IT202000001720A1 - Apparecchiatura per testare schede elettroniche - Google Patents

Apparecchiatura per testare schede elettroniche

Info

Publication number
IT202000001720A1
IT202000001720A1 IT102020000001720A IT202000001720A IT202000001720A1 IT 202000001720 A1 IT202000001720 A1 IT 202000001720A1 IT 102020000001720 A IT102020000001720 A IT 102020000001720A IT 202000001720 A IT202000001720 A IT 202000001720A IT 202000001720 A1 IT202000001720 A1 IT 202000001720A1
Authority
IT
Italy
Prior art keywords
equipment
electronic boards
testing electronic
testing
boards
Prior art date
Application number
IT102020000001720A
Other languages
English (en)
Inventor
Marco Lodovico Salvi
Paolo Barbi
Original Assignee
E D Elettr Dedicata Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by E D Elettr Dedicata Srl filed Critical E D Elettr Dedicata Srl
Priority to IT102020000001720A priority Critical patent/IT202000001720A1/it
Priority to PCT/IB2021/050489 priority patent/WO2021152436A1/en
Priority to EP21705265.3A priority patent/EP4097494A1/en
Publication of IT202000001720A1 publication Critical patent/IT202000001720A1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
IT102020000001720A 2020-01-29 2020-01-29 Apparecchiatura per testare schede elettroniche IT202000001720A1 (it)

Priority Applications (3)

Application Number Priority Date Filing Date Title
IT102020000001720A IT202000001720A1 (it) 2020-01-29 2020-01-29 Apparecchiatura per testare schede elettroniche
PCT/IB2021/050489 WO2021152436A1 (en) 2020-01-29 2021-01-22 Apparatus for testing circuit boards
EP21705265.3A EP4097494A1 (en) 2020-01-29 2021-01-22 Apparatus for testing circuit boards

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102020000001720A IT202000001720A1 (it) 2020-01-29 2020-01-29 Apparecchiatura per testare schede elettroniche

Publications (1)

Publication Number Publication Date
IT202000001720A1 true IT202000001720A1 (it) 2021-07-29

Family

ID=70295941

Family Applications (1)

Application Number Title Priority Date Filing Date
IT102020000001720A IT202000001720A1 (it) 2020-01-29 2020-01-29 Apparecchiatura per testare schede elettroniche

Country Status (3)

Country Link
EP (1) EP4097494A1 (it)
IT (1) IT202000001720A1 (it)
WO (1) WO2021152436A1 (it)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4758780A (en) * 1986-12-08 1988-07-19 Ncr Corporation Circuit board test apparatus and method
US5448164A (en) * 1992-12-24 1995-09-05 Delco Electronics Corp. Electrical test apparatus and method of checking the apparatus
US5621312A (en) * 1995-07-05 1997-04-15 Altera Corporation Method and apparatus for checking the integrity of a device tester-handler setup
US20030197521A1 (en) * 2002-04-17 2003-10-23 Eagle Test Systems Inc. Interface adapter for automatic test systems
US20040064288A1 (en) * 2002-09-30 2004-04-01 Chanh Le Universal automated circuit board tester
US20070096759A1 (en) * 2005-11-02 2007-05-03 Chananiel Weinraub Analog built-in self-test module

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4758780A (en) * 1986-12-08 1988-07-19 Ncr Corporation Circuit board test apparatus and method
US5448164A (en) * 1992-12-24 1995-09-05 Delco Electronics Corp. Electrical test apparatus and method of checking the apparatus
US5621312A (en) * 1995-07-05 1997-04-15 Altera Corporation Method and apparatus for checking the integrity of a device tester-handler setup
US20030197521A1 (en) * 2002-04-17 2003-10-23 Eagle Test Systems Inc. Interface adapter for automatic test systems
US20040064288A1 (en) * 2002-09-30 2004-04-01 Chanh Le Universal automated circuit board tester
US20070096759A1 (en) * 2005-11-02 2007-05-03 Chananiel Weinraub Analog built-in self-test module

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
LARRY OSTEROS: "Load Board Testing Saves Time and Money", 1 August 2000 (2000-08-01), pages 1 - 12, XP055739168, Retrieved from the Internet <URL:https://www.evaluationengineering.com/home/article/13001728/load-board-testing-saves-time-and-money> [retrieved on 20201013] *

Also Published As

Publication number Publication date
WO2021152436A1 (en) 2021-08-05
EP4097494A1 (en) 2022-12-07

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