JP2000505547A - 位相および周波数検出器 - Google Patents
位相および周波数検出器Info
- Publication number
- JP2000505547A JP2000505547A JP9529262A JP52926297A JP2000505547A JP 2000505547 A JP2000505547 A JP 2000505547A JP 9529262 A JP9529262 A JP 9529262A JP 52926297 A JP52926297 A JP 52926297A JP 2000505547 A JP2000505547 A JP 2000505547A
- Authority
- JP
- Japan
- Prior art keywords
- counter
- value
- signal
- register
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
- G01R25/08—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents by counting of standard pulses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
- G01R25/005—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller, or for passing one of the input signals as output signal
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D13/00—Circuits for comparing the phase or frequency of two mutually-independent oscillations
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Phase Differences (AREA)
- Manipulation Of Pulses (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9600540A SE508585C2 (sv) | 1996-02-14 | 1996-02-14 | Fas och frekvensdetekorer för ett på förhand bestämt antal insignaler, jämte förfarande för mätning av fas och frekvens |
SE9600540-0 | 1996-02-14 | ||
PCT/SE1997/000215 WO1997030357A1 (en) | 1996-02-14 | 1997-02-12 | Phase- and frequency detector |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2000505547A true JP2000505547A (ja) | 2000-05-09 |
Family
ID=20401387
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9529262A Pending JP2000505547A (ja) | 1996-02-14 | 1997-02-12 | 位相および周波数検出器 |
Country Status (7)
Country | Link |
---|---|
US (1) | US6172533B1 ( ) |
EP (1) | EP0880707B1 ( ) |
JP (1) | JP2000505547A ( ) |
AU (1) | AU1817197A ( ) |
DE (1) | DE69738867D1 ( ) |
SE (1) | SE508585C2 ( ) |
WO (1) | WO1997030357A1 ( ) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014066717A (ja) * | 2009-05-22 | 2014-04-17 | Seiko Epson Corp | 周波数測定装置 |
JP2014077797A (ja) * | 2008-12-01 | 2014-05-01 | Seiko Epson Corp | 周波数測定装置 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8146078B2 (en) * | 2004-10-29 | 2012-03-27 | Intel Corporation | Timer offsetting mechanism in a virtual machine environment |
US7917472B2 (en) * | 2008-11-03 | 2011-03-29 | Mats Stefan Persson | Method, system and computer-readable media for backing up information contained in a database |
JP5883558B2 (ja) | 2010-08-31 | 2016-03-15 | セイコーエプソン株式会社 | 周波数測定装置及び電子機器 |
US9766278B2 (en) * | 2012-01-12 | 2017-09-19 | Cirrus Logic, Inc. | Three phase power quality measurement using asynchronous, isolated single phase circuits |
RU171415U1 (ru) * | 2017-03-17 | 2017-05-30 | Акционерное общество "Научно-исследовательский институт "Полюс" им. М.Ф. Стельмаха" | Фазовый детектор |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2914072C2 (de) * | 1979-04-07 | 1985-06-20 | Kernforschungsanlage Jülich GmbH, 5170 Jülich | Schaltungsanordnung zur Ermittlung der Periodendauer und/oder davon abgeleiteten Größen eines im wesentlichen periodischen Signals |
FR2538909A1 (fr) * | 1982-12-30 | 1984-07-06 | Thomson Csf | Comparateur de phase |
US4912734A (en) * | 1989-02-14 | 1990-03-27 | Ail Systems, Inc. | High resolution event occurrance time counter |
US4979177A (en) | 1989-10-26 | 1990-12-18 | Tektronix, Inc. | Enhanced counter/timer resolution in a logic analyzer |
JP2868266B2 (ja) * | 1990-01-25 | 1999-03-10 | 株式会社日本自動車部品総合研究所 | 信号位相差検出回路及び信号位相差検出方法 |
US5128909A (en) * | 1990-08-17 | 1992-07-07 | Ball Corporation | Advanced clock measurement system |
US5097490A (en) | 1991-01-14 | 1992-03-17 | Sundstrand Data Control, Inc. | Apparatus and method for improving the resolution with which a test signal is counted |
JP2837982B2 (ja) * | 1991-12-27 | 1998-12-16 | 三菱電機株式会社 | 遅延検波復調装置 |
KR970001636B1 (ko) * | 1994-01-20 | 1997-02-11 | 엘지전자 주식회사 | 영상신호의 시간축 보정 장치 |
-
1996
- 1996-02-14 SE SE9600540A patent/SE508585C2/sv not_active IP Right Cessation
-
1997
- 1997-02-12 JP JP9529262A patent/JP2000505547A/ja active Pending
- 1997-02-12 AU AU18171/97A patent/AU1817197A/en not_active Abandoned
- 1997-02-12 DE DE69738867T patent/DE69738867D1/de not_active Expired - Fee Related
- 1997-02-12 EP EP97903697A patent/EP0880707B1/en not_active Expired - Lifetime
- 1997-02-12 WO PCT/SE1997/000215 patent/WO1997030357A1/en active Application Filing
-
1998
- 1998-08-12 US US09/133,151 patent/US6172533B1/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014077797A (ja) * | 2008-12-01 | 2014-05-01 | Seiko Epson Corp | 周波数測定装置 |
JP2014066717A (ja) * | 2009-05-22 | 2014-04-17 | Seiko Epson Corp | 周波数測定装置 |
Also Published As
Publication number | Publication date |
---|---|
EP0880707B1 (en) | 2008-07-30 |
DE69738867D1 (de) | 2008-09-11 |
EP0880707A1 (en) | 1998-12-02 |
SE9600540L (sv) | 1997-08-15 |
AU1817197A (en) | 1997-09-02 |
SE9600540D0 (sv) | 1996-02-14 |
WO1997030357A1 (en) | 1997-08-21 |
US6172533B1 (en) | 2001-01-09 |
SE508585C2 (sv) | 1998-10-19 |
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