IL122768A - Contact probe unit - Google Patents

Contact probe unit

Info

Publication number
IL122768A
IL122768A IL12276897A IL12276897A IL122768A IL 122768 A IL122768 A IL 122768A IL 12276897 A IL12276897 A IL 12276897A IL 12276897 A IL12276897 A IL 12276897A IL 122768 A IL122768 A IL 122768A
Authority
IL
Israel
Prior art keywords
probe unit
contact probe
contact
unit
probe
Prior art date
Application number
IL12276897A
Other languages
English (en)
Other versions
IL122768A0 (en
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=5178041&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=IL122768(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of IL122768A0 publication Critical patent/IL122768A0/xx
Publication of IL122768A publication Critical patent/IL122768A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
IL12276897A 1996-12-27 1997-12-25 Contact probe unit IL122768A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP35068096 1996-12-27
JP18001697A JP3326095B2 (ja) 1996-12-27 1997-07-04 導電性接触子

Publications (2)

Publication Number Publication Date
IL122768A0 IL122768A0 (en) 1998-08-16
IL122768A true IL122768A (en) 2000-06-29

Family

ID=5178041

Family Applications (1)

Application Number Title Priority Date Filing Date
IL12276897A IL122768A (en) 1996-12-27 1997-12-25 Contact probe unit

Country Status (8)

Country Link
US (1) US6323667B1 (xx)
EP (1) EP0950191B1 (xx)
JP (1) JP3326095B2 (xx)
KR (1) KR100348698B1 (xx)
CN (2) CN1769897A (xx)
DE (1) DE69711083T2 (xx)
IL (1) IL122768A (xx)
MY (1) MY119910A (xx)

Families Citing this family (75)

