JP2002318258A5 - - Google Patents

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Publication number
JP2002318258A5
JP2002318258A5 JP2002007639A JP2002007639A JP2002318258A5 JP 2002318258 A5 JP2002318258 A5 JP 2002318258A5 JP 2002007639 A JP2002007639 A JP 2002007639A JP 2002007639 A JP2002007639 A JP 2002007639A JP 2002318258 A5 JP2002318258 A5 JP 2002318258A5
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JP
Japan
Prior art keywords
wiring
circuit board
electrode portion
electromagnetic wave
electrode
Prior art date
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Application number
JP2002007639A
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English (en)
Japanese (ja)
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JP2002318258A (ja
JP3804046B2 (ja
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Priority to JP2002007639A priority Critical patent/JP3804046B2/ja
Priority claimed from JP2002007639A external-priority patent/JP3804046B2/ja
Publication of JP2002318258A publication Critical patent/JP2002318258A/ja
Publication of JP2002318258A5 publication Critical patent/JP2002318258A5/ja
Application granted granted Critical
Publication of JP3804046B2 publication Critical patent/JP3804046B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2002007639A 2001-02-19 2002-01-16 回路基板の検査装置および検査方法 Expired - Lifetime JP3804046B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002007639A JP3804046B2 (ja) 2001-02-19 2002-01-16 回路基板の検査装置および検査方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2001-42356 2001-02-19
JP2001042356 2001-02-19
JP2002007639A JP3804046B2 (ja) 2001-02-19 2002-01-16 回路基板の検査装置および検査方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2006067135A Division JP3934664B2 (ja) 2001-02-19 2006-03-13 回路基板の検査装置および検査方法

Publications (3)

Publication Number Publication Date
JP2002318258A JP2002318258A (ja) 2002-10-31
JP2002318258A5 true JP2002318258A5 (https=) 2004-10-28
JP3804046B2 JP3804046B2 (ja) 2006-08-02

Family

ID=26609652

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002007639A Expired - Lifetime JP3804046B2 (ja) 2001-02-19 2002-01-16 回路基板の検査装置および検査方法

Country Status (1)

Country Link
JP (1) JP3804046B2 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7202690B2 (en) 2001-02-19 2007-04-10 Nidec-Read Corporation Substrate inspection device and substrate inspecting method
JP2006029997A (ja) * 2004-07-16 2006-02-02 Nidec-Read Corp 基板検査装置及び基板検査方法
JP4336170B2 (ja) * 2003-09-10 2009-09-30 日本電産リード株式会社 基板検査装置及びレーザービーム光照射位置補正方法
JP4287255B2 (ja) * 2003-11-27 2009-07-01 日本電産リード株式会社 基板検査装置及び基板検査方法
US10670656B2 (en) * 2016-05-09 2020-06-02 International Business Machines Corporation Integrated electro-optical module assembly
CN112738992A (zh) * 2020-11-24 2021-04-30 合肥联宝信息技术有限公司 一种印制电路板、电路板的印制方法及调试方法

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