IN2014CN02499A - - Google Patents

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Publication number
IN2014CN02499A
IN2014CN02499A IN2499CHN2014A IN2014CN02499A IN 2014CN02499 A IN2014CN02499 A IN 2014CN02499A IN 2499CHN2014 A IN2499CHN2014 A IN 2499CHN2014A IN 2014CN02499 A IN2014CN02499 A IN 2014CN02499A
Authority
IN
India
Prior art keywords
test
test instrument
programmed
processing system
configurable interface
Prior art date
Application number
Other languages
English (en)
Inventor
Stephen J Bourassa
Michael Francis Mcgoldrick
David Kaushansky
Michael Thomas Fluet
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of IN2014CN02499A publication Critical patent/IN2014CN02499A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31704—Design for test; Design verification
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
IN2499CHN2014 2011-10-28 2012-09-20 IN2014CN02499A (enrdf_load_stackoverflow)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/284,378 US9470759B2 (en) 2011-10-28 2011-10-28 Test instrument having a configurable interface
PCT/US2012/056247 WO2013062692A1 (en) 2011-10-28 2012-09-20 Test instrument having a configurable interface

Publications (1)

Publication Number Publication Date
IN2014CN02499A true IN2014CN02499A (enrdf_load_stackoverflow) 2015-06-26

Family

ID=48168296

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2499CHN2014 IN2014CN02499A (enrdf_load_stackoverflow) 2011-10-28 2012-09-20

Country Status (6)

Country Link
US (1) US9470759B2 (enrdf_load_stackoverflow)
EP (1) EP2771704A4 (enrdf_load_stackoverflow)
JP (1) JP2014532862A (enrdf_load_stackoverflow)
KR (1) KR101970290B1 (enrdf_load_stackoverflow)
IN (1) IN2014CN02499A (enrdf_load_stackoverflow)
WO (1) WO2013062692A1 (enrdf_load_stackoverflow)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9759772B2 (en) 2011-10-28 2017-09-12 Teradyne, Inc. Programmable test instrument
US10776233B2 (en) 2011-10-28 2020-09-15 Teradyne, Inc. Programmable test instrument
US9116785B2 (en) 2013-01-22 2015-08-25 Teradyne, Inc. Embedded tester
US10156611B2 (en) 2013-09-12 2018-12-18 Teradyne, Inc. Executing code on a test instrument in response to an event
EP2990817A1 (de) * 2014-09-01 2016-03-02 Siemens Aktiengesellschaft Kompakte Prüfanordnung für Leiterplatten
EP3213214B1 (fr) 2014-10-30 2021-03-03 SPHEREA Test & Services Banc et logiciel pour tester un appareillage electrique, notamment un calculateur
US10241146B2 (en) * 2017-05-01 2019-03-26 Advantest Corporation Test system and method
US11169203B1 (en) 2018-09-26 2021-11-09 Teradyne, Inc. Determining a configuration of a test system
JP7295954B2 (ja) * 2019-01-22 2023-06-21 株式会社アドバンテスト オンチップシステムテストコントローラを使用した自動テスト装置
JP7316818B2 (ja) * 2019-03-28 2023-07-28 株式会社アドバンテスト 波形データ取得モジュールおよび試験装置
US11408927B2 (en) 2019-06-18 2022-08-09 Teradyne, Inc. Functional testing with inline parametric testing
JP7317209B2 (ja) 2019-08-06 2023-07-28 株式会社アドバンテスト 処理ユニット並びにプログラム及び／又はデータメモリを含む被試験デバイスをテストするための自動試験機器、テストコントローラ、被試験デバイスへの１又は複数のインターフェース、共有メモリを含む自動試験機器、並びに被試験デバイスをテストするための方法
US11461222B2 (en) 2020-04-16 2022-10-04 Teradyne, Inc. Determining the complexity of a test program
CN112653598B (zh) * 2020-12-18 2022-02-22 迈普通信技术股份有限公司 自动化测试方法、装置、设备及可读存储介质
CN113868038B (zh) * 2021-08-30 2024-06-04 中科可控信息产业有限公司 信号测试方法、装置、计算机设备和存储介质
CN114020554A (zh) * 2021-10-30 2022-02-08 江苏信而泰智能装备有限公司 一种测试仪的端口隔离方法和具有端口隔离功能的测试仪

