BRPI0705067A2 - testador e emulador funcional e paramÉtrico de placas e màdulos eletrânicos - Google Patents

testador e emulador funcional e paramÉtrico de placas e màdulos eletrânicos

Info

Publication number
BRPI0705067A2
BRPI0705067A2 BRPI0705067-4A BRPI0705067A BRPI0705067A2 BR PI0705067 A2 BRPI0705067 A2 BR PI0705067A2 BR PI0705067 A BRPI0705067 A BR PI0705067A BR PI0705067 A2 BRPI0705067 A2 BR PI0705067A2
Authority
BR
Brazil
Prior art keywords
electronic
modules
functional
emulator
parametric
Prior art date
Application number
BRPI0705067-4A
Other languages
English (en)
Inventor
Gilberto Antonio Possa
Original Assignee
Gilberto Antonio Possa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gilberto Antonio Possa filed Critical Gilberto Antonio Possa
Priority to BRPI0705067-4A priority Critical patent/BRPI0705067A2/pt
Priority to US12/148,939 priority patent/US20080297167A1/en
Publication of BRPI0705067A2 publication Critical patent/BRPI0705067A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G01R31/2848—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms using simulation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

TESTADOR E EMULADOR FUNCIONAL E PARAMETRICO DE PLACAS E MàDULOS ELETRâNICOS. Novo equipamento eletro-eletrônico Testador e Emulador Funcional e Paramétrico de Placas e Módulos Eletrônicos. O qual é um equipamento que permite a realização de testes funcionais e paramétricos em uma grande variedade de circuitos, módulos ou sistemas eletrônicos. Tem como principais características a flexibilidade e a facilidade de programação. Onde a característica de flexibilidade é devido à Biblioteca de Circuitos Eletrônicos (BCE) que o mesmo possui. O BCE é um conjunto de circuitos eletrônicos que permite emular uma grande variedade de sistemas eletrônicos, possibilitando assim a execução de uma grande variedade de testes.
BRPI0705067-4A 2007-04-23 2007-04-23 testador e emulador funcional e paramÉtrico de placas e màdulos eletrânicos BRPI0705067A2 (pt)

Priority Applications (2)

Application Number Priority Date Filing Date Title
BRPI0705067-4A BRPI0705067A2 (pt) 2007-04-23 2007-04-23 testador e emulador funcional e paramÉtrico de placas e màdulos eletrânicos
US12/148,939 US20080297167A1 (en) 2007-04-23 2008-04-22 Functional parametric tester and emulator of electronic modules and PCB's

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
BRPI0705067-4A BRPI0705067A2 (pt) 2007-04-23 2007-04-23 testador e emulador funcional e paramÉtrico de placas e màdulos eletrânicos

Publications (1)

Publication Number Publication Date
BRPI0705067A2 true BRPI0705067A2 (pt) 2008-12-09

Family

ID=40087415

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0705067-4A BRPI0705067A2 (pt) 2007-04-23 2007-04-23 testador e emulador funcional e paramÉtrico de placas e màdulos eletrânicos

Country Status (2)

Country Link
US (1) US20080297167A1 (pt)
BR (1) BRPI0705067A2 (pt)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9448964B2 (en) * 2009-05-04 2016-09-20 Cypress Semiconductor Corporation Autonomous control in a programmable system
US9470759B2 (en) * 2011-10-28 2016-10-18 Teradyne, Inc. Test instrument having a configurable interface
US9759772B2 (en) 2011-10-28 2017-09-12 Teradyne, Inc. Programmable test instrument
US10776233B2 (en) 2011-10-28 2020-09-15 Teradyne, Inc. Programmable test instrument
ES2391013A1 (es) * 2012-05-25 2012-11-20 Universidad De La Rioja Emulador tutor virtual de prácticas eléctricas y dispositivo emulador de componentes de circuitos eléctricos, electrónicos y/o electromecánicos para las mismas
US9164142B2 (en) 2012-11-07 2015-10-20 International Business Machines Corporation Testing electronic components on electronic assemblies with large thermal mass
CN106327971A (zh) * 2015-06-23 2017-01-11 天津梦祥原科技有限公司 可拆卸式实验箱

Also Published As

Publication number Publication date
US20080297167A1 (en) 2008-12-04

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Legal Events

Date Code Title Description
B03A Publication of a patent application or of a certificate of addition of invention [chapter 3.1 patent gazette]
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE AS 4A E 5A ANUIDADES.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2161 DE 05/06/2012.