* Cited by examiner, † Cited by third party
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JP3326095B2 (ja) * 1996-12-27 2002-09-17 日本発条株式会社 導電性接触子
JP2000338151A (ja) * 1999-05-31 2000-12-08 Micro Craft Kk プリント配線基板用インピーダンス測定装置
US6856152B2 (en) * 1999-05-31 2005-02-15 Microcraft K.K. Impedance measuring device for printed wiring board
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WO2001096883A2 (en) * 2000-06-16 2001-12-20 Nhk Spring Co., Ltd. Microcontactor probe and electric probe unit
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JP2003014779A (ja) * 2001-07-02 2003-01-15 Nhk Spring Co Ltd 導電性接触子
ATE371196T1 (de) * 2002-03-05 2007-09-15 Rika Denshi America Inc Vorrichtung für eine schnittstelle zwischen elektronischen gehäusen und testgeräten
US6688906B2 (en) 2002-05-28 2004-02-10 Agilent Technologies Inc. Probes and methods for testing electrical circuits
US6696850B1 (en) * 2002-10-02 2004-02-24 Interconnect Devices, Inc. Contact probe with off-centered back-drilled aperture
KR100977324B1 (ko) * 2003-05-09 2010-08-20 동부일렉트로닉스 주식회사 계측기의 멀티 탐침 장치
US7980325B2 (en) * 2004-01-16 2011-07-19 Credo Technology Corporation Rotating shaft locking mechanism
JP4695337B2 (ja) * 2004-02-04 2011-06-08 日本発條株式会社 導電性接触子および導電性接触子ユニット
WO2005083773A1 (ja) * 2004-02-27 2005-09-09 Advantest Corporation プローブカード及びその製造方法
US7315176B2 (en) 2004-06-16 2008-01-01 Rika Denshi America, Inc. Electrical test probes, methods of making, and methods of using
US7626408B1 (en) * 2005-02-03 2009-12-01 KK Technologies, Inc. Electrical spring probe
US7154286B1 (en) * 2005-06-30 2006-12-26 Interconnect Devices, Inc. Dual tapered spring probe
DE102006005319B4 (de) * 2006-02-06 2010-12-30 Infineon Technologies Ag Heizvorrichtung zum Testen integrierter Bauelemente
JP2007285882A (ja) * 2006-04-17 2007-11-01 Nidec-Read Corp 基板検査用接触子、基板検査用治具および基板検査装置
JP2007304008A (ja) * 2006-05-12 2007-11-22 Nidec-Read Corp 基板検査用接触子、基板検査用治具及び基板検査装置
US7601009B2 (en) * 2006-05-18 2009-10-13 Centipede Systems, Inc. Socket for an electronic device
JP4857046B2 (ja) 2006-08-02 2012-01-18 株式会社エンプラス 電気接触子及び電気部品用ソケット
KR100854267B1 (ko) * 2006-08-08 2008-08-26 정운영 포고핀의 제조방법과, 이를 이용한 테스트 소켓
JP4939879B2 (ja) * 2006-09-13 2012-05-30 株式会社エンプラス 電気接触子、及び、電気部品用ソケット
WO2008084627A1 (ja) * 2006-12-19 2008-07-17 Nhk Spring Co., Ltd. 導電性接触子ユニット
KR100806379B1 (ko) * 2006-12-22 2008-02-27 세크론 주식회사 프로브 및 이를 포함하는 프로브 카드
KR100769891B1 (ko) 2007-01-25 2007-10-24 리노공업주식회사 검사용 탐침 장치 및 이를 이용한 검사용 소켓
KR100759082B1 (ko) 2007-02-06 2007-09-19 주식회사 엔티에스 프로브장치 및 이의 제조방법
JP4999079B2 (ja) 2007-04-10 2012-08-15 サンユー工業株式会社 プローブ
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JP4566248B2 (ja) * 2008-03-06 2010-10-20 日本電子材料株式会社 垂直コイルスプリングプローブ
JP2010025665A (ja) * 2008-07-17 2010-02-04 Nidec-Read Corp 基板検査治具及び接触子
WO2010048971A1 (en) * 2008-10-30 2010-05-06 Verigy (Singapore) Pte., Ltd. Test arrangement, pogo-pin and method for testing a device under test
US7798867B2 (en) * 2008-11-12 2010-09-21 Interconnect Devices, Inc. Environmentally sealed contact
DE102008060985A1 (de) * 2008-12-06 2010-06-10 Dr. Ing. H.C. F. Porsche Aktiengesellschaft Prüfverfahren und Vorrichtung zur Durchführung des Prüfverfahrens
JP4900843B2 (ja) 2008-12-26 2012-03-21 山一電機株式会社 半導体装置用電気接続装置及びそれに使用されるコンタクト
US7874880B2 (en) * 2009-02-26 2011-01-25 Ironwood Electronics, Inc. Adapter apparatus with sleeve spring contacts
TWI482973B (zh) * 2009-04-03 2015-05-01 Nhk Spring Co Ltd 彈簧用線材、接觸探針及探針單元
WO2011115082A1 (ja) * 2010-03-15 2011-09-22 日本電産リード株式会社 接続端子及び接続治具
WO2011162362A1 (ja) 2010-06-25 2011-12-29 日本発條株式会社 コンタクトプローブおよびプローブユニット
WO2012014673A1 (ja) * 2010-07-29 2012-02-02 Nishikawa Hideo 検査治具及び接触子
JP5345598B2 (ja) * 2010-09-01 2013-11-20 秀雄 西川 検査治具及び接触子
WO2012039226A1 (ja) 2010-09-21 2012-03-29 Nishikawa Hideo 検査治具及び接触子
US8506307B2 (en) 2010-12-02 2013-08-13 Interconnect Devices, Inc. Electrical connector with embedded shell layer
JP6109072B2 (ja) * 2011-10-07 2017-04-05 日本発條株式会社 プローブユニット
JP2013096699A (ja) * 2011-10-27 2013-05-20 Japan Electronic Materials Corp 電気的接触子構造
JP5465229B2 (ja) * 2011-11-14 2014-04-09 株式会社エンプラス 電気接触子
JP5858781B2 (ja) * 2011-12-29 2016-02-10 株式会社エンプラス プローブピン及び電気部品用ソケット
KR101348206B1 (ko) * 2013-01-08 2014-01-10 주식회사 아이에스시 복수의 스프링부재를 가지는 탐침장치
KR101348205B1 (ko) * 2013-01-08 2014-01-10 주식회사 아이에스시 탐침장치
US20140266277A1 (en) * 2013-03-18 2014-09-18 Cheng Yun Technology Co., Ltd. Semiconductor testing probe needle
US9894773B2 (en) * 2013-12-17 2018-02-13 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Adding test access to a back-drilled VIA
WO2015105209A1 (ko) * 2014-01-09 2015-07-16 주식회사 아이에스시 탐침장치
WO2015163160A1 (ja) * 2014-04-21 2015-10-29 オーキンス エレクトロニクス カンパニー，リミテッド プローブピンおよびｉｃソケット
JP6442668B2 (ja) * 2014-04-21 2018-12-26 株式会社ネバーグ プローブピンおよびｉｃソケット
TWI560454B (en) * 2014-11-07 2016-12-01 Primax Electronics Ltd Testing base
CN104459227A (zh) * 2014-12-31 2015-03-25 中国科学院上海硅酸盐研究所 一种太阳能电池测试夹具
US10161963B2 (en) * 2015-08-17 2018-12-25 Chaojiong Zhang Electrical contact and testing apparatus
JP6837283B2 (ja) 2016-02-29 2021-03-03 株式会社ヨコオ ソケット
JP6642359B2 (ja) * 2016-09-21 2020-02-05 オムロン株式会社 プローブピンおよび検査ユニット
JP2018107011A (ja) * 2016-12-27 2018-07-05 株式会社エンプラス 電気接触子及び電気部品用ソケット
CN106841999B (zh) * 2017-03-24 2023-05-30 深圳市斯纳达科技有限公司 集成电路测试装置及其测试探针
CN108241078B (zh) * 2017-05-18 2020-06-02 苏州韬盛电子科技有限公司 垂直探针卡
JP7098886B2 (ja) * 2017-07-04 2022-07-12 日本電産リード株式会社 接触端子、検査治具、及び検査装置
KR102279465B1 (ko) * 2017-07-21 2021-07-21 주식회사 기가레인 프로브 카드용 박막 저항기
KR20210021349A (ko) 2018-06-14 2021-02-25 폼팩터, 인크. 디커플링된 전기적 및 기계적 설계를 갖는 전기 테스트 프로브들
JP6837513B2 (ja) * 2019-05-07 2021-03-03 株式会社ヨコオ ソケット
CN112129975A (zh) * 2019-06-25 2020-12-25 中国探针股份有限公司 电连接组件
CN112688104A (zh) * 2020-12-24 2021-04-20 奥普家居股份有限公司 通过开闭门板切换控制器有线通讯的集成灶
CN113295192B (zh) * 2021-05-18 2023-04-07 南京大学 一种接触型力和声复合传感器
CN113708724A (zh) * 2021-08-27 2021-11-26 西安隆基乐叶光伏科技有限公司 一种太阳能电池片的检测探针
CN117434314B (zh) * 2023-09-11 2024-07-12 法特迪精密科技（苏州）有限公司 一种旋转探针与配套插座的适配装置及方法
CN117805592B (zh) * 2024-01-08 2024-06-07 安盈半导体技术(常州)有限公司 一种柔性介质芯片测试接口

