限公司 | 微流控芯片荧光检测设备、方法以及装置 |
| CN110888230A (zh) * | 2019-11-28 | 2020-03-17 | 天津职业技术师范大学(中国职业培训指导教师进修中心) | 一种智能生物显微镜 |
| EP4073492A1 (en) * | 2019-12-12 | 2022-10-19 | S.D. Sight Diagnostics Ltd. | Analyzing an analyte disposed within a medium |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3259012A (en) * | 1960-09-12 | 1966-07-05 | Inv S Finance Corp | Microscope having bridge type support arm for body tube and focusing mechanism |
| GB1260653A (en) * | 1968-01-25 | 1972-01-19 | Watson W & Sons Ltd | Improvements in or relating to optical apparatus |
| US3830560A (en) * | 1970-09-14 | 1974-08-20 | R Onanian | Microscope apparatus |
| JPS5524566Y2 (enExample) * | 1975-10-28 | 1980-06-12 | ||
| US5317153A (en) * | 1991-08-08 | 1994-05-31 | Nikon Corporation | Scanning probe microscope |
| JP3431309B2 (ja) | 1994-10-14 | 2003-07-28 | オリンパス光学工業株式会社 | 倒立形顕微鏡用保温装置 |
| JP2966311B2 (ja) * | 1995-03-10 | 1999-10-25 | 科学技術振興事業団 | 顕微測光装置 |
| DE19530136C1 (de) * | 1995-08-16 | 1997-02-13 | Leica Mikroskopie & Syst | Einrichtung zur Fokusstabilisierung in einem Mikroskop |
| JP3221823B2 (ja) * | 1995-11-24 | 2001-10-22 | キヤノン株式会社 | 投影露光装置およびこれを用いた露光方法ならびに半導体製造方法 |
| US5764409A (en) * | 1996-04-26 | 1998-06-09 | Alpha Innotech Corp | Elimination of vibration by vibration coupling in microscopy applications |
| JP3837165B2 (ja) * | 1996-08-16 | 2006-10-25 | アマーシャム バイオサイエンセズ ナイアガラ,インク. | ウェルプレート、ゲル及びブロットにおける検査用のディジタルイメージングシステム |
| US6091911A (en) * | 1996-08-30 | 2000-07-18 | Nikon Corporation | Microscope photographing unit with brightness control for observation optical system |
| JP3437406B2 (ja) * | 1997-04-22 | 2003-08-18 | キヤノン株式会社 | 投影露光装置 |
| US5970260A (en) * | 1997-09-10 | 1999-10-19 | Konica Corporation | Camera equipped with zoom lens |
| CA2243090A1 (en) * | 1998-07-10 | 2000-01-10 | Timothy M. Richardson | Inverted darkfield contrast microscope and method |
-
2002
- 2002-03-18 JP JP2002073455A patent/JP4084061B2/ja not_active Expired - Fee Related
- 2002-09-03 WO PCT/JP2002/008935 patent/WO2003079089A1/ja not_active Ceased
- 2002-09-03 US US10/506,107 patent/US7307784B2/en not_active Expired - Fee Related
- 2002-09-03 EP EP02772834A patent/EP1486810B1/en not_active Expired - Lifetime
- 2002-09-03 DE DE60232196T patent/DE60232196D1/de not_active Expired - Lifetime
- 2002-09-03 CN CNB028285794A patent/CN100559228C/zh not_active Expired - Fee Related
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