DE602006017446D1 - Testmodul mit blöcken universeller und spezifischer ressourcen - Google Patents

Testmodul mit blöcken universeller und spezifischer ressourcen

Info

Publication number
DE602006017446D1
DE602006017446D1 DE602006017446T DE602006017446T DE602006017446D1 DE 602006017446 D1 DE602006017446 D1 DE 602006017446D1 DE 602006017446 T DE602006017446 T DE 602006017446T DE 602006017446 T DE602006017446 T DE 602006017446T DE 602006017446 D1 DE602006017446 D1 DE 602006017446D1
Authority
DE
Germany
Prior art keywords
test module
specific resources
universal
blocks
blocks universal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006017446T
Other languages
English (en)
Inventor
Andree Weyh
Rolf Neuweiler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Verigy Singapore Pte Ltd
Original Assignee
Verigy Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Verigy Singapore Pte Ltd filed Critical Verigy Singapore Pte Ltd
Publication of DE602006017446D1 publication Critical patent/DE602006017446D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE602006017446T 2006-08-04 2006-08-04 Testmodul mit blöcken universeller und spezifischer ressourcen Active DE602006017446D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2006/065080 WO2008014827A1 (en) 2006-08-04 2006-08-04 Test module with blocks of universal and specific resources

Publications (1)

Publication Number Publication Date
DE602006017446D1 true DE602006017446D1 (de) 2010-11-18

Family

ID=38169705

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006017446T Active DE602006017446D1 (de) 2006-08-04 2006-08-04 Testmodul mit blöcken universeller und spezifischer ressourcen

Country Status (8)

Country Link
US (1) US8384408B2 (de)
EP (1) EP2047289B1 (de)
JP (1) JP5201741B2 (de)
KR (1) KR101370728B1 (de)
CN (1) CN101501517B (de)
DE (1) DE602006017446D1 (de)
TW (1) TWI345637B (de)
WO (1) WO2008014827A1 (de)

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EP2047289B1 (de) 2006-08-04 2010-10-06 Verigy (Singapore) Pte. Ltd. Testmodul mit blöcken universeller und spezifischer ressourcen
US8362791B2 (en) * 2008-06-20 2013-01-29 Advantest Corporation Test apparatus additional module and test method
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JPWO2011001462A1 (ja) * 2009-06-29 2012-12-10 株式会社アドバンテスト 試験装置
JP2011007721A (ja) * 2009-06-29 2011-01-13 Yokogawa Electric Corp 半導体試験装置、半導体試験方法および半導体試験プログラム
US8194325B2 (en) * 2009-06-30 2012-06-05 Nokia Corporation Optical apparatus and method
US9836376B2 (en) * 2009-09-24 2017-12-05 Contec, Llc Method and system for automated test of end-user devices
US8228084B1 (en) * 2009-09-29 2012-07-24 Marvell International Ltd. Systems and methods for self-testing of integrated devices during production
US9032129B2 (en) * 2009-10-14 2015-05-12 Silicon Laboratories Norway As Advanced energy profiler
CN102869998B (zh) * 2010-01-20 2015-02-11 爱德万测试(新加坡)私人有限公司 用于测试待测装置的方法及设备
KR101640831B1 (ko) * 2010-03-16 2016-07-20 삼성전자주식회사 반도체 소자 및 이를 포함하는 테스트 장치
CN102201267A (zh) * 2010-03-26 2011-09-28 上海摩波彼克半导体有限公司 基于FPGA实现Nandflash闪存控制器电路验证的平台系统及方法
KR101135394B1 (ko) * 2010-04-29 2012-04-17 전자부품연구원 다양한 측정모듈들이 선택적으로 장착되어 이용되는 무선모듈 테스트 장치 및 시스템
CN102063420A (zh) * 2010-12-29 2011-05-18 东莞市创锐电子技术有限公司 一种测试程序中测试项信息参数的编辑方法及其编辑系统
US9759772B2 (en) * 2011-10-28 2017-09-12 Teradyne, Inc. Programmable test instrument
US9470759B2 (en) 2011-10-28 2016-10-18 Teradyne, Inc. Test instrument having a configurable interface
US10776233B2 (en) 2011-10-28 2020-09-15 Teradyne, Inc. Programmable test instrument
US8924786B2 (en) 2012-06-28 2014-12-30 Intel Corporation No-touch stress testing of memory I/O interfaces
CN103336240A (zh) * 2013-06-04 2013-10-02 上海华力微电子有限公司 一种应用于集成电路的芯片测试中的测试电路
TWI504906B (zh) * 2013-10-23 2015-10-21 Princeton Technology Corp 自動化測試系統和方法
CN104570990B (zh) * 2013-10-29 2018-10-16 恩智浦美国有限公司 智能操作装置资源分配系统
CN104678986B (zh) * 2013-11-28 2017-11-24 中车大连电力牵引研发中心有限公司 变流控制单元自动测试方法、控制器和自动测试系统
KR20160015046A (ko) 2014-07-30 2016-02-12 (주) 에어로매스터 항공 시험 장비의 자체 진단 치구
US9568368B2 (en) * 2014-09-17 2017-02-14 Fluke Corporation Mobile device used with isolated test and measurement input block
US10602082B2 (en) 2014-09-17 2020-03-24 Fluke Corporation Triggered operation and/or recording of test and measurement or imaging tools
WO2016065261A1 (en) 2014-10-24 2016-04-28 Fluke Corporation Imaging system employing fixed, modular mobile, and portable infrared cameras with ability to receive, communicate, and display data and images with proximity detection
KR101706577B1 (ko) * 2015-07-06 2017-02-27 국일메카트로닉스 주식회사 센서 네트워크 밸런싱 조정 장치 및 그 조절방법
CN104965168B (zh) * 2015-07-23 2017-11-10 北京华峰测控技术有限公司 一种用于集成电路测试的fpga配置系统及方法
US10530977B2 (en) 2015-09-16 2020-01-07 Fluke Corporation Systems and methods for placing an imaging tool in a test and measurement tool
WO2017070629A1 (en) 2015-10-23 2017-04-27 Fluke Corporation Imaging tool for vibration and/or misalignment analysis
US10779056B2 (en) 2016-04-14 2020-09-15 Contec, Llc Automated network-based test system for set top box devices
CN106124966A (zh) * 2016-08-02 2016-11-16 邹霞 电源计数器故障检测系统及其检测方法
CN107885181A (zh) * 2016-09-30 2018-04-06 上海复旦微电子集团股份有限公司 现场可编程门阵列芯片中dsp单元的测试系统
US10284456B2 (en) 2016-11-10 2019-05-07 Contec, Llc Systems and methods for testing electronic devices using master-slave test architectures
CN109067956B (zh) * 2018-08-01 2021-04-27 奇安信科技集团股份有限公司 对用于警务系统的终端进行检测的方法及装置、警务系统
US10761138B2 (en) * 2018-09-18 2020-09-01 Advantest Corporation Low cost built-in-self-test centric testing
WO2020152230A1 (en) * 2019-01-22 2020-07-30 Advantest Corporation Automated text equipment using an on-chip-system test controller
CN109709474B (zh) * 2019-02-28 2021-06-04 西安太乙电子有限公司 一种射频混合信号集成电路测试系统与测试方法
US11442098B2 (en) * 2019-06-20 2022-09-13 Teradyne, Inc. Generating a waveform based on digital pulses