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JP2539453B2 (ja) 1987-09-11 1996-10-02 株式会社日立製作所 半導体素子検査装置
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JP2993980B2 (ja) 1989-12-29 1999-12-27 新光電気工業株式会社 基板用コンタクトプローブ
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JPH07115253A (ja) 1993-10-18 1995-05-02 Hitachi Chem Co Ltd 金属ベース基板
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JPH1038920A (ja) 1996-07-29 1998-02-13 Sankyo Seiki Mfg Co Ltd プローブユニット
JPH10111315A (ja) 1996-10-04 1998-04-28 Mitsubishi Electric Corp プローブカードおよびこれを用いた試験装置

Also Published As

Publication number Publication date
US6323667B1 (en) 2001-11-27
EP0950191B1 (en) 2002-03-13
JP3326095B2 (ja) 2002-09-17
IL122768A0 (en) 1998-08-16
KR100348698B1 (ko) 2002-08-13
CN1769897A (zh) 2006-05-10
EP0950191A1 (en) 1999-10-20
MY119910A (en) 2005-08-30
KR20000062366A (ko) 2000-10-25
DE69711083D1 (de) 2002-04-18
DE69711083T2 (de) 2002-07-18
CN1242078A (zh) 2000-01-19
JPH10239349A (ja) 1998-09-11
CN1236316C (zh) 2006-01-11

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