US4398824A
(en)
*
|
1981-04-15 |
1983-08-16 |
Bell Telephone Laboratories, Incorporated |
Wafer tilt compensation in zone plate alignment system
|
JPS57172726A
(en)
*
|
1981-04-16 |
1982-10-23 |
Toshiba Corp |
Position alignment of mask substrate and wafer
|
US4405238A
(en)
*
|
1981-05-20 |
1983-09-20 |
Ibm Corporation |
Alignment method and apparatus for x-ray or optical lithography
|
JPS58112330A
(ja)
*
|
1981-12-25 |
1983-07-04 |
Nippon Kogaku Kk <Nikon> |
投影型露光装置
|
US4549084A
(en)
*
|
1982-12-21 |
1985-10-22 |
The Perkin-Elmer Corporation |
Alignment and focusing system for a scanning mask aligner
|
FR2538923A1
(fr)
*
|
1982-12-30 |
1984-07-06 |
Thomson Csf |
Procede et dispositif d'alignement optique de motifs dans deux plans rapproches dans un appareil d'exposition comprenant une source de rayonnement divergent
|
US4545683A
(en)
*
|
1983-02-28 |
1985-10-08 |
The Perkin-Elmer Corporation |
Wafer alignment device
|
JPS59182933U
(ja)
*
|
1983-05-23 |
1984-12-06 |
株式会社 デイスコ |
ウェーハ装着機
|
GB2146427B
(en)
*
|
1983-08-01 |
1987-10-21 |
Canon Kk |
Semiconductor manufacture
|
JPS6098623A
(ja)
*
|
1983-11-04 |
1985-06-01 |
Hitachi Ltd |
投影式露光方法及びその装置
|
GB2151350A
(en)
*
|
1983-11-25 |
1985-07-17 |
Vs Eng Ltd |
Sensing arrangement
|
US4636080A
(en)
*
|
1984-05-07 |
1987-01-13 |
At&T Bell Laboratories |
Two-dimensional imaging with line arrays
|
US4614433A
(en)
*
|
1984-07-09 |
1986-09-30 |
At&T Bell Laboratories |
Mask-to-wafer alignment utilizing zone plates
|
US4708484A
(en)
*
|
1984-10-24 |
1987-11-24 |
Hitachi, Ltd. |
Projection alignment method and apparatus
|
JPH0666241B2
(ja)
*
|
1985-10-14 |
1994-08-24 |
株式会社日立製作所 |
位置検出方法
|
US4798470A
(en)
*
|
1985-11-14 |
1989-01-17 |
Hitachi, Ltd. |
Pattern printing method and apparatus
|
US4755053A
(en)
*
|
1986-11-12 |
1988-07-05 |
Hewlett-Packard Company |
Secondary alignment fiducials for automatic alignment using machine vision.
|
US5319444A
(en)
*
|
1988-02-16 |
1994-06-07 |
Canon Kabushiki Kaisha |
Position detecting method and apparatus
|
US5327221A
(en)
*
|
1988-02-16 |
1994-07-05 |
Canon Kabushiki Kaisha |
Device for detecting positional relationship between two objects
|
JP2623757B2
(ja)
*
|
1988-09-05 |
1997-06-25 |
キヤノン株式会社 |
位置合わせ装置
|
EP0329433A3
(en)
*
|
1988-02-16 |
1989-10-25 |
Canon Kabushiki Kaisha |
Position detecting method and apparatus
|
EP0329430B1
(en)
*
|
1988-02-16 |
1992-07-01 |
Canon Kabushiki Kaisha |
Position detecting device
|
US5325176A
(en)
*
|
1988-02-16 |
1994-06-28 |
Canon Kabushiki Kaisha |
Position detecting method and apparatus including Fraunhofer diffraction detector
|
GB8806232D0
(en)
*
|
1988-03-16 |
1988-04-13 |
Plessey Co Plc |
Vernier structure for flip chip bonded devices
|
WO1989008926A1
(en)
*
|
1988-03-16 |
1989-09-21 |
Plessey Overseas Limited |
Vernier structure for flip chip bonded devices
|
US5294980A
(en)
*
|
1988-03-24 |
1994-03-15 |
Canon Kabushiki Kaisha |
Positioning detecting method and apparatus
|
JPS6432625A
(en)
*
|
1988-05-06 |
1989-02-02 |
Hitachi Ltd |
Exposure method for semiconductor
|
EP0355496A3
(en)
*
|
1988-08-15 |
1990-10-10 |
Sumitomo Heavy Industries Co., Ltd. |
Position detector employing a sector fresnel zone plate
|
JP2676933B2
(ja)
*
|
1988-09-05 |
1997-11-17 |
キヤノン株式会社 |
位置検出装置
|
US5235408A
(en)