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CN85108326A (zh) * 1984-11-20 1986-12-03 得克萨斯仪器公司 有自测试能力的超大规模集成电路
US6275962B1 (en) * 1998-10-23 2001-08-14 Teradyne, Inc. Remote test module for automatic test equipment
US6629282B1 (en) * 1999-11-05 2003-09-30 Advantest Corp. Module based flexible semiconductor test system
US6536006B1 (en) * 1999-11-12 2003-03-18 Advantest Corp. Event tester architecture for mixed signal testing
US6377065B1 (en) * 2000-04-13 2002-04-23 Advantest Corp. Glitch detection for semiconductor test system
US6314034B1 (en) * 2000-04-14 2001-11-06 Advantest Corp. Application specific event based semiconductor memory test system
ATE298904T1 (de) 2000-07-07 2005-07-15 Sun Microsystems Inc Prüfung eines softwarepakets
JP2002286800A (ja) * 2001-03-26 2002-10-03 Hitachi Electronics Eng Co Ltd 半導体試験装置
US7362089B2 (en) * 2004-05-21 2008-04-22 Advantest Corporation Carrier module for adapting non-standard instrument cards to test systems
US7210087B2 (en) 2004-05-22 2007-04-24 Advantest America R&D Center, Inc. Method and system for simulating a modular test system
US7046027B2 (en) * 2004-10-15 2006-05-16 Teradyne, Inc. Interface apparatus for semiconductor device tester
EP2047289B1 (de) 2006-08-04 2010-10-06 Verigy (Singapore) Pte. Ltd. Testmodul mit blöcken universeller und spezifischer ressourcen
US7640471B2 (en) * 2006-10-13 2009-12-29 Texas Instruments Incorporated On-board FIFO memory module for high speed digital sourcing and capture to/from DUT (device under test) using a clock from DUT

Also Published As

Publication number Publication date
US20100164527A1 (en) 2010-07-01
JP2009545727A (ja) 2009-12-24
CN101501517A (zh) 2009-08-05
KR20090046924A (ko) 2009-05-11
TWI345637B (en) 2011-07-21
CN101501517B (zh) 2013-02-06
EP2047289A1 (de) 2009-04-15
EP2047289B1 (de) 2010-10-06
TW200809232A (en) 2008-02-16
JP5201741B2 (ja) 2013-06-05
WO2008014827A1 (en) 2008-02-07
US8384408B2 (en) 2013-02-26
KR101370728B1 (ko) 2014-03-06

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