Family Cites Families (72)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6044481A (en) * 1997-05-09 2000-03-28 Artisan Components, Inc. Programmable universal test interface for testing memories with different test methodologies
US5883852A (en) * 1998-02-23 1999-03-16 Dynachip Corporation Configurable SRAM for field programmable gate array
JP3214830B2 (ja) * 1998-02-27 2001-10-02 アジレント・テクノロジー株式会社 Ｉｃテスト用データ処理装置
US6363506B1 (en) * 1999-04-13 2002-03-26 Agere Systems Guardian Corp. Method for self-testing integrated circuits
US6400173B1 (en) * 1999-11-19 2002-06-04 Hitachi, Ltd. Test system and manufacturing of semiconductor device
US6314034B1 (en) * 2000-04-14 2001-11-06 Advantest Corp. Application specific event based semiconductor memory test system
US6526557B1 (en) * 2000-07-25 2003-02-25 Xilinx, Inc. Architecture and method for partially reconfiguring an FPGA
US6812726B1 (en) * 2002-11-27 2004-11-02 Inapac Technology, Inc. Entering test mode and accessing of a packaged semiconductor device
US6515484B1 (en) * 2000-10-31 2003-02-04 Associated Research, Inc. Electrical test instrument having an improved operator interface
JP2002311095A (ja) * 2001-04-12 2002-10-23 Tritec:Kk Ｌｓｉ検査装置
JP2003044114A (ja) * 2001-07-27 2003-02-14 Nec Corp 検査システム
US6826721B2 (en) * 2001-11-01 2004-11-30 Agilent Technoloiges, Inc. Data accelerator and methods for increasing data throughput
JP3934434B2 (ja) 2002-02-19 2007-06-20 富士通株式会社 回路の試験装置
US7127708B2 (en) * 2002-03-28 2006-10-24 Lucent Technologies Inc. Concurrent in-system programming of programmable devices
US7319688B2 (en) * 2002-05-06 2008-01-15 Extricom Ltd. LAN with message interleaving
US6965244B2 (en) * 2002-05-08 2005-11-15 Formfactor, Inc. High performance probe system
US8063650B2 (en) * 2002-11-27 2011-11-22 Rambus Inc. Testing fuse configurations in semiconductor devices
US6883150B2 (en) 2003-03-14 2005-04-19 Hewlett-Packard Development Company, L.P. Automatic manufacturing test case generation method and system
US7535851B2 (en) * 2003-08-26 2009-05-19 Finisar Corporation Discovering diagnostic port functionality in a distributed system
US7251803B2 (en) * 2003-11-05 2007-07-31 Peter Ramyalal Suaris Memory re-implementation for field programmable gate arrays
US20050129033A1 (en) * 2003-12-13 2005-06-16 Gordy Stephen C. Network tap for use with multiple attached devices
US7107173B2 (en) 2004-02-03 2006-09-12 Credence Systems Corporation Automatic test equipment operating architecture
US7058535B2 (en) * 2004-02-12 2006-06-06 Credence Systems Corporation Test system for integrated circuits with serdes ports
US7506311B2 (en) 2004-02-19 2009-03-17 Oracle International Corporation Test tool for application programming interfaces
US7307433B2 (en) * 2004-04-21 2007-12-11 Formfactor, Inc. Intelligent probe card architecture
US8581610B2 (en) 2004-04-21 2013-11-12 Charles A Miller Method of designing an application specific probe card test system
US7210087B2 (en) 2004-05-22 2007-04-24 Advantest America R&D Center, Inc. Method and system for simulating a modular test system
JP2006003239A (ja) * 2004-06-18 2006-01-05 Hitachi Ltd 半導体装置テスタ
DE102004034606B4 (de) * 2004-07-16 2012-03-29 Infineon Technologies Ag Schaltungsanordnung aus einer elektronischen Testschaltung für einen zu testenden Transceiver und aus dem zu testenden Transceiver sowie Verfahren zum Prüfen eines Transceivers
US7215591B2 (en) * 2004-08-03 2007-05-08 Lattice Semiconductor Corporation Byte enable logic for memory
US7536679B1 (en) 2004-08-18 2009-05-19 Sun Microsystems, Inc. System and methods for test tool class inheritance
US7412342B2 (en) * 2004-10-28 2008-08-12 Intel Corporation Low cost test for IC's or electrical modules using standard reconfigurable logic devices
US7600220B2 (en) 2005-01-11 2009-10-06 Worksoft, Inc. Extensible execution language
US7218134B1 (en) * 2005-01-13 2007-05-15 Altera Corporation Adjustable data loading circuit with dynamic test mode switching for testing programmable integrated circuits
US7245134B2 (en) * 2005-01-31 2007-07-17 Formfactor, Inc. Probe card assembly including a programmable device to selectively route signals from channels of a test system controller to probes
US7343558B2 (en) 2005-03-31 2008-03-11 Teradyne, Inc. Configurable automatic-test-equipment system