*
|
1988-09-05 |
1993-08-10 |
Canon Kabushiki Kaisha |
Position detecting method and apparatus
|
EP0358514B1
(en)
*
|
1988-09-09 |
2000-12-13 |
Canon Kabushiki Kaisha |
Position detecting method and apparatus
|
JP2546350B2
(ja)
*
|
1988-09-09 |
1996-10-23 |
キヤノン株式会社 |
位置合わせ装置
|
JP2626076B2
(ja)
*
|
1988-09-09 |
1997-07-02 |
キヤノン株式会社 |
位置検出装置
|
US5155370A
(en)
*
|
1988-09-09 |
1992-10-13 |
Canon Kabushiki Kaisha |
Device for detecting the relative position of first and second objects
|
DE68929314T2
(de)
*
|
1988-09-09 |
2002-05-02 |
Canon K.K., Tokio/Tokyo |
Vorrichtung zur Detektion der Positionsrelation zwischen zwei Objekten
|
JP2704002B2
(ja)
*
|
1989-07-18 |
1998-01-26 |
キヤノン株式会社 |
位置検出方法
|
JP2704001B2
(ja)
*
|
1989-07-18 |
1998-01-26 |
キヤノン株式会社 |
位置検出装置
|
EP0411966B1
(en)
*
|
1989-08-04 |
1994-11-02 |
Canon Kabushiki Kaisha |
Position detection method and apparatus
|
US5225892A
(en)
*
|
1990-02-05 |
1993-07-06 |
Canon Kabushiki Kaisha |
Positional deviation detecting method
|
US5200800A
(en)
*
|
1990-05-01 |
1993-04-06 |
Canon Kabushiki Kaisha |
Position detecting method and apparatus
|
EP0455443B1
(en)
*
|
1990-05-01 |
1997-11-12 |
Canon Kabushiki Kaisha |
Positional deviation detecting method and apparatus
|
JP2890943B2
(ja)
*
|
1990-11-30 |
1999-05-17 |
キヤノン株式会社 |
位置検出方法及びそれを用いた位置検出装置
|
US5495336A
(en)
*
|
1992-02-04 |
1996-02-27 |
Canon Kabushiki Kaisha |
Position detecting method for detecting a positional relationship between a first object and a second object
|
JP3008654B2
(ja)
*
|
1992-02-21 |
2000-02-14 |
キヤノン株式会社 |
位置検出装置
|
US5455679A
(en)
*
|
1993-02-22 |
1995-10-03 |
Canon Kabushiki Kaisha |
Position detecting system
|
US5667918A
(en)
*
|
1993-09-27 |
1997-09-16 |
Micron Technology, Inc. |
Method of lithography using reticle pattern blinders
|
JP3428705B2
(ja)
*
|
1993-10-20 |
2003-07-22 |
キヤノン株式会社 |
位置検出装置及びそれを用いた半導体素子の製造方法
|
JP3368017B2
(ja)
*
|
1993-10-29 |
2003-01-20 |
キヤノン株式会社 |
位置検出装置及びそれを用いた半導体素子の製造方法
|
JPH07135168A
(ja)
*
|
1993-11-11 |
1995-05-23 |
Canon Inc |
アライメント方法及びそれを用いた位置検出装置
|
DE69631095T2
(de)
|
1995-07-06 |
2004-08-26 |
Dai Nippon Printing Co., Ltd. |
Holographisches Farbfilter und sein Herstellungsverfahren
|
JP3352286B2
(ja)
*
|
1995-07-13 |
2002-12-03 |
キヤノン株式会社 |
位置制御方法及び装置並びにそれを使用した半導体製造装置
|
JP3292022B2
(ja)
*
|
1996-01-17 |
2002-06-17 |
キヤノン株式会社 |
位置検出装置及びそれを用いた半導体素子の製造方法
|
JPH1022213A
(ja)
*
|
1996-06-28 |
1998-01-23 |
Canon Inc |
位置検出装置及びそれを用いたデバイスの製造方法
|
US5700732A
(en)
|
1996-08-02 |
1997-12-23 |
Micron Technology, Inc. |
Semiconductor wafer, wafer alignment patterns and method of forming wafer alignment patterns
|
US5786116A
(en)
*
|
1997-02-14 |
1998-07-28 |
Micron Technology, Inc. |
Atom lithographic mask having diffraction grating aligned with primary mask pattern
|
US5851701A
(en)
*
|
1997-04-01 |
1998-12-22 |
Micron Technology, Inc. |
Atom lithographic mask having diffraction grating and attenuated phase shifters
|
JPH11241908A
(ja)
|
1997-12-03 |
1999-09-07 |
Canon Inc |
位置検出装置及びそれを用いたデバイスの製造方法
|
US6303272B1
(en)
*
|
1998-11-13 |
2001-10-16 |
International Business Machines Corporation |
Process for self-alignment of sub-critical contacts to wiring
|
US6873087B1
(en)
|
1999-10-29 |
2005-03-29 |
Board Of Regents, The University Of Texas System |
