JP2001325800A5 - - Google Patents

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Publication number
JP2001325800A5
JP2001325800A5 JP2000364005A JP2000364005A JP2001325800A5 JP 2001325800 A5 JP2001325800 A5 JP 2001325800A5 JP 2000364005 A JP2000364005 A JP 2000364005A JP 2000364005 A JP2000364005 A JP 2000364005A JP 2001325800 A5 JP2001325800 A5 JP 2001325800A5
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JP
Japan
Prior art keywords
memory
circuit
signal
address
data
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Application number
JP2000364005A
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English (en)
Japanese (ja)
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JP2001325800A (ja
JP3980827B2 (ja
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Publication date
Application filed filed Critical
Priority claimed from JP2000364005A external-priority patent/JP3980827B2/ja
Priority to JP2000364005A priority Critical patent/JP3980827B2/ja
Priority to TW090104894A priority patent/TW535279B/zh
Priority to KR1020010012207A priority patent/KR20010089236A/ko
Priority to US09/803,030 priority patent/US6601218B2/en
Priority to US09/822,429 priority patent/US6436741B2/en
Publication of JP2001325800A publication Critical patent/JP2001325800A/ja
Publication of JP2001325800A5 publication Critical patent/JP2001325800A5/ja
Publication of JP3980827B2 publication Critical patent/JP3980827B2/ja
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2000364005A 2000-03-10 2000-11-30 半導体集積回路装置および製造方法 Expired - Fee Related JP3980827B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2000364005A JP3980827B2 (ja) 2000-03-10 2000-11-30 半導体集積回路装置および製造方法
TW090104894A TW535279B (en) 2000-03-10 2001-03-02 Semiconductor integrated circuit and its manufacturing method
KR1020010012207A KR20010089236A (ko) 2000-03-10 2001-03-09 반도체 집적 회로 장치 및 제조 방법
US09/803,030 US6601218B2 (en) 2000-03-10 2001-03-12 Semiconductor integrated circuit device
US09/822,429 US6436741B2 (en) 2000-03-10 2001-04-02 Semiconductor integrated circuit device

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2000066335 2000-03-10
JP2000-66335 2000-03-10
JP2000364005A JP3980827B2 (ja) 2000-03-10 2000-11-30 半導体集積回路装置および製造方法

Publications (3)

Publication Number Publication Date
JP2001325800A JP2001325800A (ja) 2001-11-22
JP2001325800A5 true JP2001325800A5 (enExample) 2005-02-03
JP3980827B2 JP3980827B2 (ja) 2007-09-26

Family

ID=26587168

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000364005A Expired - Fee Related JP3980827B2 (ja) 2000-03-10 2000-11-30 半導体集積回路装置および製造方法

Country Status (4)

Country Link
US (2) US6601218B2 (enExample)
JP (1) JP3980827B2 (enExample)
KR (1) KR20010089236A (enExample)
TW (1) TW535279B (enExample)

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US6861864B2 (en) * 2003-04-16 2005-03-01 Lsi Logic Corporation Self-timed reliability and yield vehicle array
JP4308637B2 (ja) * 2003-12-17 2009-08-05 株式会社日立製作所 半導体試験装置
TWI369504B (en) * 2004-07-27 2012-08-01 Lsi Corp Methods of locating a fault within an array of integrated circuits, methods of testing an array of interconnect modules, and speed fault test vehicles for locating a fault within an array of interconnect modules
US7284213B2 (en) * 2005-04-08 2007-10-16 Lsi Corporation Defect analysis using a yield vehicle
US7370257B2 (en) * 2005-04-08 2008-05-06 Lsi Logic Corporation Test vehicle data analysis
JP5032996B2 (ja) * 2005-11-28 2012-09-26 太陽誘電株式会社 半導体装置
US7539967B1 (en) 2006-05-05 2009-05-26 Altera Corporation Self-configuring components on a device
US7526694B1 (en) 2006-08-03 2009-04-28 Xilinx, Inc. Integrated circuit internal test circuit and method of testing therewith
JP2008082976A (ja) * 2006-09-28 2008-04-10 Fujitsu Ltd Ｆｂｍ生成装置、ｆｂｍ生成方法
DE102007028802B4 (de) * 2007-06-22 2010-04-08 Qimonda Ag Integrierte Logikschaltung und Verfahren zum Herstellen einer integrierten Logikschaltung
US9110142B2 (en) * 2011-09-30 2015-08-18 Freescale Semiconductor, Inc. Methods and apparatus for testing multiple-IC devices
US9998114B2 (en) * 2013-10-31 2018-06-12 Honeywell International Inc. Matrix ferrite driver circuit
JP6478562B2 (ja) 2013-11-07 2019-03-06 株式会社半導体エネルギー研究所 半導体装置
US9385054B2 (en) * 2013-11-08 2016-07-05 Semiconductor Energy Laboratory Co., Ltd. Data processing device and manufacturing method thereof
JP6393590B2 (ja) 2013-11-22 2018-09-19 株式会社半導体エネルギー研究所 半導体装置
JP6444723B2 (ja) 2014-01-09 2018-12-26 株式会社半導体エネルギー研究所 装置
US9379713B2 (en) 2014-01-17 2016-06-28 Semiconductor Energy Laboratory Co., Ltd. Data processing device and driving method thereof
JP2015165226A (ja) * 2014-02-07 2015-09-17 株式会社半導体エネルギー研究所 装置
KR102253204B1 (ko) * 2014-02-07 2021-05-20 가부시키가이샤 한도오따이 에네루기 켄큐쇼 장치
JP6545970B2 (ja) 2014-02-07 2019-07-17 株式会社半導体エネルギー研究所 装置
US9871511B2 (en) 2014-07-01 2018-01-16 Honeywell International Inc. Protection switching for matrix of ferrite modules with redundant control
KR20170061602A (ko) * 2015-11-26 2017-06-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 전자 기기
CN106653098B (zh) * 2017-01-04 2020-06-16 盛科网络（苏州）有限公司 针对逻辑和cpu均可读写存储器的测试方法

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