JP2009508101A (ja) 2005-09-08 2009-02-26 エヌエックスピー ビー ヴィ スキャンテスト方法
KR100681199B1 (ko) * 2006-01-11 2007-02-09 삼성전자주식회사 코어스 그레인 어레이에서의 인터럽트 처리 방법 및 장치
US8798741B2 (en) 2006-03-09 2014-08-05 Medtronic, Inc. Automated high voltage defibrillator tester
US20070277154A1 (en) 2006-05-23 2007-11-29 Microsoft Corporation Testing distributed components
DE602006017446D1 (de) * 2006-08-04 2010-11-18 Verigy Pte Ltd Singapore Testmodul mit blöcken universeller und spezifischer ressourcen
US20080274629A1 (en) * 2007-01-05 2008-11-06 Meyer Donald A Serial Interface Converter
US7733096B2 (en) * 2007-04-02 2010-06-08 Taiwan Semiconductor Manufacturing Company, Ltd. Methods of testing fuse elements for memory devices
BRPI0705067A2 (pt) * 2007-04-23 2008-12-09 Gilberto Antonio Possa testador e emulador funcional e paramÉtrico de placas e màdulos eletrânicos
JP4975544B2 (ja) 2007-07-20 2012-07-11 富士通セミコンダクター株式会社 シミュレーション装置及びプログラム
JP2009031933A (ja) 2007-07-25 2009-02-12 S2C Inc スケーラブル再構成可能型プロトタイプシステムと方法
US7692448B2 (en) * 2007-09-12 2010-04-06 Neal Solomon Reprogrammable three dimensional field programmable gate arrays
US8310270B2 (en) * 2007-10-04 2012-11-13 Teradyne, Inc. Emulating behavior of a legacy test system
US20090101940A1 (en) * 2007-10-19 2009-04-23 Barrows Corey K Dual gate fet structures for flexible gate array design methodologies
US20090112548A1 (en) 2007-10-30 2009-04-30 Conner George W A method for testing in a reconfigurable tester
US20090119542A1 (en) 2007-11-05 2009-05-07 Advantest Corporation System, method, and program product for simulating test equipment
US7888947B2 (en) 2007-11-21 2011-02-15 Teradyne, Inc. Calibrating automatic test equipment
US7873701B2 (en) * 2007-11-27 2011-01-18 International Business Machines Corporation Network on chip with partitions
US8200742B2 (en) 2008-02-13 2012-06-12 Robert Kocyan Apparatus, system, and method for facilitating data flow between a first application programming interface and a second application programming interface
KR100930010B1 (ko) 2008-04-10 2009-12-07 프롬써어티 주식회사 웨이퍼 번인 시스템의 점검장치, 이를 구비한 웨이퍼 번인시스템 및 웨이퍼 번인 시스템의 점검방법
US8103992B1 (en) * 2008-05-02 2012-01-24 Xilinx, Inc. Rapid rerouting based runtime reconfigurable signal probing
US8370101B2 (en) * 2008-05-27 2013-02-05 The United States Of America As Represented By The Secretary Of The Navy Circuit card assembly testing system for a missile and launcher test set
JP5337155B2 (ja) 2008-06-10 2013-11-06 パナソニック株式会社 組み込み機器におけるａｐｉ評価システム
US20100058274A1 (en) * 2008-09-04 2010-03-04 Alcatel Lucent Flexible hardware upgrade mechanism for data communications equipment
JP5341464B2 (ja) * 2008-10-17 2013-11-13 日本電子材料株式会社 プローブカード
WO2010054669A1 (en) 2008-11-11 2010-05-20 Verigy (Singapore) Pte.Ltd. Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment
US9262303B2 (en) * 2008-12-05 2016-02-16 Altera Corporation Automated semiconductor design flaw detection system
US7979759B2 (en) * 2009-01-08 2011-07-12 International Business Machines Corporation Test and bring-up of an enhanced cascade interconnect memory system
CA3052820C (en) 2009-01-15 2024-03-19 Electronic Warfare Associates, Inc. Systems and methods of implementing remote boundary scan features
US7949916B1 (en) * 2009-01-20 2011-05-24 Altera Corporation Scan chain circuitry for delay fault testing of logic circuits
US8742791B1 (en) * 2009-01-31 2014-06-03 Xilinx, Inc. Method and apparatus for preamble detection for a control signal
KR20100121215A (ko) * 2009-05-08 2010-11-17 삼성전자주식회사 반도체 장치, 및 상기 반도체 장치의 ｏｓ 이미지 라이트 방법
JP2010281707A (ja) * 2009-06-05 2010-12-16 Hitachi Kokusai Electric Inc 試験装置
US7969171B1 (en) * 2010-01-06 2011-06-28 General Electric Company Test circuit and system
US8566648B2 (en) 2011-02-02 2013-10-22 Salesforce, Inc. Automated testing on devices
US8639853B2 (en) * 2011-07-28 2014-01-28 National Intruments Corporation Programmable waveform technology for interfacing to disparate devices
CN103797806B (zh) * 2011-09-16 2017-05-24 思科技术公司 下行设备架构和控制

Also Published As

Publication number Publication date
EP2771704A1 (en) 2014-09-03
KR101970290B1 (ko) 2019-04-18
JP2014532862A (ja) 2014-12-08
EP2771704A4 (en) 2015-03-25
US20130110446A1 (en) 2013-05-02
WO2013062692A1 (en) 2013-05-02
KR20140091719A (ko) 2014-07-22
US9470759B2 (en) 2016-10-18

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