High precision orientation alignment and gap control stages for imprint lithography processes
|
TWI282909B
(en)
*
|
1999-12-23 |
2007-06-21 |
Asml Netherlands Bv |
Lithographic apparatus and a method for manufacturing a device
|
EP2264524A3
(en)
*
|
2000-07-16 |
2011-11-30 |
The Board of Regents of The University of Texas System |
High-resolution overlay alignement methods and systems for imprint lithography
|
AU2001277907A1
(en)
|
2000-07-17 |
2002-01-30 |
Board Of Regents, The University Of Texas System |
Method and system of automatic fluid dispensing for imprint lithography processes
|
EP1309897A2
(en)
*
|
2000-08-01 |
2003-05-14 |
Board Of Regents, The University Of Texas System |
Methods for high-precision gap and orientation sensing between a transparent template and substrate for imprint lithography
|
US6516244B1
(en)
|
2000-08-25 |
2003-02-04 |
Wafermasters, Inc. |
Wafer alignment system and method
|
EP1352295B1
(en)
*
|
2000-10-12 |
2015-12-23 |
Board of Regents, The University of Texas System |
Template for room temperature, low pressure micro- and nano-imprint lithography
|
US20050274219A1
(en)
*
|
2004-06-01 |
2005-12-15 |
Molecular Imprints, Inc. |
Method and system to control movement of a body for nano-scale manufacturing
|
US6653639B1
(en)
|
2000-10-17 |
2003-11-25 |
Nikon Corporation |
Chuck for mounting reticle to a reticle stage
|
US6563566B2
(en)
*
|
2001-01-29 |
2003-05-13 |
International Business Machines Corporation |
System and method for printing semiconductor patterns using an optimized illumination and reticle
|
US6591161B2
(en)
|
2001-01-31 |
2003-07-08 |
Wafermasters, Inc. |
Method for determining robot alignment
|
US6885429B2
(en)
*
|
2002-06-28 |
2005-04-26 |
Asml Holding N.V. |
System and method for automated focus measuring of a lithography tool
|
US7077992B2
(en)
*
|
2002-07-11 |
2006-07-18 |
Molecular Imprints, Inc. |
Step and repeat imprint lithography processes
|
US6916584B2
(en)
|
2002-08-01 |
2005-07-12 |
Molecular Imprints, Inc. |
Alignment methods for imprint lithography
|
US7027156B2
(en)
*
|
2002-08-01 |
2006-04-11 |
Molecular Imprints, Inc. |
Scatterometry alignment for imprint lithography
|
US7070405B2
(en)
*
|
2002-08-01 |
2006-07-04 |
Molecular Imprints, Inc. |
Alignment systems for imprint lithography
|
SG152898A1
(en)
|
2002-09-20 |
2009-06-29 |
Asml Netherlands Bv |
Alignment systems and methods for lithographic systems
|
US8349241B2
(en)
*
|
2002-10-04 |
2013-01-08 |
Molecular Imprints, Inc. |
Method to arrange features on a substrate to replicate features having minimal dimensional variability
|
US6929762B2
(en)
*
|
2002-11-13 |
2005-08-16 |
Molecular Imprints, Inc. |
Method of reducing pattern distortions during imprint lithography processes
|
US6871558B2
(en)
*
|
2002-12-12 |
2005-03-29 |
Molecular Imprints, Inc. |
Method for determining characteristics of substrate employing fluid geometries
|
WO2004054784A1
(en)
*
|
2002-12-13 |
2004-07-01 |
Molecular Imprints, Inc. |
Magnification corrections employing out-of-plane distortions on a substrate
|
US7452574B2
(en)
*
|
2003-02-27 |
2008-11-18 |
Molecular Imprints, Inc. |
Method to reduce adhesion between a polymerizable layer and a substrate employing a fluorine-containing layer
|
US20040168613A1
(en)
*
|
2003-02-27 |
2004-09-02 |
