JP2002372563A5 - - Google Patents

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Publication number
JP2002372563A5
JP2002372563A5 JP2002020984A JP2002020984A JP2002372563A5 JP 2002372563 A5 JP2002372563 A5 JP 2002372563A5 JP 2002020984 A JP2002020984 A JP 2002020984A JP 2002020984 A JP2002020984 A JP 2002020984A JP 2002372563 A5 JP2002372563 A5 JP 2002372563A5
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JP
Japan
Prior art keywords
wiring
inspection
circuit board
power supply
inspected
Prior art date
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Application number
JP2002020984A
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English (en)
Japanese (ja)
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JP3804049B2 (ja
JP2002372563A (ja
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Priority to JP2002020984A priority Critical patent/JP3804049B2/ja
Priority claimed from JP2002020984A external-priority patent/JP3804049B2/ja
Publication of JP2002372563A publication Critical patent/JP2002372563A/ja
Publication of JP2002372563A5 publication Critical patent/JP2002372563A5/ja
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Publication of JP3804049B2 publication Critical patent/JP3804049B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2002020984A 2001-04-10 2002-01-30 回路基板の検査装置および検査方法 Expired - Fee Related JP3804049B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002020984A JP3804049B2 (ja) 2001-04-10 2002-01-30 回路基板の検査装置および検査方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2001-111133 2001-04-10
JP2001111133 2001-04-10
JP2002020984A JP3804049B2 (ja) 2001-04-10 2002-01-30 回路基板の検査装置および検査方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2006067137A Division JP3934665B2 (ja) 2001-04-10 2006-03-13 回路基板の検査装置および検査方法

Publications (3)

Publication Number Publication Date
JP2002372563A JP2002372563A (ja) 2002-12-26
JP2002372563A5 true JP2002372563A5 (https=) 2004-10-28
JP3804049B2 JP3804049B2 (ja) 2006-08-02

Family

ID=26613353

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002020984A Expired - Fee Related JP3804049B2 (ja) 2001-04-10 2002-01-30 回路基板の検査装置および検査方法

Country Status (1)

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JP (1) JP3804049B2 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4287255B2 (ja) * 2003-11-27 2009-07-01 日本電産リード株式会社 基板検査装置及び基板検査方法
KR101376935B1 (ko) * 2012-10-31 2014-03-20 삼성전기주식회사 비접촉식 전기검사장치 및 전기검사방법
CN119689142B (zh) * 2025-02-21 2025-05-06 深检集团(东莞)质量技术服务有限公司 一种电子产品稳定性的测试方法

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