Molecular Imprints, Inc. |
Composition and method to form a release layer
|
US7122079B2
(en)
*
|
2004-02-27 |
2006-10-17 |
Molecular Imprints, Inc. |
Composition for an etching mask comprising a silicon-containing material
|
US6888260B2
(en)
*
|
2003-04-17 |
2005-05-03 |
Infineon Technologies Aktiengesellschaft |
Alignment or overlay marks for semiconductor processing
|
US20050160934A1
(en)
*
|
2004-01-23 |
2005-07-28 |
Molecular Imprints, Inc. |
Materials and methods for imprint lithography
|
US7157036B2
(en)
*
|
2003-06-17 |
2007-01-02 |
Molecular Imprints, Inc |
Method to reduce adhesion between a conformable region and a pattern of a mold
|
US7150622B2
(en)
*
|
2003-07-09 |
2006-12-19 |
Molecular Imprints, Inc. |
Systems for magnification and distortion correction for imprint lithography processes
|
US7136150B2
(en)
|
2003-09-25 |
2006-11-14 |
Molecular Imprints, Inc. |
Imprint lithography template having opaque alignment marks
|
US20050084804A1
(en)
*
|
2003-10-16 |
2005-04-21 |
Molecular Imprints, Inc. |
Low surface energy templates
|
US8076386B2
(en)
*
|
2004-02-23 |
2011-12-13 |
Molecular Imprints, Inc. |
Materials for imprint lithography
|
US7906180B2
(en)
*
|
2004-02-27 |
2011-03-15 |
Molecular Imprints, Inc. |
Composition for an etching mask comprising a silicon-containing material
|
US20050275311A1
(en)
*
|
2004-06-01 |
2005-12-15 |
Molecular Imprints, Inc. |
Compliant device for nano-scale manufacturing
|
US20050276919A1
(en)
*
|
2004-06-01 |
2005-12-15 |
Molecular Imprints, Inc. |
Method for dispensing a fluid on a substrate
|
US7768624B2
(en)
*
|
2004-06-03 |
2010-08-03 |
Board Of Regents, The University Of Texas System |
Method for obtaining force combinations for template deformation using nullspace and methods optimization techniques
|
US20050270516A1
(en)
*
|
2004-06-03 |
2005-12-08 |
Molecular Imprints, Inc. |
System for magnification and distortion correction during nano-scale manufacturing
|
WO2005121903A2
(en)
*
|
2004-06-03 |
2005-12-22 |
Board Of Regents, The University Of Texas System |
System and method for improvement of alignment and overlay for microlithography
|
US7785526B2
(en)
*
|
2004-07-20 |
2010-08-31 |
Molecular Imprints, Inc. |
Imprint alignment method, system, and template
|
US20070231421A1
(en)
*
|
2006-04-03 |
2007-10-04 |
Molecular Imprints, Inc. |
Enhanced Multi Channel Alignment
|
US7292326B2
(en)
*
|
2004-11-30 |
2007-11-06 |
Molecular Imprints, Inc. |
Interferometric analysis for the manufacture of nano-scale devices
|
US7630067B2
(en)
|
2004-11-30 |
2009-12-08 |
Molecular Imprints, Inc. |
Interferometric analysis method for the manufacture of nano-scale devices
|
JP5198071B2
(ja)
*
|
2004-12-01 |
2013-05-15 |
モレキュラー・インプリンツ・インコーポレーテッド |
インプリントリソグラフィ・プロセスにおける熱管理のための露光方法
|
US20070228608A1
(en)
*
|
2006-04-03 |
2007-10-04 |
Molecular Imprints, Inc. |
Preserving Filled Features when Vacuum Wiping
|
KR20090003153A
(ko)
|
2006-04-03 |
2009-01-09 |
몰레큘러 임프린츠 인코퍼레이티드 |
다수의 필드와 정렬 마크를 갖는 기판을 동시에 패턴화하는방법
|
JP5027468B2
(ja)
*
|
2006-09-15 |
2012-09-19 |
日本ミクロコーティング株式会社 |
プローブクリーニング用又はプローブ加工用シート、及びプローブ加工方法
|
CN103091993B
(zh)
*
|
2011-11-02 |
2015-02-11 |
上海微电子装备有限公司 |
用于光刻机透镜热效应测量的测试标记及其测量方法
|
CN114217370B
(zh)
*
|
2021-12-16 |
2024-09-20 |
西安工业大学 |
宽带消色差聚焦与偏振调控的微结构波带片及设计方法
|